Introduction to Nanotechnology
and Nano-electronics
Material Characterization
Instructor: Md Mizan Kabir Shuvo
Lecturer, Mymensingh Engineering College
mkabirshuvo@[Link]
Introduction to Materials Characterization (L2)
• Composition, Structure and Morphology through
fundamental interactions (photons-matter, electrons-
matter, ions/particles-matter)
• Optical microscopy (conventional [wide field],
confocal/laser scanning)
• For the material characterization ex-situ or in-situ
(during a process), we need to characterize in chemical
composition, structure and structural defects at the
highest limits of resolution to understand materials
behavior and facilitate the design of new or improved
process/materials. Many properties of materials are
structure sensitive. General Principle of material
characterization technique is shown in following figure.
Where source particles/radiation (electrons, ions, x-ray,
IR/visible/UV photons) hits the material surface and
signal is emitted (either in forms of electrons, ions, x-
ray, IR/visible/UV photons)
Introduction to Materials Characterization (L2)
The incident radiation in form of electron, photon, or ion is bombarded onto the surface of sample and then
photon, ions or x-ray coming out of surface is collected as a signal, and analyzed. There are three steps involved in
all the analytical techniques, first step is excitation, second step is relaxation followed by emission. Different
characterization techniques used are broadly classified into three major groups and the information obtained from
them is generalized in four categories.
Different characterization techniques use different excitation source and signal obtained is either in form of
photons, electrons or ions. Characterization techniques broadly divided into three groups, microscopic,
diffraction and spectroscopic techniques. The different useful information that is obtained is topographic
information of surface, structural properties such as lattice parameter, crystal structures, then electrical , chemical
composition.
Introduction to Materials Characterization (L2)
Introduction to Materials Characterization (L2)
Material analysis depends on some other factors such as spatial resolution, sampling depth,
diameter of analysis, sensitivity of technique.
Spatial Resolution : If the data volume will be held constant, then high spatial resolution
image will cover a small area, while a low-spatial resolution image will cover a large area.
Factors affecting spatial resolution are Probe size, Probe energy, Sample-beam interaction,
Penetration depth, Signal Escape Depth, Type of Sample
Sampling depth: It is purely function of two things, the depth that source can penetrate and
the signal escape depth.
Diameter of Analysis Region: The area which is analyzed depends upon the beam size at
sample, volume of interaction between beam and sample, signal escape depth.
Sensitivity of Technique: It is the detectability or detection limit. That is the minimum
quantity of given element that may be detected. Units for this are atoms/cm3 or ppm, or
ppb.
Introduction to Materials Characterization Nano-tools (L2)
• Nanotools are specialized instruments used to observe, manipulate, and measure
structures at the nanometer scale. Among these, the Scanning Tunneling Microscope
(STM) is a foundational tool for nanoscale imaging and manipulation, providing atomic-level
resolution.
Scanning Tunneling Microscope (STM)
The STM, invented in 1981 by Gerd Binnig and Heinrich Rohrer, works on the principle of quantum
tunneling. It allows us to visualize and study the surface of conductive or semiconductive materials at
the atomic scale.
Quantum Tunneling:
❑ When a sharp metal tip is brought extremely close
to a surface (a few angstroms away), electrons
tunnel through the vacuum between the tip and
the surface.
❑The tunneling current is highly sensitive to the tip-
surface distance.
Introduction to Materials Characterization Nano-tools (L2)
Scanning Tunneling Microscope (STM)
Introduction to Materials Characterization Nano-tools (L2)
Scanning Tunneling Microscope (STM)
Main Compoents:
• Metal Tip
• Piezoelectric Scanner
• Current Amplifier (nA)
• Bipotentiostat (Bias)
• Feedback system
or Feedback Loop (Current)
Introduction to Materials Characterization Nano-tools (L2)
Scanning Tunneling Microscope (STM)- How it works
Quantum Tunneling:
➢ When a sharp metal tip is
brought extremely close to a
surface (a few angstroms away),
electrons tunnel through the
vacuum between the tip and the
surface.
➢ The tunneling current is highly
sensitive to the tip-surface
distance.
Modes of Operation:
- Constant Height Mode: Measures tunneling current variations
while maintaining a fixed tip height.
- Constant Current Mode: Adjusts the tip’s height to maintain a
constant tunneling current, creating a 3D topographic map.
Introduction to Materials Characterization Nano-tools (L2)
Scanning Tunneling Microscope (STM)- How it works
Key Components:
• Sharp Tip: Made of tungsten or platinum-iridium, allowing atomic-level interaction.
The sharp metal tip serves as the probe to scan the sample surface at an atomic scale.
It facilitates tunneling current when brought very close to the sample.
• Piezoelectric Scanners: This component precisely controls the tip’s position in the x, y,
and z directions with sub-nanometer accuracy, enabling atomic-resolution imaging.
• Bipotentiostat (Bias): It applies a voltage bias between the tip and the sample,
creating the tunneling conditions for electron flow and allowing control over
tunneling current.
• Current Amplifier (nA): The amplifier detects and magnifies the extremely small
tunneling currents (in nanoamperes) for accurate measurement and imaging.
• Feedback Loop (Current): The feedback system maintains a constant tunneling
current by adjusting the tip’s height, ensuring consistent imaging of the surface
topography.
Introduction to Materials Characterization Nano-tools (L2)
Scanning Tunneling Microscope (STM)
Applications:
• Atomic-Level Imaging: Visualization
of atomic structures of surfaces,
such as silicon or graphene.
• Surface Manipulation: Individual
atoms can be repositioned to build
nanoscale structures.
• Spectroscopy: By varying the bias
voltage, STM provides information
about the electronic properties of
surfaces.
• Nanotechnology: Study of
nanoscale materials, such as carbon
nanotubes and quantum dots.
Introduction to Materials Characterization Nano-tools (L2)
Scanning Tunneling Microscope (STM)
Advantages of STM: Limitations of STM:
1. High Resolution: Provides atomic- 1. Conductive Samples: STM is
level resolution, making it one of limited to materials that are
the most precise imaging tools. conductive or semiconductive.
2. Versatility: Works on a variety of 2. Vacuum and Stability
conductive and semiconductive Requirements: Often requires
surfaces. ultra-high vacuum and vibration-
3. Surface Sensitivity: STM is free environments.
sensitive to both structural and 3. Operator Expertise: High skill is
electronic properties. needed to operate the device and
interpret data.
Introduction to Materials Characterization Nano-tools (L2)
Case Study of STM and Comparison
Imaging a Silicon Surface
Objective: Visualize the atomic structure of a silicon (111) surface.
Procedure:
• Place a silicon wafer on the sample stage.
• Use STM in constant current mode to scan the surface.
Results: The characteristic honeycomb lattice of silicon atoms is observed.
Comparison with Other Nanotools
• Advantages Over Electron Microscopes:
▪ Direct measurement of electronic properties.
▪ Higher resolution for certain surfaces.
• Limitations Compared to Atomic Force Microscopes (AFM):
▪ Requires conductive samples.
▪ AFM can work on insulating materials.