0% found this document useful (0 votes)
26 views13 pages

Submicron CMOS Process Flow Overview

Uploaded by

ceralap881
Copyright
© All Rights Reserved
We take content rights seriously. If you suspect this is your content, claim it here.
Available Formats
Download as PPTX, PDF, TXT or read online on Scribd
0% found this document useful (0 votes)
26 views13 pages

Submicron CMOS Process Flow Overview

Uploaded by

ceralap881
Copyright
© All Rights Reserved
We take content rights seriously. If you suspect this is your content, claim it here.
Available Formats
Download as PPTX, PDF, TXT or read online on Scribd

AY-2025-

2026
ODD SEM
Department of ECE

MIXED SIGNAL IC DESIGN


22VLS3505
Topic:
Submicron CMOS:CMOS Process
Flow

Session - 2
AIM OF THE SESSION
1. To provide an in-depth understanding of submicron CMOS technology, including device modeling, process flow, and its application
in digital and analog circuit design.
2. To enable students to apply CMOS principles in designing and analyzing both digital logic blocks and analog building blocks using
modern submicron processes.

INSTRUCTIONAL OBJECTIVES

This Session is designed to:


1. Explain the CMOS process flow and identify key fabrication steps including capacitor and resistor formation.
2. Describe how MOSFETs function as switches in digital circuits and analyze delay elements and adder circuits.
3. Illustrate analog design principles such as biasing, operational amplifier configuration, and key noise sources.
4. Relate the role of compact models and short-channel effects to performance in submicron CMOS technologies.

LEARNING OUTCOMES

At the end of this session, you should be able to:


1. Analyze and design basic digital and analog circuits using submicron CMOS models.
2. Interpret CMOS process flow diagrams and recognize how passive elements like capacitors and resistors are integrated on-
chip.
3. Evaluate the impact of process and device-level parameters on the performance and noise behavior of analog and digital
circuits.
Introduction to CMOS Process

 CMOS = Complementary Metal Oxide


Semiconductor
 Submicron refers to feature sizes < 1 µm
 Process flow involves multiple steps to
create NMOS and PMOS on a single
wafer.
 Importance: Determines performance, Fig: Schematic view of the CMOS process flow.

yield, cost.

3
Starting Material – Silicon Wafer

 High-purity single-crystal
silicon
 Types:
 p-type (doped with Boron)
 n-type (doped with
Phosphorus)
 Typical diameter: 200mm,
Fig: Silicon Wafer Process
300mm
4
Oxidation

 Thermal oxidation forms SiO₂ layer on Si


 Acts as gate oxide or isolation
 Dry oxidation (thin, high quality)
 Wet oxidation (thicker, faster growth)

Fig: Semiconductor Wafer Thermal Oxidation Method

5
Photolithography

 Patterning technique using light and


masks
 Coating
 Aligning
 Exposing
 Developing photoresist
 Positive vs Negative resists
 Resolution limited by wavelength
 Deep UV Fig: Photolithography process steps:
(A) coating of photoresist on the substrate, mask placed
 EUV over upper layer and exposed to UV radiation,
(B) resist development and stripping
(C) ion etching process,
(D) final QD structure after process.
Etching

 Removes layers not protected by


photoresist
 Types:
 Wet (chemical)
 Dry (plasma, RIE)
 Submicron tech uses anisotropic dry
etching for vertical profiles
 Selectivity: Etch one layer without
damaging other

Fig: Anisotropic and isotropic plasma


etching
Doping – Ion Implantation

 Introduce carriers (electrons/holes) by


implanting dopant ions
 NMOS: Phosphorus/Arsenic
 PMOS: Boron
 Precise control of dose, depth, and
location
 Followed by annealing to activate and
repair crystal damage
Fig: basic structure of an ion implanter
with magnetic analysis.
Gate Formation

 Gate oxide: ultra-thin SiO₂ (~1-2 nm in


submicron)
 Gate electrode: polysilicon (older) or metal
(modern)
 Defines channel length (L) → critical in
submicron scaling
 Modern nodes use High-k / Metal Gate
(HKMG) for leakage control

Fig: MOSFET
Structure
Spacer Formation and S/D Engineering

 Spacer: Deposited sidewall layer (usually


Si₃N₄)
 Forms after gate etch to protect gate side

 LDD (Lightly Doped Drain) near channel

 HDD (Heavily Doped Drain) after spacers

 Reduces hot-carrier and SCE effects


Fig: submicron
MOSFET with sidewall
spacers:
Passivation, Dicing & Testing

 Final passivation layer: protects IC from


environment
 Wafer : diced into individual dies
 Electrical testing: functional, parametric
 Good dies are packaged into ICs (e.g., QFN, Fig: Wire Bonding Process in
BGA, DIP) Semiconductor industry
Conclusion and Future Trends

 Submicron CMOS drives modern electronics


 Key is balancing performance, power, and
area (PPA)
 Future:
 CFET (Complementary FET)
 3D stacked transistors
 AI-assisted chip design
 Need for improved models and tools
Fig: Evolution of Transistors
THANK YOU

Team – LOW POWER VLSI DESIGN

Prepared by Dr. [Link]


Sravani
13

You might also like