ELECTRON
MICROSCOPE
Nobel Prize in Physics in 1986
The members
Content
PRESENTER PRESENTER
researcher
LÊ CHÍ VIỆT KHÔI HOÀNG MINH TRÍ HUỲNH HOÀNG TÍN
Content Presentation
researcher designer
CAO ĐÌNH TUẤN NGUYỄN HOÀNG QUÂN
List of contents
Introduction
The inventor
Electron Microscope
Comparisons
Conclusion
References
Introduction
The inventor
Full name: Ernst August Friedrich Ruska
Age: 25/12/1906 - 27/05/1988
Nationality: Germany
Education: Studied at Technical University of Munich
and later at Technische Hochschule Berlin
In 1931, built the first prototype of the electron microscope
with his mentor Max Knoll.
In 1933, constructed the first practical electron microscope.
At Siemens, helped commercialize the electron microscope.
In 1986, Ruska was awarded the Nobel Prize in Physics.
Technical University of Munich
Technische Hochschule Berlin
Electron
Microscope
Function and applications
Function and applications
Electron gun:
Requires high vacuum to operate (to prevent electron
scattering).
Determines the brightness and coherence of the
electron beam.
Anode:
Creates a strong electric field to accelerate electrons.
Acceleration voltage typically ranges from 60kV to
300Kv, depending on the microscope.
Function and applications
Condenser lens :
Made of electromagnetic coils to generate magnetic fields.
Controls the beam diameter (spot size) and convergence angle.
Helps balance between resolution and sample illumination (brightness).
Function and applications
Objective aperture lens:
Selects electrons based on scattering angles.
Improves contrast by filtering out inelastically
scattered electrons.
Intermediate lens:
Adjusts the magnification level before final projection.
Helps shift between imaging modes (e.g., diffraction
mode or image mode).
Fine-tunes image sharpness and size before projection.
Function and applications
Projector lens:
Further enlarges the image formed by the
intermediate lens.
Critical for adjusting the final magnification viewed on
the screen.
Fluorescent screen:
Coated with phosphorescent material like zinc sulfide.
Emits visible light when struck by electrons.
Some modern TEMs use digital CCD cameras or CMOS
detectors instead of (or in addition to) a fluorescent
screen.
Function and applications
Materials Science Chemistry Biology & Biomedical
Observe catalyst Image viruses and protein
Identify phases in alloys nanoparticles and surface complexes at high
and nanomaterials. reactions. resolution.
Function and applications
Nanotechnology Semiconductors &
Electronics
Analyze shape, size, and Evaluate material
structure of nanoparticles. degradation over time in
electronic devices.
Comparison
Scanning Tunneling Transmission Electron
Microscope Microscope
Similarity
Uses a beam of electrons
Uses the tunneling effect of
Use of electrons electrons to generate images.
transmitted through the sample
to form images.
Can achieve atomic resolution, Offers extremely high resolution,
High resolution displaying individual surface revealing internal atomic
atoms. structures.
Operates in a high-vacuum
Requires high vacuum so that
Vacuum environment to avoid
electrons are not scattered and
environment interference and protect the
maintain precision.
probe.
Comparison
Scanning Tunneling Transmission Electron
Microscope Microscope
Diffenrence
Based on quantum tunneling Based on transmission of
Working principle effect between the probe electrons through an ultra-
and the sample. thin sample.
Requires conductive or Requires ultra-thin samples
Sample requirement semiconductive surface, very (10–100 nm), can be any type
clean and flat. of material.
Displays electron density on
Shows internal structure of
Image output the surface, mainly 2D but
the sample in high detail.
can be interpreted as 3D.
conclusion
The invention of electron microscopes revolutionized multiple
scientific fields by improving the ability to study cells and
molecules in detail.
Ernst Ruska’s contributions continued to shape modern research
even after his retirement, with widespread global adoption of
electron microscopy.
His work laid the foundation for the advancement of modern
microscopy technologies that have evolved with ongoing
technological progress.
References
Springer Handbook of Microscopy – P.W. Hawkes, J.C.H. Spence (Eds.)
Transmission Electron Microscopy: A Textbook for Materials Science
– David B. Williams & C. Barry Carter
Scanning Tunneling Microscopy and Spectroscopy – Dawn Bonnell
The 1986 Nobel Prize in Physics – [Link]
Transmission electron microscope - David [Link], Brian [Link]
Electron Microscope - Handbook of Microbial Nanotechnology, 2022