BJT Structure and Operation Overview
BJT Structure and Operation Overview
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ELECTRONIC DEVICES
The bipolar transistor has three separately doped regions and two p-n junctions. Figure 1 shows
the basic structure of an n-p-n bipolar transistor and p-n-p bipolar transistor, along with the
circuit symbols. The three terminal connections are called the emitter base and collector. The
width of the base region is small compared to the minority carrier diffusion length. Generally,
the sequence of length of the three regions are WB < WE < WC.
Figure- 1: Simplified block diagram of (a) n-p-n (b) p-n-p and circuit symbol of (c) n-p-
n and (d) p-n-p bipolar transistors
There are few specific features that differentiate one region from the other region. These are:
(a) Emitter Region
• A region which supplies or emits majority carriers, for example in p-n-p transistor emitter
will supply holes and in n-p-n transistor it supplies electrons.
• Emitter is heavily doped, so that it can emit large number of carriers.
• Impurities are added in the ratio 1:103.
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(a)
(b)
Figure 3: An unbiased transistor
Following are some important points about depletion region.
• The depletion layer around the emitter junction penetrates more into the base region
and less into the emitter region. This is because the emitter is heavily doped as
compared to the base.
• The depletion layer around the collector junction penetrates more into the base region
and less into the collector region. This is because the collector is heavily doped,
whereas the base is lightly doped.
• The depletion layer penetrates more into the collector region and less into the emitter
region. Therefore, the depletion layer formed at collector junction is larger that
depletion layer formed at emitter junction.
NOTE: An unbiased transistor is not useful for any practical purpose because the
conduction of current across its junction is very small.
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2. TRANSISTOR BIASING
S.
Mode EBJ CBJ Properties Applications
No.
where IpE is injected hole diffusion current at emitter junction and InE is injected electron
diffusion current at emitter Junction.
2.1.2 Transport Factor (β*)
Injected carrier current reaching JC
Transport factor β* is defined as, * =
Injected carrier current at JE
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⇒ α = β*γ
• In below figure arrow indicates direction of current flow through emitter junction when
it is forward bias.
Figure 4
• ICBO: It is the current flowing from collector to base when emitter is open circuited
ICBO = ICO
• ICEO: It is the current flowing from collector to emitter when base is open circuited.
ICO ICBO
ICEO = (1 + ) ICO = ICEO = (1 + ) ICBO =
1− 1−
• A BJT will behave as a diode if collector is shorted to the base (i.e. V CB = 0). Such a BJT
s called diode connected transistor.
Figure 5
• When collector and base are shorted together BJT behaves like a single junction device
because current passing through BJT will be decided by the voltage V BE across JE. In this
case current through diode connected transistor will be equal to the current passing
through JE i.e.
VBE / V T
I = I EO e
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Example 1:
A transistor has IB = 25 μA. ICBO = 100 nA and β = 100, calculate a, IC, IE and ICBO.
Solution:
β = 100
100
= = = 0.99
1 + 101
IC = IB + (1 + ) ICO
Example 2:
For an n-p-n transistor connected as shown in the figure, VBE = 0.7 volts. Given the
reverse saturation current of the junction at room temperature (300°K) is
10–13 A, the emitter current is?
A. 30 mA
B. 39 mA
C. 49 mA
D. 20 mA
Solution:
When two terminals of a transistor are shorted, it acts as a diode.
VO −1 0.7 −1
I = I0 e VT = 1013 e 26103 = 49 mA
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Figure 6: Transistors Biased in forward Active mode (a) n-p-n (b) p-n-p
2.1.5. Saturation Region
As shown in Figure 5, when both the emitter-base junction and collector-base junction
are forward biased, the transistor operates in saturation region. Transistor has a large
current in saturation mode. The transistor is operated in this mode when it is to be used
as a closed switch.
Figure 8: Transistor Biased in cut off mode (a) n-p-n (b) p-n-p
2.1.7. Reverse Active Region or Inverse Region
When the emitter-base junction of the transistor is reverse biased and the collector-base
junction is forward biased, the transistor is said to be in reverse active mode. This mode
of operation is not often used. In Figure 9, transistors are biased in reverse active mode.
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Consider the BJT with base-emitter (B–E) p-n junction forward-biased, and the base-collector
(B–C) p-n junction reverse-biased, as shown in Figure 8.
Figure 10: Biasing of n-p-n Bipolar Transistor in the forward Active mode
3.1. Carrier Concentration
The B-E junction is forward-biased, so electrons from the emitter are injected across
the B-E junction into the base. These injected electrons create an excess concentration
of minority carriers in the base. The B-C junction is reverse biased, so the minority carrier
electron concentration at the edge of the B-C junction is ideally zero.
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Figure 12: Energy Band Diagram of the n-p-n Bipolar Transistor under Zero and
under a Forward-Active Mode Bias
Figure 13 shows a cross section of an n-p-n transistor with the injection of electrons from the
n-type emitter (hence the name emitter) and the collection of the electrons in the collector
(hence the name collector).
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dn ( x ) n ( 0 ) -0
iC =eDn A BE =eDn A BE B
dx 0-x B
-eDn A BE υ
= n B0exp BE ………(i)
xB Vt
Where, ABE is the cross-sectional area of the B-E junction,
nB0 is the thermal equilibrium electron concentration in the base,
Vt is the thermal voltage
Considering magnitudes only, equation (i) can be written as
υ
i C =Is exp BE ………(ii)
Vt
NOTE: The collector current is controlled by the base-emitter voltage; that is, the current
at one terminal of the device is controlled by the voltage applied to the other two
terminals of the device. Hence, the bipolar transistor is a voltage-
controlled current source.
4.2. Emitter Current:
One component of emitter current, iE1, shown in Figure 13 is due to the flow of electrons
injected from the emitter into the base. This current, then, is equal to the collector current
given by equation (i), i.e.
iE1 = iC1 = I S1 BE
Vt
Again, iE2 is forward-biased p-n junction current, so we can write (considering magnitude
only)
iE 2 = I S 2 BE
Vt
Where IS2 involves the minority carrier hole parameters in the emitter. Thus, the total
emitter current is the sum of the two components, i.e.
iE = iE1 + iE 2 = I S exp BE ………………………(iii)
Vt
From equations (ii) and (iii), we conclude that the ratio of collector current to emitter
current is a constant, i.e.
iC
iE
Where α is called the common-base current gain. Since, we have
i C < iE
So, α < 1
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In this section, we will obtain the currents in the bipolar transistor which, as in the simple p-n
junction, are determined by minority carrier diffusion. Figure 12 shows the geometry of the n-
p-n bipolar transistor used to calculate the minority carrier distribution.
Figure 14: geometry of the n-p-n Bipolar Transistor Used to Calculate the Minority
Carrier Distribution
The notations, used for BJT, are given in table below. In the following sections, we will obtain
minority carrier distribution in all the three regions for the different operating modes of the
transistor.
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Notation Definition
For both the n-p-n and p-n-p transistors
NE, NB, NC Doping concentrations in the emitter, base, and collector
xE, xB, xC Widths of neutral emitter, base, and collector regions
DE, DB, DC Minority carrier diffusion coefficients in emitter, base, and collector regions
LE, LB, LC Minority carrier diffusion lengths in emitter, base, and collector regions
τE0, τB0, τC0 Minority carrier lifetimes in emitter, base, and collector regions
For the n-p-n transistors
pE(x’), nB(x), Total minority carrier hole, electron and hole concentration in the emitter
pc(x’’) base, and collector
δpE(x’), δnB(x), Excess minority carrier hole, electron and hole concentrations in the emitter,
δpc (x’’) base, and collector
nE0, pB0, nC0 Thermal equilibrium minority carrier electron, hole, and electron
concentrations in the emitter, base, and collector
nE(x’), pB(x), Total minority carrier electron, hole, and electron concentrations in the
nC(x’’) emitter, base, and collector
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Base region:
The steady-state excess minority carrier electron concentration is found from the
ambipolar transport equation, the excess electron concentration in the base is given by
nB 0 eVBE
nB ( x ) exp − 1 ( xB − x ) − x
xB kT
Emitter Region:
The excess concentration in emitter region varies approximately linearly with distance, if
xE is small. Hence, we express the excess hole concentration in emitter as
pE 0 eVBE
pE ( x ' ) exp kT − 1 ( xE − x ')
xE
Collector region:
The excess minority carrier hole concentration in the collector is given as
− xn
pc ( x '') = − pc 0 exp
Lc
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pC (x'')
nB(x)
pE0 pC0
n B0
pE(x')
(a)
C B E
p n
n Electron Injection
(b)
Figure 18: Minority carrier Distribution in the n-p-n BJT
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7. EARLY VOLTAGE
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increases and consequently IE also increases. Hence, we see that IE increases due to
increase in gradient of concentration of holes.
Also in BJT, voltage applied across one junction has effect current Passing through other
junction therefore junctions JE and JC are called interactive junctions.
• At large value of |VCB| depletion region can fully occupy the base region or in other
words for extremely large voltages, W’B may be reduced to zero. This Phenomenon is
known as punch-through or reach through.
When punch-through occurs, effective base width becomes zero arid collector region gets
electrically shorted to emitter. Due to this shorting, the negative voltage applied at
collector reaches emitter also. This results in heavy current flow which can damage the
transistor.
8. BREAKDOWN VOLTAGE
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Assume that NB and NC are the uniform impurity doping concentrations in the base and
collector, respectively. Let WB be the metallurgy width of the base and let X dB be the
space charge width extending into the base from the B-C junction. If we neglect the
narrow space charge width of a zero-biased or forward-biased B-E junction, then punch-
through, assuming the abrupt junction approximation, occurs when
XdB=WB
Hence, we can write that
1/2
2 (V + Vpt ) NC 1
XdB = WB = s bi . .
e NB NC + NB
where Vpt is the reverse-biased B-C voltage at punch-through. Neglecting Vbi compared
to Vpt, we may express the Vpt as
eW2B NB (NC + NB )
Vpt = .
2 NC
8.2. Avalanche Breakdown
The condition for avalanche breakdown is given as
M = 2
Where M is the multiplication factor, usually written as
1
M= n
V
1 − CB
BVCBO
Where n is an empirical constant, usually between 3 and 6, and BV CBO is the B-C
breakdown voltage with the emitter left open. Now, if we assume
VCB VCE
Applying it to above equation, we get the required condition for avalanche breakdown as
n
=1
BV
1 − CEO
BVCBO
Where BVCEO is the C-E voltage at breakdown in the open base configuration. Solving for
BVCEO, we get
BVCEO = BVCBOn 1 −
Where is the common-base current gain. Since the common-emitter and common-
base current gains are related by =
1−
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Normally 1, so we have
1
1−
Hence, above equation can also be written as
BVCBO
BVCEO = n
n
i.e. the breakdown voltage in the open-base configuration is smaller, by the factor ,
than the actual avalanche junction breakdown voltage.
Following are some standard notations used in the exercise of the chapter.
Notation Definition
NE, NB, NC Doping concentrations in the emitter, base and collector
xE, xB, xC Widths of neutral emitter, base and collector regions
D E , DB , DC Minority carrier diffusion coefficients in emitter, base and collector regions
LE, LB, LC Minority carrier diffusion lengths in emitter, base and collector regions
τE0, τB0,
Minority carrier lifetimes in emitter, base and collector
τC0
Pe0, nE0, Thermal equilibrium minority carrier hole, electron and hole concentrations in the
pc0 emitter, base and collector for n-p-n transistor
nE0, pE0, Thermal equilibrium minority carrier electron, hole and electron concentrations in the
nC0 emitter, base and collector for p-n-p transistor
JnE Current density due to the diffusion of minority carrier electrons in base at x = 0
JnC Current density due to the diffusion of minority carrier electrons in base at x = x B
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The difference between JnE and JnC, which is due to the recombination of excess minority
JRB carrier electrons with majority carrier holes in the base. The J RB current is the flow of
holes into the base to replace the holes lost by recombination
JpE Current density due to the diffusion of minority carrier holes in emitter at x’ = 0
JR Current density due to the recombination of carries in forward biased B-E junctions.
Jpc0 Current density due to the diffusion of minority carrier holes in collector at x’’ = 0
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IC
oc =
IE
• For practical devices alpha typically extends from 0.90 to 0.998, with most values
approaching the high end of the range.
• For ac situations where the point of operation moves on the characteristics curve, an
ac alpha is defined by
IC
ac =
IE VCB = constant
• The alpha is formally called common base amplification factor or current gain of
common base transistor.
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NOTE: The transistor’s amplifying action is basically due to its capability of transferring
its signal current from a low resistance circuit to high resistance circuit or vice-versa.
Contracting the two terms transfer and resistor results in the name transistor; that is,
transfer + resistor → transistor
10.2. The Common-Emitter Configuration
Most transistor circuits have the emitter terminal common to both input and output.
Such a common-Emitter (CE) or grounded-emitter, configuration is indicated in Fig.
(22).
In common-emitter configuration, the input current and output voltage are taken as
independent variables, whereas the input voltage and output current are the dependent
variables. We write
VBE = f1(VCE, IB)
IC = f2(VCE, IB)
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IC
ac =
IB VCE = constant
• Range of β is to 300.
• β in terms of a is
=
1−
or =
+1
• β is called the current gain of transistor in CE mode. It is the most important
specification of the transistor.
• β is also denoted by hFE and always
βdc > βac or hFE > hfe
• Beta is a particularly important parameter because it provides a direct link between
current levels of the input and output circuits for a common-emitter configuration. That
is,
IC = βIB
and since IE = IC + IB = βIB + IB
we have IE = (β + 1)IB
10.2.4. Effect of Temperature on ‘β’
IC
IB
The average time, a carrier takes to travel from emitter junction to collector i.e. to travel
through base region is called transits time ‘τt’, which is given as
WB2
t =
2DB
The average time, a hole or electron will exist before recombination is called lifetime.
τp = Lifetime of holes
τn = Lifetime of electrons
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In average time, one hole-electron recombination occurs in τp sec, therefore in one sec
1/τp recombination can happen. Hence base should be supplied with 1/τ p electrons in
one sec to keep it neutral and these electrons will form base current, so
1
IB
p
• To achieve large ‘β’ transit time should be reduced by decreasing base width.
• When temperature increases carrier life-time increases and hence β increases.
• In indirect semiconductor such as Silicon and Germanium, recombination occurs
through an intermediate energy level present in forbidden band
• During recombination free electronics moves into intermediate level and then into hole
or vacancy present in valance band.
• But when temperature increases, the electrons which are moved into intermediate
level will come back to conduction band this process is called thermal re-excitation.
• Thermal re-excitation will prevent recombination and thereby life-time increases and
as a result β also increases.
Figure 23
10.3. Common-Collector Configuration
Another transistor configuration, shown in Figure (24), is known as the Common-
Collector (CC) configuration. In this circuit, the load resistor is in emitter circuit rather
than in collector circuit, if we continue to specify the operation of circuit in terms of the
currents which flow the operation for common-collector is much same as for common-
emitter configuration. When base current is ICO, the emitter current will be zero, and no
current will flow in load. As the transistor is brought out of this back-biased condition
by increasing the magnitude of the base current, the transistor will pass through the
active region and eventually reach saturation. In this condition whole supply voltages,
except for a very Small drop across the transistor will appear across the load.
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IE I + IB
= = C =1+
IB IB
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KT
1. A BJT is CB configuration is used to amplify a signal received by a 50Ω anteena. Assume =
q
25mV, the value of collector bias current required to match the input impedance of the amplifier
to the impedance of the amplifier to the impedance of the antenna is ____(in mA).
[Ans. 0.5]
2. Calculate V0, if |VBE| = 0.7 for the BJT and β = 100.
[Ans. 0V]
3. Obtain Eber-Moll equations for p-n-p bipolar junction transistors. Show that these equations are
true for any arbitrary geometry of the device.
4. Consider silicon n-p-n transistors for the following circuit.
If Vin is +1V, what is the value of Vout? If Vin is changed to +3V, what is the value of Vout? What
is the output voltage compliance (maximum voltage range that the output can swing when the
input is varied) of the circuit?
[Ans. 5.3 V, 1.7 V, 11.3 V]
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