Structure Characterization
Structure characterization, when used in materials science, refers to
the broad and general process by which a material's structure and
properties are probed and measured. During the past 100 years,
numerous useful characterization techniques have been developed and
practiced, which have come into play at many phases of the product
design and manufacturing process. Whether you choose materials for
new product development, concept validation and prototyping tests,
qualification of first production batches or test batches, or try to
determine the cause of failure, structural characterization is inevitable.
BOC Sciences has a wealth of experience in structure characterization,
and we can provide varieties of advanced structure characterization
techniques as you want.
Here are some common structure characterization techniques:
Scanning electron microscope (SEM)
SEM, which can achieve resolution better than 1 nanometer, is a type
of electron microscope that produces images of a sample by scanning
the surface with a focused beam of electrons. The electrons interact
with atoms in the sample, producing various signals that contain
information about the sample's surface topography and composition.
Atomic force microscopy (AFM)
AFM is a type of scanning probe microscopy (SPM), with demonstrated
resolution on the order of fractions of a nanometer. The information is
gathered by "feeling" or "touching" the surface with a mechanical probe.
Piezoelectric elements that facilitate tiny but accurate and precise
movements on (electronic) command enable precise scanning.
Fourier-transform infrared spectroscopy (FTIR)
FTIR is a technique used to obtain an infrared spectrum of absorption
or emission of a solid, liquid or gas. An FTIR spectrometer
simultaneously collects high-spectral-resolution data over a wide
spectral range. This confers a significant advantage over a dispersive
spectrometer, which measures intensity over a narrow range of
wavelengths at a time.
X-ray diffraction (XRD)
X-ray crystallography is a technique used for determining the atomic
and molecular structure of a crystal, in which the crystalline atoms
cause a beam of incident X-rays to diffract into many specific directions.
By measuring the angles and intensities of these diffracted beams, a
crystallographer can produce a three-dimensional picture of the
electron density within the crystal. From this electron density, the
average positions of the atoms in the crystal can be determined, as well
as their chemical bonds, disorder, and various other information.
Ultraviolet-visible spectroscopy (UV-vis)
UV-vis refers to the absorption or reflection spectrum in the ultraviolet-
visible spectral region. This means it uses visible light and adjacent
ranges of light. The wavelength of the absorption peak can be related
to the type of bond in a given molecule and is valuable for determining
functional groups within the molecule. In fact, there are many
techniques that can be used for structural characterization.
BOC Sciences can provide structure characterization with high quality
and short period. Our experts and analysts have rich experience and
intimate knowledge of analytical process. We are glad to hear from you
and we’re looking forward to working with you.