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Types of Redundancy in Reliability

This document discusses various types of redundancy that can be used to improve system reliability. It begins by defining serial and parallel configurations. For serial configurations, the system reliability is the product of the individual component reliabilities. For parallel configurations, the system reliability is improved compared to individual components. The document then discusses active redundancy, standby redundancy, common mode failures, load sharing, switching failures, and multiply redundant systems. It introduces concepts such as 1/N and m/N redundancy to further improve reliability through adding more parallel components.
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0% found this document useful (0 votes)
57 views15 pages

Types of Redundancy in Reliability

This document discusses various types of redundancy that can be used to improve system reliability. It begins by defining serial and parallel configurations. For serial configurations, the system reliability is the product of the individual component reliabilities. For parallel configurations, the system reliability is improved compared to individual components. The document then discusses active redundancy, standby redundancy, common mode failures, load sharing, switching failures, and multiply redundant systems. It introduces concepts such as 1/N and m/N redundancy to further improve reliability through adding more parallel components.
Copyright
© All Rights Reserved
We take content rights seriously. If you suspect this is your content, claim it here.
Available Formats
Download as PDF, TXT or read online on Scribd

Chapter 6

Redundancy

Basic Definitions

 We have learned that as the complexity of a system


increases, the reliability will decrease, unless
compensatory measures are taken.
 In the previous chapters, we applied the relevant reliability
models to the entire system.
 However, an alternative approach is to determine an
appropriate reliability model for each component of the
system and then calculate the system reliability according
to the configuration of the components within the system.

1
System Reliability

Serial Configuration

 The serially related with n independent components are


given below.
n
Rs   Ri
i 1

 If each component of the system has constant failure rate


of λi , the system reliability is given by
n
s   i Rs  exp(s t )
i 1

2
Example

 Consider a 4 component system in which the components


are independent and identically distributed with CFR. If
Rs (100) = 0.95, find the individual component MTTF.

Parallel Configuration

 Also called active redundancy, meaning satisfactory


operation of the system is possible if either one or both
components function properly.

3
Parallel Configuration

 Assume a 2 component system and then generalize for n


component systems.
C c c
Rs  P ( R1  R2 )  1  P ( R1  R2 )  1  P ( R1  R2 )
 1  (1  R1 )(1  R2 )
n
Rs  1  (1  Ri )
i 1

Reliability Improvement by N
Parallel Components

4
Parallel Configuration

 Let’s assume the system build from components with an


individual failure rate of λ (CFR) same for both. Then for
system reliability
 t 2 t
Rs  2e e
 1  e  t 
 (t )    
 1  0.5e t 
 

Example

 2 parallel i.i.d. components have CFR. A reliability of 0.95


is desired at t = 1000. Find the component and system
MTTF.

5
Standby Parallel

 The derivation of the standby parallel reliability is


complicated since the failure time of standby unit is
dependent on the failure time of the primary unit.

Rs  (1  t )e  t
 t 
 (t )    
 1   t 

MTTF

 Find the MTTF for active and standby systems for two i.i.d.
CFR units. Compare them.

6
Example

 The MTTF of a system with a constant failure rate has


been determined. An engineer is to set the design life so
that the end life reliability is 0.9
 Determine the design life in terms of the MTTF

 If 2 systems are placed in active parallel, to what value


may the design life be increased without causing a
decrease in the end of life reliability.

Rare Event Approximation


 Frequently, the reliability is of most interest for times that
are small compared to the MTTF since it is within the small
time domain where the design life of most products fall.
For a single unit;
1 2 1 3
R  exp(t )  1  t  (t )  (t )  ....
2 6
 The rare event approximation has the form leading terms.

Ra (t )  1  (t ) 2 t  1 for active redundant


1
Rs (t )  1  (t ) 2 t  1 for standby redundant
2

7
Common Mode Failures
 Common mode failures are caused by phenomena that
create dependencies between two or more dependent
components which cause them to fail simultaneously.
 CMF mechanism have the same effect as putting an
additional component in series with the parallel.
2
Rs  (2 R  R ) R

where R’ is the contribution from the common mode


failure. If we write this equation in terms of failure
probability p;
2 2
ps  p  p  pp

Common Mode Failures


 Our primary solution is to work on eliminating the CMF
causes. However, this is not always possible and we must
include these mechanism to our reliability models. With
CFR, we can show
  I  c
  c  being the common mode failure rate
 Then the system reliability for an active 2 component
redundant system becomes;
 I t 2  I t  c t
Rs (t )  (2e e )e or by using c  

Rs (t )  2  e
 (1  ) t
e  t

8
Example

 Refer to the previous example. Assume a common mode


CFR of 0.00001. Find the new reliability at time 1000 and
MTTF.

What happens if components are in series?

Load Sharing

 For redundant components such as pumps, engines and


structures, the failure of one unit will increase the stress
level on the other and therefore increase its failure rate.
Suppose that λ* > λ is the increased failure rate of the
remaining unit after the first has failed.

* *
 t 2 t (  )t
RL  2e e  2e

9
Example

 In an active parallel system each unit has a failure rate of


0.002/hr.
 What is the MTTF if there is no load sharing?

 What is the MTTF if the failure rate increases 20% as a


result of increased load?
 What is the MTTF if one simply increased both unit
failure rates by 20%?

Switching and Standby Failures

 When the system has a standby redundancy, there is a


chance that switching mechanism can fail. If there is some
probability, p, that a switch can not be made to the standby
component then the reliability of the system becomes

R (t )  1  (1  p )t e  t

10
Switching and Standby Failures

 Failure of secondary unit to function may result not only


from switching. The standby component may have failed in
standby mode because of infrequent usage or
deterioration.
   
R (t )  1  (1  p )  (1  e  t ) e t
  
where λ+ is the failure rate of the secondary unit while in
standby mode.

Example

 An engineer designs a standby system with two identical


units to have an idealized MTTF of 1000 days. To be
conservative, she then assumes a switching failure
probability of 10% and the failure rate of the unit in standby
of 10% of the unit in operation. Assuming constant failure
rates, estimate the reduced MTTF of the system with
switching and standby failures included.

11
Multiply Redundant Systems

 The reliability of a system can be further enhanced by


placing increased number of components in parallel.
(active or standby)
 Two kinds are possible, 1/N or m/N redundancy.
 In 1/N, one and in m/N, m of the total N units must function
for the system to function properly.

1/N redundancy
 System reliability for active redundancy will be
N
Ra  1  (1  Ri )
i 1
For rare-event approximation where λt is small,

Ra (t )  1  (t ) N
and by using binomial coefficients we obtain
N
Ra   (1) n 1 CnN R n
n 1

12
High and Low Level Redundancy

a b c
High Level Redundancy
a b b

a b c
Low Level Redundancy

a b c

High and Low Level Redundancy

 System redundancy may be obtained in two ways. Each


component compromising the system may have one or
more parallel components, or the entire system may be
placed in parallel with one or more identical systems.
 The first case is referred to as low-level redundancy and
the second referred to as high-level redundancy.
 The concept of the level at which redundancy is applied
can be further generalized to lower and lower levels.

13
Example

 A radio set consists of three major components; AC


supply, a receiver and an amplifier having reliabilities of
0.8 0.9 and 0.85 respectively. Compare the system
reliabilities for HL and LL redundancy for systems with two
parallel components.

High and Low Level Redundancy

 Low-level redundancy always yields to higher reliability,


but only if the failures are truly independent.
 However, in reality CMF are more likely to occur with low-
level than with high-level.
 Compare the HL and LL redundancy when CMF are
present and HL system is isolated.

14
Example

15

Common questions

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Active redundancy allows a system to continue functioning if any of the components are operational, with reliability calculated based on the probability that at least one component is working. In contrast, standby redundancy involves backup components that are only activated when primary components fail, adding a layer of complexity in reliability calculation due to the dependency of failure times . Active redundancy is generally simpler to model because all components are continuously sharing the load, whereas standby requires consideration of both switching failures and potential deterioration of standby components .

The failure rate is crucial in determining the Mean Time To Failure (MTTF) as it directly affects reliability calculations. In active redundant systems, all components are continuously contributing, so the MTTF is determined by the combined effect of all components’ failure rates . For standby systems, MTTF calculations are more complex because they need to take into account the failure rates during standby and the reliability of the switching mechanism, along with dependencies between components . The standby component failure rates may differ significantly from the active rates due to less frequent use or different stressors .

When determining the design life to maintain a desired end of life reliability, factors such as the failure rates of individual components, whether the system configuration is parallel or series, and the inherent redundancy should be considered. In parallel configurations, the design life can often be extended due to the increased reliability from redundancy, but it is vital to ensure that the increase does not exceed the point where the end of life reliability decreases . Calculations should be done for both individual component reliability and system-wide effects, factoring in potential failures or deteriorations .

Common mode failures (CMF) occur when interdependencies between components cause simultaneous failure, effectively reducing the system's redundancy by acting as if an additional component were in series with the parallel system. This significantly impacts reliability . Mitigating CMF involves eliminating the root causes of these interdependencies if possible, otherwise, these effects must be incorporated into reliability models by modifying component failure rates or system configurations . Implementing high-level redundancy can also reduce the impact of CMF compared to low-level redundancy .

Increasing the number of parallel components in a system enhances its reliability due to redundancy. High-level redundancy, where entire systems are placed in parallel, tends to be more advantageous than low-level redundancy because it is less susceptible to common mode failures (CMF). Low-level redundancy can lead to higher reliability only if failures are independent, but in reality, CMF can have a more significant impact on low-level redundant systems, reducing their effectiveness compared to high-level redundancy systems .

In redundant systems with load sharing, the failure of one component increases the stress and thus the failure rate of the remaining components. This can decrease the overall system reliability compared to an ideal redundancy scenario where components operate independently . The increase in failure rates after one component's failure needs to be quantified and modeled to accurately predict the system MTTF, taking into account both the initial load and the load distribution post-failure .

Switching failures and secondary standby failures are significant because they can prevent the system from effectively transitioning to a backup component, thus reducing system reliability. These can be mitigated by improving the reliability of the switching mechanism and ensuring that standby components are regularly maintained to prevent failures due to infrequent use or deterioration . Combining these considerations with robust reliability analysis allows systems to better handle potential standby activation issues .

Key factors include the likelihood of independent failures versus common mode failures (CMF), the cost implications of additional components versus entire system replication, and the operational impact of potential failures. High-level redundancy is typically preferred in scenarios where CMF are a concern since it is inherently more isolated, though it may be more costly to implement . Low-level redundancy can be more cost-effective and provide better reliability if failures are truly independent, but it may not be as robust against CMF . Careful analysis of failure modes and costs are necessary to make informed decisions on redundancy planning.

Increasing a component's failure rate by a fixed percentage in a parallel configuration generally reduces the system's Mean Time To Failure (MTTF) because each component's probability of failure affects the overall system reliability. In configurations where components are supposed to back each other up, higher failure rates decrease the overall backup capacity, leading to a reduced MTTF . The rate of decrease depends on how sensitive the system is to changes in individual component reliabilities and can vary based on the redundancy level and configuration .

Estimating reliability for the design life can significantly affect the rare event approximations, which are often employed when event times are small compared to the Mean Time To Failure (MTTF). In such cases, systems may leverage simplified approximations to model reliability at these early stages, which helps in efficient design and testing . Implications for system design include the potential for overestimating reliability under rare events if these estimations are inaccurate, leading to potential system failures that could have been prevented with more detailed modeling .

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