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Chapter 14 Solutions: Semiconductor Devices

This document provides solutions to problems from Chapter 14 of a semiconductor physics textbook. It includes calculations of wavelengths and absorption coefficients for various semiconductor materials, as well as solutions involving excess carrier generation and diffusion under optical excitation.

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0% found this document useful (0 votes)
50 views11 pages

Chapter 14 Solutions: Semiconductor Devices

This document provides solutions to problems from Chapter 14 of a semiconductor physics textbook. It includes calculations of wavelengths and absorption coefficients for various semiconductor materials, as well as solutions involving excess carrier generation and diffusion under optical excitation.

Uploaded by

water9991234
Copyright
© All Rights Reserved
We take content rights seriously. If you suspect this is your content, claim it here.
Available Formats
Download as PDF, TXT or read online on Scribd

Semiconductor Physics and Devices: Basic Principles, 4th edition Chapter 14

By D. A. Neamen Problem Solutions


______________________________________________________________________________________

Chapter 14
14.1 1.24
(b)    0.653  m
1.24
 max  m 1.90
Eg (i) From Figure 14.4,   2.6 10 4 cm 1
1.24 I d 
(a) Si:  max   1.11  m (ii)   exp  d 
1.12 I 0
(b) Ge:  max 
1.24
 1.88  m 
 exp  2.6 10 4 0.80 10 4  
0.66  0.125
(c) GaAs:  max 
1.24
 0.873  m Fraction absorbed  1  0.125  0.875
1.42 _______________________________________
1.24
(d) InP:  max   0.919  m 14.4
1.35
 I x 
_______________________________________ g 
h
14.2 1.24
(a) For   480 nm, For h  1.3 eV,    0.95  m
1 .3
1.24 1.24
E   2.58 eV For silicon:   310 2 cm 1

Then for I x   10 2 W/cm 2 , we obtain
0.480
For   725 nm,
1.24 g 
3 10 10 
2 2

E
0.725
 1.71 eV
1.6 10 1.3 19

(b) For E  0.87 eV, or


1.24 1.24 g   1.44 1019 cm 3 s 1
   1.43  m
E 0.87 The excess concentration is
For E  1.32 eV, 
n  g   1.44 1019 10 6  
1.24 or
  0.939  m
1.32 n  1.44 1013 cm 3
For E  1.90 eV, _______________________________________
1.24
  0.653  m 14.5
1.90
p
_______________________________________ (a) p  g  p 0  g  
 p0
14.3
5 1015
1.24 g   2.5 10 22 cm 3 s 1
(a)    0.752  m 2 10 7
1.65
For h  1.65 eV,
(i) From Figure 14.4,   910 3 cm 1 1.24
I d    0.752  m
(ii)   exp  d  1.65
I 0
From Figure 14.4,   910 3 cm 1
 
 exp  9 10 1.2 10
3 4

I 0 
g h 
 0.340 
Fraction absorbed  1  0.34  0.66

2.5 10 1.6 10 1.65
22 19

9 10 3
 0.733 W/cm 2
Semiconductor Physics and Devices: Basic Principles, 4th edition Chapter 14
By D. A. Neamen Problem Solutions
______________________________________________________________________________________

I  d  where L p  D p p
(b)  0.1  exp  d 
I 0 The photon flux in the semiconductor is
  
0.1  exp  9 10 3 d  x    O exp  x 
1  1  and the generation rate is
d ln   G L   x     O exp  x 
9 10 3
 0.1 
so the differential equation becomes
 2.56 10 4 cm  2.56  m
d 2 p n  p n  O
_______________________________________  2  exp  x 
dx 2 Lp Dp
14.6 The general solution is of the form
1.24 1.24 x  
   0.886  m p n x   A exp   B exp  x 
E 1.40  Lp   Lp 
   
From Figure 14.4,   4.5 10 2 cm 1
  O p
I d   2 2  exp  x 
(a)   0.1  exp  d   L p 1
I 0
As x   , p n  0 so that B  0 . Then
1  1  1  1 
d  ln   ln     x    O p
  0.1  4.5 10  0.1 
2
p n x   A exp   exp  x 
 L p   2 L2  1
 5.12 10 3 cm  51.2  m   p

At x  0 , we have
1  1 
(b) d  ln   d p n 
4.5 10 2
 0.3  Dp  sp n
dx x 0 x 0
 2.68 10 3 cm  26.8  m
so we can write
_______________________________________
  O p
p n  A 2 2
14.7 x 0  L p 1
GaAs: and
For x  1  m  10 4 cm, we have 50% d p n  A   O p
2

absorbed or 50% transmitted, then   2 2


dx x 0 L p  L p 1
I x 
 0.50  exp  x  Then we have
IO
AD p  2  O p D p s  O  p
We can write    sA  2 2
1  1   1 
Lp  L p 1
2 2
 L p 1
     ln      4   ln 2 Solving for A, we find
 x   0.5   10 
or   O p  s   D p 
A 2 2  
  0.69 10 4 cm 1 
 L p  1  s  D p L p  
This value corresponds to The solution can now be written as
  0.75  m , E  1.65 eV   O p
_______________________________________ p n x   2 2
 L p 1
14.8  s  Dp x 
  exp   exp  x 
The ambipolar transport equation for minority
carrier holes in steady state is 
 s  D p L p  
 Lp 
 
d 2 p n  p _______________________________________
Dp  GL  n  0
dx 2
p
or
d 2 p n  p n G
2
 2  L
dx Lp Dp
Semiconductor Physics and Devices: Basic Principles, 4th edition Chapter 14
By D. A. Neamen Problem Solutions
______________________________________________________________________________________

14.9 The solution is then


We have   x   x 
 
d 2 n p n p n p x   G L n 1  cosh   B sinh  
Dn  GL  0   L n   Ln 
dx 2
n where B was just given.
or _______________________________________
 
d 2 n p n p G
 2  L 14.10
dx 2 Ln Dn
L n  D n n 0  2510 6   5 10 3 cm
where Ln  Dn n
The general solution can be written in the L p  D p p 0  105 10 7 
form  2.236 10 3 cm
 x   x 
n p x   A cosh   B sinh    G L n  Dn Dp 
Now J S  en i2   
 Ln   Ln   Ln N a L p N d 
 
For s   at x  0 means n p 0  0 . Then
0  A  G L n  A  G L n  
 1.6 10 19 1.5 1010  2

At x  W ,  25 10 
 
 Dn
 
d n p
 s o n p
 3
 5 10 10   
16 3 15 
2.236 10 10   
10
dx x W x W J S  1.790 10 A/cm 2
Now 
I S  AJ S  5 1.79 10 10 
W 
n p W   G L n cosh   8.950 10 10 A
 Ln  (a) I L  eG L AW
W  We find
 B sinh    G L n

 Ln 
Vbi  0.0259  ln 
  
 1016 1015 
  0.6350 V
and
 
 
 1.5 1010 
2

d n p G L n W 
 sinh    2  V  Na  Nd 
1/ 2

dx x W Ln  Ln  W   s bi  
 e  N N 
W   a d 
B

Ln
cosh 
 Ln 

 211.7 8.85 10 14 0.635


so we can write  1.6 10 19
G L n Dn W  BDn W   10 16  1015  
1/ 2
sinh  
 L cosh L
 
   16
Ln  Ln  n  n    
 10 10
15 
 
W 
 s o  G L  n cosh  W  9.508 10 5 cm
 Ln  Then
W      
I L  1.6 10 19 5 10 21 5 9.508 10 5 
 B sinh    G L n 
  0.380 A  380 mA
 Ln  
 I 
Solving for B, we obtain (b) Voc  Vt ln 1  L 
 W    W     IS 
G L  L n sinh    s o n cosh   1 
  0.380 
  Ln    L n     0.0259 ln 1  
B 10
 8.95 10 
Dn W  W 
cosh   s o sinh   Voc  0.5145 V
Ln  n
L  Ln  Voc 0.5145
(c)   0.810
Vbi 0.635
_______________________________________
Semiconductor Physics and Devices: Basic Principles, 4th edition Chapter 14
By D. A. Neamen Problem Solutions
______________________________________________________________________________________

14.11  V  V  I
From Problem 14.10, I S  8.95 10 10 A (ii) 1  m  exp m
 V
  1 L

 Vt   t  IS
 I  10 10 3
(a) Voc  Vt ln 1  L   1
 IS  8.95 10 10
 120 10 3   1.117 10 7
 0.0259 ln 1  
10 
 8.95 10  By trial and error, V m  0.351 V
 0.4847 V Now
 V    V  
(b) I  I L  I S exp   1 I m  I L  I S exp m   1
  Vt     Vt  
100 10 3  120 10 3  10 10 3
 V
 8.95  10 10 exp
 
  1

 
  0.351  
 8.95 10 10 exp   1
  0.0259  
  Vt  
 V  0.4383 V I m  9.3110 3 A  9.31 mA
 V  V  I Then
(c) 1  m  exp m
 V
  1 L
 Pm  I mVm  9.310.351  3.27 mW
 Vt   t  IS
(b)
120 10 3 
 1 100 10 3 
8.95 10 10 (i) Voc  0.0259 ln 1  
10 
 8.95 10 
 1.34110 8
 0.480 V
By trial and error, V m  0.412 V
 V  V  I
Now (ii) 1  m  exp m   1  L
 V    Vt   Vt  IS
I m  I L  I S exp m   1 100 10 3
  Vt    1
8.95 10 10
 120  10 3
 1.117 10 8
 
  0.412  
 8.95 10 10 exp   1 By trial and error, Vm  0.407 V
  0.0259   Now
 I m  112.75 10 3 A  112.75 mA  V  
I m  I L  I S exp m   1
Pm  I mVm  112.750.412   Vt  
 46.5 mW
 100  10 3
V 0.412
(d) V m  I m R L  R L  m 
I m 0.11275  
  0.407  
 8.95 10 10 exp   1
  0.0259  
R L  3.65 
_______________________________________ I m  9.40 10 2 A  94.0 mA
Then
14.12 Pm  I mVm  94.00.407   38.3 mW
From Problem 14.10, I S  8.95 10 10 A P 38.3
(c) m 2   11.7
(a) Pm1 3.27
 I  _______________________________________
(i) Voc  Vt ln 1  L 
 IS 
 10 10 3 
 0.0259 ln 1  
10 
 8.95 10 
 0.420 V
Semiconductor Physics and Devices: Basic Principles, 4th edition Chapter 14
By D. A. Neamen Problem Solutions
______________________________________________________________________________________

14.13  V  
 J   
I  50  10 3  4.579  10 12 exp   1
VOC  Vt ln 1  L    Vt  
 JS  We see that when I  0 , V  VOC  0.599 V.
 30 10 3 
 0.0259 ln 1  

We find
 JS 
where V (V) I (mA)
0 50
 1 Dn 1 Dp 
J S  en i2    0.1 50
 N a n Nd p  0.2 50

0.3 50
which becomes 0.4 49.98

J S  1.6 10 19 1.8 10 6  
2
0.45 49.84
0.50 48.89
 1 225 1 7 
 8
 19  0.55 42.36
 N a 5  10 10 5  10 8  0.57 33.46
or 0.59 14.19
 6.708 10 4 

J S  5.184 10 7    1.183 10 15  (b) The voltage at the maximum power point
 N a  is found from
Then  Vm   Vm  I
N a (cm 3 ) J S (A/cm 2 ) VOC (V) 1    exp   1 L

 Vt   Vt  IS
10 15 3.477 10 17 0.891 50  10 3
 1
10 16 3.478 10 18 0.950 4.58 10 12
19
10 17
3.484 10 1.01  1.092 1010
10 18 3.539 10 20 1.07 By trial and error,
_______________________________________ V m  0.520 V
At this point, we find
14.14 I m  47.6 mA
(a) so the maximum power is
 
I L  J L  A  25 10 3 2  50 10 3 A Pm  I mVm  47.60.520
We have or
 1 D 1 Dp  Pm  24.8 mW
J S  en i2  n
  (c) We have
 N a  n Nd  p 
 V V 0.520
or V  IR  R   m 
I I m 47.6  10 3

J S  1.6 10 19 1.5 1010   2
or
 1 18 1 6  R  10.9 
 6
 19 7  _______________________________________
 3  10 16
5  10 10 5  10 
which becomes 14.15
J S  2.289 10 12 A/cm 2  180 10 3 
or (a) Voc  0.0259  ln 1  

 2 10 9 
I S  4.579 10 12 A  0.474 V
We have  V  V  I
 V   (b) 1  m  exp m   1  L
I  I L  I S exp   1  Vt   Vt  IS
  Vt   180 10 3
or  1  9  10 7
2 10 9
Semiconductor Physics and Devices: Basic Principles, 4th edition Chapter 14
By D. A. Neamen Problem Solutions
______________________________________________________________________________________

By trial and error, V m  0.402 V (e) Then I  60.09463  0.5678 A


V  V
So R L  
10.14
 17.86 
I m  I L  I S exp m 
 I 0.5678
 Vt 
_______________________________________
 
 0.402 
 180 10 3  2 10 9 exp 
 0.0259  14.17
1
 1.69 10 A  169 mA Let x  0 correspond to the edge of the space
Pm  I mVm  1690.402  67.9 mW
charge region in the p-type material. Then in
the p-region
(c) R L 
V m 0.402
  2.379   
d 2 n p n p
I m 0.169 Dn  GL  0
dx 2
n
(d) R L  1.52.379  3.568 
or
Now
 
d 2 n p n p G
V V   2  L
I  I L  I S exp  dx 2
Ln Dn
RL  Vt  where
V

 180 10 3  2 10 9 exp 
 V 
 G L   x     O exp  x 
3.568  0.0259  Then we have
By trial and error, V  0.444 V  
d 2 n p n p  O
V 0.444  2  exp  x 
Then I    0.1244 A
2
dx Ln Dn
R L 3.568
The general solution is of the form
P  IV  124.40.444  55.2 mW x x
_______________________________________ n p x   A exp   B exp
 L 

 Ln   n 
 
 2 O2 n exp  x 
14.16
 100 10 3   Ln  1
(a) Voc  0.0259  ln 1  

 10 10  As x   , n p  0 so that B  0 . Then
 0.5367 V   x    O n
 V  V  n p x   A exp  2 2
  exp  x 
 Ln   Ln  1
I
(b) 1  m  exp m
 V
  1 L

 Vt   t  IS  
We also have n p 0  0  A  2 O2 n ,
100 10 3  Ln  1
 1
10 10 which yields
 10 9
 
A  2 O2 n
By trial and error, V m  0.461 V  Ln  1
Then We then obtain

I m  100 10 3  10 10 exp
 0.461 
      x 
n p x   2 O2 n exp

  exp  x 
 0.0259   L n  1   L n  
 9.463 10 2 A  94.63 mA where  O is the incident flux at x  0 .
Pm  I mVm  94.630.461  43.62 mW
_______________________________________
10
(c) n   21.7  n  22 cells
0.461 14.18
(d) Now V  220.461  10.14 V For 90% absorption, we have
x 
P  IV  exp  x   0.10
5.2  I 10.14  I  0.5128 A O
0.5128 Then
Then n    5.42  n   6
0.09463
Semiconductor Physics and Devices: Basic Principles, 4th edition Chapter 14
By D. A. Neamen Problem Solutions
______________________________________________________________________________________

14.20
exp   x  
1
 10 n-type, so holes are the minority carrier
0 .1
(a)
  
or
p  G L p  10 21 10 8
1
x     ln 10 or
 
p  n  1013 cm 3
For h  1.7 eV ,   10 4 cm 1
(b)
Then
 1 

  ep  n   p 
x   4   ln 10  2.3 10  4 cm
 10  
 1.6 10 19
10 8000  250
13

or or
x  2.3  m   1.32 10 2 (  -cm) 1
and for h  2.0 eV,   10 5 cm 1 . (c)
Then I L  J L  A   A 
 AV
 1  L
x   5   ln 10  0.23 10  4 cm 
1.32 10 10 4 5
2
 
 10  
or 100 10  4
x  0.23  m or
I L  0.66 mA
_______________________________________
(d)
14.19 IL
 ph 
(a) no  N d  51015 cm 3 eG L AL
I  e n no A 0.66 10 3

 
 1.6 10 19 1200  5 1015   1.6 10  19

10 21 10  4 100 10  4 
or

 5 10  4 
3

4

  ph  4.125
 120 10 
_______________________________________
I  0.12 A  120 mA
  
(b) p  GL p 0  10 21 10 7  1014 cm 3 14.21
(c)   ep    n p
x    O exp  x 
 1.6 10 10 1200  400
19 14 The electron-hole generation rate is
g    x     O exp  x 
 2.56 10 2 (  -cm) 1 and the excess carrier concentration is
(d) I L   A p   p x
 
 2.56 10  2 5 10  4  3
4

  Now

  ep  n   p 
 120 10 
3
 3.2 10 A  3.2 mA and
IL J L   
(e)  ph  The photocurrent is now found from
eG L AL
W xO
3.2 10 3

1.6 10  
19

10 21 5 10  4 120 10  4 
IL      dA   dy     dx
0 0

ph  3.33 xO

_______________________________________

 We  n   p  p  dx  
0
Then
Semiconductor Physics and Devices: Basic Principles, 4th edition Chapter 14
By D. A. Neamen Problem Solutions
______________________________________________________________________________________

xO 
(c) I L  eGL A W  Ln  L p 
 
I L  We  n   p   O p exp  x dx  
 1.6 10 19
10 10 
21 3
0


 We  n   p   O p  2.095  35.36  10.010 4
 1  xO I L  7.593 10 4 A  0.7593 mA
  exp  x 
   0 _______________________________________
which becomes
 
I L  We n   p O p 1  exp  xO 
14.23
In the n-region under steady state and for
Now   0 , we have
  
I L  50 10 4 1.6 10 19 1200  45050 d 2 p n  p
 2 10
 10 16 7
1  exp 5 10 10  4 4 Dp
dx  2
 GL  n  0
p
or or
I L  0.131  A d 2 p n  p n G
_______________________________________  2  L
dx  2
Lp Dp
14.22 where L p  D p p and where x  is

Vbi  0.0259  ln 
 
 10 2  10 16 15
 positive in the negative x direction. The

 1.5  1010
2
  homogenerous solution is found from
 0.6530 V d 2 p nh  p nh
 2 0
L n  D n n 0  255 10 7  dx  2 Lp
The general solution is found to be
 3.536 10 3 cm
  x   
  B exp  x  
L p  D p p 0  1010 7  p nh x   A exp
 Lp   Lp 
   
 10 3 cm The particular solution is found from
 2  V  V R   N a  N d 
1/ 2
p np G
W   s bi    2  L
  N N  Lp Dp
e  a d 

 211.7  8.85 10 14 0.653  5

 which yields

 
1.6 10 19  p np 
G L L2p
 G L p
1/ 2
Dp
 1016  2  1015  
  16 The total solution is the sum of the
 
 10 2  10
15
 
  homogeneous and particular solutions, so we
Then have
  x   
W  2.095 10 4 cm p n x   A exp   B exp x    G L p
(a) I L1  eWG L A  Lp   Lp 
   
 
 1.6 10 19 2.095 10 4 10 21 10 3    One boundary condition is that p n remains
 3.352 10 A  33.52  A 5 finite as x    which means that B  0 .
(b) In n-region, Then at x   0 , p n 0  0  p n 0  p nO , so
 
p  G L p 0  10 21 10 7  1014 cm 3  that p n 0   p nO .
We find that
In p-region,
 
n  G L n0  10 21 5 10 7  
A   p nO  GL p 
The solution is then written as
 51014 cm 3
  x 
p n x   G L p  G L p  p nO  exp 
 Lp 
 
Semiconductor Physics and Devices: Basic Principles, 4th edition Chapter 14
By D. A. Neamen Problem Solutions
______________________________________________________________________________________

The diffusion current density is found as 14.25

J p  eD p
d p n x 
(a) G L 0 
I 0

10 3 0.080
dx x  0 h 1.6 10 19 1.5
But  3.33 10 20 cm 3 s 1
d p n  d p n  Then

dx dx  G L x   G L 0 exp x 
since x and x  are in opposite directions.
So
    
 3.33 10 20 exp  10 3 x 

d p n  (b) J L  e o 1  exp W 


J p  eD p
dx  x0

 eD p  GL p  p nO   1  exp W 
eG L 0

 1 

 
 exp  x   
 
1.6 10 19 3.333 10 20 
 Lp 
 
 L p  x 0
  10 3  
Finally  1  exp 10 100 10 
3 4

eD p p nO
J p  eG L L p  J L  5.33 10 2 A/cm 2  53.3 mA/cm 2
Lp _______________________________________
_______________________________________
14.26
14.24 (a) J L  eWG L
(a) J L  e o 1  exp W 
 
 1.6 10 19 20 10 4 10 21  

Diode A: J L  1.6 10 19
5 10  17
 0.32 A/cm 2

 1  exp 10 2 10 


4 4
(b) J L  e o 1  exp W 
J L  6.92 10 2 A/cm 2
 1  exp W 
eG L 0

Diode B: J L  1.6 10 19
5 10  17 
 1  exp 10 10 10 
4 4


1.6 10 19 10 21  
J L  8.0 10 2 A/cm 2
10 3  
 1  exp 10 20 10 
4
  
3
Diode C: J L  1.6 10 19 5 1017
J L  0.138 A/cm 2
 1  exp 10 80 10 
4 4
_______________________________________
J L  8.0 10 2 A/cm 2
(b) J L  e o 1  exp W  14.27
The minimum  occurs when   1  m
 
Diode A: J L  1.6 10 19 5 1017 
which gives   10 2 cm 1 . We want
 1  exp 5 10 2 10 
2 4
x 
J L  7.613 10 3 A/cm 2  exp  x   0.10
O
 
Diode B: J L  1.6 10 19 5 1017  which can be written as
 1  exp 5 10 10 10 
2 4
exp  x  
1
 10
0.10
J L  3.148 10 2 A/cm 2
Then
 
Diode C: J L  1.6 10 19 5 1017  x  ln 10   2 ln 10   2.30  10  2 cm
1 1
 1  exp 5 10 80 10 
2 4
 10
or
J L  7.853 10 2 A/cm 2
x  230  m
_______________________________________
_______________________________________
Semiconductor Physics and Devices: Basic Principles, 4th edition Chapter 14
By D. A. Neamen Problem Solutions
______________________________________________________________________________________

14.28 14.33
For Al x Ga1 x As system, a direct bandgap for We can write the external quantum efficiency
0  x  0.45 , we have as
E g  1.424  1.247 x  ext  T1T2
where T1  1  R1 and where R1 is the
At x  0.45 , E g  1.985 eV, so for the direct
reflection coefficient (Fresnel loss), and the
bandgap
factor T 2 is the fraction of photons that do not
1.424  E g  1.985 eV
experience total internal reflection. We have
which yields 2
0.625    0.871  m  n  n1 
R1   2 
_______________________________________  n 2  n1 
so that
14.29 2
 n  n1 
(a) From Figure 14.24, E g  1.64 eV T1  1  R1  1   2 
1.24 1.24  n 2  n1 
   0.756  m which reduces to
Eg 1.64
4n1 n 2
(b) From Figure 14.24, E g  1.78 eV T1 
n1  n 2 2
1.24 1.24
   0.697  m Now consider the solid angle from the source
Eg 1.78 point. The surface area described by the solid
_______________________________________ angle is  p 2 . The factor T1 is given by
 p2
14.30 T1 
1.24 1.24 4 R 2
Eg    1.85 eV From the geometry, we have
 0.670
From Figure 14.23, x  0.35   p 2  
sin  C    p  2R sin  C 
_______________________________________  2  R  2 
Then the area is
14.31  
1.24 1.24 A   p 2  4 R 2  sin 2  C 
Eg    1.85 eV  2 
 0.670
Now
From Figure 14.24, x  0.38
 p2  
_______________________________________ T1   sin 2  C 
4 R 2  2 
14.32 From a trig identity, we have
(a) For GaAs, n 2  3.66 and for air, n1  1.0 .   1
sin 2  C   1  cos C 
The critical angle is  2  2
n   1  Then
 C  sin 1  1   sin 1    15.86
 n2   3.66  T1  1  cos C 
1
The fraction of photons that will not 2
experience total internal reflection is The external quantum efficiency is now
2 C 215.86  4n1 n 2
 1  cos C 
1
  8.81%  ext  T1T2 
360 360 n1  n2  2
2

(b)Fresnel loss: or
2
 n  n1 
2 2n1 n 2
 3.66  1   ext  1  cos C 
R   2      0.3258
 2
n  n 1   3.66  1  n1  n 2 2
The fraction of photons emitted is then _______________________________________
0.08811  0.3258  0.0594  5.94%
_______________________________________
Semiconductor Physics and Devices: Basic Principles, 4th edition Chapter 14
By D. A. Neamen Problem Solutions
______________________________________________________________________________________

14.34 14.35
For an optical cavity, we have For GaAs:
 h  1.42 eV   
1.24
 0.873  m
N   L
2 1.42
If  changes slightly, then N changes slightly Then
also. We can write
 
2

0.873 10 
4 2
 5.08 10 7 cm
N 1 1 N 1  1 2
 2L 275 10 
4

2 2 or
Rearranging terms, we find
  5.08 10 3  m
N 1 1 N 1  1 2 N 1 1 N 1  2  2
    0 _______________________________________
2 2 2 2 2
If we define   1   2 , then we have
N1 
  2
2 2
We can approximate  2   , then
N 1 2L
 L  N1 
2 
Then
1 2L 
  
2  2
which yields
2
 
2L
_______________________________________

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The ambipolar transport equation for minority carrier holes in steady state is expressed as \(0 = D_p \frac{d^2 \delta p}{dx^2} - \frac{\delta p}{\tau_p} + G\), where \(D_p\) is the diffusion coefficient, \(\delta p\) is the excess minority carrier hole concentration, \(\tau_p\) is the minority carrier lifetime, and \(G\) is the generation rate. This equation becomes linked to the photon flux \(\Phi(x) = \Phi_0 e^{-\alpha x}\) and the generation rate \(G(x) = \alpha \Phi_0 e^{-\alpha x}\), where \(\alpha\) is the absorption coefficient .

Matheson's rule is used to approximate the absorption of multi-layered semiconductor devices by relating absorption coefficients through a weighted sum based on material composition: \(\alpha(\lambda)_{eff} = \sum c_i \alpha_i(\lambda)\) where \(c_i\) is the fraction of material \(i\). This helps in designing devices like multi-junction solar cells, ensuring optimal layer thicknesses and compositions are chosen for broad-spectrum absorption and efficiency. Correct application improves light absorption efficiency while minimizing material costs .

The external quantum efficiency (EQE) of a solar cell indicates the effectiveness of converting incident photons into electrical current. It depends on photon absorption and minority carrier diffusion. When photons are absorbed, electron-hole pairs are generated. These carriers must reach the p-n junction; thus, good diffusion properties and low recombination improve EQE. Specifically, EQE is the product of the absorption efficiency, the collection efficiency of carriers, and the ratio of carriers reaching the junction .

The relationship is derived through the diode equation \(V = n V_T \ln \left(\frac{I}{I_S} + 1\right)\), where \(I\) is the current, \(I_S\) is the reverse saturation current, \(V_T\) is the thermal voltage, and \(n\) is the ideality factor. In large bandgap semiconductors, \(I_S\) is typically smaller, which leads to higher open-circuit voltages \(V_{OC}\). The reverse saturation current can be expressed as \(I_S = A e^{\frac{-E_g}{kT}}\), where \(A\) is a constant, \(E_g\) is the bandgap energy, \(k\) is Boltzmann's constant, and \(T\) is the temperature .

In p-type semiconductors, the space charge region significantly influences electron transport. The presence of an electric field due to the space charge affects electron motion, enhancing drift currents over diffusion, as indicated by \(0 = D_n \frac{d^2 \delta n}{dx^2} - \frac{\delta n}{\tau_n} + G\). The boundary conditions at the space charge edges modify the general solution for minority carrier concentrations, \(\delta n(x)\), typically reducing it in the depletion region due to recombination, as the recombination rate exceeds generation .

The saturation current \(I_S\) in p-n junctions is influenced by material properties, junction area, carrier lifetimes, and intrinsic carrier concentration. It is expressed as \(I_S = q A n_i^2 \left( \frac{1}{N_A \tau_p} + \frac{1}{N_D \tau_n} \right)\), where \(q\) is the charge, \(A\) is the junction area, \(n_i\) is the intrinsic carrier concentration, \(N_A\) and \(N_D\) are doping concentrations, and \(\tau_p\) and \(\tau_n\) are carrier lifetimes. A lower \(I_S\) improves device performance by reducing leakage currents and enhancing open-circuit voltage .

The parameter \(\alpha\), known as the absorption coefficient, determines how strongly a material absorbs light at a given wavelength. It is a measure of the exponential attenuation of the light as it penetrates the material: \(\Phi(x) = \Phi_0 e^{-\alpha x}\). A higher \(\alpha\) implies a short penetration depth, meaning photons are absorbed closer to the surface. For example, in semiconductors, the penetration depth \(d\) relates to \(\alpha\) by \(d = \frac{1}{\alpha}\).

The diffusion length \(L_D\) in a semiconductor photodetector is crucial because it determines the mean distance minority carriers (generated by absorbed photons) travel before recombination. Efficiency is maximized when \(L_D\) greatly exceeds the depletion width. It ensures generated carriers contribute to the photocurrent and are efficiently collected at the contacts. Photodetectors require a long \(L_D\) to enhance sensitivity, as based on \(L_D = \sqrt{D_n \tau_n}\), where \(D_n\) is the diffusion coefficient and \(\tau_n\) is the carrier lifetime .

The open-circuit voltage \(V_{OC}\) in photovoltaic devices is described by the equation \(V_{OC} = n V_T \ln \left(\frac{I_L}{I_S} + 1\right)\), where \(I_L\) is the light-generated current, \(I_S\) is the diode saturation current, \(V_T\) is the thermal voltage, and \(n\) is the diode ideality factor. \(V_{OC}\) increases with \(I_L\) and decreases with \(I_S\): as \(I_S\) relates to recombination losses, a lower \(I_S\) results in a higher \(V_{OC}\).

Generation refers to the creation of electron-hole pairs as a result of energy absorption, such as from photons, while recombination is their annihilation, returning them to the atomic lattice. The carrier lifetime \(\tau\) is affected by both processes: a higher generation rate due to light can increase the number of carriers, reducing effective lifetimes as it enhances non-radiative recombination. These processes are modeled by the rate equation \(\frac{d\delta p}{dt} = G - \frac{\delta p}{\tau}\). The net effect on \(\tau\) depends on material properties and illumination conditions .

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