Standard Cell

Characterization
Richard Sohnius

Computer Architecture Group

Prof. Dr. U. Brüning
University of Mannheim

16.12.2003

Standard Cell Characterization Page 1

 Overview
• Basics
• Reasons for Characterization
• Characterization Flow
• Characterization Parameters
• Models
• Measurement & Verification
• Library Formats
• Summary
• Sources & Acknowledgments
Standard Cell Characterization Page 2
 Basics
• Standard Cells
– Logic units of similar geometry
(same height)
– Implement basic logic (NAND,
NOR, INV, FF, LATCH,
complex gates, …)
– Usually come in libraries for a
specific technology

Prof. P. Fischer: “Digitale Schaltungstechnik”

Standard Cell Characterization Page 3

 Basics
• Use (Flow)
– Hardware is described in higher
level language (e.g. RTL)
– Description is translated in
Boolean logic and sequential
elements
– The logic is mapped on standard
cells
– Standard cells are placed in
rows
– Cells are properly connected by
routing channels and/or
Prof. P. Fischer: “Digitale Schaltungstechnik”
additional metal layers

Standard Cell Characterization Page 4

 Reasons for Characterization
• Problems of Standard Cells in polygon level
format (GDSII)
– Extraction of functionality is complicated and unnecessary as it
is known
– Functional/Delay simulation takes way too long
– Power extraction for a whole chip takes too long
– Automatic detection of timing constraints (e.g. Setup time) is
difficult
• Solution
– A simple model for delay, function, constraints and power on
cell/gate level => cell characterization

Standard Cell Characterization Page 5

 Characterization Flow
• Netlist Extraction
– Transistors, resistances and capacitances are extracted with
special tools and saved as SPICE netlist (or similar)

• Specification of parameters
– Library-wide parameters have to be specified:
e.g. max Transition time, PVT-corners

• Model selection and specification

– The used models determine the required data

Standard Cell Characterization Page 6

 Characterization Flow
• Measurement
– The cells are simulated with a SPICE-like tool to obtain the
required data

• Model Generation
– The obtained data is fed into the models
– Completes characterization itself

• Verification
– Different checks are performed to ensure the correctness of the
characterization

Standard Cell Characterization Page 7

 Characterization Flow
GDS2 Knowledge
Database

LPE Extraction Model Generation

Flow

Power, SI, Synopsys Cadence

SPICE timing timing
Knowledge etc.
netlist
Database
I-Slew, O-Load
PVTs, NxN

PVT Characterization EDA Vendor Synopsys Cadence

(Model) (.LIB) (TLF)
SPICE
Models

Timing, Power,
Database

Trend Model Model Model

Checks Verification Verification Verification
“Model Generation & Verification”; Artisan Presentation Page 40

Standard Cell Characterization Page 8

 Characterization Parameters
• Global Parameters
– PVT Corner Selection (Process, Voltage, Temperature)
– Unit Definition (e.g. Standard Load)
– Default Definition
– Threshold values (Transition Thresholds, …)
– Limits (max. Output Load, max. Transition time, …)
– Wireload Models
Measured Transition
Time
Transition Time: Characterized
and Measured 70% Vdd
30% Vdd
Y
Reported Transition
Transition Time: Time
Standardized Reporting 90% Vdd
10% Vdd
Y
“Transition Time”; Artisan Presentation Page 23

Standard Cell Characterization Page 9

 Characterization Parameters
• For mapping, functional simulation
– Functionality

• For optimization, delay simulation

– Area
– Power
– Timing constraints (Setup/Hold time, Recovery/Removal time)
– Propagation Delay time
– Requires:
• Input Capacitance
• Transition time
(Output Slew)
“Setup and Hold Constraints”; Library Compiler User Guide; Fig 3-10

Standard Cell Characterization Page 10

 Characterization Parameters
• For Power extraction, IR-Drop analysis, EM analysis
– Dynamic Power (switching power)
– Static Power (leakage power)
– Passive power (internal power)
(power used by sequential cells (e.g. flip-flops) when inputs (clock too) change
without output change)
– Same Requirements as Delay

• For Place & Route

– Geometry (cell width)
– Pin locations
– Routing channels (metal areas not used by a cell)
and Routing obstructions (additional metal areas used by cell)
Standard Cell Characterization Page 11
 Models
• Simple Models
– Functionality, geometry, capacitance
• Propagation Delay and Transition Time
– Both are usually modeled together in the same way
• Power
– Depends on the same values as the Propagation Delay
=> often modeled analogical to Propagation Delay
• Constraints
– Usually as fixed timing values

Standard Cell Characterization Page 12

 Delay Models
• Generic CMOS Delay Model:
– Sum of Intrinsic delay, Slope delay, Transition delay and
Connect delay
– Intrinsic delay is a fixed value which models delays independent
of the surroundings
– Slope delay is produced by the slew of the input signal. The
input slew is multiplied with a sensitivity factor
– Transition delay is the time required to charge the capacitance of
the next stage input pins
– Connect Delay is delay produced by the RC value of the wire to
the next stage input pin and the capacitance of the next stage
input pins

Standard Cell Characterization Page 13

 Delay Models
• CMOS Non-linear
Delay Model:
– Very common
– Delay and Transition time
are modeled as functions of
Input slew and Output load
– The data is stored as a 2-
dimensional lookup-table
– Intermediate values are
interpolated
– Data point are usually not
equidistant “Result of Delay Calculation“
Synopsys; Library Compiler User Guide, Figure 2-7

Standard Cell Characterization Page 14

 Delay Models
• Scalable Polynomial Delay Model:
– Data is stored as polynomial approximation
– PVT-Parameters are input values themselves
=> only one characterization file necessary
– The Polynomial may depend on Input slew, Output load,
Voltage, Temperature and a Second voltage for level shifter cells
– The Polynomial can be piecewise defined

• CMOS Piecewise Linear Delay Model:

– Like the generic model
– Uses piece linear (constant) functions instead of proportional
functions

Standard Cell Characterization Page 15

 Delay Models
• Delay Calculation Module (DCM):
– Delay information is stored in a special DCM file
– Does not store parameters of an equation but a sort of
programming code (Delay Calculation Language (DCL))
– Very flexible since not bound to a specific model
– Defined in IEEE 1481.1
– Also called DPCM (delay and power calculation module)

Standard Cell Characterization Page 16

 Power Models
• Static Power Model
– Each cell is assigned a fixed power consumption
• Complex Power Model
– Leakage power
• Fix value: average or per state
– Internal/Passive power
• 1D-lookup table depending on input slew
– Switching/Dynamic power
• Simple: const * output load
• Complex: 2D-lookup table: depending on Input Slew and Output
Load
sometimes even per state

Standard Cell Characterization Page 17

 Measurement & Verification
• Simulation
– Extracted netlist is simulated with a SPICE-like tool
– Every required data point is processed (pass mill method)
– Temperature sweeps and simulations with varying element parameters
(Monte Carlo simulation) give information about result reliability
– Constraints are found by binary search
• Physical
– Creation of chip with all cells and special testing logic (see next page)
– Measurement of cells with probing tool
– E.g. INV-chain is used to measure typical delay

“Combinational Cell Test Circuits”; Artisan Presentation Page 48

Standard Cell Characterization Page 18

 Measurement & Verification
Control Block Functional Block
CK, CKN
ACTIOUT
CK Gray
RESETN Counter All Mux
Mux Core ACTO_A/B
ACTI Tree
Cells
MSB of GRAY

Binary 2 Instances
Counter
Mux
SEL ACSELOUT

ACMANSEL
Timing Block
Delay Mux
ADY
ADA Chains Tree

Setup Mux
ATSET Hold block Tree ATOUT

“Standard Cell – Block Diagram”; Artisan Presentation Page 47

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 Measurement & Verification
• Trend Checks
– Checks if values like capacitances are in expected range
– Checks if models behave like expected
• Higher load => higher delay
• Higher input slew => higher transition time
• Higher driving strength => lower delay
• Higher temperature => higher delay
• …

• Test Designs
– Typical design is created with standard tools
– Checked for functionality and technology rule violations
Standard Cell Characterization Page 20
 Library Formats
• Synopsys Liberty Library (LIB)
– Used by Synopsys products
– Synthesis, Timing and Power
– Supports most models
– Virtually a standard
– Can be compiled (.db)

• Timing Library Format (TLF)

– Used by Cadence products
– Synthesis, Timing and Power
– Same features as .lib
– Can be compiled
Standard Cell Characterization Page 21
 Library Formats
• Delay and Power Calculation System (DPCS)
– Defined by IEEE 1481.1
– Timing and Power. No Synthesis
– Uses the Delay and Power Calculation Module (DCM/DPCM)
instead of discrete values

• Open Library API (OLA)

– Open-source extension to IEEE 1481.1 (DPCS)
– Includes functional information for synthesis

Standard Cell Characterization Page 22

 Library Formats
• Advanced Library Format (ALF)
– Extension to the .lib - Format
– Binary
• Library Exchange Format (LEF)
– Place & Route
• Synopsys Stamp Model
– Used to describe large blocks (e.g. RAM)
• Verilog/VHDL
– For simulation only

Standard Cell Characterization Page 23

 Summary
• Characterization is necessary for the use of
Standard Cells
• Characterization is done on extracted netlists
• The Non-linear Delay Model is the most common one
• The Synopsys Liberty Format (.lib) is virtually
standard with the Cadence Timing Library Format
(.tlf) as number two
• Smaller feature sizes require more accurate models

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 Acknowledgments
• Patrice Betton / Artisan
– For the much appreciated help and insight

• Patrick Haspel
– For help with the sources

Standard Cell Characterization Page 25

 Sources
• Artisan Components, Inc.
– Presentation: “Artisan Standard Cell Products Overview”
• Cadence
– PKS Manual: “Timing Analysis Using BuildGates Synthesis and
Cadence PKS”
– Aptivia User Guide
• Synopsys
– Library Compiler User Guide
• Prof. Dr. P. Fischer
– Script: “Digitale Schaltungstechnik”

Standard Cell Characterization Page 26