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Advanced Characterization Techniques Exam

The document is a mid-term examination for the course MBM 601 on advanced characterization techniques, authored by Prof. Dr. M. Lütfi ÖVEÇOĞLU. It includes five detailed questions covering topics such as lens defects in electron microscopy, Bright-Field and Dark-Field operation modes in TEM, derivation of expressions for diamond, indexing of diffraction patterns from Aluminum, and analysis of a ring pattern from a heavy alloy in the W-Ni-Fe ternary system. Each question is assigned a specific percentage of the total exam score.

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Lütfi Öveçoğlu
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29 views2 pages

Advanced Characterization Techniques Exam

The document is a mid-term examination for the course MBM 601 on advanced characterization techniques, authored by Prof. Dr. M. Lütfi ÖVEÇOĞLU. It includes five detailed questions covering topics such as lens defects in electron microscopy, Bright-Field and Dark-Field operation modes in TEM, derivation of expressions for diamond, indexing of diffraction patterns from Aluminum, and analysis of a ring pattern from a heavy alloy in the W-Ni-Fe ternary system. Each question is assigned a specific percentage of the total exam score.

Uploaded by

Lütfi Öveçoğlu
Copyright
© All Rights Reserved
We take content rights seriously. If you suspect this is your content, claim it here.
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Download as DOC, PDF, TXT or read online on Scribd

MBM 601 ADVANCED CHARACTERIZATION TECHNIQUES

MID-TERM EXAMINATION Autumn 2003-2004


Prof. Dr. M. Lütfi ÖVEÇOĞLU

1) Please explain in detail the major lens defects observed in electron microscopy investigations (%10)

2) Describe and explain Bright-Field (BF) and Dark-Field (DF) operation modes in TEM in detail by drawing
sketches. (%15)

3) Derive simplified expressions of F 2 for diamond, including the rules governing observed reflections. The
crystal is cubic and contains 8 carbon atoms per unit cell, located in the following positions. (%20)
000 ½½0 ½0½ 0½½
¼¼¼ ¾¾¼ ¾¼¾ ¼¾¾

4) Given below is a diffraction pattern taken from Aluminum which has a f. c. c. (face-centered cubic) Bravais
lattice. The TEM operating conditions were 200kV ( = 0.0251 A = 0.0251 x 10 -8 cm)) and L = 86 cm (L : camera
length). The lattice parameter of Al is a = 4,0496 A = 4,0496 x 10 -8 cm. Index the spot pattern by measuring the
relevant distances of the spots from the 000 – transmitted spot and measuring the angles between the spots.
Compare the measured angles with the calculated angles which you find by using the equation below. The
measured angle value must be equal (or approximately equal) to the calculated one; otherwise the indexing is
wrong and you need to re-index! Calculate the zone axis of this pattern and check the validity of this zone axis
by repeating the same calculation with the other two vectors. (%40)
Note : For the cubic crystal system :

a) Distance between the planes


1/d2 = (h2 + k2 + l2)/a2
a) Angle between the planes having different Miller indices:
cos = (h1h2 + k1k2 + l1l2)/ [(h12 + k12 + l12)1/2 (h22 + k22 + l22)1/2]
5) Shown below is a ring pattern taken from the matrix region of a heavy alloy which belongs to the W-Ni-Fe
ternary system. The diffraction pattern shown below is taken using 200 kV ( = 0.0251 A) accelerating voltage
conditions and L = 100 cm (L : camera length) conditions. Using the lattice parameters of W, Ni and -Fe, index
the rings. If there are rings which cannot be indexed as belonging to pure elements, please comment on those
– make speculations about these rings, i. e. which phase(s) they might belong to. Use the equation rd = L.
(%28)

Given :
W b. c. c. (body-centered cubic) a = 3.165 A = 3.165 x 10-8 cm
Ni f. c. c. (face-centered cubic) a = 3.524 A = 3.524 x 10-8 cm
-Fe b. c. c. (body-centered cubic) a = 2.866 A = 2.866 x 10-8 cm

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