Transmon Using SN
Transmon Using SN
Amrita Purkayastha,1, ∗ Amritesh Sharma,1 Param J. Patel,1, 2 An-Hsi Chen,3 Connor P. Dempsey,4
Shreyas Asodekar,1 Subhayan Sinha,1 Maxime Tomasian,1, † Mihir Pendharkar,4, ‡ Christopher
J. Palmstrøm,4, 5, 6 Moı̈ra Hocevar,3 Kun Zuo,7, 8 Michael Hatridge,2 and Sergey M. Frolov∗1, §
1
Department of Physics and Astronomy, University of Pittsburgh, Pittsburgh, PA 15260, USA
2
Department of Applied Physics, Yale University, New Haven, CT 06511, USA
3
Univ. Grenoble Alpes, Grenoble INP, CNRS, Institut Néel, 38000 Grenoble, France
4
Department of Electrical and Computer Engineering,
University of California, Santa Barbara, CA 93106
5
California NanoSystems Institute, University of California Santa Barbara, Santa Barbara, CA 93106, USA
arXiv:2508.04007v1 [[Link]-hall] 6 Aug 2025
6
Materials Department, University of California Santa Barbara, Santa Barbara, CA 93106, USA
7
School of Physics, The University of Sydney, Sydney, NSW 2006, Australia
8
ARC Centre of Excellence for Engineered Quantum Systems,
School of Physics, The University of Sydney, Sydney, NSW 2006, Australia
(Dated: August 7, 2025)
Superconductor qubits typically use aluminum-aluminum oxide tunnel junctions to provide the
non-linear inductance. Junctions with semiconductor barriers make it possible to vary the supercon-
ductor material and explore beyond aluminum. We use InAs semiconductor nanowires coated with
thin superconducting shells of β-Sn to realize transmon qubits. By tuning the Josephson energy with
a gate voltage, we adjust the qubit frequency over a range of 3 GHz. The longest energy relaxation
time, T1 = 27 µs, is obtained at the lowest qubit frequencies, while the longest echo dephasing time,
T2 = 1.8 µs, is achieved at higher frequencies. We assess the possible factors limiting coherence
times in these devices and discuss steps to enhance performance through improvements in materials
fabrication and circuit design.
200 nm
fr
fd
(d) (e)
f02/2
f01
FIG. 1. False-colored SEM image of the NbTiN qubit chip. The readout resonator (blue) is inductively coupled to the
transmission line (purple) and capacitively coupled to the qubit capacitor (green). The gate port is colored red. (b) Schematic
of the junction area showing InAs nanowire (dark brown) with Sn shell (yellow) patched with Al (magenta) to the NbTiN
ciruit (grey). (c) False-colored SEM image of the Sn-InAs nanowire Josephson junction in the red box in (a). (d) Two-tone
spectroscopy showing transmission S21 at fr as a function of qubit drive frequency fd and Vg . Inset: A line cut from (d) at
Vg =1.12 V. (e) Extracted f01 (left) and EJ /Ec (right) as a function of Vg .
provements such as with preventing partial oxidation of GHz for Qubit B. The readout resonators are inductively
Sn and charging energy optimization. coupled to a common transmission line. The qubits are
Identifying superconductor/barrier combinations with designed for a charging energy of Ec /h = e2 /2C ≈ 380
long coherence times opens pathways to explore quan- MHz.
tum computing beyond aluminum. While our metrics do The Josephson element consists of a semiconducting
not overshadow the tunnel junctions at this stage, they InAs nanowire coated with a 15 nm thick shell of β-Sn
show the promise of Sn, and provide a rare example of as shown in Fig. 1(b),(c). The shell covers half of the
alternative junctions with coherence times in the tens of nanowire circumference. Along the nanowire, the shell is
microseconds range. Semiconductor InAs nanowires fa- interrupted to create the junction. The break in the shell
cilitate high transparency barriers to many superconduc- is achieved by shadowing the junction wire with a nearby
tor metals, making them an attractive template for pro- wire that acts as a shadow mask. Using a micromanipula-
totyping materials combinations until a set of the most tor, the nanowire is placed in between the capacitor pads
promising ones is identified. Selective-area grown [39] or of the pre-fabricated NbTiN circuit indicated by the red
top-down etched nanowires [26, 30, 40, 41] can be used box in Fig. 1(a). The nanowire is then connected to the
in the future for scaling up the most promising materials circuit via an Al patch. The schematic of the transmon
platform. circuit with the nanowire Josephson junction is shown in
Fig. 1(c). The full details of device fabrication can be
found in supplementaryS2.
II. DEVICE DESIGN
V. COHERENCE TIMES
(a) (b)
T1 =26.9 μs
T2E =1.8 μs
FIG. 3. (a) T1 as a function of side gate voltage Vg for Qubit A. Inset: Relaxation time extracted by fitting an exponential
to the data, T1 = 26.9 ± 0.7 µs at f01 = 3.494 GHz. (b) T1 plotted as a function of qubit frequency f01 for multiple gate
sweeps. (c) Two dephasing times of T2a = 1.4 ± 0.1 µs and T2b = 1.3 ± 0.2 µs are extracted by fitting the decaying oscillations
to double sinusoidal functions with different exponential envelopes. Here, f01 = 6.616 GHz. (d) Echo measurement gives
T2E = 1.8 ± 0.1 µs. (e) T2∗ , T2a and T2b and T2E plotted as a function of f01 . The error bars in (a), (b), and (e) represent the
standard deviations of the fits.
∗ ∗
coherence times T2a = 1.4 µs and T2b = 1.3 µs. We rials properties of the Sn-InAs nanowire junction, the
attribute the beating pattern to a nearby low frequency fabrication details, or by the configuration of the exter-
two-level fluctuator similar to what has been reported in nal circuit. In Fig. 4, we compare the T1 data for two
[22]. qubits fabricated on the same chip. The contour lines,
We also perform echo measurements by applying a π- T1 = Q/2πf01 , for comparison, assume fixed quality fac-
pulse in the middle of the Ramsey sequence to mitigate tors. For Qubit A, the data fall close to a trend consistent
low-frequency noise. We observe a T2E = 1.8 µs, which with the readout resonator quality factors fabricated on
is similar to T2∗ as shown in Fig. 3(d). This indicates the the same NbTiN-Si wafer (Fig. S2). This hints at the
presence of higher-frequency noise in the system. The on-chip losses as the most relevant limiting factor for
relaxation time at this qubit frequency is T1 = 4.12 µs, this qubit. Further optimization could involve varying
thus T2 is not limited by energy relaxation. the substrate, the groundplane superconductor and the
In Fig. 3(e), the measured dephasing time and echo circuit geometry.
times is summarized as a function of the qubit frequency. For Qubit B, the data align closer with the lower con-
T2∗ is extracted by fitting the decaying oscillations to a stant quality factor dependence. This may indicate that
single sinusoidal function. We observe a decrease in T2∗ the details of the nanowire growth and fabrication can
with decreasing qubit frequency f01 . We attribute this constrain T1 for some devices. We note that neither for
behavior to reduced EJ /Ec ratios at these lower frequen- Qubit A nor Qubit B the dependences align perfectly
cies, where the qubit is more sensitive to offset charge with the fixed quality factor lines, a deeper understand-
fluctuations. At f01 = 3.494 GHz, where the highest T1 ing of this would require a more elaborate modeling.
times are obtained, we are unable to measure T2∗ and T2E
due to short timescales. Below we discuss the various factors that may be af-
fecting coherence times. When it comes to the nanowires,
crystalline defects such as stacking faults may still be
present in InAs nanowires [43]. The angle of AlOx cap-
VI. DISCUSSION ping deposition is 60 ◦ away from the angle of Sn deposi-
tion leads to partial capping and to the oxidation of Sn.
A central question in this study is whether the longest The nanowire may land with Sn facing upwards so that
measured coherence times are determined by the mate- the Al patch touches Sn directly, or downwards - in which
5
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Appendix: Supporting Information and Additional Data for ”Transmon qubit using
Sn as a junction superconductor”
Amrita Purkayastha,1, ∗ Amritesh Sharma,1 Param J. Patel,1, 2 An-Hsi Chen,3 Connor P. Dempsey,4
Shreyas Asodekar,1 Subhayan Sinha,1 Maxime Tomasian,1, † Mihir Pendharkar,4, ‡ Christopher
J. Palmstrøm,4, 5, 6 Moı̈ra Hocevar,3 Kun Zuo,7, 8 Michael Hatridge,2 and Sergey M. Frolov∗1, §
1
Department of Physics and Astronomy, University of Pittsburgh, Pittsburgh, PA 15260, USA
2
Department of Applied Physics, Yale University, New Haven, CT 06511, USA
3
Univ. Grenoble Alpes, Grenoble INP, CNRS, Institut Néel, 38000 Grenoble, France
4
Department of Electrical and Computer Engineering,
University of California, Santa Barbara, CA 93106
5
California NanoSystems Institute, University of California Santa Barbara, Santa Barbara, CA 93106, USA
6
Materials Department, University of California Santa Barbara, Santa Barbara, CA 93106, USA
7
School of Physics, The University of Sydney, Sydney, NSW 2006, Australia
8
ARC Centre of Excellence for Engineered Quantum Systems,
School of Physics, The University of Sydney, Sydney, NSW 2006, Australia
(Dated: August 7, 2025)
InAs nanowires were grown using a gold-assisted vapor-liquid-solid (VLS) mechanism in a molecular beam epitaxy
(MBE) reactor. Gold nanoparticles were deposited on deoxidized InAs (001) substrates, which were thermally prepared
before initiating nanowire growth. The nanowires grow along the [111]B direction, resulting in inclined growth relative
to the substrate surface. On (001) substrates, this leads to nanowires extending in opposing in-plane directions,
producing natural crossing geometries. These geometries allow neighboring nanowires to shadow each other in later
processing steps, enabling selective deposition without the need for etching.
Following nanowire growth, tin shells were deposited at cryogenic temperatures (85 K) in an ultra-high vacuum
(UHV) environment. The native oxide on the nanowires was removed via atomic hydrogen cleaning prior to metal
deposition. A 15 nm thin Sn layer was then evaporated at a shallow angle relative to the substrate normal, allowing
in-situ shadowing to define semiconducting weak links for Josephson junctions. While the sample remained cryogenic,
a 3 nm AlOx capping layer was deposited at normal incidence via electron-beam evaporation. The AlOx coating
prevents Sn oxidation and de-wetting into granular structures; however, due to differing deposition angles, complete
conformal coverage of the Sn shell is not warranted. Samples were subsequently warmed to room temperature under
vacuum.
The nanowires so formed have diameters in the range 50-70 nm. Such etch free junctions can vary in length from
70-120 nm. It was found in transport studies that Sn induces a superconducting gap of order 600 µeV and switching
currents reaching values up to 500 nA. Further details can be found in [30]
The qubit devices are fabricated in multiple steps involving optical lithography and electron beam lithography.
A 120 nm NbTiN film is first sputtered onto a acid (Piranha+BOE) cleaned high resistivity (ρ > 5kΩcm) silicon
wafer at 600◦ C in AJA DC magnetron sputtering chamber. Then using optical lithography, the readout resonators,
transmission line, gate line and qubit capacitors are patterned and etched with ICP-RIE chlorine etching. Fine
markers with Ti/Au are defined with e-beam lithography in between the capacitor pads for positioning the Sn-InAs
nanowires with a micromanipulator needle. Once positioned, SEM images are taken to locate the break in the Sn shell
that defines the Josephson junction. Contacts to the Sn-InAs nanowires are designed using CAD and lithographically
∗ Current address: Materials Research Laboratory, University of ‡ Current address: Department of Materials Science and Engineer-
Illinois at Urbana-Champaign, Urbana, IL 61801
† ing, Stanford University, Stanford, CA 94305
Current address: Univ. Grenoble Alpes, Grenoble INP, CNRS, § frolovsm@[Link]
Institut Néel, 38000 Grenoble, France
9
defined using e-beam. The connection to the rest of the superconducting circuit is established with aluminum from
an e-beam evaporator after removing 3 nm of the capping AlOx layer with 80 seconds of 250V - 15mA in-situ Argon
milling. After that, the lift-off is done with acetone-IPA.
10MHz Reference
Clock
Trigger
Marker
20 dB
20 dB
20 dB
I1
S LO R S LO R
Pre-Amplifier
I I2
LO LO
I Q I Q
Qubit drive
Cavity drive
R R
30 dB
VNA
Attenuator
S
Voltage Bias DAC
1 K&L Low Pass
A Filter
5x Amp 2 Eccosorb
Filter
300K
3
Output Lines
Input Lines
C-124 Eccosorb
Gate Lines
4K Band Pass
H Filter
20 dB
DC Block
800mK
HEMT
H
Amplifier
100mK
20 dB
RT
A
Amplifier
2 3
Dual Junction
Isolator
2
20 dB
4 Signal Generator
2 2 S Splitter
LO
I Q IQ Mixer
R
Device
LO
I IR Mixer
Cu Octobox R
FIG. S1. Schematic of the measurement setup along with fridge wiring.
10
All measurements discussed in the paper are performed in an Oxford triton (DR200) dilution refrigerator with a
base temperature 20mK. The schematic of the measurement setup is given in Fig. S1. Inside the fridge the input
lines have a total attenuation of 60dB split into 20dB attenuations at different temperature stages as shown in the
schematic. Homemade eccosorb filter and low pass K&L filters are used at the lowest temperature stage before
the input signal is routed onto the device chip. The device chip resides in a copper PCB which is placed in an
copper octobox. The output line has eccosorb filters and dual junction isolator at the MC stage. Then the signal is
amplified with a HEMT amplifier at the 4K stage along with a room temperature microwave amplifier. The voltage
to bias the gates adjacent to the semiconducting weak link of the nanowire transmons was provided by DACs of a
TU Delft IVVI rack, amplified with a 5 V/V battery-driven amplifier. They are also low-pass filtered using Calmont
coaxial cables along with Mini-Circuits VLFX (cutoff 80MHz) and homemade copper tube filters (filled with CR124
eccosorb-cutoff 1GHz-2dB attenuation) at the MCX before arriving at the device chip. For single tone and two tone
measurements, a vector network analyzer (Keysight, E5071C) and a microwave signal generator (Keysight, N5813B)
are used. For the time domain measurements, the qubit control and readout tones are generated using SigCore5511A
and modulated by a gaussian envelope with an arbitrary waveform generator (AWG, Tektronix 5014C). The output
signals are demodulated and detected using AlazarTech ATS9870 digitizer with 1GS/s sampling rate.
To evaluate the relative contributions of NbTiN on high resistivity silicon and the nanowire Josephson junction
to qubit energy loss, we measure the quality factors of readout resonators fabricated under identical conditions but
without the nanowire qubits. We extract the Qi of these λ/4 resonators at single photon levels by functional fits of
the transmission data to the following complex transmission coefficient [46–48]
where a accounts for the net attenuation in the fridge lines, α is the global phase shift, τ is the electric delay,
fr is the resonant frequency and Qc = |Qc |e−iϕ is the complex coupling quality factor with ϕ which describes the
asymmetry in response due to impedance mismatches
′
between the transmission line ports. The real valued Ql is the
loaded quality factor Q1l = Q1i + Q1′ where 1/Qc = cos ϕ
|Qc | Fig.S2 shows the plot of the fitted internal quality factors. We
.
c
find that Qi increases with the input power. This behavior is explained by a power-dependent saturation effect[49],
indicating that the primary source of loss in the resonators is due to surface two-level systems in Si-NbTiN.
FIG. S2. Power dependence of internal quality factor Qi for eight measured resonators with different resonant frequency fr . All
the resonators show power dependence, with Qi improving as photon number increases. This indicates Qi limited by two-level
systems at low photon numbers.
11
(a) (b)
FIG. S3. (a) S21 as a function of fd and Vg at low drive power near low qubit frequencies. The linewidth of S21 dips could
be seen broadening as the qubit frequency decreases with Vg . (b) At high drive power, the f02 /2 dip broadens and splits at
certain gate voltages. A possible explanation is charge dispersion at these low qubit frequencies where EJ /Ec ∼ 15. At around
Vg =0.995 V, a state anti-crosses with the qubit at f01 which is a TLS state where we also see a drop in T1
(a) (b)
FIG. S4. (a) Rabi oscillations showing an asymmetric chevron pattern around f01 = 3.481 GHz. (b) Repeated T1 measurement
over time for f01 = 3.481 GHz showing an average T1 = 23.6 ± 0.5 µs. The error bars in (b) represent the standard deviations
of the T1 curve fit.
12
Qubit B is another device measured along side Qubit A presented in the main text. Both were designed to have
the same parameters except the readout resonator frequency and went through the same fabrication process.
A. Spectroscopic measurements
(a) (b)
FIG. S5. (a) Variation of resonator frequency fr with gate voltage Vg . Vacuum Rabi splittings due to qubit-resonator
hybridization in gate range 1.8 V < Vg < 3.2 V. (b) Variation of f01 as a function of Vg showing a tunability of ∼ 2 GHz within
a gate range of 0.5 V.
13
(a) (b)
T1 =4.2 μs
(c) (d)
FIG. S6. (a) Rabi oscillations as a function of drive frequency and pulse duration. (b) Decay curve fit to an exponential at
f01 = 4.210 GHz, yielding T1 = 4.2 ± 0.2 µs. (c) T1 as a function of f01 for two different gate sweeps. (d) T2∗ and T2E as a
function of f01 for GateSweep1.