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CMOS Transistor Operation and I-V Curves

This document provides an overview of CMOS transistor theory. It discusses the MOS capacitor structure and how the transistor operates in different modes depending on the voltages at the gate, source, and drain terminals. These modes include cutoff, linear, and saturation. The linear region current depends on both the charge in the channel and how fast the charge is moving. The channel charge is modeled as a parallel plate capacitor with the gate and channel as the plates.

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0% found this document useful (0 votes)
19 views29 pages

CMOS Transistor Operation and I-V Curves

This document provides an overview of CMOS transistor theory. It discusses the MOS capacitor structure and how the transistor operates in different modes depending on the voltages at the gate, source, and drain terminals. These modes include cutoff, linear, and saturation. The linear region current depends on both the charge in the channel and how fast the charge is moving. The channel charge is modeled as a parallel plate capacitor with the gate and channel as the plates.

Uploaded by

Harshdeep Bhatia
Copyright
© All Rights Reserved
We take content rights seriously. If you suspect this is your content, claim it here.
Available Formats
Download as PPT, PDF, TXT or read online on Scribd

CMOS Transistor Theory

THANKS TO PROF. DAVID HARRIS


Outline
 Introduction
 MOS Capacitor
 nMOS I-V Characteristics
 pMOS I-V Characteristics
 Gate and Diffusion Capacitance
 Pass Transistors
 RC Delay Models

CMOS VLSI Design Slide 2


Introduction
 So far, we have treated transistors as ideal switches
 An ON transistor passes a finite amount of current
– Depends on terminal voltages
– Derive current-voltage (I-V) relationships
 Transistor gate, source, drain all have capacitance
– I = C (DV/Dt) -> Dt = (C/I) DV
– Capacitance and current determine speed
 Also explore what a “degraded level” really means

CMOS VLSI Design Slide 3


MOS Capacitor
 Gate and body form MOS capacitor
 Operating modes Vg < 0
polysilicon gate
silicon dioxide insulator
+
– Accumulation - p-type body

– Depletion (a)

– Inversion 0 < V g < Vt


depletion region
+
-

(b)

V g > Vt
inversion region
+
- depletion region

(c)

CMOS VLSI Design Slide 4


Terminal Voltages
 Mode of operation depends on Vg, Vd, Vs Vg

– Vgs = Vg – Vs Vgs
+ +
Vgd
– Vgd = Vg – Vd - -

– Vds = Vd – Vs = Vgs - Vgd Vs


-
Vds +
Vd

 Source and drain are symmetric diffusion terminals


– By convention, source is terminal at lower voltage
– Hence Vds  0
 nMOS body is grounded. First assume source is 0 too.
 Three regions of operation
– Cutoff
– Linear
– Saturation

CMOS VLSI Design Slide 5


nMOS Cutoff
 No channel
 Ids = 0

Vgs = 0 Vgd
+ g +
- -
s d

n+ n+

p-type body
b

CMOS VLSI Design Slide 6


nMOS Linear
 Channel forms
 Current flows from d to s
V > Vt
– e from s to d Vgd = Vgs
gs
- + g +
- -
 Ids increases with Vds s d
Vds = 0
n+ n+
 Similar to linear resistor p-type body
b

Vgs > Vt
Vgs > Vgd > Vt
+ g +
- - Ids
s d
n+ n+
0 < Vds < Vgs-Vt
p-type body
b

CMOS VLSI Design Slide 7


nMOS Saturation
 Channel pinches off
 Ids independent of Vds
 We say current saturates
 Similar to current source

Vgs > Vt
g Vgd < Vt
+ +
- -
s d Ids

n+ n+
Vds > Vgs-Vt
p-type body
b

CMOS VLSI Design Slide 8


I-V Characteristics
 In Linear region, Ids depends on
– How much charge is in the channel?
– How fast is the charge moving?

CMOS VLSI Design Slide 9


Channel Charge
 MOS structure looks like parallel plate capacitor
while operating in inversion
– Gate – oxide – channel
 Qchannel =

gate
Vg
polysilicon + +
gate source Vgs Cg Vgd drain
W
Vs - - Vd
tox
channel
n+ - + n+
SiO2 gate oxide
Vds
L
n+ n+ (good insulator, ox = 3.9) p-type body
p-type body

CMOS VLSI Design Slide 10


Channel Charge
 MOS structure looks like parallel plate capacitor
while operating in inversion
– Gate – oxide – channel
 Qchannel = CV
 C=

gate
Vg
polysilicon + +
gate source Vgs Cg Vgd drain
W
Vs - - Vd
tox
channel
n+ - + n+
SiO2 gate oxide
Vds
L
n+ n+ (good insulator, ox = 3.9) p-type body
p-type body

CMOS VLSI Design Slide 11


Channel Charge
 MOS structure looks like parallel plate capacitor
while operating in inversion
– Gate – oxide – channel
 Qchannel = CV
 C = Cg = oxWL/tox = CoxWL Cox = ox / tox
 V=
gate
Vg
polysilicon + +
gate source Vgs Cg Vgd drain
W
Vs - - Vd
tox
channel
n+ - + n+
SiO2 gate oxide
Vds
L
n+ n+ (good insulator, ox = 3.9) p-type body
p-type body

CMOS VLSI Design Slide 12


Channel Charge
 MOS structure looks like parallel plate capacitor
while operating in inversion
– Gate – oxide – channel
 Qchannel = CV
 C = Cg = oxWL/tox = CoxWL Cox = ox / tox
 V = Vgc – Vt = (Vgs – Vds/2) – Vt
gate
Vg
polysilicon + +
gate source Vgs Cg Vgd drain
W
Vs - - Vd
tox
channel
n+ - + n+
SiO2 gate oxide
Vds
L
n+ n+ (good insulator, ox = 3.9) p-type body
p-type body

CMOS VLSI Design Slide 13


Carrier velocity
 Charge is carried by e-
 Carrier velocity v proportional to lateral E-field
between source and drain
 v=

CMOS VLSI Design Slide 14


Carrier velocity
 Charge is carried by e-
 Carrier velocity v proportional to lateral E-field
between source and drain
 v = mE m called mobility
 E=

CMOS VLSI Design Slide 15


Carrier velocity
 Charge is carried by e-
 Carrier velocity v proportional to lateral E-field
between source and drain
 v = mE m called mobility
 E = Vds/L
 Time for carrier to cross channel:
– t=

CMOS VLSI Design Slide 16


Carrier velocity
 Charge is carried by e-
 Carrier velocity v proportional to lateral E-field
between source and drain
 v = mE m called mobility
 E = Vds/L
 Time for carrier to cross channel:
– t=L/v

CMOS VLSI Design Slide 17


nMOS Linear I-V
 Now we know
– How much charge Qchannel is in the channel
– How much time t each carrier takes to cross

I ds 

CMOS VLSI Design Slide 18


nMOS Linear I-V
 Now we know
– How much charge Qchannel is in the channel
– How much time t each carrier takes to cross
Qchannel
I ds 
t

CMOS VLSI Design Slide 19


nMOS Linear I-V
 Now we know
– How much charge Qchannel is in the channel
– How much time t each carrier takes to cross
Qchannel
I ds 
t
 mCox
W V  V  Vds V
 gs  ds
 2 
t
L
W
  Vgs  Vt  ds Vds
V  = mCox
 2 L

CMOS VLSI Design Slide 20


nMOS Saturation I-V
 If Vgd < Vt, channel pinches off near drain
– When Vds > Vdsat = Vgs – Vt
 Now drain voltage no longer increases current

I ds 

CMOS VLSI Design Slide 21


nMOS Saturation I-V
 If Vgd < Vt, channel pinches off near drain
– When Vds > Vdsat = Vgs – Vt
 Now drain voltage no longer increases current

I ds   Vgs  Vt  dsat Vdsat


V
 2

CMOS VLSI Design Slide 22


nMOS Saturation I-V
 If Vgd < Vt, channel pinches off near drain
– When Vds > Vdsat = Vgs – Vt
 Now drain voltage no longer increases current


I ds   Vgs  Vt 
Vdsat V
 dsat
 2 

  Vt 
2
 V gs
2

CMOS VLSI Design Slide 23


nMOS I-V Summary
 Shockley 1st order transistor models


 0 Vgs  Vt cutoff

  Vds V V  V
I ds    Vgs  Vt   ds linear
 2 
ds dsat

 
Vgs  Vt 
2
 Vds  Vdsat saturation
2

CMOS VLSI Design Slide 24


Example
 We will be using a 0.6 mm process for your project
– From AMI Semiconductor
– tox = 100 Å 2.5
V =5
– m = 350 cm /V*s
gs
2
2
– Vt = 0.7 V 1.5 V =4

Ids (mA)
gs

 Plot Ids vs. Vds 1


– Vgs = 0, 1, 2, 3, 4, 5 0.5
V =3 gs

– Use W/L = 4/2 l


V =2 gs
V =1 gs
0
0 1 2 3 4 5
W  3.9  8.85  1014   W  W Vds
  mCox   350  8    120 m A /V 2
L  100  10  L  L

CMOS VLSI Design Slide 25


pMOS I-V
 All dopings and voltages are inverted for pMOS
 Mobility mp is determined by holes
– Typically 2-3x lower than that of electrons mn
– 120 cm2/V*s in AMI 0.6 mm process
 Thus pMOS must be wider to provide same current
– In this class, assume mn / mp = 2

– *** plot I-V here

CMOS VLSI Design Slide 26


Capacitance
 Any two conductors separated by an insulator have
capacitance
 Gate to channel capacitor is very important
– Creates channel charge necessary for operation
 Source and drain have capacitance to body
– Across reverse-biased diodes
– Called diffusion capacitance because it is
associated with source/drain diffusion

CMOS VLSI Design Slide 27


Gate Capacitance
 Approximate channel as connected to source
 Cgs = oxWL/tox = CoxWL = CpermicronW
 Cpermicron is typically about 2 fF/mm

polysilicon
gate
W
tox
L SiO2 gate oxide
n+ n+ (good insulator, ox = 3.90)
p-type body

CMOS VLSI Design Slide 28


Diffusion Capacitance
 Csb, Cdb
 Undesirable, called parasitic capacitance
 Capacitance depends on area and perimeter
– Use small diffusion nodes
– Comparable to Cg
for contacted diff
– ½ Cg for uncontacted
– Varies with process

CMOS VLSI Design Slide 29

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