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Opamp Design Assignment for EE5320

The document describes an assignment to design and simulate a two-stage op-amp with a telescopic cascode first stage and common-source second stage. Students are to realize an inverting amplifier using the op-amp, matching component values from a previous assignment. Simulations must characterize the closed-loop gain, bandwidth, slew rate, noise, and harmonic distortion. Plots and tables of results are required.
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0% found this document useful (0 votes)
18 views2 pages

Opamp Design Assignment for EE5320

The document describes an assignment to design and simulate a two-stage op-amp with a telescopic cascode first stage and common-source second stage. Students are to realize an inverting amplifier using the op-amp, matching component values from a previous assignment. Simulations must characterize the closed-loop gain, bandwidth, slew rate, noise, and harmonic distortion. Plots and tables of results are required.
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© All Rights Reserved
We take content rights seriously. If you suspect this is your content, claim it here.
Available Formats
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EE5320: Analog Integrated Circuit Design; Nagendra Krishnapura (nagendra@[Link].

in) 1

Assignment 6

Vdd Vdd
M00 M0 M12
I00 M3 M4 M11

VB78
M1 M2 M7 M8
A out
B C
M5 M6 VB56 Cc
VB56 M5 M6
B C
A out
M7 M8 Cc M1 M2
VB78

M00 M0
I00 M3 M4 M11 M12
Vss Vss
(a) (b)

Rf = kRi Rf = kRi

Ri RL Ri L
Vcm+Vi − − −
Vo Vo C Vo
Vcm Vreturn
Vcm + Vcm + +
-Vreturn Vtest − +
CL L(s) =
Vtest
(c) (d) Vcm (e)

Figure 6.1: Problem 6.1.

6.1. Fig. 6.1 shows two-stage opamps. The first stage is a telescopic cascode stage. (a) uses a pMOS differential pair
in the first stage and an nMOS common-source amplifier in the second stage. (b) uses an nMOS differential pair
in the first stage and an pMOS common-source amplifier in the second stage.
Realize the inverting amplifier (Fig. 6.1(c)) that you designed in assignment 4 using these opamps. You will be
using the same component values here. You will also need the results of MOS characterization to determine the
current density.
For simulating the operating point, place the opamp in unity negative feedback as shown in Fig. 6.1(d) or
simulate it in open loop with nodes A, B, and C shorted to each other and both inputs at Vcm .

• Vdd = 1.8 V, Vss = 0 V, Vcm = 0.9 V.


• Simulation temperature: 100◦ C.
• Odd roll numbers: pMOS input pair; Even roll numbers: nMOS input pair.
• L = 0.3 µm for all transistors.
• Use1 VDSAT = 0.15 V for the first stage transistors except M0 . Use VDSAT = 0.25 V for the second stage
transistors, M0 , and M00 .
• Choosing the VDSAT value fixes the gm and ID per 1 µm/0.3 µm finger. Choose the multiplier m for each
transistor to set its gm or ID as required.
1 Choose the current density that sets the VDSAT to within 10 mV of the specified values. Do not aim for microvolt precision.
2 EE5320: Analog Integrated Circuit Design; Nagendra Krishnapura (nagendra@[Link])

• For M00 , use m = 2 and choose I00 (integer µA) that sets the desired bias in the first and the second stages.
• All nMOS bulk terminals should be connected to Vss . All pMOS bulk terminals should be connected to
Vdd .
• Adjust VB56 such that the VDS of M1,2 is 50 mV above their VDSAT . Similarly, Adjust VB78 such that the
VDS of M3,4 is 50 mV above their VDSAT . i.e., M1−4 must be in saturation region with 50 mV margin.

Verify that the operating point (bias currents, voltages, transconductances) are correctly set up before simulating
the amplifier.
Present the following results.
Tables:

(a) Specification table with your specific values and all the component values.
(b) Table showing simulation results: closed loop dc gain, closed loop 3-dB bandwidth, unity loop gain
frequency, phase margin, rms output noise (integrated from 10 kHz to 100 MHz), fraction of noise vari-
ance (integrated from 10 kHz to 100 MHz) contributed by Ri , Rf , first stage, second stage, and RL , Opamp
open loop dc gain, positive and negative slew rates, positive and negative swing limits, HD3 , supply volt-
age, current consumption. To find the opamp slew rates apply a large input step (from Vcm to Vcm + Vstep )
such that the first stage current is completely switched to one side.

To find HD3 , apply a sinusoidal input that results in a 1 V peak-peak output at a frequency that is 1/4th the
bandwidth. Report HD3 , the ratio of the third harmonic to the fundamental (in dB).
Plots:

(a) Loop gain magnitude (dB) and phase (degrees). The unity loop gain frequency and phase margin must be
marked. Break the loop as shown in Fig. 6.1(e) to simulate the loop gain. Use large L, C, e.g., L = 106 H,
C = 1 F. The frequency range should be from ∼ 0.1× dominant pole to where the loop gain is ∼ −20 dB.
(b) Closed loop transfer function magnitude on a log-y scale showing the dc gain and the 3-dB bandwidth.
(c) Closed loop dc transfer curve. Vary Vi from Vcm − 0.5 V to Vcm + 0.5 V
(d) Small-signal step response: Output should step from Vcm − 0.05 V to Vcm + 0.05 V and back. Use a short
rise time ∼ 100 ps.
(e) Large-signal step response: Output should step from Vcm − 0.5 V to Vcm + 0.5 V and back. Use a short
rise time ∼ 100 ps. Check to see that the current is completely switched to one side in the first stage.
(f) Output noise PSD and the input referred noise PSD of the closed loop amplifier from 10 kHz to 100 MHz.
(g) Input referred noise PSD of the opamp from 10 kHz to 100 MHz.

(Not for submission):

• Remove the cascodes from the first stage, run the simulations and find out the differences
• Connect Cc to the drain of M2 or M4 instead of the drains of M6,8 . See if there is a difference in phase
margin. You can also try connecting Cc /2 each to the drains of M2 and M4 .

Common questions

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The slew rate of an opamp is determined by applying a large step input (e.g., from Vcm to Vcm + Vstep) such that the first stage current is completely switched to one side. This tests the opamp's maximum rate of change of output voltage in response to a rapid input change. A higher slew rate indicates that the opamp can handle fast-changing signals more effectively, which is essential for high-frequency applications. Limited slew rates result in a slower response, leading to signal distortion and increased settling time. This parameter is essential to analyze as it affects transient response and overall circuit bandwidth .

Harmonic distortions in an opamp result from nonlinearities in the amplification process, leading to signal distortion and inaccuracies in output. These distortions, characterized by the presence of harmonics at multiples of the input frequency, reduce the fidelity of signal reproduction. Third-Harmonic Distortion (HD3) is a critical metric as it impacts the linearity of the system. Measuring harmonic distortion involves applying a sinusoidal input to the opamp and analyzing the output. Techniques such as FFT (Fast Fourier Transform) are used to evaluate the amplitude of harmonics relative to the fundamental frequency, often expressed in decibels (dB). Maintaining low harmonic distortion levels is crucial for high-accuracy and signal integrity in applications .

Temperature variations can significantly affect the performance of an opamp by altering the device parameters such as threshold voltage, carrier mobility, and leakage currents. Increased temperature generally leads to decreased mobility, which reduces the transconductance (gm) and the open-loop gain, potentially resulting in slower response times. Threshold voltage variations also affect the bias points of the transistors, which may lead to instability if not precisely managed. In simulations, these effects are accounted for by setting a high simulation temperature, such as 100°C, to ensure the opamp performance meets the specifications under worst-case thermal conditions. This ensures that the design remains stable and functional across all expected operating environments .

Compensation capacitors, such as Cc, play a pivotal role in opamp design by introducing poles and zeros that shape the frequency response, particularly the phase response, to enhance stability. By adding a dominant pole at a lower frequency and pushing higher frequency poles outside the unity-gain bandwidth, compensation capacitors increase the phase margin, thereby reducing the risk of oscillations and instability. They also affect the circuit's gain-bandwidth product and transient response, often necessitating trade-offs between speed and stability. Proper placement and sizing of these capacitors are critical to achieving the desired performance without excessive bandwidth reduction .

Setting specific saturation voltage (VDSAT) values is crucial for ensuring that each transistor operates efficiently in its appropriate mode, particularly in analog circuits like opamps. For the first stage, a lower VDSAT ensures high transconductance and better gain, essential for initial signal amplification. In contrast, a higher VDSAT in the second stage can accommodate larger signal variations without entering the triode region. Maintaining transistors in their saturation regions optimizes their linearity and stability, crucial for the accurate processing of analog signals. Specific VDSAT values thus help balance the gain, bandwidth, and power consumption of the opamp .

Modeling the loop gain and phase margin is vital to assess the stability of an opamp. The loop gain determines the feedback network's ability to sustain oscillations or disturbances, while the phase margin provides a measure of how close the system is to instability. These metrics help predict the likelihood of overshoot or ringing in the output signal. They are typically evaluated by breaking the feedback loop and measuring the gain and phase response over a range of frequencies. The unity loop gain frequency is where the gain drops to unity (0 dB), and the corresponding phase margin is the phase angle at this frequency. A phase margin of at least 45-60 degrees is generally considered adequate for stable operation .

In a pMOS differential pair, the transconductance parameters (gm) are generally lower than those in an nMOS differential pair due to the mobility differences between electrons and holes. This difference affects the overall gain and bandwidth of the opamp. Additionally, pMOS transistors have higher threshold voltages and typically require larger chip areas. In terms of performance, nMOS pairs can offer faster switching speeds due to higher electron mobility, which can be advantageous for high-frequency applications. However, pMOS transistors provide better noise performance and are more stable under varying power supply conditions due to their threshold voltage characteristics .

Noise analysis is crucial in opamp design to ensure the integrity of the signal being amplified, especially in high-precision applications. The types of noise that should be taken into account include thermal noise, flicker noise (1/f noise), and quantization noise. Thermal noise is generated by the thermal agitation of charge carriers and is proportional to temperature and bandwidth. Flicker noise, on the other hand, dominates at lower frequencies and is inversely proportional to frequency. Both types of noise affect the signal-to-noise ratio (SNR), which determines the quality of the output signal. In simulation, these noise components are typically integrated over a specified frequency range (e.g., from 10 kHz to 100 MHz) to evaluate their impact on the opamp's performance .

When selecting bias points for the first and second stages of an opamp, it is crucial to ensure that each transistor operates in the saturation region for optimal performance. This involves setting the V_DS (drain-source voltage) slightly above the V_DS saturation value (V_DSAT) to maintain a sufficient margin. Specifically, V_DS should be 50 mV above V_DSAT for the transistors M1-4. The bias currents must be chosen such that sufficient transconductance (gm) is maintained while ensuring power efficiency. For M00, the current I00 needs to be set to maintain the desired bias voltage across the opamp stages. Additionally, variations in temperature and load conditions must be accounted for to ensure stability .

The bulk terminals of nMOS and pMOS transistors should be connected to specific power rails to prevent substrate-bias effect and to maintain threshold voltage stability. For nMOS transistors, connecting the bulk to the lowest potential Vss ensures that the source-bulk junction remains reverse-biased, thus preventing unwanted parasitic conduction paths. Similarly, for pMOS transistors, connecting the bulk to Vdd ensures p-n junction isolation. These connections help maintain consistent threshold voltages, which is vital for reliable device operation and minimizes leakage currents and variations due to body effects, thus ensuring uniform performance across the circuit .

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