Chemical Vapour Deposition (CVD) Overview
Chemical Vapour Deposition (CVD) Overview
10 Chemical Vapour
Deposition (CVD)
The principle of CVD was known in the nineteenth century, but it was not
1940s and 1950s that interest in it as a untilthe
method of
coating materials commenced. Initial studies at the producing
hard and refractory
the United States Battelle Memorial Institute n
demonstrated that CVD could be used to
variety of metals and non-metals, synthesise a broad
nitrides and oxides including their compounds like borides, carbides
(Campbell et al,
2013). Such studies were conducted1949; Powell, 1966; Pierson, 1992; Kafizas et a
on a
passing appropriate gases over very small scale and merely
i
heated wires inductively heated carbon substrates or resisia
(usually tungsten). Such work
reduction of metal halides (centring on the endothermic e
advances. A list of some of by hydrogen) fundamentally underpinned later
the CVD
reactions with useful na ntials
given in Table 4.10, whilst engineering Po this way
are crystalline and
compared to those made via PVD amorphous deposits produced
CVD reaction and (Section 4.111) in Table 4.11.
tion deposition rates increase reac
temperature, obeying exponentially witn
always) two basic reactions: Arrhenius-type relation. There are no hutno
an
creasing
tnot
Fs Asexp. (Equation4 4
the
for the main respectively; and Am and activation
and substrate A, are
rgies for the
energies m a s si n c r e a s
f Coatings deposited by CVD (without plasma assistance). After Yee 1978; Pierson,
et al, 2013.
1997; Kafizas
Table4.10
B e s m a n
eettal,
n
.
1992;
Borides
Carbides 930-1030 TiB2 TiCl4-BCl-H2 830-1030
TICl-CH4-H2
930
ZrC 930-1230
ZrBr-CH4-H2
catalyst]
900-1100
ZrCly-H,O
1130-1230 monoclinic
ZrN ZrCl-Na-H2 ZrO2
>830
ZrBr-NH-H2
830-15300
TaN TaCly-N2-H2
830-1230
AIN AICly-NH-H2
930-11300
Al(CH3)-NH3-H2
VN VClL-N-H 930-1230
NDN NbCl5-Na-H2 930-13300
QRT 1S
whilst the quotient
and R is the gas constant (8.314 J/K), growth of
to the
d eaction may positively
contribute
(Equation 4.6)
+24H2
SHF+ Ta+ TaFs
158 Introduction to Surface Engineering
H2 CH N2 Ha, etc.
External
furnace
Substrates
Liquid
ring
pump Water
Supply
TICI
evaporator HCI
scrubber
than one reaction vessel for better efficiency; i.e., one vessel can be occupied
more
whilst another is cooling. It is also sensible to reserve at least one
deposition wh
CVD
for
ction vessel for each coating compositional design (e.g., one for TicTiN and
CIAlO3 and so on) to avoid possible cross-contamination. With
for TiC/
a n o t h e r
taminant oxides on the surfaces of the components. Once the desired temperature is
reached (Table 4.10), the reactants are introduced into the chamber. Many CVD
processes generate residual corrosive gases like HF or HCI (Eqs. 4.7 to 415). which
are disposed of by passing through appropriate chemical or cryogenic traps. For
SOme sub-atmospheric pressure CVD processes, a liquid ring pump is commonly
used to attain the desired processing pressure; this also aids the dissolution o
Lanted process gases prior to final neutralisation and disposal (Fig. 424).
(a)
TIC coating (a)
Cementeed
carbide
substrate
10um
Cemented
carbide
substrate
20um
(c)
-TiN coating
Ti(C,N) coating
-TIC coating
Cemented
carbide
substrate
10um
.
avail-
whilst the accompanying substrate reaction
able) is:
(provided that excess carbo
(Equation 48)
TiCl4+2H2 +C TiC+ 4HCI
For the main reaction
(Eqs. 4.3 & 4.7), the activation energy for the
mined (Hara et al, 1977)
to be about 370kJ/mol compared with 110kJ/mioni ction
AlLOg coating
AlOg/TiC coating interface
Coating/substrate interface
2um
Cemented carbide
substrate
TiN Coating
C-Al2O3 Coating
TiC coating
10um
getically casier. At the commencement of the process, the sum of both reac
tions
s n a deposition rate of -1-2m per hour for CVD carried out in the
Tange and 1060*'C. The substrate reaction is rate-controlling during nuclea-
tion and U
ion the diffusion path for
initial grow
owth, but as the coating becomes thicker,
carbonsugh the TiC lengthens and the substrate carbon supply diminishes.
Hence
ence the action (Eq. 4.7) gradually becomes predominant and the growth
main react
approaches a lowe
lower limit of about 1um per hour. In practice, the carbon
Content of the substrate must
substrate mus be exactly known and the substrate carbon loss
carburisation via Eq. 4.8) allowed for. For cemented carbide substrates,
162 Introduction to Surface Engineering9
20um
excess decarburisation (refer to the vertical section taken through the ternary
wCCo phase diagram shown in Appendix A) can result in the formation of
n-phase (Co3W,C) - a very brittle phase at the coat/substrate interface (Fig. 42
This can, when of sufficient thickness, aid exfoliation or spalling of the adjacent TiC
coating during use in its intended application - as for example in metal cutting
operations like milling or interrupted turning, which is further worsened under cuting
conditions that produce built-up-edge formation (see Section 7.6.1 in Chapter 1,
Detrimental n-phase formation due to decarburisation can be avoided by carburising
the substrate prior to the commencement of CVD or by using substrates with opti-
mised uncombined carbon contents (adjusted during the carburising of W powder
substrate reaction
in WC manufacture). Both routes supply sufficient carbon for the
(Eq. 4.8) without n-phase formation taking place.
y
rates are possible, but this eventually leads to micro-porosity and poo 2013
al,
coatings. Sometimes, ammonia (NH,) is used in place of N2 (Kanzaserte v e rt e m
o ft h e
y
activityo*
perature of -850"C,made possible by
the greater chemical
compound.
Surface Engineering with Deposition Technologies 163
the
substrate via: thick, directly
adjacent
ked
ed) 2TiCl4+N2 +2C+ 4H2 2Ti(C, N) +8HCI
TO (Equation 4.10)
1on. The compounds T1C, T1(C, N) and l1N are isostructural and
han oe in lattice being observed between the mutually soluble, a
parameter
ence in the case of
triplex CVD coating material extreme composi-
rtN (Fig. 4.25b), a gradual "blending' ot nitrogen and designs, like TiC/Ti(C, N)/
dhrouieh the thickness of the layer, resulting in a smooth carbon content is possible
microstructure and properties like microhardness. progression in composition,
rnary
on 4.10.3 CVD of AlLO.
Surface Engineering with Deposition Technologies 173
44 Physical Vapour Deposition (PVD)
4.11.1 Early Background
aporation took place. Vacuum evaporation is still carried out in the twenty-first
century and may be used for creating a wide range of metal and/or ceramic coatings.
The evaporation process is highly line of sight' (poor throwing power), as depicted in
Fig, 4.35a, this means it is not possible to completely cover a surface with the evapo-
rated material, without rotating it with respect to the source position.
Another early type of PVD coating technique was sputter coating. The origins of
the process are not entirely clear. The physical effect of sputtering was first reported
by Grove (1852), who observed that a prior oxidised metal surface could be 'beauti
faully cleared off'- that is, sputter cleaned -by a discharge created in hydrogen at low
pressure (approximately 10'Pa). This was before the invention of vapour or diffusion
pumps. Subsequently, Wright (1877), observing phenomena inside sealed glass
vacuum tubes containing a much lower pressure (-4Pa) of air (obtained with the
then recently invented mercury vapour pump - refer to the review of Redhead,
(a) (b)
Air pressure -10*Pa Argon pressure -0.4Pa
Negative
Substrate DC bias
Coating Substrate
1ttt Direction of
vapour
flux
Evaporant
Heat Heat Positive
ground
Dlac
place during:Schematic depiction comparing the difference in the vapour pathways that take
(a) Simple evaporation
(6) lon plating
The glow discharge
ge plasma surrounding the substrate in (b) is not shown for better clarity. The
wing power of ionplating is superior, providing greater coating coverage.
ased on a
drawing by Talivaldis Spalvins (Spalvins, 1978).
6
Company (USA auSA), which named it Ivadising' (Muehlberger, 1986). Typically such
partsreq
ire a final chromating treatment to provide additional corrosion resistance
andt oa i d
adherence of any subsequently applied organic paints.
Based [Link] of ion plating, it was discovered that sputter-deposited
coatingm a t e r i a .
aaterials could also be made more adherent and could be delivered with
fewer roblems when a glow discharge plasma is made to surround the
of-sight prob
sputter
As with ion plating, this is achieved by applying a
parts
Huring deposition.
current or radio frequency-induced negative bias voltage to the
negative d i r e
during the «coating cycle. Both ion plating and the latter form of sputter
bstrates
subst
PAPV processes (Fancey & Matthews, 1991). Nowadays, the term PVD' is gen-
1sed, whether or not plasma assistance is involved in the process concerned.
erally used,
Eor both categories of PVD process, the substrates must be thoroughly cleaned
aCombination of degreasing and particulate removal methods (Chapter 2)
rior to mounting within the vacuum chamber. For the best coating adhesion, the
aihstrates should always be subjected to an initial intensive ionic bombardment
-
-800 volts
Ti target
Plasma
N+ Cathode Figure 4.39 Schematic diagram showingg
the principle of
O TO simple reactive sputter
TiN molecule deposition of TiN (without any magnetic
field assistance). Note that this
requires a
higher applied voltage than for magne-
TiN coating tron sputtering.
Based on an
original drawing by John
Substrate Thornton.
these
materials, coatings produced in this way can only be produced at low deposi-
Tion rates.
Fortunately, much higher deposition rates are possible if such coatings are
synthesised reactively. In the
example of TiN deposition, this means evaporating or
puttering metallic Ti into a plasma containing Ar and N2 (the reactive element).
ureatly simplified, this can be
expressed by the equation:
2Ti
(vapour or sputter flux) +N22TiN (Equation 4.16)
The
nese PVD methods were termed reactive ion plating and reactive sputtering
Typicale PVD processes). A schematic of the latter method is shown in Fig. 4.39.
deposition rates using simple reactive sputter deposition are only fractions of
tim tres per hour compared to CVD (-1um/hour); these demand process cycle
mes >12
was the case for producing thecoated cemented carbide shown
hours. This was
178 Introduction to Surface Engineering
in Fig. 4.38. The earliest attempts to prepare TiN and TiC coatings via t
PVD route of reactive ion plating were similarly frustrated. Here alternative
[Link]. (-1660°C) and vaporisation temperature of Ti (compared t e high
of Ti could
be vaporised
[Link]. 660°C) meant only small quantities aluminium:
electrical resistance heating (small diameter Ti wires/fla
(duris ion
plating) using
used as the source). Both limitations were overcome (circa 197 nts were
1970 to 1980) bytWo
technological advances:
1. High-energy vapour sources for reactive ion plating
Conventional Magnetron
TiN 0.9 12.6
TiC 1.0 14.4
Cr 0.5 28.8
Surface Engineering with Deposition Technologies 179
Evaporation SourceS
A popular design of EB source used for ion plating is shown in Fig. 4.40. To
operateefficiently, this type of EB must be placed in its own separate (differentially
chamber (devised by Chambers & Carmichael, 1971) and
umped) low-pressure
DC
power
supply
0.5-5kV
Cathode
Gas inlet
Glow
discharge Electron emitter
Primary
pumps
(tungsten filament)
Auxiliary Components
anode
Dark space
AC power
supply
MtMt M+
Vapour
Low Dividing
Voltage wall
C
Supply
Evaporant
Electron
beam gun
Secondary pumps
Figure 4.40 Simplified schema natic diagram showing the principle of triode reactive ion plating.
Electrons
metal iorom the emitter are dragged across the rising vapour stream, causing an increasein the
The glow discharge plasma surrounding the cathodically charged parts
Based enhan
becomesonConcentration.
a ed or *supported', requiring less potential to sustain a given current density.
carlier an original drawing by Allan Matthews (Matthews & Teer, 1981), following an
ideaby Wan et al (1974).
180 Introduction to Surface Engineering
Electron beam
(deflected through 270)
Vapour flux
Pressure
Evaporant (0.4Pa
Pressure
Dividing wall 104Pa
EBgun Aperture
Electromagnet
Figure 4.41 Detailed schematic showing the main features of a conventional electron beam
evaporation source deployed in PVD ion plating.
Evaporant
target plate
High-power Vapour flux Figure 4.42 Detailed schematic
electric arcs showing the main features ofa
conventional high power density
30 to -100 electric arc evaporation soure
volts
deployed in PVD ion plating.
Pressure
0.4Pa
Isolation
Conical anode
-
discharge plasma
recent
Fig. 4.40) i.e., -0.2 to 0.4Pa. Here,
mor
several EA sources can De a f
um vessel. The early and blev, 1974
orientation around the internal walls of a
vacuum
developments Martin
of the EA sources
have been well
Matthews, 1985; Bergman, 1986; Martin documentea &Mar
& Bendavid, 2001; Benda
Surface Engineering with Deposition Technologies 181
10um
10um
y afew milliseconds, the tip of the arc melts and evaporates a small volume of
arget material required for the reactive process (e.g.,as in Eq. 4.16). A smal
T of liquid droplets are also produced at the same time; these can be seen
n g arc melted craters on the target surface (Fig. 4.43). Commonly, how-