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Anisotropic Material Inspection Techniques

The document discusses various inspection techniques and limitations associated with dual arrays and matrix arrays for testing materials. It highlights issues such as attenuation in isotropic materials, higher rejection rates with dual arrays, and the need for manual adjustments. Additionally, it mentions recent advancements in de-penetration probes and the specific capabilities of different array types for inspecting materials up to certain depths.

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4 views1 page

Anisotropic Material Inspection Techniques

The document discusses various inspection techniques and limitations associated with dual arrays and matrix arrays for testing materials. It highlights issues such as attenuation in isotropic materials, higher rejection rates with dual arrays, and the need for manual adjustments. Additionally, it mentions recent advancements in de-penetration probes and the specific capabilities of different array types for inspecting materials up to certain depths.

Uploaded by

prabu
Copyright
© All Rights Reserved
We take content rights seriously. If you suspect this is your content, claim it here.
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 Cross over depth limits penetration

 PSEUDO Focusing
 Crossover is customizable depends on inspection range. This is called conventional dual
array- that is mentioned in the wedges
 Steer and focus in both axis
 Attenuation is the problem in the isotropic materials
 Inspection of SS is troublesome
 Dual linear restricted penetration
 Dual matrix no restrictions
 Using the above two we can inspect the anisotropic materials
 All the inspection shall be accomplished within half skip beam path
 Rejection rate is higher when using dual arrays- due to employment of higher angles
 Near surface inspection is not efficient in the dual array
 There won’t be uniform sensitivity across all beams as like in linear array
 We have to do manual TCG
 Not all angles catch all reflectors
 Block should be exactly same as that of test part
 Surface flaw oversized and compensation computing should be done before reporting
 Recently de-penetration probes introduced in the market for penetration up to 100mm
 Matrix array up to 20-25mm and dual linear up to 30-40mm
 For surface matrix is the only solution
 Creep wave velocity is slightly lesser than longitudinal. So that delay for angles 86-90 not
same as that of other angles
 In mx2 focal law loading required
 In x3 we can do it directly
 Due to creep wave attenuating factor, index offset distance is limited and always cap flush
required to pick opposite side toe reflectors

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