18CSE357T – BIOMETRICS
Unit –1 : Session –4 : SLO -2
SRM Institute of Science and Technology 1
Biometrics
◼ False Acceptance Rate (FAR)
◼ False Rejection Rate (FRR)
◼ Failure To Enroll Rate (FTE)
◼ Ability To Verify (AVT)
• AVT = (1 - FTE)(1 - FRR)
by Alvaro E. Escobar 3