VLSI Design & Testing

BY VTU Academy (on YouTube)

Watch Full Video Lectures, Click Here –
VLSI Design Complete Playlist
✔️ All 5 Modules Explained

✔️ Model Paper Solved

✔️ Important Questions Explained

✔️ Chapter wise PDF Notes

VLSI Design and Testing (BEC602) Module-3-Circuit Characterization and Performance Estimation

Department of Electronics and Communication Engg.

VLSI Design and Testing(BEC602)

Circuit Characterization and Performance Estimation

1 Introduction
 An MOS structure is created by superimposing multiple layers of conducting, insulating,
and transistor-forming materials.
 A conventional silicon gate MOS device consists of a gate-forming region and a
source/drain-forming region, which includes diffusion, polysilicon, and metal
layers separated by insulating layers.
 Each of these layers exhibits resistance and capacitance, which are fundamental in
determining the performance of a circuit or system.
 While these layers also have inductive characteristics, for simplicity, we assume their
effects to be negligible.
 We will focus on developing simple models to analyze system behavior and estimate key
performance metrics such as signal delays and power dissipation.
 These models help in understanding the design and optimization of MOScircuits.
 The key areas to be considered are
1. Resistance and Capacitance Calculations
– Each layer in an MOS structure has a specific resistance and capacitance.
– These parameters impact signal integrity and circuit speed.
2. Delay Estimations
– Delays arise due to the resistance-capacitance (RC) time constant of interconnects.
– Understanding delays is essential for high-speed circuit design.
3. Determination of Conductor Size for Power and Clock Distribution
– Proper conductor sizing ensures minimal power loss and maintains signal integrity.
– Efficient clock distribution minimizes skew and ensures synchronization across the
circuit.
4. Power Consumption
– Includes both dynamic power and static power.
– Optimization is necessary for energy-efficient circuit design.
5. Charge Storage Mechanism
– MOS capacitors store charge, playing a crucial role in logic transitions and
memory operations.

1
VLSI Design and Testing (BEC602) Module-3-Circuit Characterization and Performance
Estimation

6. Effects of Scaling
– As MOS devices scale down, resistance, capacitance, and power consumption change.
– Scaling impacts device performance and requires careful consideration in design.

 By understanding these concepts, we can develop accurate models to optimize MOS

circuits for improved performance and efficiency.

2 Resistance Estimation
Sheet Resistance
 The resistance R of a uniform slab of conducting material is given by:

(1)

where:

ρ=resistivity of the material,

t=thickness of the conductor,

l=conductor length,

w=conductor width.

 This equation can be rewritten using sheet resistance Rs (measured in ohms per square) as:

(2)

 Thus, the resistance of a thin conducting layer can be calculated by multiplying the sheet
resistance Rs by the length-to-width ratio of the conductor. Consider the following figure:

2
VLSI Design and Testing (BEC602) Module-3-Circuit Characterization and Performance
Estimation

Figure1: Determination of layer resistance

For smaller conductor

For bigger conductor

 This illustrate show different conductor geometries can have the same resistance if their
length-to-width ratios are equivalent. This demonstrates the utility of sheet resistance in
simplifying resistance calculations.
Typical Sheet Resistance Values:
 Table below presents typical sheet resistances for materials used in 3µm to 5µm MOS
processes.
Table1:Typical Sheet Resistances for Conductors

Material Min(Ω)/sq) Typical(Ω/sq) Max(Ω/sq)

Metal(Al) 0.03 0.05 0.08
Silicides 2 3 6
Diffusion(n+ and p+) 10 25 50
Polysilicon 15 50 100

 For metals, the resistivity is primarily determined by material properties.

 However, for polysilicon and diffusion layers, the resistivity varies based on the
doping concentration introduced during implantation.
 Accurate resistance estimation requires knowledge of process parameters.

Channel Resistance in MOS Transistors

 Although the voltage-current characteristics of an MOS transistor are nonlinear,an
approximate channel resistance can be used for performance estimation.
 The channel resistance Rc in the linear region is:

 For both n-channel and p-channel MOSFETs, k typically ranges from 5,000 to 30,000
Ω/sq.
3
VLSI Design and Testing (BEC602) Module-3-Circuit Characterization and Performance
Estimation

 The above equation shows that channel resistance depends on the surface mobility of
majority carriers (electrons in n-MOS, holes in p-MOS).

 Since mobility is a temperature-dependent parameter, the channel resistance and

consequently switching time and power dissipation vary with temperature.

 The resistance increases by approximately +0.25% per◦C above 25◦C.

Resistance of Non-Rectangular Regions

 In VLSI layouts, conducting paths often take non-rectangular shapes, such as bends
or junctions.

 The resistance of such regions is more complex to calculate than for simple rectangles.

 A common approach is to divide a complex shape into simpler rectangular sections

and calculate resistance accordingly.

 Figure below presents standard resistance values for commonly encountered VLSI layout
shapes.

Figure2: Resistance of commonly encountered shapes.

 These values serve as useful approximations when designing complex circuits.

 Figure below illustrates practical layout geometries encountered in integrated circuit design.

4
VLSI Design and Testing (BEC602) Module-3-Circuit Characterization and Performance
Estimation

Figure3: Examples of non-rectangular layout shapes in practical VLSI designs.

 These shapes often require careful estimation of resistance due to their irregular dimensions.
 Table below presents resistance values for commonly encountered layout shapes.

Table2: Resistance of Non-Rectangular Shapes

Shape Ratio Resistance(Ω)

A 1 1
A 5 5
B 1 2.5
B 1.5 2.55
B 2 2.6
B 3 2.75
C 1.5 2.1
C 2 2.25
C 3 2.5
C 4 2.65
D 1 2.2
D 1.5 2.3
D 2 2.3
D 3 2.6
E 1.5 1.45
E 2 1.8
E 3 2.3
E 4 2.65

5
VLSI Design and Testing (BEC602) Module-3-Circuit Characterization and Performance

 These values can also be used to estimate the effective W/L ratio for irregular
MOS transistors.

 However, special attention must be given to the placement of the source and drain
in such layouts.

Contact and Via Resistance

 Contacts and vias also introduce resistance, which increases as their size decreases.

 Typical values for modern processes range from 0.25 Ω to 100 Ω.

 Careful design is required to minimize resistance and ensure proper signal transmission.

Key Take aways

1. Resistance Calculation:

 For rectangular conductors: R=Rs(l/w).

 For MOSFET channels: Rc=k(l/w).

2. Process Dependency:

 Metal resistance is fixed, while diffusion and polysilicon resistance depend on

dopant concentration.
 Channel resistance varies with temperature (+0.25 %per◦C).

3. Non-Rectangular Resistance:

 Divide complex shapes into simpler regions for easier calculation.

 Effective W/L ratio must be carefully estimated for non-rectangular MOSFETs.

4. Contacts and Vias:

 Have non-negligible resistance, which increases with decreasing size.

 These principles are essential for accurate resistance estimation in VLSI design and layout.
3 Capacitance Estimation
 The dynamic response of MOS systems, particularly the switching speed, is significantly
influenced by the parasitic capacitances associated with MOS devices and
interconnections.

 These capacitances arise from metal, polysilicon, and diffusion wires(often referred to as
“runners”) in combination with transistor and conductor resistances.

 The total load capacitance at the output of a nMOS gate consists of the following components:

1. Gate Capacitance: Due to other inputs connected to the output of the gate.
6
VLSI Design and Testing (BEC602) Module-3-Circuit Characterization and Performance

2. Diffusion Capacitance: Arises from the drain regions connected to the output.
3. Routing Capacitance: Results from the connections between the output and other
inputs.

 Understanding the sources and variations of these parasitic loads is crucial in MOS
circuit design, where system performance is largely dictated by switching speed.

 To analyze this, we first examine the characteristics of an MOS capacitor before

estimating the MOS transistor gate capacitance, source/drain capacitance, and routing
capacitance.

MOS Capacitor Characteristics

 The capacitance-voltage characteristics of an MOS structure depend on the state
of the semiconductor surface. As the gate voltage (VG) varies, the surface can be
in one of the following three states:

1. Accumulation
2. Depletion
3. Inversion

 Figure below illustrates the MOS structure.

Figure4: MOS capacitor structure

Accumulation Mode

 In a p-substrate MOS capacitor, an accumulation layer forms when VG<0 (for an

n-substrate, this occurs when VG>0).

 The negative charge on the gate attracts holes to the silicon surface, forming a high
concentration of charge carriers.

 Under these conditions, the MOS structure behaves like a parallel plate capacitor, where:

7
VLSI Design and Testing (BEC602) Module-3-Circuit Characterization and Performance

– The gate conductor forms one plate.

– The accumulated hole layer in the p-substrate (or electron layer in an n-substrate)
forms the second plate.
 Since the accumulation layer is directly connected to the substrate, the gate capacitance
can be approximated as:

Depletion Mode
 When a small positive voltage is applied to an n-device gate with respect to the p-
substrate, a depletion layer forms.

 The positive gate voltage repels holes, leaving behind a negatively charged region depleted
of carriers.

 A similar effect occurs in an n-substrate device for a small negative gate voltage.

 The charge density per unit area in the depletion region depends on:

– Doping concentration(N)
– Electronic charge(q)
– Depletion layer depth(d)

 As the gate-to-substrate voltage increases, the depletion depth (d) also increases, causing a
decrease in capacitance.

 The depletion capacitance is given by:

 Since the depletion capacitance is in series with the gate oxide capacitance, the total capacitance in
depletion mode is:

This equation shows that as d increases, the total gate-to-substrate capacitance decreases.
8
VLSI Design and Testing (BEC602) Module-3-Circuit Characterization and Performance

Inversion Mode
 As the gate voltage increases further, minority carriers (electrons for a p-substrate)
accumulate at the surface, forming an inversion layer that effectively turns the surface into
an n-type channel.

 This results in a high-conductivity layer under the gate.

 At low frequencies(<100Hz), the capacitance returns to Co.

 At higher frequencies, the limited supply of minority carriers prevents the charge
from following rapid gate voltage variations. Consequently, the dynamic capacitance
remains at the depletion value, given by:

 Figure below illustrates the variation of dynamic gate capacitance as a function of gate
voltage.

Figure 5: MOS capacitance variation as a function of Vgs

MOS Device Capacitances

 So far, we have considered the MOS gate in isolation.

 However, in practical MOS transistors, several parasitic capacitances exist due to the
physical structure of the device.

 Figure below presents a diagrammatic representation of these parasitic capacitances.

 For simplicity, we assume that the overlap of the gate over the drain and source is negligible.

 This is a valid first-order approximation in self-aligned silicon gate processes.

9
VLSI Design and Testing (BEC602) Module-3-Circuit Characterization and Performance

Figure6: Representation of parasitic capacitance for an MOS transistor

Capacitive Components in MOS Transistor

 The following capacitances are identified:

o Cgs and Cgd: Gate-to-channel capacitances, which are lumped at the source and drain
regions of the channel.

Csb and Cdb: Source and drain diffusion capacitances to the bulk (or substrate).

Cgb: Gate-to-bulk capacitance.

 It is possible to represent this model using circuit symbols, as shown in figure below.

Figure7: Circuit symbols for parasitic capacitance

 The total gate capacitance (Cg) of an MOS transistor is given by:

Gate Capacitance in Different Operating Regions

 The behavior of the gate capacitance depends on the region of operation of the MOS
transistor.

 The capacitance values can be approximated using simple models in each region:
10
VLSI Design and Testing (BEC602) Module-3-Circuit Characterization and Performance

1. Off Region(VGS<Vt):

 When the MOS transistor is “OFF”, there is no conducting channel, meaning

Cgs=Cgd=0.

 The gate-to-bulk capacitance (Cgb) can be modeled as the series combination of the gate

oxide capacitance (Co) and the depletion capacitance (Cdep), as discussed earlier.

2. Linear Region( VGS>Vt , VDS<VGS−Vt):

 In this region, the depletion layer depth remains relatively constant.

 Consequently, Cgb remains constant.

 As a conducting channel forms, the gate-to-channel capacitances Cgs and Cgd become
significant.
 These capacitances depend on the gate voltage and can be estimated as:

3. Saturation Region (VGS>Vt,VDS>VGS−Vt):

 In this region, the channel is heavily inverted, and the drain end of the channel is pinched
off. This causes Cgd to be approximately zero, while Cgs increases to:

 The behavior of the input capacitances in the three regions of operation is summarized
in table below.
Table3: Approximation of intrinsic MOS gate capacitance in different regions.

11
VLSI Design and Testing (BEC602) Module-3-Circuit Characterization and Performance

12
VLSI Design and Testing (BEC602) Module-3-Circuit Characterization and Performance

Effect of Gate Overlap

 If the gate overlaps the drain and source (as in a metal gate process), then a fixed
parasitic capacitance due to the overlap area and separation must be added to Cgs and

Cgd.

 Despite the voltage dependence of some capacitance components, the overall gate
capacitance (Cg) for an n-device is approximately equal to the intrinsic “gate-oxide”

capacitance (Co) for all gate voltage values, except near the threshold voltage(Vt), as
illustrated in figure below.

Figure8: Total gate capacitance as a function of Vgs

 Since transistors in digital circuits transition through this threshold region rapidly, a
conservative approximation is:
Cg ≈ Cox A

Where Cox is the “thin oxide” capacitance per unit area, given by:
ϵSiO2ϵ0
Cox = t
ox

 For a thin-oxide thickness in the range of 500–1000 Å and a relative permittivity of SiO2
(ϵSiO2=4), the capacitance per unit area is:

13
VLSI Design and Testing (BEC602) Module-3-Circuit Characterization and Performance

Diffusion Capacitance
 In MOSFETs, the source and drain regions are formed by shallow n+and p+ diffusions.
 These diffusion regions also act as interconnects in some layouts.
 All diffusion regions have capacitance to the substrate (or well), known as diffusion
capacitance (Cd).

 Cd arises due to the reverse-biased junction between diffusion and substrate.

 It depends on:

– Voltage across the junction (Vj)

– Area of the depletion region:

* Base area (horizontal)
* Side wall area (vertical, due to diffusion depth)

Capacitance Model
Let:

Cja= Capacitance per unit area (pF/µm2)

Cjp= Capacitance per unit periphery (pF/µm)

a= Width of diffusion region (µm)

b= Length of diffusion region (µm) Then the total diffusion capacitance is:

Cd=Cja (ab)+ Cjp (2a+2b)

14
VLSI Design and Testing (BEC602) Module-3-Circuit Characterization and Performance

Figure9: Area and peripheral components of diffusion capacitance

Note: As dimensions scale down, the peripheral (sidewall) capacitance becomes increasingly

significant.

15
VLSI Design and Testing (BEC602) Module-3-Circuit Characterization and Performance

Example Calculation
Given:
Cja=1×10−4pF/µm2, Cjp= 9×10−4pF/µm
a=10µm, b=8µm
Cd=(1×10−4)(10×8)+(9×10−4)[(2×10)+(2×8)]
=8×10−3+32.4×10−3= 40.4fF

Voltage Dependence

 The junction capacitance varies with junction voltage Vj:

Typical Values

Table4: Typical diffusion capacitance values

Device Type Cja (pF/µm2) Cjp (pF/µm)

n-device / wire 1×10−4 9×10−4
p-device/wire 1×10−4 8×10−4

Routing Capacitance
 Routing capacitance arises between interconnect layers (e.g.,metal, poly) and the substrate
or other layers.

 It is crucial in estimating interconnect delay and dynamic power consumption.

Parallel Plate Model Approximation

 Capacitance between layers can be estimated using the parallel-plate capacitor model:
A
C=ε
t

Where:
C= Capacitance (F)
ε= Dielectric constant of the insulating material
A= Overlapping area of the plates
t= Thickness of the dielectric (insulator)

16
VLSI Design and Testing (BEC602) Module-3-Circuit Characterization and Performance

Limitations of the Model

 The parallel-plate model ignores fringing fields.
 Fringing fields increase the effective area and hence increase the capacitance.
 Actual capacitance can be upto twice than predicted.
 Inter layer capacitance (e.g.,metal-to-poly) is also enhanced by fringing effects.

Figure10: Effect of fringing fields on capacitance

Scaling and Fringing

 With technology scaling, wire widths (w) and heights reduce less than separations (l).

 Thus, fringing fields become more prominent in deep submicron technologies.

 A fringing factor between 1.5 and 3 is typically used in modern processes.

Physical Layout vs. Drawn Layout

 Another source of error in capacitance estimation arises from differences between the
drawn layout (on mask) and the actual fabricated geometry.
 This is particularly pronounced for diffusion regions.
 The difference can be modeled:
– Analytically (using process parameters)
– Empirically (using experimental data)

17
VLSI Design and Testing (BEC602) Module-3-Circuit Characterization and Performance

Figure11: Effect of processing on drawn geometry

Distributed RC Effects
 Long interconnect wires exhibit distributed resistance and capacitance.
 This leads to signal delay that cannot be accurately modeled by lumped RC alone.
 This is especially critical for long polysilicon lines due to their high resistivity.

Modeling with Distributed RC

 Along wire can be modeled as a chain of small RC sections as shown in figure below.

Figure12: Representation of long wire interms of distributed RC sections

 For node voltage Vi, the differential equation is:

d2V
dV
rc = dx2
dt
Where:
r= resistance per unit length
c= capacitance per unit length
x= distance from the input
 This is the well-known diffusion equation.
18
VLSI Design and Testing (BEC602) Module-3-Circuit Characterization and Performance

Delay Estimation
1. Step Response Delay: Propagation time for a step input over wire of length l is:

tx=k·l2

2. Discrete RC Chain Approximation: For n RC sections:

RC n(n+1)
t n=
2
As n becomes very large (i.e., the individual sections become very small),this reduces to:
rc·l2
t l= 2
Example: 2 mm Poly Bus

Figure13: Segmentation of polysilicon line

Given:
r=12Ω/µm
c=4×10−4pF/µm
l= 1000µm

With a buffer delay tbuf, the total delay for two segments:

tp,seg=2.4ns+tbuf
Without segmentation (i.e., full 2mm wire):

tp=9.6ns
Optimization Techniques
 Segmentation: Break the line and insert buffers to reduce delay.
 Wider Poly: Reduces r, increases c—may be useful in some cases.
 Use Metal Instead of Poly: Second metal layer can replace high-r poly for long connections.
 Silicides: Use of low-resistance materials like molybdenum or tantalum (2–4Ω/sq).

19
VLSI Design and Testing (BEC602) Module-3-Circuit Characterization and Performance

Compact RC Model
 Compact RC Model is shown in figure below.

Figure14: Simple model for RC delay calculation

 It includes:

– Rs: Driver output resistance

– Cl: Receiver input capacitance

– Rt, Ct: Lumped line resistance and capacitance

 This model yields results that are very economical interms of computation and, more
importantly, are accurate enough for most purposes.
 The concept of using RC time constants for delay estimations is based upon the
assumption that the time taken for a signal to reach 63% of its final value
approximates the switching point of an inverter.

Capacitance Design Guide

 Accurate estimation of parasitic capacitances is crucial in digital VLSI design because
inter connect and device capacitances directly influence propagation delays,
power consumption, and circuit performance.
 To assist in design planning, standard capacitance values for a typical λ=2µm CMOS
process are provided in following table.
Table5: Typical 4µm silicon gate CMOS process capacitances

Parameter Description Min Capacitance Max Capacitance

Cg (pF/µm2) Gate oxide capacitance 4.0×10−4 5.0×10−4
Cp (pF/µm2) Polysilicon over field 0.4×10−4 0.6×10−4
Cmp (pF/µm2) Metal over poly 0.4×10 −4
0.6×10−4
Cmf (pF/µm2) Metal over field 0.15 ×10−4 0.3×10−4
Cmd (pF/µm2) Metal over diffusion (n and p) 0.8×10−4 1.0×10−4
Cjan (pF/µm2) n-diffusion capacitance 0.8×10 −4
1.0×10−4
Cjap (pF/µm2) p-diffusion capacitance 0.8×10−4 1.0×10−4
Cjpn (pF/µm) Gate capacitance (n-channel) 7.0×10−4 9.0×10−4
Cjpp (pF/µm) Gate capacitance (p-channel) 6.0×10 −4
8.0×10−4

20
VLSI Design and Testing (BEC602) Module-3-Circuit Characterization and Performance

 Capacitance of second-level metal layers is governed by planarization layer thickness.

 Fringing fields are negligible in current technologies.

Table6:Typical 4µm second level metal CMOS process capacitances

Parameter Description Min Capacitance Max Capacitance

(pF/µm2) (pF/µm2)
Cm2f Metal2 to substrate 0.1×10−4
0.15 ×10−4
Cm2p Metal 2 to poly 0.2×10−4 0.3×10−4
Cm21 Metal2 to metal1 0.3×10−4 0.5×10−4

Example: Capacitance Calculation

Figure15: Example of parasitic capacitance calculation for λ=2µm

 Assume λ = 2µ[Link] parasitic capacitances:

Metal line over field:

Cmf=(3λ×100λ)·0.3×10−4=0.036pF

Polysilic online:

Cp=[(4λ×4λ)+(λ+2λ)×2λ]·0.6×10−4=0.0053pF

Gate area:
Cg=(2λ×2λ)·5.0 ×10−4=0.008pF

Total capacitance:

CT=Cmf+Cp+Cg=0.036+0.0053+0.008=0.049pF

21
VLSI Design and Testing (BEC602) Module-3-Circuit Characterization and Performance

Design Insight
 Before completing a detailed layout, designers should have ball park estimates of
capacitance values to:
o Estimate bus loading and fan-out requirements.
o Perform early-stage timing and delay analysis.
o Choose suitable wire widths, spacings, and transistor sizes.
 Reference values like capacitance of:
o A unit-size gate,
o 100µm of poly wire,
o Common metal-poly overlaps, etc.
 Are helpful for making quick and reasonable design decisions.

Wire Length Design Guide

 In VLSI design, signal propagation delay is an important consideration.
 For timing analysis, an electrical node is defined as a region of connected interconnect
paths where the RC (resistance-capacitance) delay is small compared to gate delays.
 In such cases, the interconnect can be modeled as a lumped capacitance and included in the
gate delay.

Key Concept
 For short wires, RC delays can be neglected.
 These wires act as one electrical node.
 Such wires are modeled as simple capacitive loads rather than distributed RC networks.
Timing Condition

 To ignore RC delay, wire delay τw should be much smaller than gate delay τg:

τw≪τg (10)
 Substituting the delay equation:
rc·l2
τ w= 2
 We get the condition on maximum wire length:
rcl· 2
≪τg
2

This expression gives an upper bound on the wire length l where RC delay can be safely ignored.

22
VLSI Design and Testing (BEC602) 4 Switching Characteristics

Design Guidelines for Interconnect Length

 Using above equation and assuming typical gate delays (1.5ns–2.0ns) and values for r from
table of Typical sheet resistance for conductors and c from table of Typical 4 µm
silicon gate CMOS process capacitances, we can derive maximum allow able wire
lengths interms of λ, the design rule unit:

τg= 2.0×10−9s (typical gate delay)

r= 0.03Ω/λ (resistance per unit length)

c= 0.3×10−16F/λ (capacitance per unit length)
 To be conservative in practice, the maximum recommended length is chosen lower:
l<20,000λ
 The following table shows the guidelines for ignoring RC wire delays:
Table7: Guidelines for Ignoring RC Wire Delays

Interconnect Maximum Length(in λ)

Layer
Metal 20,000
Silicide 2,000
Polysilicon 200
Diffusion 20

4 Switching Characteristics
 The switching speed of a CMOS gate is limited primarily by the time it takes to charge
and discharge the load capacitance CL.

 When an input transition occurs, the output undergoes a corresponding transition —

either charging CL toward VDD or discharging it toward VSS.

23
VLSI Design and Testing (BEC602) 4 Switching Characteristics

Key Definitions

Figure 16: Switching characteristic for CMOS Inverter

 Before proceeding, we define a few important timing parameters, referring to above figure:

o Rise time (tr):Time for a voltage waveform to rise from 10% to 90% of its final steady-
state value.

o Fall time(tf):Time for a voltage waveform to fall from 90% to 10% of its steady-state value.

o Delay time (td): Time difference between the 50% transition level of the input and
the corresponding 50% level of the output. This represents the time for the logic
transition to propagate through the gate.

Inverter with Load Capacitance

 Figure (a) shows a standard CMOS inverter driving a capacitive load CL. This capacitance
models:

– The input capacitance of subsequent stages

24
VLSI Design and Testing (BEC602) 4 Switching Characteristics

– The output capacitance of the driving gate

– The routing (interconnect) capacitance

 The voltage response Vo(t) of the output node is of primary interest when the input Vin(t)
is a step waveform, as shown in figure (b).

 The analysis of Vo(t) under such conditions allows us to estimate the inverter’s delay
and transition behavior in practical digital circuits.

Fall time determination

Figure17: Equivalent circuits for fall time determination

 The total fall time is given by:

tf=tf1+tf2
where:

tf1 is the time during which VO drops from 0.9VDD to VDD−Vtn (saturation region),

tf2 is the time during which VO drops from VDD−Vtn to 0.1VDD (linear region).

Saturation Region(tf1)

In this region, the drain current is constant:

The current through the capacitor is

25
VLSI Design and Testing (BEC602) 4 Switching Characteristics

 Integrating from VO=0.9VDD to VO=VDD−Vtn:

Linear Region(tf2)

 Here, then MOS is in the linear(triode) region, and the current is:
2
O
ID=βn V
(VDD−Vtn)VO− 2

 Equating with the capacitor current:

Total Fall Time

 Adding both terms:
tf=tf1+tf2

 Assuming
4CL
Vtn=0.2VDD: t≈
f
βnVDD
 This final result is a good approximation for hand analysis and clearly shows the dependence
off all time on load capacitance, mobility, and supply voltage.

Rise Time Determination

 When the input to a CMOS inverter goes from high to low, the pMOS turns ON and the
nMOS turns OFF. The output voltage rises from 0toVDD through the pMOS, charging the

load capacitor CL. As before, rise time can be divided into two regions:

tr=tr1+tr2

where: tr1:VO rises from 0.1VDD to VDD−|Vtp|(pMos in saturation),

tr2:VO rises from VDD−|Vtp| to 0.9VDD (pMOS in linear).

26
 VLSI Design and Testing (BEC602) 4 Switching Characteristics

Figure18: Equivalent circuits for rise time determination

Saturation Region(tr1)

In saturation, the drain current of the pMOS is:

Linear Region (tr2)

In the linear region, the pMOS current is:

27
VLSI Design and Testing (BEC602) 4 Switching Characteristics

28
VLSI Design and Testing (BEC602) 4 Switching Characteristics

Total Rise Time:

 Adding both parts:
tr= tr1+tr2

Comparison with Fall Time

 Since βn=2βp for equally sized transistors (duetoµn≈2µp),then:

tr=2×tf

 Hence, to equalize rise and fall times, we must make:

βp=βn ⇒ Wp≈2Wn

 Thus:
o Rise time is slower than fall time unless pMOS is made wider.
o The difference arises due to lower mobility of holes (µp) compared to electrons (µn).

Delay Time
 In a CMOS digital circuit, the gate delay is the time taken by the output to respond to a
change ininput. This delay is mainly dominated by the time it takes to charge or discharge
the output load capacitor CL, which corresponds to the rise time (tr) and fall time (tf),
respectively.

Rising and Falling Propagation Delays

 The propagation delay during a rising transition is defined as:
tr
tdr =
2
 This corresponds to the average time taken for the output voltage to transition from low to
high (e.g., from 0.1VDD to 0.9VDD),typically measured at the 50% point of the output voltage
swing.

 Similarly, the propagation delay during a falling transition is:

tf
tdf =
2

29
VLSI Design and Testing (BEC602) 4 Switching Characteristics

Average Gate Delay

 To characterize a gate’s delay independent of the direction of the signal transition, we define the
Average delay τav as the average of the rising and falling propagation delays:
tdf+tdr t +t
τav = =f r
2 4
 This quantity τav is widely used in delay modeling of CMOS gates in digital circuit design.

Interpretation

 τav depends on the transistor parameters (βn,βp),supply voltage VDD, and load capacitance

CL.

 A higher CL increases delay.

 Using wide transistors (higher W/L) improves (reduces) delay by increasing β.

 For balanced design, designers often size pMOS wider than nMOS (e.g.,Wp=2Wn)to

equalize tr and tf, minimizing τav.

Example using Approximate Formulas

 This expression clearly shows how CMOS delay is affected by load capacitance,
supply voltage, and transistor sizing.

30
VLSI Design and Testing(BEC602) 5 CMOS Gate Transistor Sizing

5 CMOS Gate Transistor Sizing

Similar Stage Loads
 To achieve approximately equal rise and fall times in a CMOS inverter, it is necessary to
size the pMOS transistor larger than the nMOS transistor:

Wp≈2Wn

where:

Wp: Channel width of the pMOS transistor

Wn: Channel width of the nMOS transistor

 This sizing compensates for the lower mobility of holes in the pMOS device.

Implications:
o Increased layout area

o Increased dynamic power dissipation.

Minimum-Size Devices in Cascaded Structures:

 In cascaded logic structures, using minimum-size devices (i.e.,Wp=Wn) does not necessarily
degrade the switching response. This is illustrated using an inverter pair.

Delay Analysis:

31
VLSI Design and Testing(BEC602) 5 CMOS Gate Transistor Sizing

Figure19: CMOS Inverter pair timing response

32
VLSI Design and Testing(BEC602) 5 CMOS Gate Transistor Sizing

Case1: Wp= 2Wn (as shown in Fig.(a))

tinv-pair=tfall+trise=3RC+3RCeq=6RCeq

Case2: Wp=Wn (as shown in Fig.(b))

tinv-pair=4RCeq+2RCeq=6RCeq

where:

R: Effective ‘on’ resistance of a unit-sized nMOS transistor

Ceq=Cg+Cd: Total capacitance of a unit-sized gate and drain

Conclusion: Both configurations result in similar delays. Hence, in cascaded stages, minimum-size
inverters can be used without significantly affecting performance.

Effect on Inverter Threshold Voltage (Vinv):

 The inverter threshold voltage is given by:

substitute:

VDD= 5V, Vtn=1V, Vtp=−1 V

β∝µW L so βn/βp depends on Wp/Wn

Results:

For Wp= 2Wn:Vinv≈2.24V

For Wp=Wn:Vinv≈2.5V

Observation: Less than 10% variation in Vinv, which is acceptable in most designs.
Design Note:

 It is usually preferable to use Wp=Wn when cascading similar stages to optimize area and
power.
33
VLSI Design and Testing(BEC602) 5 CMOS Gate Transistor Sizing

Switching Performance of the Pseudo-nMOS Inverter

 A simplified timing model of the pseudo-nMOS inverter is shown in figure below. This design
uses a width ratio of 3:1 (nMOS to pMOS).

Figure20: Pseudo-nMOS Inverter pair timing response

Delay for inverter pair:

tinv-pair= 6R(Cg+2Cd)+R(Cg+2Cd) = 7R(Cg+2Cd) where

Ceq= Cg+ 2Cd.

Cascaded Stage Loads

 When driving large capacitive loads such as:

o Long buses

o I/O buffers

o Pad drivers and off-chip loads

 It is necessary to design cascaded driver stages.

Design Method:

1. Determine the final stage size based on desired rise/fall time and load capacitance CL.

2. Determine the size and number of intermediate stages based on optimization goals (speed,
power, area).

Stage Ratio:

34
VLSI Design and Testing(BEC602) 5 CMOS Gate Transistor Sizing

 Defined as the ratio of transistor size between consecutive stages.

 Optimal speed is obtained when the stage ratio is approximately 2.7.

 Ratios between 2 and 10 are commonly used in practice.

35
VLSI Design and Testing (BEC602) 6 Determination of Conductor Size

6 Determination of Conductor Size

Electro migration
 Electro migration refers to the movement of metal ions in a conductor due to the
passage of direct current (DC).

 This phenomenon results from the modification of normally random atomic diffusion
to a directional process driven by the momentum transfer from electrons (charge carriers)
to metal atoms.

Effects of Electro migration:

 Deformation of metal conductors

 Creation of voids and hillocks

 Potential failure of interconnects and circuitry

Key Factors Affecting Electro migration:

 Current density(J)

 Temperature

 Crystal structure of the metal

Minimum Conductor Size Estimation

 When designing power conductors, especially VDD and VSS lines, it is critical to keep the
current density below threshold values to prevent electro migration-induced failures.

Electro migration Threshold Example:

 For a1µm thick aluminum line,the limiting current density is:

 JAl≈1−2mA/µm

 As a conservative design rule:

 J≈0.5mA/µmto1.0 mA/µm
 Should be used for power supply lines to avoid electro migration issues.

36
VLSI Design and Testing (BEC602) 7 Power Consumption

Current Crowding and Constrictions:

 If a conductor has a constriction, metal atoms tend to migrate more rapidly in that region due
to increased current density.

 This leads to local weakening and eventual failure—similar to a fuse blowing.

Voltage Drops(IRDrops)
 Another reason for ensuring adequate conductor sizing is the voltage drop (IR drop) that can
occur during charging transients.

 These can cause improper functioning if VDD or VSS falls below critical limits.

Note: Although electro migration typically sets the minimum width, IR drop considerations often

determine the actual width required in practical design.

Alternative Techniques for Power Distribution:

 When increasing conductor width is not feasible:

o Add extra VDD and VSS supply pins

o Use multiple distributed power paths

Current Density in Window Cuts

 Special attention must be given to the current density at window (cut)edges.

 It must be kept below:

 Jcut≤0.1mA/µm
 Due to current crowding effects near window peripheries, a chain of small, well-spaced
windows can provide similar current carrying capability as one long narrow window.

 This technique reduces peak current density and mitigates electro migration risk.

7 Power Consumption
 In CMOS circuits, the total power dissipation arises from two primary components:

1. Static dissipation—due to leakage current

2. Dynamic dissipation—due to:

o Switching transient currents

o Charging and discharging of load capacitances

37
VLSI Design and Testing (BEC602) 7 Power Consumption

Static Dissipation
 Consider a complementary CMOS gate as shown in figure below:

Figure21:CMOS inverter states for static dissipation calculations

 When the input is at logic ‘0’,then MOS is OFF and the pMOS is ON, pulling the output to
VDD.

 When the input is logic ‘1’, the nMOS is ON and the pMOS is OFF, pulling the output to
ground (VSS).

 In both states, one transistor is OFF, and there is no direct current path from VDD to VSS.

 Hence, under ideal conditions, the quiescent current and power dissipation are zero.

 However, there exists a small leakage current due to reverse-biased junctions between the
diffusion regions and the substrate.

 A model illustrating these parasitic diodes in a CMOS inverter is shown in figure below:

Figure22:Model describing parasitic diodes

38
VLSI Design and Testing (BEC602) 7 Power Consumption

 The diode D1 models leakage from the p-well to substrate.

 The reverse-biased leakage current is modeled by the diode equation:

where:

– is= reverse saturation current

– V= voltage across the diode
– q= electronic charge
– k= Boltzmann’s constant
– T= temperature (in Kelvin)
 The static power dissipation is given by:

Where n= number of devices

 For example, typical static power dissipation due to leakage for an inverter operating at
5volts is between 1—2 nano-watts.

Dynamic Dissipation
 When the output switches states (either from ‘0’ to ‘1’ or ‘1’ to ‘0’), both nMOS and
pMOS devices conduct for a brief interval.

 This causes a short-duration current pulse from VDD to VSS.

 Additionally, current is drawn to charge and discharge the load capacitance, which is
typically the dominant component of dynamic power.
 This short-circuit power dissipation is important in I/O buffer design and is influenced
by gate design and capacitance.
 Assuming a step input with rise/fall times much smaller than there petition period, the
average dynamic power dissipation for a square-wave input with frequencytpfp=1(as shown
in figure below)is:
– VDD=supply voltage

where: – fp=switching frequency

– CL=load capacitance

39
VLSI Design and Testing (BEC602) 7 Power Consumption

Pd=CLV2 fp
DD

 This equation shows that dynamic power is proportional to both the capacitance
and the square of the supply voltage, and it increases linearly with frequency.
 Note that it is independent of transistor parameters.

Figure23: Waveforms for determination of dynamic power dissipation

Total Power Dissipation

 The total power consumed by a CMOS circuit is the sum of the static and dynamic
components:

Ptotal=Ps+Pd (4.41)

Design Considerations
 When estimating power dissipation:

 Group all capacitances that operate at a given frequency.

 Sum the contributions from each group to estimate total dynamic power.

 Use the total dynamic power to size VDD and VSS conductors appropriately, minimizing
IR [Link] consideration becomes increasingly important in large-scale CMOS designs.

40
VLSI Design and Testing (BEC602) 8 Charge Sharing

Example: Power Dissipation in CMOS Inverter Array

Given:
Number of inverters=N

Operating frequency=10MHz

VDD=+5V

Output capacitance=2Cd, where Cd=40fF⇒2Cd= 80fF

Input capacitance=2Cg,whereCg=11.2fF⇒2Cg=22.4fF

Solution:
Total capacitance per inverter:

Ctotal=2Cd+2Cg=80fF+22.4fF=102.4fF

Dynamic power per inverter:

Pd=Ctotal·V2 DD ·fp=102.4×10−15·25·107=2.56×10−5W

Total dynamic power for N inverters:

Pd,total=N·2.56×10−5W

Static power (estimated leakage of 0.5nW per gate):

Ps=N·0.5×10−9W

Total power:
Ptotal≈ N·(2.56×10−5+0.5×10−9)W
This example illustrates that dynamic power dominates static power in typical CMOS circuits.

8 Charge Sharing-In many digital CMOS circuits, especially during dynamic logic or bus
operations, charge sharing is a critical consideration for maintaining signal integrity.

Charge Sharing Model

 A bus can be modeled as a capacitor Cb, as shown in figure [Link], a signal from this bus

is sampled via a switching element connected to another capacitor Cs. This configuration can
be analyzed by modeling the pre-and post-switching charge conditions.

41
VLSI Design and Testing (BEC602) 8 Charge Sharing

Figure24: Charge sharing mechanism

Initial Conditions
Before the switch is closed:
Q b= C bV b, Qs=
Total initial charge:

Total capacitance after switching:

CsVsQT= CbVb+ CsVs

CT=Cb+Cs

Final Voltage After Sharing

 Once the switch closes, the charge redistributes, and both capacitors settle at a common
voltage VR:

QT CbVb+CsVs
VR = =
CT Cb +Cs
Special Case: Vs≈0
 Assuming Vb=VD D and Vs≈0, the resulting voltage becomes:
Cb
·
VR=VDD Cb+Cs

 This shows that VR is reduced compared to VDD, and the amount of drop depends on the ratio

Cs/Cb.

Design Guideline
 To ensure reliable signal transfer from Cb to Cs, it is essential to maintain: Cb≥10·Cs

 This minimizes the voltage drop due to charge sharing and preserves logic levels in sampling
operations.

42
VLSI Design and Testing(BEC602) 9 Scaling of MOS Transistor Sizing

Understanding Charge Sharing: A Simple Analogy

In digital circuits, sometimes we store voltage (like information)on a bus line, which acts like
A big capacitor Cb. Another circuit part may want to sample that information using a

smaller capacitor Cs through a switch (see the figure).This process is called charge
sharing.
Think of it like this:

Cb is a big water tank with water level Vb,

Cs is a small water tank with level Vs,

A switch is like a valve that connects the two tanks.

What happens when the valve is opened(switch closed)?

Water (charge) flows between the tanks until both have the same level.

The final level (voltage) is in between CbVb+CsVs

VR= the original levels and depends on both volume
(capacitance) and initial levels. C+C
b s

Special case: If Vb=VDD and Vs=0,then:

Thefinalvoltagebecomes:
Cb
VR =V DD · C+C
b s

Problem: If Cs is too large, VR becomes much smaller than VDD, leading to unreliable logic
levels.
Design Tip: To avoid this,
Cb>10·Cs
This ensures the voltage remains close to the original bus value after sharing.
Key Idea: Sharing charge is like mixing water. Keep the sampling tank small to avoid
changing the level too much!

9 Scaling of MOS Transistor Sizing

 As CMOS fabrication technology evolves, the dimensions of transistors are continually
reduced to improve performance and increase packing density.

 Let us examine how reducing device dimensions affects circuit behavior, guided by a first-
order “constant-field” scaling model proposed by Dennardetal.

43
VLSI Design and Testing(BEC602) 9 Scaling of MOS Transistor Sizing

Scaling Principles
 First-order MOS scaling theory assumes that the electric fields in the device are kept
constant as dimensions are reduced.

 If all critical parameters—such as device dimensions (length L, width W, oxide

thickness tox, and junction depth Xj), voltages (VDD), and doping concentrations — are
scaled by a factor α>1, then the key electrical properties of the device can still be
preserved.

 The scaling is applied as follows:

– All horizontal and vertical dimensions are scaled by 1/α.

– Voltages are scaled by 1/α.
– Doping concentrations are scaled by α.

 This approach results in a new device that is physically smaller, uses lower
voltage, but maintains the same electric field intensities.

 The outcome of such scaling is illustrated in figure and table shown below.

Figure25: Basic scaled MOS device

44
VLSI Design and Testing(BEC602) 9 Scaling of MOS Transistor Sizing

Table8: Influence of First-Order Scaling on MOS Device Characteristics

Parameter Scaling Factor

Length L, Width W, Junction depth Xj 1/α
Gate oxide thickness tox 1/α α
1/α
Device Substrate doping Na or Nd 1(Constant)
Parameters
Supply voltage VDD
Electric field E
Depletion layer thickness d 1/α
Parasitic capacitance C=WL/tox 1/α
Gate delay(VC/I) 1/α
Static power Ps, dynamic power Pd 1/α2
Power-speed product 1/α3
Resultant Gate area A 1/α2
Influence Power density P/A 1(Constant)
Current density I/A α
Transconductance gm 1(Constant)

 The primary benefit of constant-field scaling is that nonlinear effects are minimized,
making design more predictable.

 However, practical limits exist. For instance:

– The depletion layer thickness d must reduce with L.

– To reduced, we increase doping concentration, which affects mobility.
– Electric fields remain constant, reducing the risk of breakdown.

 One important rule is that the channel length must be larger than the sum of depletion
widths from source and drain.

 To scale L down, the depletion width must be reduced by increasing the substrate doping.

 However, high doping reduces carrier mobility, increasing propagation delay.

 Scaling also affects current and power:

– Drain current Ids per transistor scales as 1/α.

– Transistor density increases as α2.

– Current density increases as α.
– Wider metal lines are needed to handle increased current.

Power Density Consideration:

 Though Pd per gate drops as 1/α2, the number of gates increases as α2, so overall
power density remains constant.
45
VLSI Design and Testing(BEC602) 9 Scaling of MOS Transistor Sizing

Thermal Constraint:

Let the maximum silicon junction temperature be Tj=175◦ C and ambient temperature

Tamb =75◦C.

For a 40-pin ceramic package with thermal resistance θ= 40◦C/W:

Tj−Tamb 175−75
Pmax = = =2.5W
θ 40
Beyond this, heat sinks or cooling may be required.
Practical Limitations:
 Mobility decreases slightly with increased doping.
 Delay reduction is less than the ideal 1/α.
 Power may reduce by more than 1/α2.
 Power-speed product remains close to 1/α3.
 Surface doping above 1019cm−3 causes oxide break down before inversion.
As shown in figure below, oxide and junction break down limit scaling.

Figure26:Relationship between channel length L, voltage and doping level (N)

Minimum channel length and maximum voltage are dictated by doping and break down constraints.

Memory Scaling Challenge:

 As diffusion areas reduce, stored charge becomes vulnerable to alpha particles.
 Radiation-hardened techniques or error detection become necessary.

46
VLSI Design and Testing(BEC602) 9 Scaling of MOS Transistor Sizing

Interconnect Layer Scaling

 While transistor performance improves with scaling, interconnect parameters degrade.

 For example, scaling width and thickness of metal lines by 1/α reduces their cross-sectional
area by 1/α2.
 The line resistance becomes:
l l
R′=ρ =ρ =α2R
A′ A/α2
So, R scales as α .
2

Note: The wire length is not scaled as some global wires (e.g. clock, power, long signal paths)
still need to cross similar-sized chips because chip functionality grows.

Analogy
Imagine squeezing a straw thinner and thinner, but not making it shorter. It becomes
harder to blow through—not because it’s longer, but because it’s narrower.

Similarly, when we scale down the width and thickness of metal interconnects (like
squeezing the straw),but keep their length the same, their resistance increases significantly—
just like the air resistance in the narrow straw.

 If voltage is scaled down by 1/α, the voltage drop Vd along the interconnect (for constant chip
size, i.e., unscaled l) increases by α.

 Similarly, line response time becomes:

τ ′ =R′C′=α RC (for fixed interconnect length)

 Hence, for constant chip size:

– Voltage drops increase.

– Response time worsens.
– Signal integrity and clock distribution become harder.
Table9: Influence of Scaling on Interconnect Media

Parameter Scaling Factor

Line resistance r α2
Line response rc α
Normalized line response α
Voltage drop Vd α
Normalized voltage drop α
Current density J α
Normalized contact voltage drop α

47
VLSI Design and Testing (BEC602) 10 Yield

Key Issues:
o Higher current density leads to electro migration.
o New materials may be needed for metal layers.
o Capacitance of interconnect increases.
o Gates have less ability to drive long interconnects.
 As shown in above table, the interconnection network becomes the bottleneck in performance.
To mitigate this:
o Vertical dimensions are often kept constant.
o More metal layers are used.
o Interconnect-aware design techniques are employed.

10 Yield
 Yield is a critical factor in the manufacturing of VLSI (Very-Large-ScaleIntegration)
circuits.
 Although yield is not directly a performance parameter, it significantly affects the
Economic feasibility of fabrication and is influenced by several factors:
o Technology used in fabrication
o Chip area
o Layout strategy
Definition of Yield:
Yield is defined as:
No. of Good Chips on Wafer
Yield (%)= ×100%
Total Number of Chips

Yield depends primarily on the chip area (A) and the defect density (D) (number of lethal
defects per cm2).
Two widely accepted models describe how yield relates to these parameters.
1. Seed’s Yield Model: This model is used primarily when:
o The chip area is large
o The yield is expected to be less than 30%

o The yield is expressed as:

48
VLSI Design and Testing (BEC602) 10 Yield

where
A = chip area (in cm2)
D= defect density (lethal defects/cm2)
 As chip area increases or defect density rises, the exponent becomes more negative,
causing yield to drop exponentially.

2. Murphy’s Yield Model: This model is preferred when:

 Chip area is relatively small

 Yield is expected to be greater than 30%

o Murphy’s model gives:

—
 This formulation softens the drastic yield drop for small areas, making it more
accurate for high-yield conditions.

Observations and Insights

 Larger chip areas result in lower yield, due to the increased probability of a defect
occurring anywhere in the chip.

 In extreme cases, entire wafers can be rendered useless if the chip area is large and
defect density is high.

 Modern processes, such as dry etching, have improved defect densities. A typical value
might be:
D≈4defects/cm2

Improving Yield
 Redundancy can be built into chip designs, especially in memory circuits, to tolerate
localized defects.

 In random logic circuits, adding redundancy often increases chip area and may not
improve yield significantly.

 In contrast, memory arrays(which have a regular structure) can benefit greatly from
techniques like spare rows or columns.

49