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TEM Diff Pattern

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42 views9 pages

TEM Diff Pattern

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pillaideepak.v
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APPENDIX 4. STANDARD SPOT PATTERNS ‘This appendix includes diagrams of standard spot diffraction patterns for both cutie and hexagonal crystal structure. In the cubic cases each pattern for a given zone axis (2, defined in appendix 1) thas the same, six-, four-, three- or two-fold symmetry but the reflections that occur obey the rules outlined in table 2.1. The patterns for the hexagonal crystal structure are indexed using the Miller-Bravais system outlined in appendix 2, assuming exact close packing, that is am axial ratio (c/a) of €.633. The positions of the spots will change when the ¢/a changes. It is recommended that standard patterns be constructed for the c/a value corresponding to the actual material studied using the tables of Rarey, Stringer and Edingion (1966). In figures Ad.1-A4.4, the indexing pro- ‘cedure outlined in section 2.7.2 hasbeen followed. ‘The positions of superlattice reflections are also shown in figures A4.I and A42. The intensities of ‘the spots will depend upon their structure Facioe as described in section 23.1. The reflections that occur in cubic crystal structures are shown in tables AA and 44.2 Appendix 4: Reference Rarey, C. R., Stringer, J., and Edington, J. W. (1960). Trans, A.L.M-E., 236, 811 oe [. . Lee e Soke 2 2 Pe ee . . ROLLE & 2 . bk Hes oo o enti ade fieee Laan once se fix gts g § = 4 feats ee: Sema * oe oe $-Peisn ole] feMarese oe[oe) fxg wey) Figure A&1 Single-crystal spot transmission electron dittaction pateras forthe Festal steutue (a + «+? < 2) The zone axis, defite in appends Ii the beam det’ B eine in setion 2.72, as indicated. The crowes in one quadrant the diagram indeae the positon f te spas for he ordered fc (LI) unit ol The complete pltrn may be generated ‘prpenting thee spots inthe retainer of he pattern an indesing using the adton of ctor se oton 27.21 (oft ese Beas web) ea a gefhuns eetia) . Figure AA comin) ce fe jeebene ents) yp cymuaddy soe 908 $-fhnees anf) rae Adoasousyyy wos eon 201 Botthiccee BexBi2ec0 werfia] — $-4B sue Be ¥B-s00 weed] gSurw anh] 1! 22) The 2one axe =, defined in append is he beam dition 8 3 erefed bce (bunt ea The complete patiern ma be gener by the addon of Vsor se sedion 272.1 Figure M2_Single-ceytl spt ranemission aston eration pat einen sestion 272, a8 ndeated. Te crows nove quadrant fh Tepesing thn spon the reminder athe ptece aid i » xipuaday. Loe Practical Electron Microscopy 308 Practical Electron Microscopy 310 aun Appendix 4 (pommen) yy any fee voor F eseieg

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