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MOS LNA Distortion Analysis in EE 242

The document discusses modeling nonlinearities in MOS transistors. It describes how MOS transistors exhibit square law behavior at high frequencies but includes nonlinear terms at lower frequencies. It also summarizes factors that cause nonlinearities like short channel effects, mobility degradation from vertical and horizontal fields, and output impedance variations. The document proposes models to account for these effects including power series expansions and single equation models that are valid from weak to strong inversion. It discusses biasing the transistor at a "sweet spot" where certain nonlinear terms cancel out to improve linearity.

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0% found this document useful (0 votes)
63 views70 pages

MOS LNA Distortion Analysis in EE 242

The document discusses modeling nonlinearities in MOS transistors. It describes how MOS transistors exhibit square law behavior at high frequencies but includes nonlinear terms at lower frequencies. It also summarizes factors that cause nonlinearities like short channel effects, mobility degradation from vertical and horizontal fields, and output impedance variations. The document proposes models to account for these effects including power series expansions and single equation models that are valid from weak to strong inversion. It discusses biasing the transistor at a "sweet spot" where certain nonlinear terms cancel out to improve linearity.

Uploaded by

Ravinder Kumar
Copyright
© All Rights Reserved
We take content rights seriously. If you suspect this is your content, claim it here.
Available Formats
Download as PDF, TXT or read online on Scribd

EECS 242:

MOS High Frequency Distortion


MOS LNA Distortion
Workhorse MOS LNA
is a cascode with
inductive degeneration
Assume that the device
is square law
Neglect body effect
(source tied to body)

2 EECS 242: Prof. Ali M. Niknejad


Governing Differential Eq

3 EECS 242: Prof. Ali M. Niknejad


Linear Analysis

Let
Equating linear terms

By design, at resonance we have

4 EECS 242: Prof. Ali M. Niknejad


Relevant Time Constants

Using these relations we simplify A1 as

5 EECS 242: Prof. Ali M. Niknejad


Second Order Terms
Equate second-order terms

6 EECS 242: Prof. Ali M. Niknejad


Third Order Terms

If the MOS is truly square law, then there


are no A3 terms but when we calculate
the output current, we generate third order
terms
These are generated by the action of the
feedback.

7 EECS 242: Prof. Ali M. Niknejad


Output Current Volterra Series
Using Volterra algebra, we have

8 EECS 242: Prof. Ali M. Niknejad


MOS HD2/IIP2

The expression for IIP2 is now very simple! For a


zero-IF system, we care about distortion at DC:

9 EECS 242: Prof. Ali M. Niknejad


Compact Model Physics vs. Reality
Even the most advanced compact models
have very humble physical origins
Essentially a 1D core transistor model due to
GCA (gradual channel approximation)
Quantum effects necessarily ignored in core
model
Small dimension and 2D effects treated in a
perturbational manner as corrections to 1D
core
Conclusion: Core model is important but
any claims of physical accuracy should be
taken with a grain of salt!
Physical behavior and computational
efficiency are therefore the key attributes
Need a simple design model to capture
important effects!
10 EECS 242: Prof. Ali M. Niknejad
Building on a strong foundation: BSIM4
Short/Narrow Channel Effects on Threshold Voltage

Technology { Non-Uniform Vertical and Lateral Doping Effects


Mobility Reduction Due to Vertical Field
Quantum Mechanic Effective Gate Oxide Thickness Model

Carrier Velocity Saturation

Saturation { Channel Length Modulation (CLM)


Substrate Current Induced Body Effect (SCBE)
Unified current saturation model(velocity saturation, velocity
overshoot, source end velocity limit)

Leakage { Gate Dielectric Tunneling Current Model


Gate Induced Drain Current Model (GIDL)
Trap assisted tunneling and recombination current model

RF Model (Gate & Substrate Resistance Model)


RF { Unified Flicker Noise Model
Holistic Thermal Noise Model

Parasitic { Asymmetric Layout-Dependent Parasitic Model


Scalable Stress Effect Model

11 EECS 242: Prof. Ali M. Niknejad


Important MOS Non-Linearity

Square law short channel effects


Mobility degradation
Universal mobility curve
Velocity saturation
Body effect
Output impedance non-linearity
Cgs for high input swings

12 EECS 242: Prof. Ali M. Niknejad


Velocity Saturation

S D

In triode, the average electric field across


the channel is:
The carrier velocity is proportional to the
field for low field conditions
13 EECS 242: Prof. Ali M. Niknejad
Mobility Reduction
As we decrease the channel length from say 10
m to 0.1 m and keep VDS=1V, we see that the
average electric field increases from 105 V/m to
107 V/m. For large field strengths, the carrier
velocity approaches the scattering-limited
velocity.
This behavior follows the following curve-fit
approximation:

For E << Ec, the linear behavior dominates


For E >> Ec, vd nEc=vscl

14 EECS 242: Prof. Ali M. Niknejad


Vertical Mobility Degradation

S D
100, to

Experimentally, it is observed that is


degraded due to the presence of a vertical
field. A physical explanation for this is that
a stronger VGS forces more of the carriers in
the channel towards the surface where
imperfections impede their movement.
15 EECS 242: Prof. Ali M. Niknejad
Unified Mobility Degradation

S D

High field
region

Model horizontal mobility degradation in


saturation, modify low field equation to
include velocity saturation.
Result looks like vertical field degradation.
16 EECS 242: Prof. Ali M. Niknejad
Source Degeneration

neglect

Equation has approximately the same form.


17 EECS 242: Prof. Ali M. Niknejad
Simple Short Channel Model

The short channel I-V model can be


approximated by

models:
Rsx parasitic
Vertical Field Mobility Degradation
Horizontal Field Mobility Degradation

18 EECS 242: Prof. Ali M. Niknejad


Power Series Expansion
Device is no longer square law

19 EECS 242: Prof. Ali M. Niknejad


Coulomb Scattering
Source: Physical Background of MOS
Model 11 (Level 1101), R. van
Langevelde, A.J. Scholten and D.B.M.
Klaassen

A more complete model should include the effects


of low field mobility.
At low fields, the low level of inversion exposes
Coulomb Scattering sites (due to shielding effect
of inversion layer)
20 EECS 242: Prof. Ali M. Niknejad
Mobility with Coulomb Scattering

21 EECS 242: Prof. Ali M. Niknejad UC Berkeley - 21


Need for Single Equation I-V
Our models up to now only include strong
inversion. In many applications, we would
like a model to capture the entire I-V range
from weak inversion to moderate inversion
to strong inversion
Hard switching transistor
Power amplifiers, mixers, VCOs
Surface potential models do this in a natural
way but are implicit equations and more
appropriate for numerical techniques
22 EECS 242: Prof. Ali M. Niknejad
Smoothing Equation
Since we have good models for weak/strong
inversion, but missing moderate inversion, we can
smooth between these regions and hope we capture
the region in between (BSIM 3/4 do this too)

As before models short-channel effects and


models the weak-inversion slope
23 EECS 242: Prof. Ali M. Niknejad
Limiting Behavior

In strong inversion, the exponential


dominates giving us square law

In weak inversion, we expand the ln


function

24 EECS 242: Prof. Ali M. Niknejad


I-V Derivatives
Use chain rule to differentiate the I-V relation:

25 EECS 242: Prof. Ali M. Niknejad


Single Equation Distortion

Source: Manolis Terrovitis Analysis and Design of Current-Commutating CMOS Mixers


26 EECS 242: Prof. Ali M. Niknejad
IP3 Sweet Spot

Notice sweet spot where gm3 = 0


Notice the sign change in the third derivative
27
can we exploit this?
EECS 242: Prof. Ali M. Niknejad
Bias Point for High Linearity

Assume gm nonlinearity dominates


(current-mode operation and low
output impedance)

Sweet IIP3 point, , exists


where the transistor transits from
weak inversion (exponential law),
moderate inversion (square law) to
velocity saturation
Sweet spot for high IIP3 28
28 EECS 242: Prof. Ali M. Niknejad
Multiple Gated Transistors
Notice that we can use
two parallel MOS
devices, one biased in
weak inversion (positive
gm3) and one in strong
inversion (negative gm3).
The composite transistor
has zero gm3 at bias
point!
Source: A Low-Power Highly Linear Cascoded Multiple-Gated Transistor CMOS
RF Amplifier With 10 dB IP3 Improvement, Tae Wook Kim et al., IEEE MWCL, Vol.
13, NO. 6, JUNE 2003
29 EECS 242: Prof. Ali M. Niknejad
MGTR (Multi-Gated Transistor)

30 EECS 242: Prof. Ali M. Niknejad


Wideband Noise Cancellation

Take advantage of amplifier topologies where the output


thermal noise flows into the input (CG amplifier, shunt
feedback amplifer, etc).
Cancel thermal noise using a second feedforward path.
Can we also cancel the distortion?
Source: F. Bruccoleri, E. A. M. Klumperink, B. Nauta, Wide-Band CMOS
Low-Noise Amplifier Exploiting Thermal Noise Canceling, JSSC, vol. 39,
Feb. 2004.
31 EECS 242: Prof. Ali M. Niknejad
Noise Cancellation LNA
Motivated by [Bruccoleri, et al., ISSCC02]
M1 noise full cancellation

Optimal choice subject to


fewer design parameter
variations
32 EECS 242: Prof. Ali M. Niknejad UC Berkeley - 32
33 EECS 242: Prof. Ali M. Niknejad UC Berkeley - 33
130nm LNA Prototype

130nm
CMOS
1.5V, 12mA
Employ only
thin oxide
transistors

W.-H. Chen, G. Liu, Z. Boos, A. M. Niknejad, "A Highly Linear Broadband CMOS LNA Employing
Noise and Distortion Cancellation," IEEE Journal of Solid-State Circuits, vol. 43, pp. 1164-1176,
May 2008.

34 EECS 242: Prof. Ali M. Niknejad


Measured S-Parameters

Matches simulations well. Very broadband


performance.
35 EECS 242: Prof. Ali M. Niknejad
Measured Noise Performance

Noise cancellation is clearly visible. This is also a


knob for dynamic operation to save current.
36 EECS 242: Prof. Ali M. Niknejad
Measured Linearity

Record linearity of +16 dBm for out of band blockers.


Linearity works over entire LNA band.
37 EECS 242: Prof. Ali M. Niknejad
Linearity Bias Dependence

As we vary the bias of key transistor, we simulate the


effects of process/temp variation. There is a 50 mV
window where the performance is still acceptable.
38 EECS 242: Prof. Ali M. Niknejad
LNA Distortion Analysis
Lets assume that the drain current is a
power-series of the Vgs voltage:

The purpose of the differential input is to


cancel the 2nd order distortion of the first
stage (to minimize 2nd order interaction):

39 EECS 242: Prof. Ali M. Niknejad


Distortion Equivalent Circuit

Assume R1/R2 and RL are


small so that ro non-linearity
is ignored.

40 EECS 242: Prof. Ali M. Niknejad


Drain Current Non-Linearity

Assuming that the gates of the input


transistors are grounded at RF:

First-order Kernels are found from:

41 EECS 242: Prof. Ali M. Niknejad


Simplified First-Order

At the frequency of interest, Z12 ~ 0 and B1


~ C1

42 EECS 242: Prof. Ali M. Niknejad


Second-Order Terms

Retaining only 2nd order terms in the KCL


equations:

43 EECS 242: Prof. Ali M. Niknejad


Second-Order Kernels
Solving above equations we arrive at:

44 EECS 242: Prof. Ali M. Niknejad


Third-Order Terms

45 EECS 242: Prof. Ali M. Niknejad


Third-Order Kernel

Assuming Z12 ~ 0 (at s1+s2+s3):

46 EECS 242: Prof. Ali M. Niknejad


Simplified Results Z12~0

The simplified equations are summarized


here:

47 EECS 242: Prof. Ali M. Niknejad


Output Voltage

The output voltage is given by a new


Volterra series. Assume for simplicity the
following:

The fundamental and third-order output are


therefore:

48 EECS 242: Prof. Ali M. Niknejad


Focus on Third-Order Output

At low frequencies:
A1/B1 ~ Rin/R1
A2/B2 ~ -Rs/R1
Cancels like New distortion gen at
A3/B3 ~ -Rs/R1 thermal noise output. Cancel with
MGTR.

Second-order interaction: Must use g =0


49 EECS 242: Prof. Ali M. Niknejad
Two-Tone Spacing Dependence
Because 2nd order interaction is
minimized by using a PMOS
and NMOS in parallel, the
capacitor C12 plays an
important role.
When second order distortion is
generated at low frequencies,
f1-f2, the capacitor C12 has a
high reactance and distortion
cancellation does not take
place.
There is therefore a
dependency to the two-tone
spacing.

50 EECS 242: Prof. Ali M. Niknejad


Power Supply Ripple

In RF systems, the supply ripple can non-linearity


transfer noise modulation on the supply to the output.
This problem was recently analyzed by Jason Stauth:
Energy Efficient Wireless Transmitters: Polar and
Direct-Digital Modulation Architectures, Ph.D.
Dissertation, U.C. Berkeley
51 EECS 242: Prof. Ali M. Niknejad
Supply Noise Sources

52 EECS 242: Prof. Ali M. Niknejad


Multi-Port Memoryless Non-linearity

The output voltage is a non-linear function


of both the supply voltage and the input
voltage. A two-variable Taylor series
expansion can be used if the system is
memory-less:

Sout (Sin , Svdd ) = a10 Sin + a20 Sin


2
+ a30 Sin
3

+a11 Sin Svdd + a21 Sin
2
Svdd +
+a01 Svdd + a02 Svdd
2
+ a03 Svdd
3

53 EECS 242: Prof. Ali M. Niknejad


Supply Noise Sideband

Assume the input is at RF and the supply


noise is a tone. Then the output signal will
contain a noise sideband given by:

54 EECS 242: Prof. Ali M. Niknejad


Multi-Port Volterra Series

Extending the concept of a Volterra Series


to a two input-port system, we have

55 EECS 242: Prof. Ali M. Niknejad


Example

id = gm1 vgs + gm2 vgs


2
+ gm3 vgs
3
+
2
gmb1 vsb gmb2 vsb 3
gmb3 vsb +
+gmo11 vds vgs + gmo12 vds vgs
2
+ gmo21 vds
2
vgs +
+C1 dt
d
(vdb ) + 2 dt (vdb )
C2 d 2
+ 3 dt (vdb )
C3 d 3
+

Several important terms:


gm,go non-linearity is usual transconductance and output resistance terms
gmo is the interaction between the input/output
Cj is the output voltage non-linear capacitance

56 EECS 242: Prof. Ali M. Niknejad


First Order Terms

First-order transfer function:


(RF Node Transfer)

(Supply Node Transfer)


Node

57 EECS 242: Prof. Ali M. Niknejad


Mixing Product
The most important term for now is the
supply-noise mixing term:

58 EECS 242: Prof. Ali M. Niknejad


PSSR Reduction

Increase gm1
Reduce second order conductive non-linearity at
drain (go2)
Reduce the non-linear junction capacitance at
drain
Reduce cross-coupling term by shielding the
device drain from supply noise (cascode)
59 EECS 242: Prof. Ali M. Niknejad
Output Conductance Non-Linearity
For short-channel devices, due to DIBL, the
output has a strong influence on the drain current.
A complete description of the drain current is
therefore a function of f(vds,vgs).
This is especially true if the device is run close to
triode region (large swing or equivalently high
output impedance):

60 EECS 242: Prof. Ali M. Niknejad


Total Distortion

Including the output conductance non-


linearity modifies the distortion as follows

Source: S. C. Blaakmeer, E. A. M. Klumperink, D. M. W. Leenaerts,, B. Nauta,


Wideband Balun-LNA With Simultaneous Output Balancing, Noise-Canceling and
Distortion-Canceling, JSSC, vol. 43, June 2008.
61 EECS 242: Prof. Ali M. Niknejad
Example IIP Simulation

Contributions to c2 are shown above.


For low bias, gds2 contributes very little but x11 and
gm2 are significant. They also have opposite sign.

62 EECS 242: Prof. Ali M. Niknejad


PA Power Supply Modulation
When we apply a 1-tone to a class
AB PA, the current drawn from the
supply is constant.
For when we apply 2-tones, there is
a low-frequency component to the
input:

This causes a low frequency current


to be drawn from the supply as well,
even for a differential circuit.
P. Haldi, D. Chowdhury, P. Reynaert, G. Liu, A. M Niknejad, A 5.8 GHz 1 V Linear Power Amplifier Using a Novel On-Chip Transformer Power Combiner
in Standard 90 nm CMOS, IEEE Journal of Solid-State Circuits, vol. 43, pp.1054-1063, May 2008.
63 EECS 242: Prof. Ali M. Niknejad
Supply Current

The supply current is a full-wave rectified sine.


64 EECS 242: Prof. Ali M. Niknejad
Fourier Components of is
Substitute the Fourier
series for the rectified
sine and cosine.
Note that an on-chip
bypass can usually absorb
the higher frequencies
(2fc) but not the low
frequency beat (fs and
harmonics)

65 EECS 242: Prof. Ali M. Niknejad


Supply Ripple Voltage

The finite impedance of the supply means


that the supply ripple has the following
form. Assuming a multi-port Volterra
description for the transistor results in:

66 EECS 242: Prof. Ali M. Niknejad


Experimental Results

Even though the PA is fully


balanced, the supply inductance
impacts the linearity.
Measurements confirm the
source of the IM3 at low offsets
arising from supply modulation.

67 EECS 242: Prof. Ali M. Niknejad


MOS CV Non-Linearity

Cgs, Cu, and Cdb all


contribute to then non-
linearity.
As expected, the
contribution is
frequency dependent
and very much a strong
function of the swing
(drain, gate).
Gate cap is particular
non-linear.
68 EECS 242: Prof. Ali M. Niknejad
PMOS Compensation Technique

Make an overall flat CV curve by adding an


appropriately sized PMOS device.
Source: C. Wang, M. Vaidyanathan, L. Larson, A Capacitance-Compensation
Technique for Improved Linearity in CMOS Class-AB Power Amplifiers, JSSC, vol.
39, Nov. 2004.
69 EECS 242: Prof. Ali M. Niknejad
General References

Analysis and Design of Current-Commutating CMOS


Mixers, Manolis Terrovitis Ph.D. dissertation, U.C.
Berkeley 2001
Physical Background of MOS Model 11 (Level 1101),
R. van Langevelde, A.J. Scholten and D.B.M. Klaassen,
Philips Electronics N.V. 2003 (Unclassified Report)
UCB EECS 242 Class Notes, Ali M Niknejad, Spring
2002, Robert G. Meyer, Spring 1995.

70 EECS 242: Prof. Ali M. Niknejad

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