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Defect Depth Calculation
The depth of a object such as a defect can be determined by Source Shift
taking two exposures with the source shifted in second >|
exposure. As shown in the image, a marker is placed on the st and
surface of the component, Two radiographs are produced with Exposure f expose?
the alignment between the source and the specimen different /|
for each exposure. Using the following equation, the depth of | \
the defect can be determined by relating the shift of the defect \
to the shift in the marker in the two radiographs,
tS, |
D D |
Sy |
Where: D = Defect depth |
t= thickness of the component /
Sp = Shift of defect in the radiographs |
Sw = Shift of marker in the radiographs
Example Calculation
When radiographing a component with a thickness of 1.5
inches, a defect is detected. A second radiograph is produced
with sample shifted relative to the center of the source cone
beam. A penetrameter on the surface of the component is
found to shift 0.45 inch between the two radiographs. The Film: S Ss
defect is found to shift 0.18 inch between the two radiographs. Determine the depth of the defect.
‘Substitute known values into the equation and solve for defect depth.
_t:Sp
Su
D 1 .Sinches -0.18inches
0.45inches
D =0.6inches
Back Partial support for this work was provided by the NSF-ATE (Advanced Technological Education)
program through grant #DUE 0101709. Opinions expressed are those of the authors and not
necessarily those of the National Science Foundation.