EE - Lab - II Study Note With Choice Question
EE - Lab - II Study Note With Choice Question
DEBRETABOR UNIVERSITY
Gafat institute of Technology
ELECTRICAL ENGINEERING
LABORATORY II
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May 16, 2026 [EE Lab II (ECEg2072) ]
1.2 Apparatus
[Link] Apparatus Type Range Qty
01 PN Junction Diode 1N4007 — 01
02 Resistance Carbon 470 Ω, 1 KΩ 01 each
03 Regulated Power Supply DC 0–30 V 01
04 Ammeter MC 0–100 mA, 0–100 μA 01 each
05 Voltmeter MC 0–2 V, 0–30 V 01 each
06 Breadboard and Wires — — As reqd
1.3 Theory
1.3.1 The P-N Junction
A semiconductor diode is formed by joining an N-type material (majority carrier: electrons) to a P-type
material (majority carrier: holes). At equilibrium a depletion region forms at the junction, creating a built-in
potential barrier (~0.7 V for Si, ~0.3 V for Ge).
Equation variables
I = diode current
I₀ = reverse saturation current
V = voltage across diode
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1.3.5 Si vs Ge comparison
Silicon vs Germanium
Property | Silicon (Si) | Germanium (Ge)
Cut-in voltage | 0.6 – 0.7 V | 0.2 – 0.3 V
Reverse sat. curr. | nanoamperes | microamperes (larger)
Temp. tolerance | Higher (≤200°C)| Lower (≤75 °C)
Practical use | Very common | Specialised RF/detector
1.5 Procedure
Forward Bias
4. Connect circuit. Vary VS from 0 V in steps of 0.1 V.
5. Record VF (voltmeter across diode) and IF (ammeter).
6. Stop before exceeding max diode current (1 A for 1N4007).
7. Plot IF (Y-axis) vs VF (X-axis).
Reverse Bias
8. Reconnect for reverse bias. Vary VS from 0 V in steps of 1 V.
9. Record VR and IR (μA).
10. Plot IR (Y-axis, negative) vs VR (X-axis, negative).
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Approximate formula (useful for quick estimate): r_d ≈ η·VT / I_DC →r_d ≈ 52 / IC(mA) Ω for Si at room
temp.
1.7 Precautions
11. Never exceed diode ratings (1N4007: IF(max)=1 A, PIV=1000 V, PD=3 W).
12. Connect ammeter and voltmeter with correct polarities.
13. Do NOT power the circuit until all connections are verified.
14. The 470 Ω/1 KΩ series resistor MUST be present to limit current.
15. Vary supply voltage slowly in the forward region near cut-in voltage.
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AC signal superimposed on the DC bias. It is more meaningful for circuit analysis because amplifiers and
AC circuits depend on how the device responds to signal changes, not just to DC. Approximate formula:
r_d = η·VT / I_Q ≈ 26/I_Q(mA) Ω for Ge, 52/I_Q(mA) Ω for Si.
Q: What is the V-I characteristics equation?
The V-I characteristic of a P-N junction diode is the Shockley equation: I = I₀(e^(V/ηVT) − 1). Here I₀ is
the reverse saturation current, V is the applied diode voltage (positive for forward, negative for reverse), η
is the ideality factor (1 for Ge, 2 for Si), and VT = kT/q is the thermal voltage (≈ 26 mV at 300 K). For
forward bias with V >> VT: I ≈ I₀ · e^(V/ηVT) — exponential increase. For reverse bias with |V| >> VT: I
≈ −I₀ — constant small current. The equation explains the asymmetric, non-linear current-voltage
relationship of the diode.
Q: Define potential barrier.
The potential barrier (built-in potential or contact potential V₀) is the electrostatic voltage difference that
develops spontaneously at a P-N junction in equilibrium — with no external bias applied. It forms because
electrons diffuse from N to P and holes from P to N, leaving behind fixed ionised donor (+) atoms on the
N-side and acceptor (−) atoms on the P-side. This creates a depletion region with an internal electric field
that opposes further diffusion, establishing equilibrium. Typical values: Si ≈ 0.6–0.8 V, Ge ≈ 0.2–0.4 V.
External forward bias reduces this barrier; reverse bias increases it.
Q: Define doping.
Doping is the controlled introduction of specific impurity atoms (dopants) into an intrinsic semiconductor
to modify its electrical conductivity. N-type doping: donor atoms (e.g., Phosphorus P, Arsenic As,
Antimony Sb in Si) each contribute one extra free electron, making electrons the majority carriers. P-type
doping: acceptor atoms (e.g., Boron B, Aluminium Al, Gallium Ga in Si) each accept one electron creating
a hole, making holes the majority carriers. The dopant concentration (atoms per cm³) determines
conductivity. Typical doping densities: 10¹⁴ to 10¹⁸ atoms/cm³ (compared to Si atom density ~5×10²²
atoms/cm³).
Q: What is the effect of temperature on I₀?
Temperature has a very strong effect on the reverse saturation current I₀. As temperature increases, more
covalent bonds break (higher thermal energy), producing more electron-hole pairs. These extra minority
carriers increase I₀. The empirical rule: I₀ approximately DOUBLES for every 10 °C rise in temperature
(valid for both Si and Ge). Mathematically: I₀(T₂) = I₀(T₁) × 2^((T₂−T₁)/10). This also means the forward
V-I characteristic shifts: for the same current the forward voltage decreases by ~2 mV/°C for Si. At high
temperatures, increased I₀ can cause thermal runaway in some circuits.
Q: Define a Q-point.
The Q-point (Quiescent Operating Point) is the DC operating point of a device — the pair of values (V_Q,
I_Q) at which the device is biased in the absence of any AC signal. On a V-I characteristic curve, the Q-
point is the intersection of the load line (determined by the supply voltage and series resistor) with the
device characteristic. The Q-point determines the static resistance, dynamic resistance, and the range over
which the device can amplify without distortion. For a diode, the Q-point is typically chosen in the forward
conduction region at a desired operating current.
Q: Explain how the diode can act as a capacitor.
A reverse-biased P-N junction acts as a voltage-controlled capacitor (varactor or varicap). The depletion
region — which is depleted of free carriers — acts as a dielectric insulator, while the P and N bulk
semiconductor regions on either side act as the two conducting 'plates'. As reverse voltage increases, the
depletion region widens → effective plate separation increases → capacitance DECREASES. Formula for
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1 What is the approximate cut-in voltage C) 0.7 V Si has a cut-in voltage ≈ 0.6–0.7 V. Ge is 0.2–0.3 V.
of a Silicon PN junction diode? This arises from the bandgap energy of Si (1.12 eV)
A) 0.1 V which sets the built-in potential of the junction.
B) 0.3 V
C) 0.7 V
D) 1.1 V
2 In forward bias the potential barrier at C) Lowered Forward bias reduces the potential barrier by the
the PN junction is: applied voltage, allowing majority carriers to diffuse
A) Increased across. The barrier is lowered, not eliminated —
some barrier always remains in equilibrium.
B) Completely removed
C) Lowered
D) Unchanged
3 Which has a LARGER reverse B) Ge has a smaller bandgap (0.67 eV vs 1.12 eV for
saturation current? Germanium Si), so more electron-hole pairs are thermally
A) Silicon generated. I₀(Ge) is in μA; I₀(Si) is in nA — roughly
1000× difference.
B) Germanium
C) Both equal
D) Zener diode
4 In the Shockley equation I = C) 2 For Si, η = 2. For Ge, η = 1. The ideality factor
I₀(e^(V/ηVT)−1), the ideality factor η accounts for carrier recombination in the depletion
for Silicon is: region, which is more significant in Si than in Ge.
A) 0.5
B) 1
C) 2
D) 4
5 The thermal voltage VT at room C) 26 mV VT = kT/q = T/11 600 = 300/11 600 ≈ 26 mV at 300
temperature (300 K) is approximately: K. It appears in the diode equation and sets the
A) 0.7 V 'sharpness' of the turn-on characteristic.
B) 260 mV
C) 26 mV
D) 2.6 mV
6 As reverse voltage increases, the C) Widens Reverse bias sweeps majority carriers away from the
depletion region: junction, exposing more fixed ions and widening the
A) Narrows depletion region. A wider depletion region = higher
potential barrier = better blocking.
B) Stays the same
C) Widens
D) Disappears
7 Static (DC) forward resistance at the B) R_DC = Static resistance is the simple DC ratio at the
Q-point is: VF / IF operating point: R_DC = VF/IF. Dynamic resistance
A) R_DC = IF / VF (rd = ΔVF/ΔIF) is the slope of the curve. They are
different quantities.
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B) R_DC = VF / IF
C) R_DC = ΔVF / ΔIF
D) R_DC = 1/gm
8 Why is the 470 Ω series resistor used in B) To limit Without the 470 Ω resistor, the diode current would
the forward bias circuit? current be limited only by the very low forward resistance of
A) To increase diode voltage through the the conducting diode, potentially exceeding its rating
diode and destroying it. The series resistor limits I to a safe
B) To limit current through the diode
value.
C) To improve ammeter sensitivity
D) To block reverse current
9 The reverse saturation current I₀ with C) Doubles I₀ approximately doubles for every 10 °C rise,
rising temperature: every ~10 because thermal energy breaks more covalent bonds,
A) Decreases °C generating more minority carriers. This is a critical
consideration in high-temperature electronics.
B) Stays constant
C) Doubles every ~10 °C
D) Halves every ~10 °C
10 Dynamic resistance r_d at Q-point is B) The slope r_d = ΔVd/ΔId is found from the slope of the tangent
found from: of the to the V-I curve at the Q-point. It represents the
A) A single point (VF, IF) tangent at Q incremental resistance seen by a small AC signal and
is used in small-signal equivalent circuit analysis.
B) The slope of the tangent at Q
C) The ratio VF/IF
D) The x-axis intercept
11 The approximate dynamic resistance B) r_d = r_d = η·VT/ID = 2×26mV/ID = 52mV/ID(mA) Ω for
formula for Si at room temperature is: 52/ID(mA) Si (η=2). For Ge (η=1): r_d = 26/ID(mA). So at 10
A) r_d = 26/ID(mA) mA Si bias: r_d = 52/10 = 5.2 Ω.
B) r_d = 52/ID(mA)
C) r_d = 0.7/ID(mA)
D) r_d = 100/ID(mA)
12 Which 1N4007 diode parameter C) PIV PIV (also PRV — Peak Reverse Voltage) specifies
determines maximum safe reverse (Peak the maximum reverse voltage the diode can
voltage? Inverse withstand without breakdown. 1N4007 PIV = 1000
Voltage) V. Exceeding this causes avalanche breakdown and
A) IF(max)
possible destruction.
B) PD(max)
C) PIV (Peak Inverse Voltage)
D) Cut-in voltage
13 A diode acting as a capacitor uses the C) The depletion region is depleted of free carriers and
_______ region as the dielectric. Depletion acts as an insulating dielectric between the
A) P-type bulk region region conducting P and N bulk regions (which act as
capacitor plates). Wider depletion (more reverse
B) N-type bulk region
bias) = lower capacitance.
C) Depletion region
D) Metallurgical junction
15 On the V-I graph, the Q-point is the B) The load The Q-point is determined by the intersection of the
intersection of the device characteristic line device's V-I characteristic curve with the LOAD
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2.2 Apparatus
[Link] Apparatus Type Range Qty
01 Zener Diode IMZ 5.1 V — 01
02 Resistance Carbon 470 Ω 01
03 Regulated Power Supply DC 0–30 V 01
04 Ammeter MC 0–100 mA 02
05 Voltmeter MC 0–10 V 01
06 Decade Resistance Box DRB 0–10 KΩ 01
07 Breadboard and Wires — — As reqd
2.3 Theory
2.3.1 Zener Diode
A Zener diode is a heavily-doped P-N junction diode designed to operate reliably in the reverse breakdown
region. Forward biased, it behaves like an ordinary diode. Reverse biased, it blocks until the reverse voltage
reaches VZ (Zener voltage), at which point it conducts heavily while maintaining an approximately
CONSTANT voltage VZ. This property is exploited for voltage regulation.
2.4 Procedure
V-I Characteristics (Reverse Bias)
19. Connect Zener in reverse bias (anode to −ve, cathode to +ve through 470 Ω and ammeter).
20. Vary supply in steps of 1 V; record VR and IR at each step.
21. Observe sharp increase in IR at breakdown — that voltage is VZ.
22. Plot IR (downward, −ve direction) vs VR (leftward, −ve direction).
Load Regulation
23. Set input to a voltage above VZ (confirmed from Step 1).
24. Open RL; measure VNL.
25. Connect DRB; vary RL from 1100 Ω to 100 Ω (steps of 100 Ω). Record IZ and VL.
26. Calculate % Regulation = [(VNL−VL)/VL]×100% for each RL.
2.5 Precautions
27. Never exceed power rating of Zener (PZ = VZ × IZ(max)). For IMZ 5.1V check datasheet.
28. Keep input voltage above VZ to ensure regulation; avoid excessive input that may overdrive.
29. Series resistor RS = 470 Ω MUST be present — it limits current through the Zener.
30. Electrolytic capacitors (if used) must be connected with correct polarity.
ZENER BREAKDOWN: Occurs in heavily doped junctions (narrow depletion region). Mechanism:
quantum-mechanical band-to-band tunnelling of electrons directly through the narrow energy barrier under
intense electric field. Occurs at VZ < ~6 V for Si. Has NEGATIVE temperature coefficient: as temperature
rises, VZ decreases (higher carrier energy makes tunnelling easier). Breakdown is relatively gradual (soft).
AVALANCHE BREAKDOWN: Occurs in lightly doped junctions (wide depletion region). Mechanism:
impact ionisation — thermally-generated carriers are accelerated by the field to high energies, collide with
lattice atoms, break covalent bonds, generating new carriers, which generate more, etc. (chain reaction).
Occurs at VZ > ~6 V for Si. Has POSITIVE temperature coefficient: as temperature rises, VZ increases
(more lattice collisions reduce carrier mean free path, requiring higher field for ionisation). Breakdown is
abrupt. At VZ ≈ 6 V for Si, both mechanisms coexist and their temperature coefficients cancel — excellent
temperature stability near 6 V.
Q: What is the difference between a Zener diode and an ordinary diode?
ORDINARY P-N JUNCTION DIODE: • Designed for forward bias operation only. • Reverse breakdown
is a destructive failure mode — the high reverse current can destroy the device. • No useful operation in
reverse breakdown region. • Forward voltage drop ≈ 0.6–0.7 V (Si). ZENER DIODE: • Designed to
operate in the REVERSE BREAKDOWN region. • Heavily doped to achieve a precise, well-defined
breakdown voltage VZ. • Breakdown is non-destructive as long as power dissipation (VZ × IZ) stays
within rated PD. • Maintains nearly constant VZ across terminals over a wide range of reverse currents —
used as voltage reference and regulator. • Forward operation: same as ordinary diode (cut-in ≈ 0.7 V for Si
Zener). • Zener diodes are specified by VZ, IZ(max), PD(max), temperature coefficient (TC), and Zener
impedance ZZ.
Q: Draw the equivalent circuit for a Zener diode.
In the breakdown region, the ideal Zener diode is modelled as a battery of voltage VZ in series with a small
resistance ZZ (Zener impedance): Anode ──[ZZ]──[Battery VZ]── Cathode The battery models the
nearly-constant voltage VZ. ZZ (typically a few ohms) models the slight slope in the breakdown V-I curve
(small increase in VZ with increasing IZ). For an ideal Zener: ZZ = 0 and VZ is perfectly constant. For a
practical Zener the slope in the breakdown region means ZZ = ΔVZR / ΔIZR where ΔVZR and ΔIZR are
small changes about the operating point. In forward bias, the equivalent circuit is the same as an ordinary
diode: a 0.7 V battery in series with small forward resistance rf.
Q: What is the Breakdown Voltage?
The breakdown voltage (VZ or VBR) is the specific reverse voltage at which a Zener diode transitions
from blocking to conducting, with a sharp increase in reverse current while the voltage remains
approximately constant. For the IMZ 5.1V used in this experiment, VZ ≈ 5.1 V. At and above VZ, small
increases in reverse voltage produce large increases in reverse current — the Zener 'clamps' the voltage at
VZ. The exact value of VZ is set during manufacture by controlling the doping concentration. Zener
voltages range from ~1.8 V to several hundred volts. The device is safe as long as IZ stays below IZ(max)
= PD / VZ.
Q: What are the applications of a Zener diode?
1. VOLTAGE REGULATOR (primary application): Maintains constant DC output voltage despite input or
load variations. 2. VOLTAGE REFERENCE: Provides a stable, precise voltage reference in ADCs, DACs,
and measurement instruments. 3. OVERVOLTAGE PROTECTION: Placed across sensitive components
to clamp voltage at VZ during transients and surges. 4. WAVEFORM CLIPPER/LIMITER: Two back-to-
back Zeners clip a signal at ±(VZ + 0.7) V — used in limiters and waveshaping circuits. 5. METER
PROTECTION: Protects delicate galvanometers and sensors from voltage surges. 6. LEVEL SHIFTER:
Shifts DC level of a signal by VZ. 7. SWITCHING REGULATOR: Provides reference voltage in switch-
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1 A Zener diode is specifically C) Reverse breakdown Unlike ordinary diodes, Zener diodes are
designed to operate in: region manufactured to operate in the reverse
A) Forward active region breakdown region, maintaining a nearly
constant voltage VZ. This is non-destructive
B) Forward bias only
if the power rating (VZ × IZ) is not
C) Reverse breakdown region exceeded.
D) Cut-off region
4 In a Zener shunt regulator the B) Reverse bias, The Zener is reverse biased (cathode to +ve)
Zener diode is connected in: parallel with load and connected in parallel (shunt) with the
A) Forward bias, series with load load RL. This ensures VL = VZ (the Zener
clamps the output voltage). A series resistor
B) Reverse bias, parallel with load
RS absorbs input voltage variations.
C) Forward bias, parallel with load
D) Reverse bias, series with load
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6 The IMZ 5.1V Zener diode has a B) 5.1 V The part number 'IMZ 5.1V' directly states
nominal breakdown voltage of: the Zener voltage VZ = 5.1 V. The Zener
A) 3.3 V maintains approximately 5.1 V across itself
when reverse voltage reaches this value,
B) 5.1 V
regardless of the current (within limits).
C) 6.2 V
D) 12 V
8 At a Zener voltage of C) Near zero (both At ~6 V for Si both Zener (tunnelling, −ve
approximately 6 V for Si, the mechanisms coexist) TC) and Avalanche (impact ionisation, +ve
temperature coefficient is: TC) mechanisms coexist simultaneously.
Their temperature coefficients nearly cancel,
A) Strongly positive
producing near-zero overall TC — excellent
B) Strongly negative
temperature stability, ideal for precision
C) Near zero (both mechanisms coexist) voltage references.
D) Infinite
9 The function of the series resistor B) To limit current and RS limits the current through the Zener diode
RS in a Zener regulator is: drop the excess voltage (preventing thermal destruction) and absorbs
A) To increase Zener current the voltage difference between Vin and VZ.
Without RS, the Zenerwould be directly
B) To limit current and drop the excess
connected to the supply and could easily be
voltage
destroyed by excessive current.
C) To filter ripple
D) To set Zener breakdown voltage
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May 16, 2026 [EE Lab II (ECEg2072) ]
3.2 Apparatus
[Link] Apparatus Type Range Qty
01 LED Standard — 01
02 Resistance Carbon 470 Ω 01
03 Regulated Power Supply DC 0–30 V 01
04 Ammeter MC 0–100 mA 01
05 Voltmeter MC 0–10 V 01
06 Breadboard and Wires — — As reqd
3.3 Theory
3.3.1 Structure and Materials
An LED is a P-N junction diode made from compound III-V semiconductors (elements from groups III and V
of the periodic table) that have DIRECT energy bandgaps. Direct bandgap materials allow efficient radiative
recombination (photon emission). Examples:
• GaAs (Gallium Arsenide): infrared, ~880 nm
• GaAsP (Gallium Arsenide Phosphide): red/yellow, ~620–590 nm
• GaP (Gallium Phosphide): green/red, ~560 nm
• GaN (Gallium Nitride): blue/UV, ~470 nm
• InGaN (Indium Gallium Nitride): green, blue, white, ~520–450 nm
Silicon and Germanium have INDIRECT bandgaps — recombination energy is released as heat (phonons),
not light. Hence Si/Ge cannot be used for LEDs.
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3.4 Procedure
33. Identify LED anode (longer lead) and cathode (shorter lead / flat side).
34. Connect anode to +ve supply through 470 Ω and ammeter; cathode to −ve supply. Voltmeter across
LED.
35. Increase supply voltage in 0.1 V steps from 0 V; record VLED and ILED.
36. Note the voltage at which LED starts to visibly glow — this is approximately Vγ.
37. Stop at rated maximum current (typically 20 mA for standard LEDs).
38. Plot ILED (Y) vs VLED (X). The curve is similar to a PN junction but shifted to higher Vγ.
39. Do NOT test in reverse bias — LEDs have very low PIV rating (~5 V typically).
3.5 Precautions
40. Never exceed maximum forward current (check datasheet; typically 20–30 mA).
41. Never apply reverse voltage exceeding LED's PIV rating (~5 V) — LEDs have very low reverse
breakdown voltage.
42. The 470 Ω series resistor is MANDATORY — without it the LED will burn out immediately.
43. Identify anode and cathode correctly before connecting.
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Light emission requires ELECTRON-HOLE RECOMBINATION at the junction. This only happens in
forward bias because: • In FORWARD BIAS: the potential barrier is reduced, allowing majority electrons
from N-side and majority holes from P-side to diffuse across the junction and meet — recombination
occurs — photon emitted. • In REVERSE BIAS: the potential barrier increases and majority carriers are
swept AWAY from the junction. There is no recombination near the junction, hence no photon emission.
Only a tiny reverse saturation current (due to minority carriers) flows — insufficient for observable light.
Q: Why is the cut-in voltage of an LED higher than that of a Si diode?
The cut-in voltage of an LED ≈ Eg/q (bandgap energy divided by electron charge). A photon of visible
light has energy 1.8–3.5 eV depending on colour. To produce that photon, the electron transitioning from
conduction band to valence band must release that much energy — which requires the forward voltage to
provide at least that energy. Si has Eg ≈ 1.12 eV but only needs ~0.7 V to conduct (the forward voltage is
lower than Eg because of the equilibrium built-in potential). Si is also indirect-bandgap so recombination
releases heat, not light. A red LED (GaAsP, Eg ≈ 1.9 eV) needs Vγ ≈ 1.8–2.2 V; a blue LED (GaN, Eg ≈
3.0 eV) needs Vγ ≈ 3.0–3.5 V. The higher the photon energy (shorter wavelength), the higher the required
forward voltage.
Q: What materials are used for different coloured LEDs?
Red/Infrared: GaAs (IR ~880 nm), GaAsP (~660 nm red). Yellow: GaAsP (~590 nm). Green: GaP (~565
nm), InGaN (~520 nm). Blue: GaN (~470 nm), InGaN (~460 nm). UV: GaN/AlGaN (~380 nm and below).
White: InGaN blue LED + yellow phosphor (YAG phosphor converts some blue to yellow; mix appears
white) — most common white LED structure. The compound composition (especially the alloy fraction,
e.g., GaAs₁₋ₓPₓ) fine-tunes the bandgap and hence the emission wavelength.
Q: What is electroluminescence?
Electroluminescence (EL) is the phenomenon in which a material emits light in response to an electric
current or electric field applied to it — without significant heat generation (unlike incandescence). In a
semiconductor LED, electroluminescence occurs at the P-N junction when electrons and holes are injected
(via forward bias) and recombine, releasing photons. This is specifically called INJECTION
ELECTROLUMINESCENCE. The process is highly efficient in direct bandgap semiconductors. Other
forms of EL exist (e.g., powder EL, thin-film EL used in displays), but LEDs are the most practical
implementation.
1 What type of semiconductor C) III-V compound LEDs need DIRECT BANDGAP materials for
material is used to make LEDs? semiconductors efficient photon emission. III-V compound
A) Silicon (Si) semiconductors (GaAs, GaN, InGaN, GaAsP)
have direct bandgaps. Si and Ge have indirect
B) Germanium (Ge)
bandgaps — recombination energy is released
C) III-V compound semiconductors as heat, not light.
(GaAs, GaN etc.)
D) Carbon
2 The colour of LED light is C) Bandgap energy λ = hc/Eg. Higher bandgap (e.g., GaN Eg≈3.0
determined by: of the eV) → shorter wavelength → blue. Lower
A) Forward current magnitude semiconductor bandgap (e.g., GaAs Eg≈1.42 eV) → longer
material wavelength → infrared. The bandgap is fixed by
B) Supply voltage
the material/alloy composition.
C) Bandgap energy of the
semiconductor material
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D) Size of LED
3 Typical forward voltage of a red C) 1.8–2.2 V Red LEDs (GaAsP, Eg≈1.8–2.1 eV) have
LED is approximately: forward voltage ≈ 1.8–2.2 V. Blue LEDs (GaN)
A) 0.3 V need ≈ 3.0–3.5 V. All LEDs require higher
forward voltage than Si diodes (0.7 V) because
B) 0.7 V
they must supply enough energy to produce
C) 1.8–2.2 V photons.
D) 5.0 V
4 Under reverse bias, an LED: C) Does not emit Reverse bias moves majority carriers away from
A) Emits brighter light any light junction → no recombination → no photon
emission. Additionally, LEDs have very low
B) Emits infrared
reverse breakdown voltage (~5 V), so excessive
C) Does not emit any light
reverse bias can damage the LED.
D) Acts as a Zener diode
6 Why can Silicon NOT be used to B) Silicon has an In indirect bandgap materials (Si, Ge), the
make LEDs? indirect bandgap — conduction band minimum and valence band
A) Silicon bandgap is too large recombination maximum occur at different crystal momenta.
releases heat not Electron-hole recombination must involve a
B) Silicon has an indirect bandgap —
light phonon (lattice vibration) to conserve
recombination releases heat not light
momentum. This makes radiative recombination
C) Silicon is too expensive very unlikely — energy is mostly released as
D) Silicon cannot be doped heat. Direct bandgap materials (GaAs, GaN)
allow direct radiative recombination.
7 Which LED colour requires the D) Blue/Violet Higher energy photons (shorter wavelength)
HIGHEST forward voltage? require higher bandgap materials → higher
A) Infrared forward voltage. Blue (GaN, Eg≈3.0 eV) needs
~3.0–3.5 V. Red (GaAsP, Eg≈1.9 eV) needs
B) Red
~1.8–2.2 V. Infrared (GaAs) needs ~1.2 V.
C) Green
D) Blue/Violet
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4.2 Apparatus
[Link] Apparatus Type Range Qty
01 Step-Down Transformer Single Phase 230 V/12 V, 50 Hz 01
02 Diode 1N4007 PIV=1000 V, IF=1 A 01
03 Decade Resistance Box DRB 10–1000 Ω 01
04 Electrolytic Capacitor Filter 1000 μF/25 V 01
05 Digital Multimeter (DMM) AC/DC 0–20 V 01
06 CRO with Probes Dual Trace — 01
07 Breadboard and Wires — — As reqd
4.3 Theory
4.3.1 Rectifier — Definition
A rectifier converts AC (alternating current) into pulsating DC (unidirectional current). It exploits the one-
directional conductivity of a diode. A half-wave rectifier uses ONE diode and passes only ONE half (either
positive or negative) of the AC cycle to the load.
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4.4 Procedure
Without Filter
47. Connect HWR circuit (no capacitor). Note VNL before connecting load.
48. Vary RL from 1100 Ω to 100 Ω (steps of 100 Ω). Record VL and calculate % Regulation.
49. Measure Vac and Vdc at output using DMM; compute γ = Vac/Vdc.
50. Observe output on CRO; sketch waveform and note Vm and T.
With Filter
51. Add 1000 μF/25 V capacitor in parallel with RL. Ensure correct polarity (+ve to +ve node).
52. Measure Vac and Vdc at output. Compute γ = Vac/Vdc.
53. Observe waveform on CRO; compare with unfiltered output.
4.5 Precautions
54. Identify primary (230 V) and secondary (12 V) sides of transformer correctly.
55. Identify anode (A) and cathode (K) of 1N4007 diode correctly.
56. Connect electrolytic capacitor with correct polarity (+ve terminal to +ve node).
57. Ensure transformer secondary voltage rating matches capacitor voltage rating.
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A filter is a circuit element (or network) used after a rectifier to smooth the pulsating DC output into a
steady DC level by removing (filtering out) the AC ripple components. The most common filter for
rectifiers is a CAPACITOR FILTER: a large electrolytic capacitor placed in parallel with the load. The
capacitor charges during the voltage peaks and discharges through the load between peaks, filling in the
'gaps' and maintaining a nearly constant output voltage. Other filter types include inductor (choke) filters
(series with load), LC filters (inductor + capacitor), and π-filters (capacitor-inductor-capacitor). The larger
the filter capacitor and load resistance, the less the ripple.
Q: Define Ripple Factor.
The ripple factor (γ) quantifies the AC ripple remaining in the rectified DC output. It is defined as: γ = Vac
/ Vdc = √[(Vrms/Vdc)² − 1] where Vac is the RMS value of the AC ripple component, and Vdc is the
average DC output. A LOWER γ = less ripple = better DC quality. For half-wave rectifier: γ = 1.21 (the
AC ripple is 121% of the DC output — very poor) For full-wave rectifier: γ = 0.482 (better) With capacitor
filter (HWR, C=1000μF, RL=1KΩ, f=50Hz): γ = 1/(2√3×50×10⁻³×10³) ≈ 0.006 (excellent)
Q: What is Peak Inverse Voltage (PIV)?
The Peak Inverse Voltage (PIV), also called Peak Reverse Voltage (PRV), is the maximum reverse voltage
that appears across a rectifier diode when it is NOT conducting. It determines the minimum voltage rating
the diode must have to avoid reverse breakdown. For HWR: PIV = Vm (peak secondary voltage) For
Center-Tap FWR: PIV = 2Vm (the non-conducting diode sees the full secondary voltage) For Bridge
FWR: PIV = Vm (lowest PIV requirement per diode) For a 12 V secondary: Vm = 12×√2 ≈ 17 V. The
1N4007 (PIV = 1000 V) is far more than sufficient for all these configurations. PIV rating must never be
exceeded or the diode breaks down.
Q: How does a capacitor act as a filter?
A capacitor filter exploits the capacitor's ability to store charge and release it gradually. In a half-wave
rectifier:
1. CHARGING PHASE: When the rectified output rises toward Vm (during diode conduction), the
capacitor charges rapidly toward Vm through the low diode resistance.
2. DISCHARGING PHASE: After the peak, the rectified voltage falls. The diode becomes reverse biased
(capacitor voltage > diode output). The capacitor now DISCHARGES slowly through RL with time
constant τ = RL×C, maintaining the output voltage.
3. RECHARGING: At the next positive peak the diode conducts again and recharges the capacitor to Vm.
The voltage sags slightly during discharge (ripple voltage Vr). A larger C or RL means slower discharge
and smaller Vr. The ripple factor = 1/(2√3·f·C·RL) for HWR with filter.
Q: Define percentage voltage regulation.
Percentage voltage regulation measures how much the output DC voltage changes between no-load and
full-load conditions: % Regulation = [(VNL − VFL)/VFL] × 100% VNL = No-Load voltage (output when
no load is connected, RL = ∞) VFL = Full-Load voltage (output at minimum RL = maximum load current)
An IDEAL regulator has 0% regulation (output unchanged regardless of load). A practical HWR without
filter has poor regulation (high %) because the output voltage drops significantly under load due to the
diode resistance and transformer impedance. With a capacitor filter, regulation improves because the
capacitor acts as a local energy reservoir maintaining output voltage.
Q: What are the applications of rectifiers?
Rectifiers are used in virtually every electronic system:
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2 The average (DC) output of a half- B) Vm/π Vdc = (1/2π)∫₀^π Vm sin(θ) dθ = Vm/π ≈ 0.318 Vm.
wave rectifier is: Only one half cycle contributes, so the average is
A) Vm/2π Vm/π, not 2Vm/π (which is for full-wave).
B) Vm/π
C) 2Vm/π
D) Vm/√2
3 The output frequency of a half-wave B) 50 Hz HWR passes only ONE half cycle per input cycle. So
rectifier fed by a 50 Hz supply is: the output has one pulse per input period — same
A) 25 Hz frequency as the input (50 Hz). Full-wave gives 100
Hz (two pulses per cycle).
B) 50 Hz
C) 100 Hz
D) 200 Hz
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C) 0.006
D) 0.29
5 The PIV rating of the diode in a half- B) Vm In HWR, the non-conducting diode sees the full peak
wave rectifier must be at least: secondary voltage in reverse: PIV = Vm. For a 12V
A) Vm/2 secondary: Vm = 12√2 ≈ 17 V. The 1N4007
(PIV=1000V) is far more than sufficient.
B) Vm
C) 2Vm
D) √2·Vm
7 The purpose of the electrolytic B) Store The capacitor charges to peak voltage during
capacitor in the HWR filter circuit is and release conduction and discharges slowly through RL
to: energy to between peaks, filling in the voltage troughs and
smooth the reducing ripple. The bigger C and RL, the better the
A) Block DC from reaching the load
output smoothing (smaller ripple).
B) Store and release energy to smooth the
output
C) Increase the output frequency
D) Protect the diode from PIV
8 Which has BETTER voltage regulation B) With With a filter capacitor, the output stays close to Vm
— HWR with filter or without filter? filter even under load (capacitor acts as a local charge
A) Without filter reservoir). Without filter, the output drops
significantly under load (VFL << VNL). So %
B) With filter
regulation is lower (better) with filter.
C) Both are equal
D) Depends on frequency
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5.2 Apparatus
[Link] Apparatus Type Range Qty
01 Center-Tapped Transformer Single Phase 230 V/(12-0-12) V, 50 Hz 01
02 Diode 1N4007 PIV=1000 V, IF=1 A 02
03 Load Resistance Carbon 1 KΩ 01
04 Electrolytic Capacitor Filter 1000 μF/25 V 01
05 Digital Multimeter AC/DC 0–20 V 01
06 CRO with Probes Dual Trace — 01
07 Breadboard and Wires — — As reqd
5.3 Theory
5.3.1 Full-Wave Center-Tap Rectifier
Uses TWO diodes (D1, D2) and a center-tapped transformer (12-0-12 V). The center tap is the common
reference (neutral). D1 connects to the top of the secondary; D2 to the bottom.
POSITIVE HALF CYCLE: Top of secondary is positive → D1 forward biased (conducts), D2 reverse biased.
Current flows: Top → D1 → RL → Center tap.
NEGATIVE HALF CYCLE: Bottom of secondary is positive → D2 forward biased (conducts), D1 reverse
biased. Current flows: Bottom → D2 → RL → Center tap.
Both half cycles produce current in the SAME direction through RL — full-wave rectification.
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5.4 Procedure
Without Filter
61. Connect FWR circuit per diagram (no capacitor). Apply AC mains to primary.
62. Measure Vac and Vdc at output with DMM; compute γ = Vac/Vdc.
63. Observe CRO waveform; verify output frequency = 100 Hz (two pulses per 20 ms cycle).
With Filter
64. Add 1000 μF/25V capacitor across RL (correct polarity).
65. Measure Vac and Vdc; compute γ. Compare with unfiltered value.
66. Observe CRO; note smoother DC with only small residual ripple.
5.5 Precautions
67. Correctly identify primary (230 V) and secondary (12-0-12 V) of transformer.
68. The CENTER TAP must be connected to the negative terminal of output (common ground).
69. Identify anode and cathode of each 1N4007 diode carefully.
70. Capacitor polarity: +ve terminal to positive output node.
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DISADVANTAGE of the center-tap design. BRIDGE RECTIFIER (4 diodes): PIV = Vm per diode —
same as HWR, but achieves full-wave rectification. This is why bridge rectifiers are preferred over center-
tap designs for high-voltage applications. For a 12-0-12 V transformer: Vm = 12√2 ≈ 17 V. Center-tap
FWR needs diodes rated ≥ 34 V PIV. 1N4007 (1000 V PIV) is vastly over-rated — deliberately chosen for
safety margin.
Q: Why is a center-tapped transformer required for full-wave rectification (two-diode circuit)?
The center-tapped transformer is required because the two-diode FWR needs TWO AC voltage sources
that are equal in magnitude but 180° out of phase, sharing a common reference point (center tap). During
the positive half cycle, the upper end of secondary (+Vm) drives D1 forward, while D2 (connected to lower
end, −Vm) is reverse biased. Current returns via the center tap. During the negative half cycle, the lower
end (+Vm relative to center) drives D2 forward, D1 is reverse biased. Current again returns via center tap.
Without the center tap, both D1 and D2 would be in different loops with no common return path — correct
rectification would be impossible with two diodes. ALTERNATIVE: The 4-diode BRIDGE rectifier
achieves full-wave rectification without a center-tapped transformer, at the cost of two extra diodes and
double the diode voltage drop (~1.4 V total vs ~0.7 V for two-diode FWR).
3 Output frequency of a full-wave C) 100 Hz FWR rectifies both half cycles → two pulses per
rectifier (50 Hz input) is: input period (20 ms) → output frequency = 2 × 50
A) 25 Hz Hz = 100 Hz. This higher frequency is easier to
filter (smaller C needed for same ripple).
B) 50 Hz
C) 100 Hz
D) 200 Hz
4 PIV per diode in a center-tapped C) 2Vm When D1 conducts (upper half cycle), D2 is reverse
FWR is: biased and sees the combined voltage of the D1
A) Vm/2 output (+Vm) plus the lower secondary (−Vm
referenced to center tap, so +Vm reversed = another
B) Vm
Vm). Total PIV = 2Vm per diode — higher than
C) 2Vm HWR (Vm) or bridge (Vm).
D) √2·Vm
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6 The rectification efficiency of a full- C) 81.2% η(FWR) = 8/π² ≈ 81.2% — exactly DOUBLE the
wave rectifier is approximately: HWR efficiency (40.6%). This is because FWR
A) 40.6% uses both half cycles of the AC input, converting
twice as much input power to useful DC output.
B) 60%
C) 81.2%
D) 100%
7 Compared to HWR, the FWR C) Higher TUF(HWR) ≈ 0.287 — very poor because only one
transformer utilisation factor (TUF) (≈0.693) half cycle is used and DC flows in secondary
is: (causing core saturation risk). TUF(FWR center-
tap) ≈ 0.693 — better because both halves are used
A) Lower (≈0.287)
and the DC components in the two halves cancel in
B) Equal
the core. Bridge TUF ≈ 0.812 (best).
C) Higher (≈0.693)
D) Always 1.0
8 A key advantage of the bridge B) Does NOT Bridge rectifier uses 4 diodes but works with ANY
rectifier over the center-tap FWR is: require a transformer secondary (no center tap required).
A) Higher output voltage center-tapped Center-tap FWR uses only 2 diodes but needs a
transformer special center-tapped transformer (more expensive,
B) Does NOT require a center-tapped
heavier, harder to obtain in some voltages). Also
transformer
bridge PIV = Vm vs center-tap PIV = 2Vm per
C) Fewer diodes needed diode.
D) Lower ripple factor
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Regions of Operation
ACTIVE: EBJ forward, CBJ reverse | IC = β·IB | Used for AMPLIFICATION
SATURATION: Both junctions forward | VCE ≈ 0.1–0.2 V | Transistor fully ON (closed switch)
CUT-OFF: Both junctions reverse | IC ≈ 0, IB = 0 | Transistor fully OFF (open switch)
6.2 Apparatus
[Link] Apparatus Type Range Qty
01 NPN Transistor BC107 — 01
02 Resistance Carbon 1 KΩ 02
03 Regulated Power Supply DC 0–30 V 02
04 Ammeter MC 0–100 mA, 0–50 mA 01 each
05 Voltmeter MC 0–2 V, 0–20 V 01 each
06 Breadboard and Wires — — As reqd
6.3 Theory
6.3.1 CB Configuration
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Base is COMMON to both input (Emitter-Base) and output (Collector-Base) circuits. Input signal
applied between Emitter and Base; output taken between Collector and Base.
CB Configuration Properties
Input current: IE (large, mA range) | Output current: IC (slightly < IE)
Current gain hfb = α = IC/IE < 1 (typically 0.95–0.999)
Input impedance hib: LOW (20–50 Ω) — E-B is forward biased junction
Output impedance 1/hob: VERY HIGH (MΩ range)
Phase relationship: NO phase inversion (non-inverting)
Application: High-frequency amplifiers, impedance matching (low→high), cascode amplifier
6.4 Procedure
Input Characteristics
4. Connect BC107 in CB config (Base grounded). Set VCB=0V.
5. Vary VEE to change VEB in 0.1 V steps. Record IE for each VEB.
6. Repeat for VCB = 5 V and VCB = 10 V.
7. Plot IE (Y) vs VEB (X) at each constant VCB.
Output Characteristics
8. Set IE = 10 mA (adjust VEE). Vary VCC to change VCB from 0–20 V (steps of 1 V). Record
IC.
9. Repeat for IE = 15 mA and 20 mA.
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6.5 Precautions
12. Never exceed BC107 ratings: IC(max)=100 mA, VCE(max)=45 V, PD(max)=300 mW.
13. Correctly identify Emitter, Base, Collector terminals of BC107.
14. Connect ammeters and voltmeters with correct polarities.
15. Do not switch ON supply until all connections are verified.
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CASCODE AMPLIFIER: CE stage (for high gain) followed by CB stage (for wide bandwidth and
high output impedance). Combines benefits of both. 3. IMPEDANCE MATCHING: Converts a
low-impedance source (hib ≈ 20–50 Ω) to a high-impedance output (1/hob ≈ 1 MΩ) — useful for
matching between stages. 4. CURRENT BUFFER: Unity current gain (approximately), extremely
low input Z, very high output Z. 5. PHASE PRESERVATION: Non-inverting — used when 180°
phase shift is undesirable.
Q: What will be the h-parameters of CB configuration?
The four h-parameters for CB configuration, their symbols, and typical values for BC107: hib
(Short-circuit input impedance): hib = ΔVEB/ΔIE |VCB=const ≈ 20–50 Ω. Very LOW because E-B
is a forward-biased junction. hrb (Open-circuit reverse voltage gain): hrb = ΔVEB/ΔVCB
|IE=const ≈ 10⁻³ to 10⁻⁴. Very small — little feedback from output to input in CB. hfb (Short-circuit
forward current gain): hfb = ΔIC/ΔIE |VCB=const = α ≈ 0.95 to 0.999. Less than 1 — a
characteristic property of CB (no current amplification). hob (Open-circuit output admittance):
hob = ΔIC/ΔVCB |IE=const ≈ 0.1–1 μS. Very small → 1/hob ≈ 1–10 MΩ output impedance (very
HIGH).
Q: Explain transistor operation.
A BJT operates by controlling a large collector current IC with a small base current IB (CE) or a
large emitter current IE (CB). For NPN in ACTIVE region:
1. The emitter-base junction (EBJ) is forward biased (VBE ≈ 0.7 V). This injects large numbers of
electrons from the N-type emitter into the P-type base.
2. In the base, most injected electrons do NOT recombine with holes (the base is very thin and
lightly doped — few recombination sites). Most electrons diffuse across the base.
3. The collector-base junction (CBJ) is reverse biased. The electric field at the CBJ sweeps the
electrons that reach it into the collector.
4. Since most emitter electrons (≈99%) reach the collector: IC ≈ IE, so α = IC/IE ≈ 0.99.
5. Only a small fraction (~1%) of emitter electrons recombine in the base, forming the small base
current IB.
6. Since IB = IE − IC and IC ≈ αIE: IB = IE(1−α) = very small. Thus β = IC/IB = α/(1−α) >> 1. This
current-control principle makes BJT a useful amplifier and switch.
1 In Common Base configuration, B) Base In CB, the BASE is the common terminal. Input
which terminal is common to input is applied between Emitter-Base; output is
and output? taken between Collector-Base. The base
terminal is shared (common) between the input
A) Emitter
and output loops.
B) Base
C) Collector
D) None
2 Forward current gain (hfb = α) in C) Less α = IC/IE < 1 (typically 0.95–0.999). Some
CB is: than 1 emitter-injected carriers recombine in the base,
A) Greater than 1 so IC is always slightly less than IE. This is why
CB does not provide current amplification — it
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3 Input impedance (hib) of CB C) Very low The CB input port (E-B junction) is a forward-
configuration is: (20–50 Ω) biased junction with very low dynamic
A) Very high (MΩ) resistance re. hib ≈ re = ηVT/IE ≈ 26/IE(mA) Ω.
At IE=1 mA: hib ≈ 26 Ω. This low input Z limits
B) Medium (KΩ)
CB's versatility but makes it good for matching
C) Very low (20–50 Ω) low-Z sources.
D) Zero
5 The Early Effect in BJT refers to: B) Base- The Early Effect is the modulation of effective
A) Breakdown at low temperature width base width by the collector-base voltage VCB.
modulation Higher VCB widens the CBJ depletion region
B) Base-width modulation by VCB
by VCB into the base, narrowing it. Narrower base →
C) Emitter efficiency decreasing with
less recombination → slightly higher IC. This
current
causes a slight positive slope in CB/CE output
D) Thermal runaway characteristics.
7 CB configuration is preferred for C) It has no The Miller effect multiplies the feedback
high-frequency amplifiers Miller effect capacitance CBC (or CGD in FET) by the
because: voltage gain, dramatically increasing effective
input capacitance at high frequencies. In CB
A) It has the highest current gain
configuration, the collector is not at the input
B) It has the lowest noise side, so the feedback from CBC does not
C) It has no Miller effect cause Miller multiplication. CB maintains wider
D) It has highest input impedance bandwidth than CE at high frequencies.
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7.2 Apparatus
[Link] Apparatus Type Range Qty
01 NPN Transistor BC107 — 01
02 Resistance Carbon 300 KΩ, 1 KΩ 01 each
03 Regulated Power Supply DC 0–30 V 01
04 Ammeter MC 0–100 mA, 0–100 μA 01 each
05 Voltmeter MC 0–2 V, 0–20 V 01 each
06 Breadboard and Wires — — As reqd
7.3 Theory
7.3.1 CE Configuration — Why Most Widely Used
Emitter is COMMON to both input (Base-Emitter) and output (Collector-Emitter) circuits. CE is the
most widely used configuration because:
• Highest current gain: β = hfe = IC/IB typically 50–300 (far exceeds CB's α < 1)
• Highest power gain of the three configurations
• Moderate input impedance: hie ≈ 1–10 KΩ (suitable for most sources)
• Moderate output impedance: 1/hoe ≈ 10–100 KΩ
• Phase inversion: output is 180° inverted relative to input
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7.4 Procedure
Input Characteristics
19. Connect BC107 in CE config (Emitter grounded). Set VCE=0V.
20. Vary VBB to change VBE in 0.1 V steps. Record IB (μA) for each VBE.
21. Repeat for VCE = 5 V and VCE = 10 V.
22. Plot IB (Y, μA) vs VBE (X, V) at each constant VCE.
Output Characteristics
23. Set IB = 0μA. Vary VCC to change VCE from 0–20 V (steps 1 V). Record IC.
24. Repeat for IB = 10 μA, 20 μA, 30 μA, 40 μA.
25. Plot IC (Y, mA) vs VCE (X, V) at each constant IB.
26. Calculate hfe from active region: hfe = ΔIC / ΔIB at constant VCE.
7.5 Precautions
27. Do not exceed BC107 ratings.
28. Identify E, B, C terminals correctly.
29. Ammeter for IB must be sensitive (μA range); for IC use mA range.
30. Verify all connections before powering the circuit.
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4. SIMPLE BIASING: A single supply can bias a CE stage with a straightforward voltage divider.
5. VERSATILITY: Can be used as voltage amplifier, current amplifier, power amplifier, oscillator
building block, switching circuit, and logic gate. Disadvantage: 180° phase inversion (output is
inverted relative to input) — easily handled by design.
Q: Draw the equivalent circuit of CE configuration.
SMALL-SIGNAL h-PARAMETER EQUIVALENT CIRCUIT for CE: Base (B) ─────[hie]────
Collector (C) | | [hre·Vce] [hfe·Ib]↑ [1/hoe] | | Emitter
(E) ─────────────────── Emitter (E) Input loop: Vbe = hie·ib + hre·Vce Output loop: ic
= hfe·ib + hoe·Vce Simplified T-MODEL (for hand calculations): • hre ≈ 0 (neglect feedback):
simplifies to re model • b-e: small signal resistance re = VT/IC (or β×re = hie) • Collector:
controlled current source ic = β·ib • Simplified: input impedance Zin = hie = β·re; output is current
source β·ib in parallel with large 1/hoe.
Q: What is the current gain, voltage gain, input and output impedance in CE?
CURRENT GAIN (AI): β = hfe = IC/IB typically 50–300. This is the key advantage of CE — the
base current is amplified by β to give the collector current. VOLTAGE GAIN (AV): AV = −β·RL /
hie = −gm·RL, where RL is the load resistance and gm = β/hie = IC/VT is the transconductance.
The negative sign indicates 180° phase inversion. For typical values (β=100, RC=4.7KΩ,
hie=2.6KΩ): AV ≈ −100×4700/2600 ≈ −181. Voltage gain is HIGH. INPUT IMPEDANCE (Zi): Zi =
hie = β·re ≈ 1–10 KΩ. With bias resistors R1||R2 in parallel: Zi = R1||R2||hie — typically hundreds
of ohms to a few KΩ. OUTPUT IMPEDANCE (Zo): Zo = 1/hoe ≈ 10–100 KΩ (with RL in parallel:
Zo(loaded) = RL||1/hoe ≈ RL for typical RL < 10KΩ).
Q: What is the relation between α (alpha), β (beta), and γ (gamma)?
Alpha (α): Common Base current gain. α = IC/IE = hfb. Range: 0.95–0.999. Always < 1. Beta (β):
Common Emitter current gain. β = IC/IB = hfe. Range: 50–300. Always > 1. Gamma (γ): Not a
standard BJT parameter notation in this context. However, the third configuration (Common
Collector or Emitter Follower) has current gain AI = 1+β (current gain > β, close to β+1). Key
relationships: β = α/(1−α) ←→ α = β/(1+β) IE = IC + IB [fundamental Kirchhoff's current law for
BJT] IC = α·IE = β·IB IB = IE − IC = IE(1−α) = IC/β Example: If α = 0.98: β = 0.98/(1−0.98) =
0.98/0.02 = 49. If β = 100: α = 100/101 ≈ 0.99.
Q: Give the conditions to operate the transistor in Active, Saturation, and Cut-off regions.
ACTIVE REGION (used for amplification): • EBJ: Forward biased (VBE ≈ 0.6–0.7 V for Si NPN) •
CBJ: Reverse biased (VCB > 0, or VCE > VCE(sat) ≈ 0.2 V) • IC = β·IB; IC is controlled by IB •
Device acts as a voltage-controlled current source SATURATION REGION (used as closed
switch, ON state): • EBJ: Forward biased (VBE ≈ 0.7 V) • CBJ: Also forward biased (VBC > 0,
i.e., VCE < VBE) • VCE(sat) ≈ 0.1–0.2 V for Si BJT • IC is NOT controlled by IB; determined by
external circuit • Transistor is fully ON; acts like a closed switch (low VCE) CUT-OFF REGION
(used as open switch, OFF state): • EBJ: Reverse biased (VBE < 0.5 V or negative) • CBJ:
Reverse biased • IB ≈ 0, IC ≈ ICEO (collector-emitter leakage, very small) • Transistor is fully
OFF; acts like an open switch
Q: What is Emitter Efficiency?
Emitter efficiency (γ, sometimes called injection efficiency) is defined as the fraction of the emitter
current that is due to minority carrier injection from the emitter into the base: γ = Injected minority
carrier current from emitter into base / Total emitter current IE For NPN: γ = electron current
component of IE / IE = In_E / IE High emitter efficiency is essential for high transistor
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performance because only the carriers injected from the emitter into the base can be swept
across to the collector. Carriers injected from base into emitter (holes from P-base into N-emitter)
contribute to IE but NOT to IC — they are wasted. To maximise γ: • Emitter should be HEAVILY
DOPED (high donor concentration in N-emitter) — so emitter can inject many more electrons
than the base can inject holes • Base should be LIGHTLY DOPED — to minimise hole injection
from base into emitter For BC107: emitter doping >> base doping → γ ≈ 0.995 → excellent.
Emitter efficiency directly contributes to high α (α ≈ γ × base transport factor).
2 CE forward current gain hfe (beta) B) IC/IB β = hfe = IC/IB. This is the CE short-circuit
equals: current gain — a small base current IB controls
A) IC/IE a large collector current IC, with β = 50–300 for
BC107. This is CE's primary advantage.
B) IC/IB
C) IB/IC
D) IE/IC
3 In saturation region of CE D) Both In saturation BOTH EBJ and CBJ are forward
configuration: junctions biased. VCE ≈ 0.1–0.2 V (very low). The
A) Only EBJ forward biased forward transistor is fully ON. IC is determined by the
biased external circuit (not β·IB). The transistor acts
B) Only CBJ forward biased
like a closed switch with very low VCE across it.
C) Both junctions reverse biased
D) Both junctions forward biased
4 The approximate small-signal input B) 1–10 KΩ hie = β·re = β·(VT/IC). For β=100, IC=1mA: hie
impedance of CE configuration is: = 100×26 = 2600 Ω = 2.6 KΩ. This is much
A) 20–50 Ω higher than CB (hib ≈ 26 Ω) because CE input
current is IB (tiny) while CB input current is IE
B) 1–10 KΩ
(large). Same VBE → higher impedance for
C) 1 MΩ smaller current.
D) Zero
6 In the output characteristics of CE, B) Nearly In the active region (VCE >VCE(sat) ≈ 0.2V), IC
the ACTIVE REGION is identified flat IC lines = β·IB is nearly constant for a given IB,
by: above a independent of VCE (ideally). The output
small VCE characteristics show nearly horizontal (flat) lines
A) IC rapidly rising with VCE
for each value of IB. The slight positive slope is
B) Nearly flat IC lines above a small
due to the Early Effect.
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VCE
C) IC = 0
D) VCE = 0
7 For BC107 NPN transistor, the C) 110–220 BC107 is specified with hFE (DC current gain β)
typical β (hFE) range is: typically in the range 110–220, with a minimum
A) 1–10 of about 75 and maximum of 300 depending on
the collector current and temperature. This
B) 10–50
relatively high β makes BC107 suitable for audio
C) 110–220 amplifier and switching applications.
D) 1000–5000
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Input Impedance Low-moderate (KΩ for CE) Very High (MΩ gate junction)
8.2 Apparatus
[Link] Apparatus Type Range Qty
01 N-Channel JFET BFW10 — 01
02 Resistance Carbon 1 KΩ 01
03 Regulated Power Supply DC 0–30 V 01
04 Ammeter MC 0–100 mA 01
05 Voltmeter MC 0–10 V, 0–20 V 01 each
06 Breadboard and Wires — — As reqd
8.3 Theory
8.3.1 N-Channel JFET Structure
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BFW10: N-channel JFET. An N-type semiconductor bar (channel) with Source (S) and Drain (D) at
opposite ends. P-type Gate (G) is diffused into both sides of the N-channel. Positive VDD drives
conventional current from Drain to Source through the N-channel. Negative VGS (Gate-Source
voltage) reverse-biases the P-gate/N-channel junctions, creating depletion regions that squeeze the
channel.
8.4 Procedure
Drain Characteristics
33. Set VGS=0 (VGG=0). Vary VDD to change VDS in 0.5 V steps (0 to ~15 V). Record ID.
34. Observe:ohmic region (linear rise) then saturation (ID constant at IDSS).
35. Repeat for VGS=−1V and VGS=−2V.
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Transfer Characteristics
37. Set VDS=1V (constant VDD). Vary VGG to change VGS from 0 to VP in 0.5 V steps. Record
ID.
38. Repeat for VDS=2V and VDS=3V.
39. Plot ID (Y) vs VGS (X) at each constant VDS. Curves are parabolic (Shockley equation).
8.5 Precautions
40. NEVER forward bias the gate junction — this destroys the JFET. Always keep VGS ≤ 0 for
N-channel.
41. Do not exceed JFET ratings: VDS(max)=30V, PD(max)=300mW for BFW10.
42. Identify S, G, D terminals correctly before connecting.
43. Verify connections before powering circuit.
increases with T → more heat → higher IC); FET is self-stabilising (ID decreases with T for most
bias points). SIZE: MOSFET can be made far smaller → VLSI with billions of transistors per
chip. SPEED: Both can be fast; MOSFET has advantage in large integrated circuits due to
smaller size and no minority carrier storage delay. APPLICATION: BJT preferred for discrete
linear circuits; FET (MOSFET) dominates digital ICs and VLSI.
Q: What are the characteristics of FET?
The key V-I characteristics of a JFET are:
1. DRAIN CHARACTERISTICS (ID vs VDS at constant VGS): • Ohmic/linear region: ID rises
linearly with VDS (FET acts as resistor rDS = 1/gmo for VGS=0). • Saturation region: ID saturates
at approximately IDSS(1−VGS/VP)² — nearly flat, independent of VDS. • Higher VGS (less
negative) = higher ID curve. VGS=0 gives maximum ID = IDSS. • Breakdown: Very large VDS
causes device breakdown.
2. TRANSFER CHARACTERISTICS (ID vs VGS at constant VDS): • Parabolic curve following
Shockley equation: ID = IDSS(1−VGS/VP)². • At VGS=0: ID = IDSS (maximum). At VGS=VP: ID
= 0 (cut-off). • Transconductance gm is the slope at any point: gm = 2IDSS/|VP| × (1−VGS/VP). •
gm is maximum at VGS=0 and decreases toward VP.
Q: What is Pinch-Off Voltage?
The Pinch-Off Voltage (VP) is the gate-source voltage VGS at which the JFET channel is
completely depleted of free carriers, reducing the drain current to zero. For N-channel JFET: VP
is NEGATIVE (e.g., −3 V for BFW10). At VGS = VP, the P-gate depletion regions from both sides
of the N-channel meet in the middle, 'pinching off' the channel — no conductive path for
electrons. Physical interpretation: VP is also equal to the drain-source voltage at which the drain
end of the channel just reaches pinch-off when VGS=0: VDS = |VP| (at VGS=0 pinch-off begins).
Shockley equation: ID = IDSS(1−VGS/VP)² = 0 when VGS = VP. For BFW10: VP is typically −2
V to −7 V. The operating range of VGS is: VP ≤ VGS ≤ 0 V. Practical implication: To turn the N-
channel JFET OFF, apply VGS = VP or more negative. To get maximum current, set VGS = 0.
Q: Why is FET called a Voltage-Controlled Device?
The FET is called a VOLTAGE-CONTROLLED DEVICE because the drain current ID is
controlled by the gate-to-source VOLTAGE VGS, not by a gate current. Mechanism: For an N-
channel JFET, the P-gate/N-channel junctions are REVERSE BIASED. A reverse-biased junction
draws virtually zero current. The gate voltage VGS creates an electric FIELD across the narrow
channel. This field modulates the width of the depletion regions in the channel, changing its
effective cross-sectional area and hence its resistance. A more negative VGS → wider depletion
regions → narrower channel → higher resistance → less ID. Consequences: • Gate current IG ≈
0 → input impedance = ∞ (practically MΩ) • No input power consumed by gate (P = VGS × IG ≈
0) • Gain is characterised by transconductance gm = ΔID/ΔVGS (Siemens) rather than current
gain β • FET is an efficient voltage amplifier: ID = gm × VGS (in small-signal model) Contrast
with BJT: IB (current) controls IC → current-controlled. BJT input consumes power (IB × VBE).
Q: Draw the small-signal model of FET.
The small-signal equivalent circuit of a JFET (CS configuration): Gate (G)
──────────────────────── Drain (D) | | | (open) Cgs
[gm·Vgs] ↑ [rd] | | | Source (S)───────────────────────
Source (S) Elements: • Cgs: Gate-Source capacitance (important at high frequencies; causes
gain rolloff) • Cgd: Gate-Drain capacitance (causes Miller effect at high frequencies — not shown
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for simplicity) • gm·Vgs: Controlled current source — models the transconductance action • rd:
Drain resistance = 1/gds = ΔVDS/ΔID (from drain characteristic slope) • Input impedance: ideally
infinite (gate draws no current); practically limited by Cgs at high frequencies Voltage gain (CS,
with load RD): AV = −gm × (RD || rd) ≈ −gm × RD (when rd>> RD)
Q: What are the advantages of FET over BJT?
FET has several important advantages over BJT:
1. EXTREMELY HIGH INPUT IMPEDANCE: Gate draws essentially zero current (reverse-
biased junction for JFET; insulated gate for MOSFET → input Z can be 10¹² Ω). BJT base
requires input current. FET is ideal for high-impedance sources (pH meters, electrometers,
microphones, biosensors).
2. LOWER NOISE: FET current is carried by majority carriers only — no minority carrier injection
or recombination. These processes generate shot noise and generation-recombination noise
which are absent in FET. FET has lower 1/f noise at low frequencies in many designs. Critical for
radio receivers, audio preamplifiers, scientific instruments.
3. BETTER THERMAL STABILITY: FET transconductance gm ∝ 1/√T (decreases with
temperature). Higher temperature → lower ID at same bias → negative feedback → prevents
thermal runaway. BJT IC increases with temperature → positive feedback → risk of thermal
runaway.
4. SMALLER SIZE / SIMPLER FABRICATION: MOSFET can be made with extremely small
dimensions (sub-nanometer gate lengths today). Entire modern computing (CPUs, RAM) is built
with CMOS MOSFETs. Billions of transistors on a single chip.
5. NO OFFSET VOLTAGE: FETs can handle signals all the way down to 0 V (both polarities in
depletion mode), useful in chopper amplifiers and analog switches.
6. SQUARE-LAW CHARACTERISTIC: The parabolic ID-VGS relationship makes JFET useful for
analog multiplication and modulation circuits.
1 The JFET is a _____ and _____ D) UNIPOLAR: current flows through one carrier
device. Unipolar, type only (electrons for N-channel). VOLTAGE-
A) Bipolar, current-controlled voltage- CONTROLLED: gate voltage VGS controls ID;
controlled gate draws no current. Both properties
B) Unipolar, current-controlled
fundamentally distinguish FET from BJT
C) Bipolar, voltage-controlled (bipolar, current-controlled).
D) Unipolar, voltage-controlled
2 For an N-channel JFET, VGS must B) Zero or For N-channel JFET, VGS ranges from 0 V
be _____ for normal operation. negative (0 (maximum ID = IDSS) to VP (typically −2 to −7
A) Positive to VP) V, where ID = 0). Positive VGS would forward-
bias the gate-channel P-N junction, causing
B) Zero or negative (0 to VP)
gate current and potentially destroying the
C) Exactly zero device.
D) Any value
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7 JFET is preferred for low-noise B) Current JFET current flows by majority carriers only
amplifiers because: flows by (electrons for N-channel). No minority carrier
A) It has higher gain majority injection or recombination means no
carriers generation-recombination (G-R) noise and no
B) Current flows by majority carriers
only — no shot noise from minority carriers. This gives
only — no minority carrier noise
minority FET amplifiers significantly lower noise than
C) It has lower input impedance BJT amplifiers at audio and RF frequencies —
D) It requires lower supply voltage carrier
noise critical for microphone preamplifiers,
instrumentation amps, radio receivers.
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Key Concepts
Gain (dB) = 20 × log₁₀(Vo/Vi)
Bandwidth (BW) = fH − fL
3-dB Frequencies
fL = Lower 3-dB frequency: gain falls to (max gain − 3 dB) on the low side
fH = Upper 3-dB frequency: gain falls to (max gain − 3 dB) on the high side
At 3-dB points: voltage gain = 0.707 × Av(max) | Power gain = 0.5 × Ap(max)
Mid-band region (fL to fH): gain is maximum and constant
Low freq roll-off: caused by coupling capacitors C1,C2 and bypass capacitor CE (or CS)
High freq roll-off: caused by transistor junction capacitances (CBE, CBC or CGS, CGD)
9.2 Apparatus
[Link] Apparatus Type Range Qty
01 NPN Transistor BC107 — 01
02 Resistors Carbon 33KΩ, 4.7KΩ, 2.2KΩ, 01 each
8.2KΩ, 1KΩ
03 Regulated Power Supply DC 0–30V (use 10V) 01
04 Capacitors Electrolytic 10μF (×3) 03
05 Signal Generator AF 10Hz–1MHz 01
06 CRO with Probes Dual trace — 01
07 Breadboard and Wires — — As reqd
9.3 Theory
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9.4 Procedure
46. Connect circuit per diagram. VCC=10V.
47. Set input: VS=20mV peak-to-peak, f=1kHz from signal generator.
48. Connect CRO at output (across load, through C2).
49. KEEP INPUT AMPLITUDE CONSTANT (20mV). Change only FREQUENCY.
50. Vary f from 10Hz to 1MHz. At each frequency, measure output VO from CRO.
51. Calculate: Av = Vo/Vi and Gain(dB) = 20×log₁₀(Av).
52. Plot Gain(dB) vs Frequency (use log scale for frequency axis).
53. Draw horizontal line at [maximum gain − 3dB]. Find intersections → fL and fH.
54. Calculate BW = fH − fL.
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1 10 Hz
2 50 Hz
3 100 Hz
4 500 Hz
5 1 kHz
6 5 kHz
7 10 kHz
8 50 kHz
9 100 kHz
10 500 kHz
11 1 MHz
9.6 Precautions
55. Keep input signal amplitude strictly constant (20mV) throughout. Use CRO to verify input.
56. Use log-scale for frequency axis when plotting Bode plot.
57. BC107 ratings must not be exceeded.
58. Verify correct polarity of electrolytic capacitors C1, C2, CE.
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1 The voltage gain of a CE amplifier B) Internal At high f, CBE and CBC have low reactance
falls at HIGH frequencies due to: transistor and shunt signal to ground. CBC creates the
A) Coupling capacitors becoming junction Miller effect: effective input capacitance =
open capacitances CBC(1+|AV|), which is very large and severely
(Miller effect) loads the input at high frequency, causing
B) Internal transistor junction
gain rolloff.
capacitances (Miller effect)
C) Bypass capacitor short circuit
D) Power supply dropping
2 If mid-band gain = 46 dB, the 3-dB B) 43 dB 3-dB points are where gain = peak gain − 3
frequency points are where gain = dB = 46 − 3 = 43 dB. At this level, voltage
A) 23 dB gain = 0.707 × Av(peak) and power gain = 0.5
× Ap(peak). The frequency axis intersections
B) 43 dB
with the 43 dB line give fL and fH.
C) 49 dB
D) 3 dB
4 The emitter bypass capacitor CE B) Bypasses CE shorts out RE for AC signals, giving AV =
in a CE amplifier: RE for AC to −RC/re (maximum). Without CE: AV =
A) Blocks DC from input maximise gain −RC/(re+RE) (much lower). CE does NOT
affect DC bias. For CE to be effective at a
B) Bypasses RE for AC to maximise
given frequency, XCE << RE: CE must be
gain
large enough for the operating frequency
C) Filters high-frequency noise range.
D) Sets the Q-point
6 At the mid-band, the gain of a CE B) AV = −gm × With CE bypass capacitor present (shorts RE
amplifier is approximately: RC = −RC/re at mid-band): AV = −gm×RC = −RC/re =
A) AV = −RC/(re+RE) when CE −β×RC/hie. The negative sign = 180° phase
present inversion. re = VT/IC ≈ 26/IC(mA) Ω.
Example: IC=1mA, RC=4.7KΩ: AV =
B) AV = −gm × RC = −RC/re
−4700/26 ≈ −181.
C) AV = +β/RC
D) AV = RE/RC
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10.2 Apparatus
[Link] Apparatus Type Range Qty
01 N-Channel JFET BFW10 — 01
02 Resistors Carbon 6.8KΩ (RD), 1MΩ (RG), 01 each
1.5KΩ (RS)
03 Regulated Power Supply DC 0–30V (VDD=12V) 01
04 Capacitors Mixed 0.1μF (×2 coupling), 03
47μF (bypass CS)
05 Signal Generator AF 10Hz–1MHz 01
06 CRO with Probes Dual trace — 01
07 Breadboard and Wires — — As reqd
10.3 Theory
10.3.1 CS Amplifier Circuit (VDD=12V)
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resistors and BJT base resistance hie). FET's zero gate current makes RG the sole determinant of
input Z — simply choose a large RG (1 MΩ typical).
10.4 Procedure
61. Connect CS FET amplifier circuit per diagram. VDD=12V.
62. Set signal generator: VS=20mV, f=1kHz. Connect to input.
63. Connect CRO at output (drain side of CGout). Verify phase inversion (180°).
64. Keep input amplitude constant (20mV). Vary frequency from 10Hz to 1MHz.
65. At each frequency, measure VO from CRO. Calculate Av and Gain(dB).
66. Plot Gain(dB) vs frequency (log scale). Determine fL, fH, BW from 3-dB points.
10.5 CS vs CE Comparison
Parameter CE (BJT) Amplifier CS (FET) Amplifier
High Freq. fH CBE, CBC (Miller effect) CGS, CGD (Miller effect)
1 Mid-band voltage gain of a CS FET B) AV = −gm AV = −gm × RD. The negative sign indicates
× RD 180° phase inversion (same as CE). gm is the
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amplifier (CS bypass present) is: JFET transconductance (A/V) and RD is the
A) AV = β × RD drain resistor. With CS bypass cap, RS is AC
shorted, eliminating source degeneration and
B) AV = −gm × RD
giving maximum gain.
C) AV = −gm × RS
D) AV = RD/RS
2 Input impedance of CS FET C) Gate bias JFET gate current ≈ 0 → intrinsic gate
amplifier is primarily set by: resistor RG impedance is essentially infinite (GΩ). The
A) Gate-source capacitance CGS input impedance is limited by the external gate
bias resistor RG = 1 MΩ. This is why FET
B) Transconductance gm
amplifiers have very high Zi ≈ RG = 1 MΩ,
C) Gate bias resistor RG compared to CE'shie ≈ 1–10 KΩ.
D) Drain resistor RD
6 The high-frequency gain rolloff in C) FET At high f, CGS and CGD (few pF each) have
a CS FET amplifier is caused by: internal low reactance → shunt signal to ground. CGD
A) Source bypass capacitor capacitances (gate-drain capacitance) is multiplied by the
CGS and Miller effect: effective CM = CGD(1+gm×RD) at
B) Input coupling capacitor
CGD (Miller the input. This large effective capacitance limits
C) FET internal capacitances CGS and the high-frequency response. Analogous to
CGD (Miller effect of CGD) effect of
CGD) CBC in CE amplifier causing Miller effect.
D) Drain resistor RD
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