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Chip tester
Published Tue, 05/09/2017 - 15:45 by trol
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Forgot your password? Description of the device
The device is intended for testing logic chips, operational amplifiers, optocouplers, and some other

To come in
elements. From logic chips, domestic (series 155, 555, 1531, 1533, 176, 561, 1561, 1564, 580, 589, etc.) and
imported (74xxx, 40xxx, 45xxx) TTL and CMOS ICs are supported. The menu and test results are displayed
on a 128x160 color display (for the latest version, or 128x128 for the previous one). The tester can also
check DRAM, SRAM microcircuits, can read EPROM and show whether there is written data in them. In
addition, the device can be used when debugging various digital devices as an interface with 40
input/output channels controlled via USB.

At the moment, the test database contains more than 300 microcircuits and this figure is constantly
growing.

Supported chips
Below is a list of supported logic chips (imported analogues of 74xxx are indicated in brackets):

TTL, 155/531/555/1531/1533 series

АП2, АП3 (240), АП4 (241), АП5 (244), АП6 (245), АП9 (640), АП10 (646), АП14 (465), АП
 ИД3 (154), ИД4 (155), ИД5 (156), ИД6 (42), ИД7 (138), ИД9, ИД10 (145), ИД11, ИД12, ИД13

ИЕ1, ИЕ2 (90), ИЕ4 (92), ИЕ5 (93), ИЕ6 (192), ИЕ7 (193), ИЕ8 (97), ИЕ9 (160), ИЕ10 (16

ИЕ17 (169), ИЕ18 (163), ИЕ19 (393), ИЕ20 (390), ИЕ23 (4520)

ИМ1 (80), ИМ2 (82), ИМ3 (83), ИМ5 (183)

ИК1 (Am25S05), ИК2

ИП2 (180), ИП3 (181), ИП4, ИП5 (280), ИП6 (242A), ИП7 (243)

ИР1 (95), ИР8 (164), ИР9 (165), ИР10 (166), ИР11, ИР12 (195), ИР13 (198), ИР15 (173), И

ИР22 (373), ИР23 (374), ИР24 (299), ИР26 (670), ИР27 (377), ИР29 (323), ИР30 (259), ИР3
ИР38 (874), ИР40 (533), ИР41 (534), ИР43 (396), ИР51 (4035), ИР52 (595)

ИВ1 (148)

КП1 (150), КП2 (153), КП5 (152), КП7 (151), КП11 (257), КП12 (253), КП13 (298), КП14 (2

ЛА1 (20), ЛА2 (30), ЛА3 (00), ЛА4 (10), ЛА6 (40), ЛА7 (22), ЛА8 (01), ЛА9 (03), ЛА10 (

ЛА17, ЛА18 (452), ЛА19 (134), ЛА21 (1000), ЛА22 (1020), ЛА23 (1003), ЛА24 (1010)

ЛЕ1 (02), ЛЕ2 (23), ЛЕ3 (25), ЛЕ4 (27), ЛЕ5 (28), ЛЕ6 (128), ЛЕ7 (260), ЛЕ10 (1002), ЛЕ

ЛИ1 (08), ЛИ2 (09), ЛИ3 (11), ЛИ4 (15), ЛИ5, ЛИ6 (21), ЛИ8 (1008), ЛИ9 (34), ЛИ10 (101

ЛЛ1 (32), ЛЛ2, ЛЛ4 (1032)

ЛН1 (04), ЛН2 (05), ЛН3 (06), ЛН5 (16), ЛН6 (366), ЛН7 (368), ЛН8 (1004), ЛН10 (1005)

ЛП3, ЛП5 (86), ЛП7, ЛП8 (125), ЛП9 (07), ЛП10 (365), ЛП11 (367), ЛП12 (136), ЛП16 (1034

ЛР1 (50), ЛР3 (53), ЛР4 (55), ЛР9 (64), ЛР11 (LS51), ЛР13 (54)

ТМ2 (74), ТМ5 (77), ТМ7 (75), ТМ8 (175), ТМ9 (174), ТМ10 (375)

ТР2 (279)

ТВ1 (72), ТВ6 (107), ТВ9 (112), ТВ10 (113), ТВ11 (114), ТВ15 (109)

ТЛ1 (13), ТЛ2 (14), ТЛ3 (132)

РП1

ПР6 (184), ПР7

РУ2 (89), РУ5, РУ8(189), РУ9(289)

СП1 (85)

ВЖ1 (630)

Imported TTL microcircuits that have no domestic analogues

7431, 7447, 7449, 7470, 7478, 74126, 74137, 74238, 74247, 74390, 74534, 74541, 74597, 7
CMOS (series 176, 561, 1561, imported analogues 40xxx, 45xxx are indicated in
brackets)
ИД1 (4028), ИД2, ИД3, ИД6 (4555), ИД7 (4556)

ИЕ1 (4028), ИЕ2, ИЕ3, ИЕ4, ИЕ5*, ИЕ8 (4017), ИЕ9 (4022), ИЕ10 (4520), ИЕ11 (4516), ИЕ12

ИК1

ИМ1 (4008A)

ИП2 (MC14585), ИП5 (MC14554)

ИР2 (4015), ИР3, ИР4, (4031), ИР6, ИР9 (4035), ИР10, ИР11 (4036), ИР12 (MC14580), ИР14

КП1 (4052), КП2 (4051), КП3 (4512), КП4 (4519), КП5 (4053)

КТ1 (4016), КТ3 (4066)

ЛА7 (4011), ЛА8 (4012), ЛА9 (4023), ЛА10

ЛЕ5 (4001), ЛЕ6 (4002), ЛЕ10 (4025)

ЛИ1, ЛИ2 (4081)

ЛН1 (4502), ЛН2 (4049), ЛН3 (4503)

ЛП1 (4007), ЛП2, ЛП4, ЛП11, ЛП12, ЛП13, ЛП14 (4070)

ЛС1, ЛС2 (4019)

ПР1 (4094)

ПУ1, ПУ2 (4009), ПУ3 (4010), ПУ4 (4050), ПУ5, ПУ7 (4069)

РУ2 (4061)

ТВ1 (4027)

ТЛ1 (4093)

ТМ1 (4003), ТМ2 (4013), ТМ3

ТР2 (4043)

4003,
4006,
4010,

4011,
4012,
4013,
4014,

4015,
4016,
 4019,

4021,
4023,
4024,
4025,

4026,
4027,
4030,
4035,

4036,
4043,
4044,
4048,
4050,

4051,
4052,
4053,
4060,

4061,
4066,
4068,
4069,

4070,
4071,
4072,
4073,
4075,

4078,
4081,
4082,
4093,

4099,
40103,
40106,
40107BE,
40109

40192,
40193
4511,
4512,

4518,
4519,
4522,
4580,
4585

Series 580 and 589

580ВИ53 (Intel 8253)

580ВВ55 (Intel 8255)

580ВН59 (Intel 8259)

580ИР82 (Intel 8282)

 580ИР83 (Intel 8283)

580ВА86 (Intel 8286)

580ВА87 (Intel 8287)

589ИР12 (Intel 8212/3212)

589АП16 (Intel 8216/3216)

589АП26 (Intel 3226)

Series 1802

1802ИР1 (am29705)

Series 1810

1810ВН59 (Intel 8259A)

1810ГФ84 (Intel 8284)

1810ВГ88 (Intel 8288)

Series 1821

1821ВИ54 (Intel 8254)

1821ВН59 (Intel 8259A)

Others
КР514ИД1 (MSD047), КР514ИД2 (MSD101)

559ИП1 (DS3881)

КР571ХЛ4, К1102АП13

RAM (SRAM)

К565РУ2 (1024 x 1)

К132РУ4 (1024 x 1)

К537РУ10 (2K x 8)

К132РУ2, 2102A (1024 x 1)

К132РУ15, КР541РУ2, MM2114, UM6114 (1024 x 4)

КР185РУ5 (1024 x 1)
 D2115A (1024 x 1)

HM6167 (16384 x 1)

61C16, 62C16 (2K x 8)

61C64, 62C64, DS2064, 537РУ17 (8K x 8)

W24129A, AE88128AK (16K x 8)

61C256, 62C256, MCM6206CP20 (32K x 8)

61C512, 62C512 (64K x 8)

62C1024, HM628128, TC551001 (128K x 8)

6C4008 (512K x 8)

RAM (DRAM)

К565РУ5 (64K x 1)

К565РУ6 (16K x 1)

К565РУ7 (256K x 1)

2118 (16K x 1)

4164 (64K x 1)

41256 (256K x 1)

KM41C1000 (1M x 1)

4416 (16K x 4)

41464, 4464 (64K x 4)

514256 (256K x 4)

ROM (reading and checking "purity")

К155РЕ3 (SN74188N)

556РТ4 (SN74287), 556РТ5 (Intel 3601, 3621), 556РТ7 (82S191), 556РТ11 (93427С), 556РТ12

27C16 (К573РФ2, К573РФ5), 27C32, 27C64, 27C128, 27C256, 27C512, 27С1000 (27C010, 27C100

Mask ROMs (firmware CRC check)

К555РЕ4, К155РЕ21, К155РЕ22, К155РЕ23, К155РЕ24.

Operational amplifiers
LM358 (LM158, LM258, LM2904), LM393 (LM193, LM293, LM2903), LM386, LM324 (LM124, LM224

Also, the tester must work with other op-amps that have a similar pinout and operate from a unipolar 5V
voltage source.

Optocoupler
PC817, PC827, PC837, PC847, HCP2601 (6N137, HCP2611), 4N35, TLP504A, TLP504A-2, CN74-2

Other analog chips

ULN2002, ULN2003 ULN2002, ULN2004, ULN2803, К1109КТ2

DG4008 (К590КН6)

Sensors
DS18B20, DS18S20, DS1822

(temperature sensors)

DHT11, DHT22 (AM2301, AM2302, AM2320)

(humidity and temperature sensors)

Construction
The tester consists of two boards connected by a “sandwich”. The main board contains a 128x128 color
display, a keyboard, a ZIF-40 panel, microcontrollers and a UBS-UART converter with a miniUSB connector.
The additional board contains MOSFET switches to supply power to the chip being tested.

The microcontroller pins have a maximum pin load capacity of up to 40 mA. This is sufficient to power
CMOS ICs, op-amps, optocouplers, switch assemblies, and most 155-series ICs (and most 555- and 1533-
series ICs). But for some TTL microcircuits this current is not enough, and for convenient work with them, a
key module is designed, which contains 24 field-effect transistors for supplying power to different ZIF pins.
16 switches supply ground and 8 supply +5V.

Interface
Main menu
When you turn on the tester, we get to the main menu:
From here you can run an automatic test of logic and analog microcircuits with type detection; perform a
manual test, setting levels at the inputs of the microcircuit and monitoring the states of its outputs; check
the EPROM chips to ensure that they are completely erased; test RAM chips; go to the settings and see
information about the firmware version and the number of tested chips in the database.

Logic MS testing
To check and identify microcircuits, use the first menu item Detect & Test . First you need to decide on the
type of chip being tested - CMOS or TTL:

Then, a prompt is displayed to install the chip in the panel:

In this case, if the installation key module is configured, its status (ON/OFF) is displayed on the screen. The
"up" button can be used to turn on the power, and the "down" button can be used to turn off the power. If
the power is turned off, during tests the microcircuit will be powered from atmeg (which is more secure), if
turned on, the key module will be used. That is, you can first perform the test with the module turned off,
then, if unsuccessful, try turning it on.

The central or right button starts the test and displays its progress.
The device sequentially goes through all the tests in the database and executes all commands until it
receives the first error. After an error, it proceeds to check the next MS, etc. After the test is completed, the
names of all chips for which the tests were completed successfully will be displayed on the screen. For
example, here is the result for the 555AP14 chip (imported analogue of 74LS465):

The tester's microcontroller operates at a clock frequency of 16 MHz, which may be too fast for some chips.
Therefore, in case of failure, the device will re-run all tests adding delays between sending signals to the
inputs and reading them from the outputs. If in this case it is possible to identify the microcircuit, the test
will be repeated with a decrease in the added delay until the microcircuit is no longer detected. As a result,
the delay value (measured in conventional parrots) will be displayed at the bottom of the screen. The lower
this number, the higher the performance of the microcircuit:

If, after all these searches, nothing was found, then the result will be like this:
To check the next microcircuit of the same type (TTL, CMOS, or analog), just press the "right" button.

Analog MC testing
When checking analog microcircuits, their pinout is displayed. If the microcircuit contains several gates
(operational amplifiers, optocouplers) and some of them are faulty, then they are displayed in red and
crossed out:
Operational amplifiers are tested in comparator mode (the tester can physically apply three different
voltages to the inputs, and it goes through all possible combinations of input voltages and checks the
result).

Checking RAM
A separate menu item includes a memory test. At the time of updating this page, the tester can check
dynamic memory 4164 and 41256 (domestic analogues - 5655RU5 and 565RU7, respectively) and static
memory 61c256 and 61c512 (used as cache on motherboards).

Before starting the memory test, it is also suggested to insert the MS into the panel and turn the power
on/off. The device itself will determine the type of installed microcircuit.

For dynamic memory, the result is shown in the form of a map - filled cells indicate fully operational areas,
crosses indicate an area contains at least one faulty (from the tester’s point of view) cell. For example, this
is what the result of a successful check of 565RU5 looks like:

And this is what the result looks like if there are a lot of bad cells:
Another example is 565RU7 with several faulty cells:

For static memory, the result screen looks like this in the case of a working chip:

As statistics have shown, in the event of damage, one of the lines of these microcircuits often burns out.
That is, errors usually occur in all cells at once. If errors are detected, in addition to the memory card, the
data bus bits on which errors were detected are shown on the screen:

In this example, the microcircuit encountered problems when working with data bits 7 and 4.

Checking ROM
The tester can also read EPROM chips (27cXXX series, and some domestic ones - 155PE3, 556PT4, 556PT5)
and check whether they are “clean”. If the chip contains data, the percentage of pure bits and bytes is
shown. For UV-erasable microcircuits, this allows you to evaluate the success of exposure under the lamp
(especially if home-made options like DRL lamps with a broken outer bulb are used for erasing) and quickly
select a sufficient exposure time.

First, select the type of chip:

After the reading is completed, we see the result - a message that the chip is completely erased, or
information about the percentage of “erased” (i.e., set to 1 for 27сХХХ) bits and “erased” bytes (i.e., bytes, y
of which all bits are erased). This information allows you to assess the degree of success of ultraviolet
irradiation and quickly determine the necessary and sufficient exposure time.

Manual tests
In addition to automatic tests, there is support for manual tests, which allows you to set different levels at
the inputs of the microcircuit and view the status of the outputs. After going to the Custom test menu item,
the enclosure type selection screen appears:

There are two modes on the manual test screen - "Setup" and "Output". Use the cursor buttons to move
between pins and mode names. In the Setup mode, the pins are configured for input or output and the
power supply of the microcircuit is configured. By default, all pins are outputs, i.e., the tester reads their
state. The outputs are drawn with an arrow FROM the microcircuit. If the arrow is directed towards the
microcircuit, then the pin is its input, the tester can change the level at the MS input. The name of the
current mode is displayed on the screen in the lower left corner. To switch the mode, you need to move the
cursor to this name and press the middle key.

If the key module is installed, configured and enabled in the settings, then three submodes appear in the
Setup mode - “I/O”, “GND” and “VCC”. The first is the I/O pin configuration mode mentioned above. The added
modes are power management from the key board. In GND mode, all pins to which negative switches are
connected are marked with a blue circle. If you select such a pin and press the middle key, the field-effect
transistor will connect it to ground (in this case, the output will be automatically reconfigured for reading
by the tester). VCC mode is similar and supplies +5V power to the pin. The outputs to which the
corresponding keys are connected are marked with red circles.

In Output mode, the tester can change the states of the inputs and outputs of the microcircuit. Output
voltage levels are displayed outside the chip package. The green square corresponds to a high level. If the
pin is configured as a tester input, then the green square means that the power pull-up is turned on for
this input (for example, for the pins of a microcircuit with an open collector).

The state of the microcircuit's pins is displayed by blue squares inside its body. The levels at the inputs of
the microcircuits must coincide with the levels at the outputs of the tester, and based on the levels at the
outputs of the microcircuit, conclusions are drawn about its performance.

To exit the manual check mode to the main menu, select the "Exit" button in the lower right corner and
press the middle button.

Settings screen
Before you start working with testers, you need to configure it, and this is done on the Settings screen .
Here you can configure the auto-turn off of the backlight by timeout (Backlight), and the brightness of the
backlight (Brightness), which is important when the tester is powered by batteries. If Backlight = on, the
backlight will always be on.

You can also adjust the volume of sound signals (Sound) when you press keys and when tests are
completed.

Next, you can turn on/off the key module for power supply (Power). If Power = on, then when testing logic
and memory chips, power will be supplied to them through the module keys (otherwise, they will be
powered directly from the microcontroller pins through current-limiting resistors). In general, you can
control the key module immediately before testing on the “insert chip” screen. The settings are set to the
default value.

The power module has 16 switches that supply ground and 8 switches that supply +5V to the chip under
test. In order for the tester to determine which key is connected where, you need to go to the “Configure”
item. Important! Before performing configuration, the ZIF panel must be empty (there should be no chips in
it). The tester will go through all the keys one by one and determine which panel pins they are connected
to. The result will be displayed as follows:

Here on the left are the pin numbers of the ZIF panel, and on the right are the numbers of the key board
pins connected to them. That is, in this case, key number 2 of negative polarity is connected to the 7th pin
of the panel, and key number 21 of positive polarity is connected to the 40th pin. Pressing the middle
keyboard button switches the display mode:
In this mode, the numbers of the power keys are on the left, and the panel pins to which these keys are
connected are on the right. The keys are divided into three groups of 8 pieces, controlled by one register
74HC595. That is, in this example, key number 2 of the first group has negative polarity and is connected to
the 7th pin of the panel. And key number 5 of the third group has a positive polarity and is connected to
the 40th pin of the panel. Whereas, keys number 3, 4, 6 and 7 from the third group are not connected
anywhere.

If the key module is missing, not connected or unrecognized for any reason, the tester will report this:

The key module configuration procedure must be performed the first time it is connected. Further, the
configuration is stored in the non-volatile memory of the microcontroller. It makes sense to perform
reconfiguration only when the key connection diagram is changed or after updating the tester firmware.
After configuring the keys, the tester is ready for use.

The next parameter, Chips, determines which chip names will be shown:
USSR - show only the names of domestic chips
USA - show only the names of imported chips (Texas Instruments, Intel)
All - show all names
This parameter does not limit the tests themselves. That is, if, for example, you choose to display only
domestic names, and you are testing an imported microcircuit that does not have a domestic analogue,
then it will still be detected and its bourgeois marking will appear.

Information screen
The last menu item About shows a screen with the current firmware version. You can also see the number
of microcircuits in the tester database.

The last line is the number of microcircuits in the TTL and CMOS test database (not counting RAM/ROM
and analog microcircuits, optocouplers, etc.).

PC connection and software

The tester connects to the computer directly via a miniUSB connector. To work, you will need to install the
driver for CH340G (USB-UART converter).

To update the firmware, it is recommended to use this console utility .

To debug tests, there is a program written in Java and requires Java Runtime version at least 8. When
running under Windows OS, a 32-bit version of the JRE is required, which can be obtained, for example, by
installing the Arduino environment.
The software allows

1. write, compile and debug tests

2. read ROM contents
3. run testing of microcircuits with display of results (the tester can work without a display module)
4. update the tester firmware

Launched with the command

java -jar [Link]

First you need to initialize the device. In the main menu -> "Device" -> "Connect to" will display a list of
detected COM ports. Among them, you need to select the port to which the tester is connected. If
successful, the connection will be established and the port name will be remembered, and a command to
connect to exactly this (last successful) port will appear in the Device menu.

The menu command Device -> "Device info" will display the device information window. Here you can view
the firmware version, make a backup copy of the firmware and update it (the "Read firmware" and "Write
firmware" buttons, respectively).

In menu -> Windows you can open one of three tester windows. "Test builder" is a test editor and debugger.
Here you can write, compile, and run tests, executing them step by step.
There is also a manual test mode.

The menu command -> Windows -> Programmer opens the programmer window (for now you can only read
the contents of ROM chips).
The menu command -> Windows -> "Logic tester" opens the logic chip test window. Here you can run an
autotest of logic chips, similar to how it is done in the tester.

Writing tests
The test writing language is described in detail in this article .

Sample source codes for some tests are available on github

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Links, files, firmware

You can purchase the device in the store .

PC software:

For devices with firmware 0.9.24 and higher

[Link]
For devices with firmware 0.9.23 and lower
[Link]
Article on writing tests
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