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Understanding
Phased Array
Technology
 Understanding Phased Array Technology
Basic Concepts
The distinguishing feature of phased array (PA) ultrasonic testing
(UT) is the computer-controlled excitation (amplitude and delay) of
Examples of focal laws
Acquisition unit Phased array unit
individual elements in a multielement probe. The excitation of multiple
piezocomposite elements can generate a focused ultrasonic beam, and Probe elements
software can be used to dynamically modify beam parameters such as Pulses
Incident wave front
140

angle, focal distance, and focal spot size. To generate a beam in phase Trigger
FD= 15

by means of constructive interference, the various active transducer

120
Transmitting Delay (ns) Delay (ns)
Emitting Flaw
elements are pulsed at slightly different times. Similarly, the echo from delays 100
FD= 15
PA probe
the desired focal point hits the various transducer elements with a time PA probe

Time delay [ns]

80
FD= 30

shift that can be calculated. The echoes received by each element are
Incident angle steering FD= 30
60
Reflected wave front
time-shifted before being summed together. The resulting sum is an Echo signals 40

A-scan that emphasizes the response from the desired focal point and
FD= 60
FD= 60

attenuates echoes from other points in the test piece.

20
Receiving Receiving delays
Flaw
and sum 0
Incident wave front 0 4 8 12 16 20 24 28 32
Incident wave front Element number

Delay values (left) and depth scanning principles

Illustration of beam focusing Illustration of beam steering (right) for a 32-element linear array probe focusing
at 15-mm, 30-mm, and 60-mm longitudinal waves.

Scanning Patterns
Electronic linear scanning Sectorial scanning Compound scanning
With electronic scanning, a single focal law is multiplexed across a group of active elements;
scanning is performed at a constant angle and along the phased array probe length (aperture). With sectorial scanning (also called azimuthal or angular scanning), the beam is moved through a A compound scan is an improved inspection strategy in applications such as weld inspection.
This is equivalent to a conventional ultrasonic transducer performing a raster scan for corrosion sweep range for a specific focal depth using the same elements; other sweep ranges with different A compound scan consists of a mix of linear and sectorial beams; the lower active aperture
mapping or shear-wave inspection. If an angled wedge is used, the focal laws compensate for focal depths may be added. The angular sectors may have different values. generates the lower angle beam and the higher active aperture generates the higher angle beam.
different time delays inside the wedge. This technique produces a compound S-scan, providing a higher probability of detection, faster
inspections, shorter setup and calibration time, faster data analysis, and smaller file sizes. When
inspecting welds, this technique results in better weld coverage.

Phased Array Probes

Linear arrays are the most commonly used phased array probes for industrial applications, making the
active probe aperture one of the most important features. Phased array probes are made in a variety of shapes and sizes for different applications.
e
The active aperture (A) is the total active probe length. Aperture length is given by the following formula: A few types are illustrated here:

A = (n – 1) • p + e
wheren = Number of elements in the PA probe W passive
n=8 Linear 1.5-D array 2-D array

p = Elementary pitch—distance between the centers of two adjacent elements

e = Element width—width of a single piezocomposite element (a practical value is e < λ/2)
g = Gap between adjacent elements
λ=v Convex Concave Annular Internal focus

f p g
whereλ = Wavelength
A
v = Material sound velocity
Skewing Variable angle Dual linear Dual 1.5-D
f = Frequency

Time-Corrected Gain

70° 70° 70° 70° 70° 70°

60° 60° 60° 60° 60° 60°

45° 45° 45° 45° 45° 45°

In order to cover the whole volume of the part with consistency, each focal law has to be calibrated
for attenuation and beam spread. This time-corrected gain (TCG) calibration can be performed with
a calibration block having several identical reflectors (for example, side-drilled holes) at different
depths. Using a sectorial scan, the probe is moved back and forth so that each beam hits each
reflector. The amplitude of each signal is recorded (DAC) and used to construct one TCG curve
per focal law.

Distance-amplitude curves (DAC) used to create the Once the TCG calibration is completed, each focal law has one individual TCG curve. Consequently, a reflector will always yield the same signal amplitude,
time-corrected gain (TCG) regardless of its position inside the part and of the beam that detected it. A defect detected at a depth of 3 mm with an angle of 45 degrees will provide the
same signal amplitude as if it were at 10 mm and detected at 60 degrees.

Defect Positioning

Top

RA
PA
RA Reference point to the indication in gate A
B0
PA Probe front face to the indication in gate A
Bottom
DA
45° SA DA Depth of the indication in gate A
T1
Top
SA Sound-path length to the indication in gate A

For manual inspections, real-time readings are essential to quickly position the reflected signal source with RA, PA, DA, and SA readings enable the user to accurately
respect to the part geometry and/or probe location. position the defect in real time during an inspection.

Probe Types

Angle Beam Near Wall Immersion 2-D and 1.5-D Arrays Dual Arrays
Angle beam probes are used with a removable or The near wall probe is designed to minimize the dead Immersion probes are designed to be used with a Two-dimensional arrays have multiple strips of linear Two linear or two 1.5-D array probes can be
integrated wedge to transmit a refracted shear or zone at probe ends by reducing the distance between water wedge or in an immersion tank when the test arrays, enabling electronic focusing and steering in positioned on a roof-angled wedge. One of the
longitudinal wave into a test piece. They are designed the last available element and the external edge of part is partially or wholly immersed. The water acts as both probe axes. 2-D arrays have the same number of probes is used as a transmitter whereas the other
for a wide range of applications and can be used the housing. This probe type is useful for composite a uniform couplant and delay line. Immersion probes elements in both dimensions, whereas 1.5-D applies probe is used as a receiver. This configuration offers
to vary the refracted beam angle or the skew of radius and corner inspections or any application are longitudinal-wave probes that can be set up for to probes with any combination of uneven numbers of optimal performance in noisy materials such as
the beam, depending on the wedge orientation. requiring close contact to a wall using a 0° wedge. refracted shear-wave inspection under water. elements. The probes can be used for achieving austenitic steel, and is widely used in the power-
The probe face is acoustically matched to the Immersion probes are mostly intended for automated optimal focusing capability or to cover a defined area generation industry.
wedge material. inspections. without probe movement.

Copyright © 2025 by Evident Corporation. All rights reserved. 920-419-EN Rev. A - Posters_PhasedArray_EN_2025_Evident. Printed in the USA.

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