TECHNICAL OVERVIEW
PNA-X Modulation Distortion
Application
Maximize your budget with rentals of Keysight test equipment
• EVM, NPR and ACPR measurements on the PNA-X for complete device characterization
• VNA calibration and de-embedding applied to modulation analysis
• Isolates the distortion and additive noise contributions while removing contributions from the input signal
• Very wide measurement bandwidth limited only by the signal generator
• High dynamic range and lowest residual EVM
• Simplifies high power setups and switch matrices for EVM, NPR and ACPR measurements
Modulation Distortion – Fast and Accurate EVM,
ACPR or NPR Measurements
The S93070xB Modulation Distortion Application combined with the PNA-X Vector Network Analyzer and
a Vector Signal Generator, VSG, enables users to measure the nonlinear behavior of power amplifiers
under the wideband modulated stimulus conditions. The new frequency-domain measurement method
delivers lower residual EVM and faster EVM measurement speed. The VNA-based vector calibration
accurately extends the reference planes of the signal generator and the analyzer to the DUT planes. As a
result, users can achieve an excellent signal fidelity and accurate modulated measurement at RF and
mmWave frequencies.
The PNA-X X microwave network analyzer with the new Modulation Distortion application allows
complete characterization of an amplifier that would have taken two separate test stations or the use of a
complex and expensive switching matrix which degrades performance. This helps speed device test
through R&D, DVT by reducing design cycle times, as well as, speed manufacturing throughput.
For example, when wafer probing devices only a single-touch is needed which improves overall
throughput or enables testing that was difficult in the past. The single touch to the device also eliminates
unnecessary wear to bonding pads which ultimately improves device quality.
The modulation distortion application delivers faster, more accurate, and repeatable EVM, NPR and
ACPR measurements than conventional signal analyzers.
• Lowest residual EVM
• Fast and accurate measurement
• Simple and intuitive setup
• Cost-effective solution
Single Connection/Single Touch Traditional approach requiring two test stations or complex
switch matrix
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Modulation Distortion Analysis Theory
The Modulation Distortion Analysis application uses the PNA-X’s measurements of the input and the
output spectrum, as well as, their complex ratio across the complete in-channel and out-of-channel
bandwidth.
External
Control
De-embed De-embed
In s2p Out s2p
Simplified configuration example with VXG and PNA-X
A Vector Signal Generator is used to generate a repetitive signal with a given CCDF (Complementary-
Cumulative-Distribution-Function) and PSD (Power Spectral Density). The VNA then measures the
amplitude of the input spectrum |X(f)|, the amplitude of the output spectrum |Y(f)|, and the phase
relationship of the tones relative to each other, φ(Y(f))-φ(X(f)).
Calculation of the spectral correlation between the input and output enables decomposition the output
spectrum into linearly correlated and non-linear spectrum and analysis of the distortion product EVM,
ACPR and NPR
• The spectral correlation enables to determination of the linear and nonlinear distortion solely
introduced by the DUT, eliminating contributions from the signal generator.
• Repetitive test signals are designed to faithfully represent the amplitude statistics as well as the
power spectral density of the modulation format of choice.
• The total amount of distortion measured in the frequency domain is equal to the total amount of
distortion in the time domain as measured using the existing EVM method.
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Modulation Distortion Measurements
The measured data is available for the input signal, output signal and calculated contribution of the DUT.
For example, it is possible to measure the NPR into the device, the output NPR and the distortion NPR
that is added by the device only.
The modulation distortion application performs the following measurements (see PNA-X help file for
complete list of measurement parameters):
• EVM
o Equalized EVM of the DUT (non-linear contribution)
o Un-equalized EVM of the DUT (Includes non-linear and linear distortion due to frequency
dispersion)
• ACP
o Upper and lower side bands of the input signal
o Upper and lower side bands of the output signal
o Upper and lower side bands contribution of the DUT
• NPR
o Input NPR
o Output NPR
o NPR contribution of the DUT
• Band Power
o Input Band Power
o Output Band Power
o Band Power Gain of the DUT (magnitude and phase)
Measurements and results on a 200 MHz x 4CC (800 MHZ) at carrier frequency of 28 GHz
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Simple Setup and Control
Signal generator and external amplifier setup and control
Modulation Distortion application sets everything required
for the measurement
• Creates compact test signal (CTS) based on standard
compliant waveforms or user generated waveforms
• Creates NPR signals
• Sets proper paths and controls the external generator
• Measures the signal and corrects waveform to the
DUT.
• Calibrates the power to the DUT including any booster
amplifier needed before the DUT.
A typical external hardware setup using a M9383/84B
VXG with the signal connected externally. Other
supported signal generators include the M8190A with
E8267D PSG, N5182B MXG, N5192A and the M9383A
(see PNA-X help file for more supported configurations).
A simple setup for high power configurations uses the
setup dialogs in the modulation distortion application and
offers a variety of power and port settings.
For this example, the approximate gain of the external
amplifier of 10 dB is input into the Nominal Src Amp of the
Modulation Distortion Setup.
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Compact test signal generation
The Compact Test Signal (CTS) generation
is automatic and the input waveforms can
be Signal Studio or IQ files in *.csv format.
The resultant CTS version of the waveform
matches the CCDF and PSD of the “parent-
IQ waveform”.
The CTS waveform makes measurements
faster while maintaining proper spectral and
power statistics.
Example of a 5G NR 100 MHz parent-IQ waveform and Compact Test
Signal (CTS) time slice
PSD CCDF
Comparison of the original 5G NR 100 MHz signal vs. compact test signal consisting of 10,001 tones. Share the
same Power Spectral Density (PSD) and Complementary Cumulative Density Function (CCDF)
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Correlation of Time and Frequency Domain EVM
Measurements
It’s important to note the total amount of distortion in spectral correlation frequency domain (the method
used in the Modulation Distortion calculations) is equivalent to the distortion measured in time domain
used by time domain demodulation methods of the VSA
Correlation has been shown in simulations and through measurement comparisons of actual devices.
5G NR 400 MHz amplifier measurement comparison
Measurement results comparison of an amplifier measurement using a 5G NR 400 MHz signal. UXA
measurement (left) and PNA-X measurement (right)
802.11ac measurements comparison
EVM as a function of power for an 80 MHz 802.11ac signal with tone spacing of 102.4 kHz vs.
measurements made using a Vector Signal Analyzer
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ADS and SystemVue data flows comparison of a 180 nm
CMOS pre-amplifier
Comparison of Advanced Design System (ADS) using Modulation Distortion simulation method and
SystemVue using classical dataflow to calculate EVM of a 180 nm CMOS pre-amplifier.
Load Pull Capability for Modulation Distortion
Measurements
Evaluate device behavior for any arbitrary load
Extend the modulation distortion application by computing figure of merits such as EVM and ACPR for
any desired load with arbitrary load control (ALC). Modulation distortion with ALC integrates the powerful
capabilities of the PNA-X with an electromechanical tuner so a non 50 Ω load can be presented to the
DUT and changes in device performance or sensitivity to varying load conditions can be accurately
measured.
A passive electromechanical tuner used in load ull measurements allows for nearly any impedance to be
presented to the DUT at a target frequency representing wide coverage of the smith chart.
Modulated signal generator Move mechanical tuner to
achieve target value
Tone
Tuner Term
power [dBm]
Freq
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A) B)
C) D)
Passive Load Pull Measurement Results showing A) Pout vs Pin, B) Gain vs Pout Delivered, C) measured gamma
across modulation bandwidth and D) EVM vs Pout Delivered
Calibrate and verify tuner gamma
Keysight’s Tuner Characterization provides guided calibration and verification for user defined gamma
load grid at a target frequency. For a user specified load, requested and measured values at each load
point are displayed, verifying the accuracy of the load points at the device reference plane and providing
high confidence in the measurement setup.
User specified load grid to be measured Gamma verification
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Modulation distortion with ALC HW and SW requirements
• N524xB PNA-X (Firmware A.15.0.15 or later
• S93070xB Modulation Distortion
• S94570B Arbitrary Load Control for Modulation Distortion
• Maury Mechanical Tuner (Requires Maury driver, MTune utility)
OR
• Focus Microwave Mechanical Tuner (Requires Load Pull Explorer, FDCS)
• VSG (recommend M9384B VXG
• Dual Directional coupler (e.g. Marki C0250)
• Accessories (cable, adapter, etc.)
• Ecal (recommend N4693A male-female
A typical external hardware setup using a VXG, directional coupler, tuner and DUT.
Compatible passive electromechanical tuners
• Maury Mechanical Tuner
o Communication interface: USB, LAN
• Focus Microwave Tuner
o Communication interface: TCP/IPv4
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Active Load Pull Capability for Modulation
Distortion Measurements
Control gamma across entire modulation bandwidth
Integrate the benefits of the modulation distortion application with the active load pull solution for
computing vector corrected EVM and ACPR.
The GUI/API allows the user to specifiy a gamma load profile across the entire bandwidth and includes
the ability to import an S1P file. Keysight’s dual channel VXG provides the modulated source for he input
and output to synthesize and user specified gamma. The PNA-X’s modulation distortion applications
captures EVM and ACPR measurements as a function of the gamma profile. This gives the user insight
into the optimal DUT behavior as well as robustness and reliability validation.
Gamma profile can be specified in several ways
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Active Load Pull Measurement Results showing A) Pout vs Pin, B) Gain vs Pout Delivered, C) measured gamma
(specified with bandwidth rotation = 0° phase) across modulation bandwidth and D) EVM vs Pout Delivered
Modulation distortion HW and SW requirements
• S93070xB Modulation Distortion application (see ordering information below)
• N524xB 4-Port PNA-X Microwave Network Analyzer, FW A.16.20.00 or later for active load pull
compatibility
• Supported external sources1:
o M9383/84B VXG Microwave Signal Generator, 1 MHz to 44 GHz
o M9384C VXG Microwave Signal Generator, 9 kHz to 54 GHz
o N5182B MXG X-Series RF Vector Signal Generator, 9 kHz to 6 GHz
o N5192A UXG X-Series Vector Adapter Modified Version, 10 MHz to 20 GHz, with U3039ACK1
6 GHz Reference Source
o M8190A 12 GSa/s Arbitrary Waveform Generator with E8267D PSG Vector Signal Generator
o M9383A PXIe Microwave Signal Generator, 1 MHz to 44 GHz
1 When Signal Studio is used, a waveform playback license N76xxEMBC is required for the external source. For more
information, refer to Signal Studio. Brochure (5989 -6448EN)
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Ordering Information
• S930700B Modulation analysis up to 8.5 GHz
• S930701B Modulation analysis up to 13.5 GHz
• S930702B Modulation analysis up to 26.5 GHz
• S930704B Modulation analysis up to 43.5 GHz
• S930705B Modulation analysis up to 50 GHz
• S930707B Modulation analysis up to 67 GHz
• S94570B Arbitrary Load Control for Modulation Distortion, Passive Load Pull (Export controlled)
• S94571B Arbitrary Load Control for Modulation Distortion, Passive Load Pull (Functions limited to
50 GHz)
• S94572B Arbitrary Load Control for Modulation Distortion, Active Load Pull (Export controlled)
• S94573B Arbitrary Load Control for Modulation Distortion, Active Load Pull (Functions limited to
50 GHz)
See the PNA Configuration guide for available license types.
Related Literature
Literature Pub number
PNA Family Microwave Network Analyzers (N522x/3x/4xB) – Configuration Guide 5992-1465EN
Microwave Network Analyzers PNA-X Series – Brochure 5990-4592EN
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Additional Product Information
PNA-X – multiple measurements on a single instrument
The N524xB PNA-X Microwave Vector Network Analyzer offers an indispensable set of measurement
functions for testing 5G beamformer ICs. Its industry-leading performance and state-of-the-art error
correction capabilities enable highly accurate S-parameter measurements. Moreover, the PNA-X provides
measurement applications for testing amplifier’s nonlinear characteristics and noise figure. All of these
measurements can be quickly performed with a single connection.
• 900 Hz/10 MHz to 8.5/13.5/26.5/43.5/50/67 GHz
• Fast and accurate S-parameter measurement
• Gain Compression Measurements (S93086B)
• Intermodulation Distortion Measurements (S93087B)
• Noise Figure Measurements with Vector Correction (S93029B)
• Spectrum Analysis (S93090xB)
• Active Hot S-parameters (S93110/11B)
• Modulation Distortion analysis (S93070xB)
PNA-X vector network analyzer
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Gain compression application Accurate NF measurement with vector correction
Distortion measurements with spectrum analysis Active parameters hot S22 measurement
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VXG – mmWave Wideband Signal Generation
Combined with the PNA-X Modulation Distortion Application or the signal analyzer, the M9383B/M9384B
VXG Microwave Vector Signal Generators delivers high performance, wideband mmWave signal
generation for executing power amplifier measurements. The VXG offers a 2 GHz modulation bandwidth,
high output power to compensate for system loss at mmWave bands, and an unmatched low 1% EVM to
address critical requirements for 5G component testing.
• Frequency range from 1 MHz to 44 GHz
• 2 GHz modulation bandwidth
• 1% EVM (5G NR, 100 MHz, +10 dBm, 28 and 39 GHz)
• -50 dBc ACP (5G NR, 100 MHz, 0 dBm, 28 GHz)
• Maximum +24 dBm output power
• Dual coherent channels
M9384B VXG signal generator M9383B VXG-m signal generator
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Signal Studio – Simplifying Signal Creation
The N76xxC Signal Studio’s basic playback waveform capabilities enable you to create and customize
waveform files needed to test components and transmitters. For 5G applications, the N7631C Signal
Studio Pro for 5G NR enables users to create 5G NR signals for characterizing modulated performance of
power amplifiers. The tool simplifies the manipulation of a variety of signal parameters to streamline
signal creation.
• Quickly configure and generate 5G NR test models for FDD and TDD.
• Create spectrally-correct signals for channel power, spectral mask, and spurious testing.
• View CCDF, spectrum, time domain, and power envelope graphs to investigate the effects of power
ramps, modulation formats, power changes, clipping, and other effects on device performance.
• Adjust Peak-To-Average-Ratio (PAPR) with Crest Factor Reduction.
• Baseband filter and windowing for spectrum control to improve the out-of-band performance
Signal Studio Pro for 5G NR
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ADS – An Industry-leading Design Platform
Advanced Design System (ADS) is an industry-leading electronic design automation (EDA) software for
RF, microwave, and high speed digital applications. In a powerful and easy-to-use interface, ADS
pioneers the most innovative and commercially successful technologies, such as X-parameters and 3D
EM simulators. The EM-Circuit co-simulation capability allows the user to analyze the effects of various
physical design aspects on the overall performance of the 5G transceiver capability.
EM-Circuit co-simulation with ADS
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This information is subject to change without notice. © Keysight Technologies, 202 3,
Published in USA, April 27, 2023, [Link]