Data Sheet
Data Sheet
1
TC4427
TC4428
6
TC4427COA 8-Pin SOIC 0°C to +70°C OUTPUT
NONINVERTING
TC4427CPA 8-Pin Plastic DIP 0°C to +70°C OUTPUTS
TC4426/7/8-8 10/21/96
8
TELCOM SEMICONDUCTOR, INC. 4-245
1.5A DUAL HIGH-SPEED
POWER MOSFET DRIVERS
TC4426
TC4427
TC4428
NC 1 8 NC NC 1 8 NC NC 1 8 NC
IN A 2 7 OUT A IN A 2 7 OUT A IN A 2 7 OUT A
TC4426 TC4427 TC4428
GND 3 6 VDD GND 3 6 VDD GND 3 6 VDD
IN B 4 5 OUT B IN B 4 5 OUT B IN B 4 5 OUT B
2 7
ELECTRICAL CHARACTERISTICS: TA = +25°C with 4.5V ≤ VDD ≤ 18V, unless otherwise specified.
Symbol Parameter Test Conditions Min Typ Max Unit
Input
VIH Logic 1 High Input Voltage 2.4 — — V
VIL Logic 0 Low Input Voltage — — 0.8 V
IIN Input Current 0V ≤ VIN ≤ VDD –1 — 1 µA
Output
VOH High Output Voltage VDD – 0.025 — — V
VOL Low Output Voltage — — 0.025 V
RO Output Resistance VDD = 18V, IO = 10 mA — 7 10 Ω
IPK Peak Output Current Duty Cycle ≤ 2%, t ≤ 30 µsec — 1.5 — A
IREV Latch-Up Protection Duty Cycle ≤ 2% > 0.5 — — A
Withstand Reverse Current t ≤ 30 µsec
Switching Time (Note 1)
tR Rise Time Figure 1 — 19 30 nsec
tF Fall Time Figure 1 — 19 30 nsec
tD1 Delay Time Figure 1 — 20 30 nsec
tD2 Delay Time Figure 1 — 40 50 nsec
Power Supply
IS Power Supply Current VIN = 3V (Both Inputs) — — 4.5 mA
VIN = 0V (Both Inputs) — — 0.4 mA
NOTE: 1. Switching times are guaranteed by design.
10
–8
Crossover Energy Loss 5
9 +5V
90%
8
INPUT
7
6 0V
10%
VDD= 18V tD1 tD2
5 tF tR
VDD
A • sec
6
6
3 10% 10%
2,4 5,7 0V
INPUT OUTPUT
CL = 1000 pF Inverting Driver
2
+5V
90%
INPUT
–9
10 3 0V
10%
4 6 8 10 12 14 16 18
VDD VDD
90% 90%
tD1 tD2
INPUT: 100 kHz, square wave, tR tF
Thermal Derating Curves OUTPUT
7
tRISE = tFALL ≤ 10ns
1600
0V 10% 10%
1400
8 Pin DIP
Noninverting Driver
MAX. POWER (mW)
1200
8 Pin CerDIP
1000
800
8 Pin SOIC
600 Figure 1. Switching Time Test Circuit
400
NOTE: The values on this graph represent the loss seen by both drivers in a package
200
during one complete cycle. For a single driver, divide the stated values by 2. For a
0
0 10 20 30 40 50 60 70 80
AMBIENT TEMPERATURE (°C)
90 100 110 120
single transition of a single driver, divide the stated value by 4.
8
TELCOM SEMICONDUCTOR, INC. 4-247
1.5A DUAL HIGH-SPEED
POWER MOSFET DRIVERS
TC4426
TC4427
TC4428
TYPICAL CHARACTERISTICS
Rise Time vs. Supply Voltage Fall Time vs. Supply Voltage
100 100
2200 pF TA = 25°C 2200 pF TA = 25°C
80 80
1500 pF
1500 pF
tFALL (nsec)
tRISE (nsec)
60 60
1000 pF
1000 pF
40 40
470 pF
470 pF
20 20
100 pF 100 pF
0 0
4 6 8 10 12 14 16 18 4 6 8 10 12 14 16 18
VDD VDD
Rise TIme vs. Capacitive Load Fall TIme vs. Capacitive Load
100 100
5V 5V
TA = 25°C TA = 25°C
80 80
tFALL (nsec)
tRISE (nsec)
10V
60 60 10V
15V
15V
40 40
20 20
0 0
100 1000 10,000 100 1000 10,000
CLOAD (pF) CLOAD (pF)
Rise and Fall Times vs. Temperature Propagation Delay vs. Supply Voltage
60 60
C LOAD = 1000 pF CLOAD = 1000 pF
VDD = 17.5V t D2
50 50
DELAY TIME (nsec)
TA = 25°C
TIME (nsec)
40 40
tD1
30 30
tFALL
20 tRISE 20
10 10
–55 –35 –15 5 25 45 65 85 105 125 4 6 8 10 12 14 16 18
TEMPERATURE (°C) VDD
Effect of Input Amplitude on Delay Time Propagation Delay Time vs. Temperature 2
60 60
C LOAD = 1000 pF VDD = 18V
VDD = 10V VLOAD= 1000 pF
50 50
DELAY TIME (nsec)
40 40
30
t D2
30
t D1 3
20 t D1 20
10 10
0 2 4 6 8 10 –55 –35 –15 5 25 45 65 85 105 125
VDRIVE (V)
3.5
IQUIESCENT (mA)
IQUIESCENT (mA)
BOTH INPUTS = 1
1 3.0
BOTH INPUTS = 1
5
2.5
BOTH INPUTS = 0
0.1 2.0
4 6 8 10
VDD
12 14 16 18 –55 –35 –15 5 25 45
TA (°C)
65 85 105 125
6
High-State Output Resistance Low-State Output Resistance
25 25
20 20
WORST CASE @ TJ = +150°C WORST CASE @ TJ = +150°C
7
RDS(ON) (Ω)
RDS(ON) (Ω)
15 15
8 8
8
5 5
4 6 8 10 12 14 16 18 4 6 8 10 12 14 16 18
VDD VDD
ISUPPLY (mA)
40 40
100 pF
30 600 kHz 30
20 20
10 200 kHz 10
20 kHz
0 0
100 1000 10,000 10 100 1000
CLOAD (pF) FREQUENCY (kHz)
40 40
ISUPPLY (mA)
ISUPPLY (mA)
1000 pF
30 30
900 kHz
20 20 100 pF
600 kHz
10 10
200 kHz
20 kHz
0 0
100 1000 10,000 10 100 1000
CLOAD (pF) FREQUENCY (kHz)
ISUPPLY (mA)
40 40
30 30 2200 pF
2 MHz
20 20 1000 pF
900 kHz
10 600 kHz 10 100 pF
200 kHz
20 kHz
0 0
100 1000 10,000 10 100 1000
CLOAD (pF) FREQUENCY (kHz)