WaveView 4.5.

0
User guide

Documentation build 25831

mars 2025
 WaveView

Table of Contents
Part I . Welcome to WaveView 4 2
Part II . Introduction 4
Part III . The measurement process 6
Part IV . Overview 8
1 . Main window ....................................................................... 8
2 . Menu & Status bar ....................................................................... 9
3 . Main toolbar ....................................................................... 10
4 . Workspaces toolbar ....................................................................... 11
5 . View toolbar ....................................................................... 12
6 . Acquisition toolbar ....................................................................... 14
7 . Replay toolbar ....................................................................... 15
8 . Metrology toolbar ....................................................................... 16
9 . Diagnosis area and displays ....................................................................... 18
10 . Time related measurements and Zoom ....................................................................... 25
11 . Windows toolbar ....................................................................... 27
12 . Features panel ....................................................................... 28

Part V . Data Acquisition 30

1 . From sensor ....................................................................... 32
Parameters .......................................................................
Acquisition modes .......................................................................
Acquisition Parameters .......................................................................
2 . From data server ....................................................................... 37
Principle .......................................................................
Parameters .......................................................................
3 . From file or folder ....................................................................... 41

Part VI . Alignment & Pairing 44

1 . Sensor alignment ....................................................................... 45
2 . Spot / microlens pairing ....................................................................... 47
New lens .......................................................................
Trimmer .......................................................................

Part VII . Hartmanngram processing 54

1 . Parameters ....................................................................... 55
Dark subtraction .......................................................................
Spot detection .......................................................................
Spot Tracker .......................................................................
Cumulated images VS SNR .......................................................................

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 WaveView
2 . Associated displays ....................................................................... 59
Raw camera signal .......................................................................

Part VIII . Optics 62

1 . Formalism ....................................................................... 63
Beam parameters formalism .......................................................................
HASO axis system .......................................................................
2 . Parameters ....................................................................... 65
Intensity threshold .......................................................................
Reference .......................................................................
Fill .......................................................................
Erode .......................................................................
Double pass .......................................................................
3 . Mask ....................................................................... 70
4 . Associated displays ....................................................................... 72
Beam parameters .......................................................................
Local slopes .......................................................................
Intensity .......................................................................

Part IX . Wavefront & Aberrations 76

1 . Reconstruction modes ....................................................................... 77
Zonal reconstruction .......................................................................
Modal reconstruction .......................................................................
2 . Parameters ....................................................................... 81
Oversampling .......................................................................
Display unit .......................................................................
Reconstruction parameters .......................................................................
Aberrations Filtering .......................................................................
3 . Associated displays ....................................................................... 101
Wavefront .......................................................................
Modal coefficients .......................................................................

Part X . Propagation 108

1 . Principle ....................................................................... 109
2 . Parameters ....................................................................... 113
Perfect lens .......................................................................
Defocus manager .......................................................................
Propagated intensity .......................................................................
PSF features setup .......................................................................
MTF features setup .......................................................................
M² features setup .......................................................................
3 . Associated displays ....................................................................... 120
Spot diagram .......................................................................
PSF .......................................................................
MTF .......................................................................
M squared .......................................................................
4 . Technical appendix ....................................................................... 129
LASER beam charactrerization .......................................................................

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Part XI . Simulation 136

1 . Wavefront simulation window ....................................................................... 137
2 . Parameters ....................................................................... 138

Part XII . Software use cases 140

1 . How to handle reference wavefront ....................................................................... 140
2 . How to use full speed acquisition ....................................................................... 141
3 . How to save the recorded data ....................................................................... 142
4 . how to set WaveView to record data automatically
.......................................................................
(script mode) 143

Part XIII . Data export 146

1 . Export to Imagine Optic file format ....................................................................... 146
2 . Export to txt file ....................................................................... 148
3 . Export to int CodeV fille format ....................................................................... 149
4 . Autosave data ....................................................................... 150
5 . Other export ....................................................................... 152

Part XIV . Contact & Support 154

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 WaveView

Part I
Welcome to
WaveView 4
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WaveView

Welcome to WaveView 4

Reference: v 4.5.25831; 21/03/2025.

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 WaveView

Part II
Introduction
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WaveView

Introduction
Imagine Optic’s WaveView wavefront analysis software is the most advanced, full-featured product of
its kind. The software is always delivered with each sensor and enables you to start your
measurements within no time.

Specially designed for our wavefront sensors, WaveView is the most advanced wavefront analysis
software available. From beginners to experts, every user can quickly benefit from its interface which
divides functions into ergonomic palettes that make it faster and easier for you to find and use the
information you need.

The WaveView metrology software includes more than 150 different tools and functions for any kind
of wavefront manipulation.

· Display all key parameters of your beam in real time:

· X and Y Tilts
· Curvature
· Focal point position in three dimensions by using radius X and Y Positions
· Raw camera signal
· Wavefront
· Segmented wavefront
· Intensity
· Zernike modes
· and many more…

Behind the ergonomic interface, powerful functionality unique to the Imagine Optic wavefront sensor
line await you. Using only one program, you can measure phase and intensity simultaneously and
independently, reconstruct the wavefront by either zonal or modal methods, or use the PSF* and
Strehl ratio* to get detailed information on beam focusing. The ensemble of the information provided
about the wavefront enables you to understand why other criteria are not performing as expected,
and can help you track down problems faster by locating their source.

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 WaveView

Part III
The
measurement
process
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WaveView

The measurement process

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Part IV
Overview
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WaveView

Overview

4.1 Main window

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4.2 Menu & Status bar

Menu

File
· New session: Opens a new instance of WaveView software.
· Open file: Loads a .has (wavefront measurement) or .himg (raw data) file.
Please refer to the chapter Data acquisition > File or folder 41 for detailed information on files
loading.
Please refer to the chapter Files formats 146 for further information on the files formats.
· Open folder: Loads all the measurements files from the chosen folder.
Please refer to the chapter Data acquisition > File or folder 41 for detailed information on files
loading.
Please refer to the chapter Files formats 146 for further information on the files formats.
· Save: Saves the current measurement in .has format. Please refer to the chapter Files formats 146
for further information on the files formats.
· Sensor: Opens a configuration dialog that allows connection to a physical sensor (direct) or
connection to a data server (remote). Please refer to the chapter Data Acquisition 30 for further
information.
· Quit: Closes WaveView software.
Most of these commands are also accessible from the Main toolbar 10 .

View
· Tile: Tiles the diagnosis windows opened in the diagnosis area.
· Cascade: Cascades the diagnosis windows opened in the diagnosis area.
These commands are also accessible from the Windows toolbar 27 .

Workspace
The commands of the Workspace menu are also accessible from the Workspaces toolbar 11 and
documented in the corresponding chapter.

Help
· Documentation: opens this help.
· About: Information about the software.
· Contact: Imagine Optic address and technical support contact.

Status bar

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4.3 Main toolbar

New instance
Opens a new instance of WaveView software.

Sensor
Opens a configuration dialog that allows connection to a physical sensor (direct) or connection to a
data server (remote).
Please refer to the chapter Data Acquisition 30 for further information.

Open file
Loads a .has (wavefront measurement) or .himg (raw data) file.
Please refer to the chapter Data acquisition > File or folder 41 for detailed information on files
loading.
Please refer to the chapter Files formats 146 for further information on the files formats.

Open folder
Loads all the measurements files from the chosen folder.
Please refer to the chapter Data acquisition > File or folder 41 for detailed information on files
loading.
Please refer to the chapter Files formats 146 for further information on the files formats.

Save
Saves the current measurement in .has format.
Please refer to the chapter Files formats 146 for further information on the files formats.

Mask
Opens the Mask editor window.
Please refer to the chapter Mask 70 for further information.

Simulation
Opens the Wavefront simulation window.
Please refer to the chapter Simulation 136 for further information.

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4.4 Workspaces toolbar

A workspace records the graphical aspect of the software, as well as the current favorite features.

New
Sets a blank workspace.

Save
Saves the current workspace as a custom workspace.

Load
Loads a custom workspace selected from the custom workspaces drop-down.

Alignment or Wavefront
Loads the corresponding factory workspace.
The factory workspaces are predefined, they cannot be modified and their names are protected.
· In the Alignment workspace, the only visible diagnosis window is the Camera signal with the
alignment indicator. This workspace is only available when a sensor is directly connected to the
software.
Please refer to the chapter Sensor alignment 45 for further information.
· The Wavefront workspace has been defined as the minimal graphical environment to perform
wavefront metrology: the wavefront diagnosis window in full screen and the zonal aberrations
filtering features as favorites.

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4.5 View toolbar

A view records the way to intaract with the software by setting the diagnostic access and the features
list.

This button give you to acces to three mains actions

Select view
Select a View into the current list of view

Wavefront view is the default view, and it is available to use with any wavefront sensor or any
wavefront HAS file

Install view
Add a new view into the view list.

To install this view, you need two files, provided by Imagine Optic.
<filename>.view: this file contains the view definition to interact with the software
<filename>.auth: this file contains the authorization to use the view with the specific wavefront sensor
(serial number).

Update authorization
Update authorization to use a specific view versus wavefront sensor serial number.

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To install this view, you need <filename>.auth file, provided by Imagine Optic. this file contains the
authorization to use the view with the specific wavefront sensor (serial number).

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4.6 Acquisition toolbar

Start & Stop

Starts or stops continuous measurements acquisition.

Snapshot
Acquires, processes and displays a single measurement.

Fullspeed
Starts acquisition of a specified number of raw data at maximum sensor acquisition frequency.

Scripted
Starts acquisition of measurements

Please refer to chapter Acquisition modes 34 for further information.

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4.7 Replay toolbar

The replay toolbar is intended to browse through measures, either acquired in specific Acquisition
modes 34 (Fullspeed / scripted) or loaded from a folder.
The Status bar 9 displays information on the current measure (index and / or name) read from the
sequence.

Restart
Navigates back to first measure of sequence.

Play
Reads sequence forward until last measure is reached or Stop is pressed at a comfortable speed.

Stop
Stops sequence reading.

Step forward
Reads next measure in the sequence.

Fast forward
Reads sequence as fast as possible until last measure is reached.
This mode can be used to reach quickly last measure, or record values at maximum possible speed
using Time related measurements 25 .
Note: The reading speed may be faster than the update of the display windows. That may give the
false impression that some measures are skipped, but all the data are loaded and processed.

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4.8 Metrology toolbar

Wavefront
Opens the Wavefront display in the diagnosis area.
Please refer to the chapter Wavefront 76 for further information.

Beam parameters
Opens the Beam parameters display in the diagnosis area.
Please refer to the chapter Optics 62 for further information.

Intensity
Opens the Intensity display in the diagnosis area.
Please refer to the chapter Optics 62 for further information.

Local slopes
Opens the Local Slopes display in the diagnosis area.
Please refer to the chapter Optics 62 for further information.

Hartmanngram
Opens the Hartmanngram display in the diagnosis area.
Please refer to the chapter Hartmanngram processing 54 for further information.

Spot diagram
Opens the Spot diagram display in the diagnosis area.

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Please refer to the chapter Propagation 108 for further information.

Modal coefficients
Opens the Modal coefficients display in the diagnosis area.
Please refer to the chapter Wavefront 76 for further information.

PSF
Opens the PSF (Point Spread Function) display in the diagnosis area.
Please refer to the chapter Propagation 108 for further information.

MTF
Opens the MTF (Modulation Transfer Function) display in the diagnosis area.
Please refer to the chapter Propagation 108 for further information.

M2
Opens the M2 (M2 LASER parameter) display in the diagnosis area.
Please refer to the chapter Propagation 108 for further information.

Time related measurement

Opens the Time related measurements display at the bottom of the diagnosis area.
Please refer to the chapter Time related measurements and Zoom 25 for further information.

Zoom
Opens the floating Zoom window.
Please refer to the chapter Time related measurements and Zoom 25 for further information.

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4.9 Diagnosis area and displays

Diagnosis area
All the diagnosis windows available in WaveView open in the diagnosis area.
The diagnosis windows can be opened and closed using the Metrology toolbar 16 , and reorganized
using the Windows toolbar 27 .

Displays
This section propose an overview of the general behavior of the most common diagnosis displays.
To access specific diagnosis related information, please refer to the corresponding chapter of this
documentation.

Numerical values

· Add to Time related measurements: starts temporal analysis of the numerical value
· Add to Zoom Manager: opens the magnified display of the numerical value.
Please refer to the chapter Time related measurements and Zoom 25 for further information.

2D diagnosis

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· Actions menu: Gives access to saving and exporting:

Print screen (screenshot of the diagnosis window),
Save (save in Imagine Optic format),
Save as text (export displayed values as formatted text).
Save as INT (export displayed values into *.INT code V format file - only in micrometer unit).
Available only on Wavefront display window
Save as RAW (export displayed values into HAS format file, contains the proceed wavefront
data). Available only on Wavefront display window, Refer to File formats 146 section to get more
information.

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· Z Scale auto:
If checked, the extrema of the color scale match to minimum and maximum Z values.
If uncheck, user can specify the values corresponding to the extrema of the color scale.

· Display area controls :

Reset: Resize displayed data to fit in window
2D / 3D: Right click on the display area to switch from 2D to 3D view and back.
Profiles: Right click on the display area to add X/Y profiles display
Copy as text: Right click on the display area to export displayed values as formatted text into
the windows clipboard
Center click and drag to pan, Scroll to Zoom in and out.

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· 3D display area:
Reset: Resize displayed data to fit in window
2D / 3D: Right click on the display area to switch from 2D to 3D view and back.

· Profiles display area:

The position and angle of the axes can be adjusted with the mouse directly on the surface:
Adjust the position by dragging the center.
Adjust the angle by using the mouse to rotate the red or green arm.

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· Profiles display area controls:

Reset: Resize displayed data to fit in window
2D / 3D: Right click on the display area to switch from 2D to 3D view and back.
Profiles: Right click on the display area to switch off X/Y profiles display
Reset profiles: Reset the profiles X / Y positions to (0,0) and the profiles angle to 0°.
Center click and drag to pan, Scroll to Zoom in and out.

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· Color scale :
Right click on color scale to change the color mapping and the color representing NaN (Not A
Number).

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WaveView

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4.10 Time related measurements and Zoom

Time related measurements

The Time related measurements window is used to monitor the temporal changes in a numerical
value such as wavefront RMS, radius of curvature, etc.
The Time related measurements window appears below the diagnosis area. It automatically unfolds
when a numerical value is added.

Important : closing the Data Analysis window automatically clears the unsaved data, but you can
reduce the space dedicated to it with the handle above its title bar.

In addition to the graph, the display shows time-related statistics on all the recorded values.
The maximum number of samples in the history is fixed. If this number is exceeded, the oldest values
are deleted as new ones are added.

On each tab, the button Clear purges the data and the button Save saves the data in text format and
Closing the tab removes the numerical value from the Time related measurements window.
Note: The same actions can be performed at once on all the numerical values by using the Actions
menu at the left of the close icon of the Time related measurements window.

Zoom Manager
The Zoom Manager window allows the user to watch the progress of a value while being at distance
from the computer's screen.
The Zoom Manager window can be moved anywhere on the screen, independently of WaveView's
main window.
The values can be reorganized, and their sizes are automatically adjusted to the window's size.
There is no limit to the number of values displayed in the Zoom Manager window.

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For example, clicking on the magnifier icon next to the wavefront RMS value makes the zoom window
appear :

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4.11 Windows toolbar

Tile
Tiles the diagnosis displays opened in the diagnosis area.

Cascade
Cascades the diagnosis displays opened in the diagnosis area.

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4.12 Features panel

All the measurement process parameters are located in the Features panel.
This panel offers a quick access zone (Favorites panel) that eases the finding of the most frequently
modified parameters.

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Part V
Data
Acquisition
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WaveView

Data Acquisition
Important: Please check the setup wavelength as a preparatory step (Features panel > Sensor) to
ensure the correctness of all the calculations where it is directly involved (such as the point spread
function or the modulation transfer function)

The first step is to establish connection with a physical sensor or with a measurement data server (for
example, connection to the WaveTune software).
Please open the connection configuration dialog by selecting File > Sensor in the Menu, or by clicking
directly on the Sensor icon in the Main toolbar.
The Connection type field value modifies the appearance of the window to propose the appropriate
parameters.
Use Connection type = Sensor (direct) to directly control a Imagine Optic wavefront sensor physically
connected on your computer.
Use Connection type = Server (remote) to retrieve measurements taken by another software, on the
same computer or on the same network.

Depending on the type of connection to be established, please proceed to the From sensor or From
data server chapter.

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5.1 From sensor

5.1.1 Parameters
The list of wavefront sensors that may be controlled by the WaveView software depends on the
installation of the matching configuration files with the appropriate authorizations.

Sensor type
Type of sensor. Please refer to sensor specifications.

Sensor serial number

Serial number of sensor. Please refer to sensor specifications or check on the backside of your device.

Connect / Disconnect
Once sensor type and serial number have been correctly configured, opens or closes the connection
with the Imagine Optic wavefront sensor.
In case connection fails, please read the error message carefully to get some clues about the
encountered problem.

Connection parameters

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Two kinds of connection parameters can be managed before connecting the sensor:
· Sensor connection parameters
This parameters list is related to the selected sensor. Those parameters can be manage to avoid
connection issue with some windows or computer setup.

When one of this sensor connection parameters is modified from the default value, the image
grabbing performance from the sensor can be degraded.

· Compatible views
The available views list for the selected sensor is displayed.
Click on the button next to the chosen view to connect to the sensor and to load the associated view.

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5.1.2 Acquisition modes

There are four camera signal acquisition modes.
Each acquisition mode corresponds to an action of the Acquisition toolbar 14 .

Continuous mode (Start / Stop)

Performs continuous acquisition, processing and display of the data.
Use case: This is the most frequently used mode.

Snapshot mode
Acquires, processes and displays a single measurement.

Full speed mode

Acquires a defined number of raw data at maximum sensor acquisition frequency.
The raw data are processed afterwards and the resulting measurements can be reviewed using the
Replay toolbar 15 .
To acquire a sequence of image in full speed mode, first step is to select the number of requested
images.
Use case: This mode is very useful for fast phenomenon analysis.
Important : Fullspeed acquisition is not compatible with image summing.
Note: The maximum acquisition frequency depends on the exposure duration and on the external
trigger settings if applicable.
Please review the current acquisition parameters and refer to the technical specifications of the
sensor to determine the maximum acquisition frequency.

Scripted mode
Acquires a defined number of raw data at a specified rate.
The raw data are processed afterwards and the resulting measurements can be reviewed using the
Replay toolbar 15 .
To acquire a sequence of image in scripted mode, first step is to select the number of requested
images.
Use case: This mode can be used for long term observation, like overnight measurements.

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5.1.3 Acquisition Parameters

The Acquisition parameters are located in the parameters panel, under :

Experimental parameters

Wavelength
This parameter must be set accordingly to the wavelength of the setup light source.
Important: Indicating the wrong wavelength leads to aberrant results when using "lambda" as
wavefront unit or computing propagation diagnosis.

Acquisition parameters

Sum of images
This parameter controls how many images must be cumulated before computing the local slopes.
Cumulating images helps reducing the noise on acquired data but may slow down the acquisition
frequency.

Exposure duration (µs)

Exposure duration(in µs) can be adjusted in the "Exposure duration µs" field.
Note : In some cases the physical exposure duration may slightly differ from the specified exposure
duration because of the samplers in the acquisition boards.

Trigger mode

Cam_internal
This triggering mode is automatic: the camera begins the exposure as soon as possible, without
waiting for an external event as the software or external modes do.
When used with continuous acquisition mode, this is the direct way to measure the wavefront in real
time.

TTL
This mode can be used to place the camera on standby for an external TTL signal via a hardware
interface such as a BNC connector. The sensor documentation describes where the input for this
signal is located.
In this mode there is an additional option for the purpose of configuring the polarity of the front that
triggers acquisition: rising or falling.
Certain cameras are not equipped for this mode. Please refer to sensor specifications.

Software
This mode makes the acquisition board wait for a software event.
This event occurs when the 'Trigger Software' button, which appears automatically in this mode, is
pressed.
This operates is a similar way to Snapshot mode, except that Snapshot mode controls triggering 'in'
the acquisition board itself.

Temperature (°C)

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Controls the operating temperature of the sensor.

Certain cameras are not equipped for temperature control. Please refer to sensor specifications.

Offset
Controls the constant value subtracted to the camera signal.
Certain cameras are not equipped for offset control. Please refer to sensor specifications.

Gain
Controls the gain value used for photons to pixel values conversion.
Certain cameras are not equipped for gain control. Please refer to sensor specifications.

Time-out
The time-out is the time after which the user is notified that no images have arrived.
A warning message appears in the status bar in case acquisition took longer than the specified
timeout.

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5.2 From data server

5.2.1 Principle
A major feature offered by WaveView4 is the ability to acquire measures from a computer other than
the one physically connected to the sensor.
This is achieved by transmitting the wavefront measurements over the network.

Client-server mode is useful whenever it is difficult to access the machine connected to the Imagine
Optic wavefront sensor, or when doing so would disturb the measurements, for example:
· Operating in a clean room,
· A human presence in the test room disturbs the atmosphere and therefore the wavefront
measurement.

In client-server mode, a server computer connected to the sensor calculates the local slopes on an
image and broadcasts ("serves") the local slopes to clients computers, as illustrated in the following
diagram:

The receives local slopes feed the measurement process 6 that will then :
· Display the downstream diagnosis like beam parameters, PSF, MTF...
· Perform processing such as reference subtraction, user pupil, double path...
· Reconstruct the phase according to user preferences.

Important :
- The clients cannot access the camera image.
- The software configured as server provides exactly the same features as in normal use.

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5.2.2 Parameters
Server IP address & Server port
Specifies the network address of the remote server and the port to connect to on the server.
The network port has to be chosen so that the firewall allows communication through it.

Detect
Tests the connection. If the server has been successfully reached, the sensor properties and server
data are updated.

Sensor serial number & Sensor type

Once the connection has been positively tested with the server, display the properties of the Sensor
physically driven by the latter.

Server Data
Once the connection has been positively tested with the server computer, displays the data names
and types that can be retrieved from the server.
One of the "Haso slopes" type data has to be selected to set up connection and start remote measure
retrieval.

Connect / Disconnect
Establishes or closes the connection for retrieval of the selected remote data.

Update
Allows to change the data selected for retrieval.
With the data names of the screenshot :
Let suppose the connection has been established for IO_WS_ProcessSlopes retrieval.
To retrieve IO_WS_RawSlopes instead, IO_WS_RawSlopes must be selected, followed by a click on the
Update button.

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Use case: Wavetune as server, WaveView as client on the same computer

The WaveTune software included in Imagine Optic's WaveSuite software distribution is the solution
dedicated to adaptive optics applications.
The available diagnosis and settings it offers have been selected to reflect the adaptive optics users
needs, but it may be useful to deepen the diagnosis using WaveView as client of WaveTune.

Step 1
Run WaveTune and configure the software to Broadcast wavefront data (see WaveTune software
documentation).
Run WaveView software, open the Sensor panel and set the Connection type parameter to "Server
(remote)"
Use "localhost" as Server IP address and the network port number chosen in WaveTune software as
Server port.
Click the Detect button to test the connection.

Note :
If the "localhost" alias is not correctly resolved (error message indicating Unknown host or invalid
address), please try using the local IP address [Link]

Step 2
If the connection is OK, the Sensor serial number and Sensor type display the properties of the

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Sensor driven by the WaveTune software.

The list of the data made available by the server appears on the lower side of the panel.
Please select IO_WS_ProcessedSlopes to get the same wavefront as displayed in WaveTune (including
AO pupil application, target subtraction ...)

Step 3
Click on the Connect button.
Start the acquisition on WaveTune's side.
Clicking Start in WaveView acquition toolbar starts the data retrieval. Diagnosis display, projection
and other metrology tools can now be configured to further diagnose incoming measurements.

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5.3 From file or folder

Loading data from a file

WaveView software can open .has (wavefront measurement) or .himg (raw data) file.
A measurement file can be opened and processed with the settings used at saving time or with the
current instance settings.
If the file is opened in a new WaveView4 instance, the initial processing settings are those used at
saving time.
All later changes in the settings will update the displayed measure.

Loading data from a folder

WaveView software can load a folder containing .has (wavefront measurement) or .himg (raw data)
file.
If the folder's content is loaded in the current WaveView4 instance, the measurements will be opened
and processed with the current settings.
If the folder's content is loaded in a new WaveView4 instance, the initial processing settings are those
of the first file.
All later changes in the settings will apply to all the measures.
Use case : Use folder opening to process data saved with the Auto Save feature. Please proceed to
the File formats 146 chapter to get further information.

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Part VI
Alignment &
Pairing
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Alignment & Pairing

Alignment and pairing are calibration steps that will ensure the best metrological performances from
your Imagine Optic wavefront sensor.

Note : In case the sensor is of type Hartmann and not Shack-Hartmann, the spots are created by a
grid and not a microlens array.
We will still use the term "microlens" in this chapter to describe the optical hardware that creates
spots, even if it may be improper in a Hartmann sensor type case.

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6.1 Sensor alignment

The following procedure applies when :
· the Imagine Optic wavefront sensor has no high-contrast micro-lens option.
· the Imagine Optic wavefront sensor has no Spot Tracker
· The Spot Tracker confidence indicator shows that the sensor is not in the recommended position
range.

The mechanical alignment of the wavefront sensor ensures the device is positioned in the
recommended use range and offers the best metrological performances.
It is therefore strongly advised to complete the alignment process each time the optical setup
changes.

Principle

The purpose of alignment is to adjust the sensor position against the beam so that the incident
wavefront has the less possible tilt.
Even if the sensor tilt measurement dynamic is several thousand times the wavelength, a preliminary
alignment is still recommended: if the incident wavefront has an average tilt greater than a certain
limit, the sensor will not be used under good metrological conditions, and adequate performances are
no longer guaranteed.

Imagine Optic provides a dedicated tool to align the Imagine Optic wavefront sensor: the mechanical
centering device.
The mechanical centering device is a lid with a little hole at the center. When mounted on the sensor,
it allows only a small part of the beam light to pass through.
Because the light propagates perpendicularly to the wavefront, the angle between the partial light
beam and the sensor's surface is characteristic of the wavefront tilt.
The absolute tilt of the incident wavefront is therefore directly related to the position of the lighted
area.

How-to

Step 1
Position the centering device.

Step 2
Switch to the Alignment workspace from the Menu 9 or from the Workspaces toolbar 11 .
Start acquisition using the Continuous acquisition mode and adjust the acquisition parameters.

The alignment window in the diagnosis area shows :

· the raw data (the image formed by the partial light beam lighting the sensor).
· a circle indicating the acceptable positions of the lighted area. These target positions set is
calibrated when the sensor is manufactured.
· a dot indicating the current position of the lighted area. If the dot is red, the current position is not
in the acceptable range.

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Step 3
A change in sensor orientation moves the dot. When the dot is inside the circle, it becomes green and
the sensor is within its measurement dynamic.
Reposition the sensor until the dot reaches an acceptable position.

Step 4
Stop the acquisition and leave the Alignment workspace by re-clicking on the Alignment icon in the
Workspaces toolbar 11 or by switching to another workspace.
Remove the centering device without moving the sensor.

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6.2 Spot / microlens pairing

Understanding what spot / microlens pairing is and being able to ensure a correct spot / microlens
pairing can avoid poor quality measurements.

What is spot / microlens pairing ?

The software's algorithm processes the Hartmanngram to locate spots.
For each spot, it computes the corresponding local slopes of the wavefront by estimating precisely the
spot's position.
If the spots locations were to be found assuming specific Hartmanngram spatial partitioning, the
measurements
This is done without assuming any specific region of the image when calculating each spot. In this
way, wavefronts with a very large dynamic can be measurementd, because slopes can be calculated
independently of the initial position of the spots.
In certain cases, however, the algorithm is unable to 'guess' an important point. This leads to measure
errors. The problem is to find out which spot goes with which microlens.

What can cause wrong pairing and how can I diagnose it ?

In the event of large tilt (the definition of "large" depends on the sensor's specifications), the spots
displacement may be greater than the microlens pitch, and there is a risk of mismatch.
The following illustration helps to explain this phenomenon:

In the figure on the bottom right, the software will identify Spot 1 as originating from Microlens 2, and

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will then commit a matching error that will be propagated to other spots.
If the software associates an incorrect microlens index to a spot, there are two consequences:
· The tilt measurement will be false, because a general offset of all the microlens indices signifies an
absolute tilt (in the figure on the bottom right, the measured tilt will be zero, even though there is a
large real tilt). This effect is easily noticeable.
· The reference calibration, which is specialized for each microlens, will be incorrectly applied. This
will cause a systematic error making the sensor unable to perform an absolute wavefront
measurement. When the wavefront is not expected to present huge aberrations, the appearance of
a high spatial frequency pattern indicates an incorrect spot / microlens pairing.

Example of high frequency pattern caused by incorrect spot / microlens pairing.

How can I avoid this risk ?

· If the sensor has a mechanical centering device, the alignment procedure is used to ensure that the
sensor measurements a slight tilt (refer to the relevant section and the following example).
· Monitoring tilt during acquisition: If the wavefront tilt increases gradually, the software follows the
spots as images are acquired and processed, and does not lose the spot / microlens pairing.
· The trimmer is a statistical method used to calculate the combination for a large tilt via software
recognition of the high spatial frequency aberrations that appear in the event of a poor spot /
microlens pairing (refer to the preceding paragraph). Because this method comes from a probability
calculation, it should only be used as a last resort, when alignment using the mechanical centering
device is impossible.
· If the sensor has a perfectly identifiable microlens (thanks to its unusual transmission compared to
the other microlenses), the absolute tilt is computed at each measurement. In this case, it is not
necessary to perform the alignment procedure.

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6.2.1 New lens

The New lens action is located at the beginning of the features list.
This software function is used to reset the spot / microlens pairing and is used to reset the temporal
follow-up of tip-tilt measure.

Important : This operation must be performed when the optical setup is correctly aligned.

Principle
The software searches for the spot nearest to the area where the initial microlens should be located.
This combination can be modified after trimmer operation or when the camera signal becomes
inconsistent with the correct calculation of local slopes (excessive saturation, occultation of the beam
...).
After a return to nominal flux conditions, the New Lens button should be used to realign the spots on
their micro-lenses.
The New Lens operation is automatically triggered after a sensor alignment performed using the
Alignment workspace.

When the first microlens is detected automatically (see Spot Detection parameters 56 ), New lens is
automatically triggered to recalculates the optimum position for the initial micro-lens.

Use case
This feature can be useful :
· when the optic to be characterized is changed frequently and a small tilt is ensured mechanically
after each change of lens to be characterized (hence the name "New Lens"),
· when sudden changes in the experimental conditions made the Hartmanngram unusable.

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6.2.2 Trimmer
The Trimmer action is located at the beginning of the features list.
This software function computes the appropriate spot / microlens pairing, based on Imagine Optic
wavefront sensor characteristics.

Principle
This tool is one way to counteract the risk of poor spot / microlens pairing.
It is based on the principle of recognizing the pattern of high spatial frequencies of the reference
calibration.
If the pairing is incorrect, this reference calibration pattern is subtracted with a spatial shift and
appears on the local slopes.
The software identifies the pattern and measures its shift, and can therefore determine the correct
spot / microlens pairing to apply.

Use case
Here is a typical example of a wavefront with a shifted calculation (zonal reconstruction):

After application of the trimmer, the wavefront becomes smoother and the high-frequency pattern
has disappeared:

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Use cases
· The user knows that the incident wavefront has no high-frequency aberrations, and that the
software will therefore easily recognize the calibration pattern.
· The hole of the mechanical centering device is not illuminated by the incident beam, making manual
alignment impossible.

This method relies on detecting the position of a correlation peak between factory calibration of the
sensor and the measured position of the spots. It is therefore not 100% reliable, particularly when the
measured aberration is large or has high spatial frequency faults. An inexperienced user of the sensor
will prefer the classic alignment method, which is 100% reliable.
The performance of the automatic shift detection algorithm is directly related to the number of
illuminated microlenses. When the beam is significantly smaller than the sensor pupil (<30% of the
surface area), the user is strongly advised to perform manual alignment or to temporarily change the
longitudinal position of the sensor (along the optical axis) to increase the number of illuminated
microlenses.

How-to
This case assumes that manual alignment is not possible. The sensor is positioned on the beam, and
the camera exposure duration is adjusted to allow local slope measurements to be performed.

Step 1
The beam settings display window must be open. The beam tilt indicated by the software is not
guaranteed because the spot / microlens pairing is unknown (see Introduction).
Acquisition must be started in recurrent mode to obtain real-time information about the wavefront.

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In this case the images should not be averaged, to obtain the highest possible image refreshment rate
so that the sensor can 'follow' the acquisition spots after acquisition.

Step 2
The user presses Trimmer. The tilt measured by the sensor changes because the algorithm calculated
a shift that might be different from the first measured one.

Step 3
The tilt measured by the sensor is brought close to zero by orienting the sensor with respect to the
beam. This assumes that the trimmer calculated the correct pairing during the first step.

Step 4
Press Trimmer again. There are two possible cases:
· The tilt measured by the sensor does not change and remains close to zero: Both trimmer
calculations gave the same offset, the sensor is aligned and the given tilt value is the absolute one.
· The tilt measured by the sensor changes: the first trimmer application may have given an incorrect
shift information. Please repeat steps 3 and 4 until finding a case where the trimmer gives
consistent information for several consecutive measurements and sensor orientations.

In the rare case of this procedure not converging (after applying steps 3 and 4 several times in a row),
the longitudinal position of the sensor should be changed (along the optical axis) to temporarily
increase the size of the pupil on the sensor (valid only if the measured beam is convergent or
divergent in the sensor). When convergence has been reached, the sensor can be returned to its
nominal position after the start of acquisition so that the software can follow the spots during this
operation.

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Part VII

Hartmanngram
processing
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Hartmanngram processing
This chapter deals will all the parameters you can adjust to ensure the best match between the
camera signal quality and the local spots displacements detection.

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7.1 Parameters
7.1.1 Dark subtraction
The software provides the option of subtracting a background signal from the acquired images in real
time. This background signal is known to astronomers as 'dark noise'.

This operation is necessary in three cases:

· When a spurious signal on the acquisitions interferes with measurement and cannot be
suppressed, it can be saved and then subtracted from each measurement,
· For an exposure duration above 300 ms. Beyond this value, the spontaneous generating of charges
in the CCD matrix means that, in the absence of light, the level of certain pixels will rise. In certain
high-speed cameras such as DALSA CA-D8, CA-D6 and CA-D4, saturation is observed at exposure
durations of the order of 2 seconds, even in the absence of light.
· In some cameras, the camera signal background level is not uniform, even with a short exposure
duration. This feature can be useful in this case.

The image acquisition parameters (exposure duration for example) are stored in the image files.
When subtraction of the dark is confirmed, the software automatically compares these values to the
current measurement settings.
If the settings are not compatible, an error message appears.

Important: The light source whose wavefront is to be measured must be switched off during the
acquisition of this image.

Important: The number of images summed is taken into account by removing the background signal
proportion.

None
No dark subtraction.

From file
Loads the dark image from a .himg file previously saved with WaveView.
This is the most common way to define a dark.

Subtract now
Uses last acquired image as dark. In this case, the software supposes (but doesn't automatically
checks) that the last image was acquired without the light whose wavefront is to be measured.

Auto
Computes a dark image from each new acquisition and subtracts it from the camera signal.
Note: The auto dark computation algorithm may cause the software to be less responsive.

Auto now
Computes a dark image from the current acquisition and subtracts it from the camera signal.
This option offers a good tradeoff between the auto dark ease of use and software responsivity.

Embedded

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This option only appears when measure is loaded from a file. In such case, it indicates that a dark has
already been subtracted from the camera signal.
7.1.2 Spot detection
Number of areas
In most cases, the light beam forms a single associated area and only need the definition of a unique
single microlens.
In case of fragmented measured beam (typical use case: telescope mirror measurement), the
number of not connected areas has to be specified in the Number of areas field.
A start microlens has to be defined for each of these areas.

Start microlens
To calculate the position of the spots, the software needs a specific microlens that is the starting point
of the image processing algorithm.
Using the X and Y indices of the starting micro-lens, the software determines the zone of the camera
signal in which the first spot is sought. All the spot positions are then calculated, from one to the next.
Because this specific microlens is the starting point for the algorithm, it must always be illuminated
during measurement. If it switches off (insufficient incident light, the pupil of the incident beam
moves, etc.), the software then informs the user that it is impossible to calculate the local slopes. It is
always advisable to select a starting microlens near the center of the sensor measurement pupil and,
if possible, one that corresponds to the micro-lenses that are lit during the alignment phase (in the
presence of the mechanical centering device). The Alignment principle ensures that these microlenses
have a very small tilt, even when a highly curved wavefront is being measured.

Note: In case of multiple areas, please specify a start microlens for each associated area.
Note: The start microlenses are indicated on the main window by green dots in the camera display.
The user can therefore see if those microlenses are at risk of being switched off during measurement.

Auto detection
If the start microlens at risk of being switched off during measurement.

Use case : If the beam has a central occultation that moves slightly over time, using the Auto detection
option will ensure to detect almost on microlens with enough light to compute a wavefront error map
from the current beam

Note: The automatic start microlens algorithm may cause the software to be less responsive.
Important: The automatic start microlens algorithm doesn't handle the multiple areas case.

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7.1.3 Spot Tracker

Spot tracker is a new spot auto-alignment feature.
On a standard Shack-Hartmann, one must pre-align the sensor to reduce the incoming tilt of the
beam. This pre-alignment is mandatory as the software can’t know which spot is created by which
microlens. By starting the measurement process with a small tilt, the spots are placed under their
microlens and the association can be easily done by the algorithm.
Spot tracker allows the user to not have to pre-align the sensor. The software automatically detects
which spot must be associated with which microlens. This can be done because a new kind of
microlenses array is used in the sensor and a smart algorithm is now available in WaveSuite. In some
very rare cases, the algorithm detects that it fails to associate the spot and the microlens. The user is
then advised and he can deactivate the feature to align the sensor in the usual way.

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7.1.4 Cumulated images VS SNR

For applications with an inhomogeneous intensity profile, it can be useful to change the spot
detection threshold strategy according to the number of averaged images.
This parameter is used to adjust changes in the detection threshold of computable micro-lenses
according to the number of summed images.
During image summation, certain micro-lenses that were insufficiently illuminated during a single
acquisition become computable. The calculation threshold of a local slope depends on the spot
contrast and therefore the camera's signal to noise ratio. The signal to noise ratio depends on the
number of images summed. The calculation threshold can therefore be made to depend on the
number of images summed. This possibility makes it possible to increase the size of the computable
pupil in the case of a beam where the intensity contrast in the pupil is high.

The expression can be written as follows, according to the number of images summed:

where N is the number of images summed,

and Parameter is the adjustment coefficient.

There are three possible values for "Sub-pupil detection":

· Low: The value of the adjustment coefficient is 1, the threshold is proportional to the number of
images summed, and the pupil is not dependent on the number of images averaged. To be used
when image summing is used to stabilize the measurement (atmosphere, etc.).
· Medium: The value of the parameter is 0.75, which is a good tradeoff between increasing pupil size
and ensuring a good measurement.
· High: The value of the parameter is 0.5, and the changes in the threshold are in accordance with the
theoretical increase in signal to noise ratio as a function of the number of images summed. To be
used when attempting to measure a wavefront on Gaussian beams on the largest possible pupil.

Note: To prevent a defective pixel of the camera from being interpreted as a spot, when the number
of images summed is very large, an internal software limit prohibits the value of N^(1-parameter)
from exceeding 4.

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7.2 Associated displays

7.2.1 Raw camera signal
Please refer to the chapter Diagnosis area and displays 18 for detailed information on the common
features of this type of display.

Image saturation :
The saturation value is computed against the theoretical maximum value outputted by the sensor.
Note : we strongly advise to keep this value between 20 and 98% to ensure the best processing
performances.

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Part VIII
Optics
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Optics
This chapter deals will all the parameters required to describe the optical setup.

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8.1 Formalism
8.1.1 Beam parameters formalism
The algorithm calculates the local slopes of the wavefront from the camera signal. The raw data
therefore are the combination of two mappings: The X slopes and the Y slopes.
Like all mappings, these can be approximated by planes. The software calculates the best planar
regression for both mappings by a least squares method.

Let i and j are the indices of the microlenses :

X slopes = ax * i + bx * j + cx
Y slopes = ay * i + by * j + cy

The slope coefficients of these planes are used to calculate all the parameters of the wavefront
parameters window.
· The wavefront curvature is proportional to (ax + by) / 2
· The radial position (x,y) of the focal point is obtained by calculating the intersection of these planes
with the special plane slope = 0. The position of the focal point is therefore the point (i,j) where X
slopes = Y slopes = 0. This definition has the advantage of being independent of any aberrations of
the incident beam. By convention, the radial position is zero along the optical axis of the sensor (see
Imagine Optic wavefront sensor axis system).
· The coefficients of the cx and cy planes are relative to the wavefront tilts. By convention, the
wavefront tilt is defined as the angle of the main radius of the pupil. To calculate this tilt, the
software calculates the (i,j) coordinates of the central micro-lens with respect to the measured pupil.
This calculation is performed by barycentric estimation of the measured pupil. The tilts are then the
value of the planes in this micro-lens.

Important: This means that, on a divergent beam illuminating the entire pupil of the wavefront
sensor, if the software user removes a part of the pupil by 'switching off' a region of the pupil (via the
user pupil management tool), the position of the focal point will remain fixed while the tilt will be
altered because the main radius of the pupil will move.

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8.1.2 HASO axis system

The Imagine Optic wavefront sensor has its
own axis system. The focal point coordinates
are given in accordance with this axis
system.
A positive slope along X indicates a
calculated spot that has moved towards the
positive X axis with respect to its initial
position.
A positive slope along Y indicates a
calculated spot that has moved towards the
positive Y axis with respect to its initial
position.
All the diagnostic windows are displayed so
that the lower left-hand corner of the display
corresponds to the corner X = Y = - half pupil
size.
A positive wavefront radius of curvature
corresponds to a focal point located in front
of the wavefront sensor.
The astigmatism angle is measured from the
X axis.

Important: The consequence of this sign

convention is that a positive wavefront
(according to the Z axis) corresponds to a
phase lag.
This convention is the opposite of the
convention for interferometric wavefront
measurement tools. It also applies to
polynomial coefficients.
For example, a positive curvature Zernike
coefficient corresponds to a focal point
located in front of the wavefront sensor, and
therefore to a wavefront with a phase lag at
the edges of the pupil.

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8.2 Parameters
Note : The processing parameters documentation follows the order of the software processing steps.
8.2.1 Intensity threshold
This feature controls the level of thresholding on intensity to determine which microlenses have to be
considered in the measurement pupil.

Minimum
The software automatically adjusts the measurement pupil by deactivating the microlenses whose
intensity is lower than the factory threshold.
The factory threshold is low but ensure a minimum spot quality for local slope computation.
This option gives the largest measurement pupil.
Note: even setting a 0% manual threshold, the software computation won't go below this factory
threshold.

Preset
There are two predefined intensity thresholds:
· Auto 1/e: the filtration percentage is set to 60.6%,
· Auto 1/e²: the filtration percentage is set to 13.5%,

Use case: wavefront measurement on a Gaussian intensity profile.

· 1/e = sigma in Gaussian case
· 1/e² = 2 * sigma in Gaussian case

Manual
This option allows to set directly the value of the threshold.

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8.2.2 Reference
Many applications do not require absolute measurement, hence the use of the wavefront sensor
factory calibration.
Referenced mode is used to perform measurements relatively to a reference one.
Note : The subtraction of a reference measure is performed before almost all further processing
except intensity thresholding.

None
no reference is subtracted from current measure.

From File
The reference file is loaded from a previously save measure in .has format.
If the file taken as a reference was itself saved with processing, this processing may be applied before
subtracting the reference measure by unchecking the checkbox at the bottom of the file selection
dialog.

This operation can then be performed while image acquisition is in progress.

Once
In this case, the current measurement is used as reference, that is, subtracted from all subsequent
measurements.
If no measurement is available, the software waits for the next valid measurement.
The timestamp of the measurement used as reference is displayed until the reference mode changes.

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8.2.3 Fill
When isolated microlenses are "off" (no enough light passing through to form a exploitable spot), it
can be useful to extrapolate the corresponding slope value to obtain a connected computable pupil.
When Fill is selected, the software automatically completes the missing local slopes from the
neighboring ones.

Use case:
The Fill feature can be very useful when the selected wavefront reconstruction mode is modal, with
an automatically determined projection pupil.
In this case, if there are blinking "off" microlenses in the pupil of the beam to be measured, the
projection pupil may fluctuate or even be quite far from the pupil of the beam.
Activating the fill feature allows to stabilize and / or complete the measured pupil and to compute a
more appropriate projection pupil.

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8.2.4 Erode
The erode function allows the user to shrink the measurement pupil by one or more microlenses.

Use case :
The physical boundaries of the optical system's pupil often diffract.
This diffraction effect can significantly impact the local slopes values and therefore the wavefront
measurement, resulting in outliers points on the edge of the measurement pupil.
In such cases, it can be useful to remove the unreliable data coming from the pupil's boundaries.

Note: It is exceptional to erode more than 3 microlenses from the pupil edge.

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8.2.5 Double pass

Certain applications of the wavefront sensor result in the beam measured by the sensor passing twice
through the optical system to be characterized.
For example: characterization of a collimator or telescope via a double pass, the measurement of the
mechanical deformation of a mirror, ...

WaveView can be configured to automatically adjust the diagnosis to a double pass setup.

None
Single pass setup case.

Aberrations
Keeps the geometric parameters of the beam unchanged by maintaining measured tilt and curvature
components and divides the other aberrations values by two.

Aberrations, tilts + curvature

Divides all aberrations by two, including tilts and curvature.
Important: This options affects some of the computed beam parameters.

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8.3 Mask
The software calculates the spots contrasts during the search of their positions on the CCD. If the
contrast is not sufficient, the spot is considered "OFF", and the corresponding local slope is not
displayed.
The set of all computable microlenses defines the computable pupil.

The spot detection threshold is strongly dependent on the number of bits of the camera used and its
quality. In general, this minimum contrast is defined as a tenth of the maximum contrast.
The mask feature can be used:
· to restrict the computable pupil to a desired zone,
· to eliminate a zone of the computable pupil that may have been altered by a spurious beam.

This mask acts as a filter on the computable microlenses to reduce its size. It affects on all the
diagnostics resulting from the local slopes (wavefront, geometric parameters of the beam, etc.).
In zonal reconstruction mode, the final pupil will be the common part of the mask and the
computable pupil.
In modal reconstruction mode, the modal pupil takes the mask into account.

Open file / Save / Clear

Loads or Saves the mask in a classical image format.
Note: The image and the measurement data dimensions must match.
The clear operation removes all the modifications.

Color selector
Switches between black or white color.
If a "pixel" of the mask is colored in black, the corresponding microlens will be turned off.

Ellipse / Rectangle

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Draws simple geometrical shapes, filled with the current color.

Shape manipulation tools

Selection, deletion, depth order of the shapes.
Please refer to the features to rotate the selected shape.

Pen / Eraser
Allow to turn off (or on) one single microlens at a time.

Features
· Background: The user can choose between three possible backgrounds to ease the microlenses
selection: the Wavefront, the intensity or the computable pupil.
· Shape parameters: fine tune the geometry of the selected shape (width, height, position and angle).

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8.4 Associated displays

8.4.1 Beam parameters
Please refer to the chapter Diagnosis area and displays 18 for detailed information on the common
features of this type of display.

Please refer to the Formalism 63 chapters for detailed information on each displayed value.

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8.4.2 Local slopes

Please refer to the chapter Diagnosis area and displays 18 for detailed information on the common
features of this type of display.

Magnification scale
Allows to control the ratio between the length of the lines representing the local slopes and the local
slopes norm.
Adjust as needed to get a comfortable local slopes representation.
The current value of the scale is indicated in the slightly darker box below.

Grid size
The grid size is updated depending on magnification scale value, so that the local slopes
representation can be converted to mrad.

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8.4.3 Intensity
Please refer to the chapter Diagnosis area and displays 18 for detailed information on the common
features of this type of display.

Intensity values
The intensity values are not normalized.
The software uses integrated pixels values under each microlens to determine the local intensity
value.

Intensity contrast
The software uses the Michelson contrast formula: contrast = (max - min) / (max + min)

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Part IX
Wavefront &
Aberrations
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Wavefront & Aberrations

The wavefront or wavefront surface is the piece of information most often used when using the
wavefront sensor. It is the result of a calculation based on local slopes measured by the wavefront
sensor.
The wavefront surface is defined as the surface that is perpendicular to the light rays. The wavefront
sensor measures the local slopes and therefore the Cartesian gradients of the wavefront surface.
Calculating the wavefront surface from these gradients therefore amounts to integrating the
mappings of local slopes obtained.

The WaveView software can calculate the wavefront surface in two different ways, detailed in the
Reconstruction modes chapter.

The Wavefront calculation parameters refine the calculation before it is displayed in the Wavefront
display window.
In the special case of modal reconstruction, the modal pupil is a preponderant parameter of the
calculation.

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9.1 Reconstruction modes

The user can choose between the following two reconstruction modes:
· Zonal Reconstruction: this mode is often used in beam alignment phases or in LASER beam analysis,
because it can be adapted to all types of pupil. This type of reconstruction is noisier than the others
because it reconstructs the wavefront by integrating the derivative by propagation in the pupil.
· Modal Reconstruction using Zernike or Legendre polynomial basis: this mode lets the user obtain
the coefficients of the polynomials computed by projecting the wavefront on a polynomial basis.
Reconstruction is performed on a round pupil for Zernike polynomials and a square pupil for
Legendre polynomials. This modal-type reconstruction is often used in the qualification of optical
components, because the analysis pupil can be set and each type of aberration present in the
wavefront can be analysed.

Note: both reconstruction modes as implemented by Imagine Optic are robust to lack of information
in the projection pupil.

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9.1.1 Zonal reconstruction

Principle
The method used is an iterative method attributed to Southwell, known as the Successive Over
Relaxation Method.
For further information about this method, refer to the document referenced below:
Wave-front estimation from wave-front slope measurements
W.H. Southwell - J. Opt. Soc. Am, Vol 70, No 8, pages 998-1006 (1980).

Advantages
Can adapt to any possible pupil shape. Its local slope signal integration concept lets it preserve all the
spatial high frequency information.

Disadvantages
Noisier reconstruction. The reconstructed wavefront is sensitive to any noise present on a local slope.
It does not calculate the polynomial coefficients, which are often very useful in optical metrology.

Use cases
This is the only method that can be used for a special pupil shape: oval beam at laser diode output,
specific optic, etc.
It is advantageous to use a zonal reconstruction method in the adjustment phase because the beam
moves a lot on the sensor.. The phase front can then be measurementd on all computable
micro-lenses. In addition, the phase front is then displayed on the physical pupil. The pupil and the
beam aberrations can then be viewed on the same window.

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9.1.2 Modal reconstruction

Naive modal reconstruction principle
Modal reconstruction requires a base of orthogonal polynomials on a fixed support. For a round
pupil, Zernike polynomials are used. For a rectangular pupil, Legendre polynomials are used.
The information given by the sensor is a table including the local slopes of the wavefront along X and
Y for each micro-lens. For Legendre polynomials, there are 2xNxM data points, where N is the number
of illuminated micro-lenses on an axis, and M is the number on the other axis. For Zernike, the
number of micro-lenses allowed for in the pupil must be counted.
To calculate the coefficients of the polynomials being sought, a rectangular command matrix with
2xK2 columns and L rows is multiplied by the local slope vector, where K is the number of
micro-lenses being illuminated and L is the number of coefficients to be determined. This gives the L
values which happen to be the coefficients of the polynomials under consideration.

This type of reconstruction has the advantage of providing the best possible determination of the low
spatial frequencies of the wavefront. These low frequencies are often of interest to users (tilts,
curvature and third-order aberrations).
The main disadvantage of this method when it is naively implemented is that it filters the high spatial
frequencies during reconstruction.
It also introduces a constraint: the pupil must have a simple shape (round or rectangular).

Imagine Optic combined reconstruction principle

Imagine Optic proposes a reconstruction method that exploits the advantages of both the Modal and
Zonal reconstruction methods. On simple pupils, this method is ideal to give a very good estimate of
the low orders while retaining high-frequency information that might lead to the detection of abrupt
defects in a wavefront.
Step 1: As for naive modal reconstruction, the first n coefficients of the chosen polynomials are
obtained by standard modal projection method.
Step 2: Using these coefficients, the local "low-frequency" slopes of the wavefront are determined by
differentiating the reconstructed wavefront using the analytical expressions for the polynomials.
Step 3: The slopes calculated in Step 2 are removed from the initial local slopes. The zonal
reconstruction algorithm can then be used to recover the high-frequency information.
Step 4: The wavefront is then calculated by summing the phase mappings determined in Steps 2 and
3.

Advantages
The Modal reconstruction mode as provided by Imagine Optic offers combines the advantages of the
two reconstruction methods by using a modal projection for low frequencies aberrations, and zonal
integration for hight frequencies aberrations:
· The reconstruction of low-frequency orders is performed accurately because it is modal. This gives
the low-order coefficients of the polynomials.
· Unlike naive modal reconstruction, this method does not filter the high frequencies but treat them
differently. It is therefore possible to measure the defects of wavefronts with fairly high
characteristic spatial frequencies.

Disadvantages
Even if the constraint on the pupil shape may be relaxed by handling correctly th missing data points,
it is still not particularly suitable during a phase of adjusting the beam on the sensor (reducing the

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beam aberrations by adjustment): in this case it is preferable to use a zonal reconstruction, which has
the advantage of calculating the wavefront on any pupil shape.

Use cases
This reconstruction is useful in solving problems involving the characterization of simple pupil
components. It is used when a list of polynomial coefficients needs to be calculated.

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9.2 Parameters
9.2.1 Oversampling
The wavefront and intensity sampling can be set to be greater than the physical sampling of the
wavefront sensor: by default, the sampling pitch of the wavefront (or intensity) surface is equal to the
pitch of a microlens of the wavefront sensor.
The choice of the oversampling parameter impacts the downstream diagnosis, especially the beam
propagation computation (calculation of the point spread function and modulation transfer function).

There are three possible choices:

· x1 (default): In this case, the display sampling will be equal to the sampling performed by the
wavefront sensor used,
· x2: The display sampling will be equal to twice the sampling performed by the wavefront sensor
used,
· x4: The display sampling will be equal to four times the sampling performed by the wavefront
sensor used.

In these last two cases, the software performs an interpolation between the values obtained per
micro-lens.
This feature is useful for two reasons:
· When the sensor has low resolution (HASO16 for example), the displays become better-looking and
are therefore nicer to include in reports when an oversampling is selected,
· When a calculation based on FFTs is performed (e.g., point spread function), the finer the sampling
of the initial signal, the greater the support in space of the spatial frequencies. By oversampling the
wavefront, it is therefore possible to calculate point spread functions on highly aberrant wavefronts
without encountering any aliasing problems.

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9.2.2 Display unit

You can select either of two units for the wavefront display:
· microns,
· Lambda: to obtain the phase in multiple number of lambda, the following operation is performed:
Phase (Lambda) = Phase (µm) / Wavelength (µm)

The working wavelength can be modified using the Features panel, in the sensor section.

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9.2.3 Reconstruction parameters

2D integration

If zonal reconstruction of the wavefront is selected, the user can choose between three integration
presets.

The zonal algorithm is iterative. By default, the software uses a number of iterations that will provide
the best tradeoff between reconstruction quality and calculation speed.
When aberrations are small (< 1 lambda PV) and have low spatial frequency (third order Zernike at
most), it may be advantageous to use the fast integration option.
Reciprocally, in case the aberrations are huge and show quick spatial variations, the accurate option
can give better results.

Important:
Using this feature supposes a deep understanding of the zonal wavefront integration algorithm.
We strongly advice to keep the standard integration option.
To guard against errors, it is recommended that the user estimates the difference obtained on the
reconstruction with, and then without, this option.

The default mode is standard option.

To get Fast or Accurate options, please select the filtering feature level at Expert level. In this case,
you can change the 2D integration behaviour.

In this case, It is also possible to manage three low parameters to setup the 2D integration algorithm
in Manual option.

Max. number of weak iterations A weak iteration is defined as an iteration for which the
variation of the residue from previous iteration is below the residual variation limit multiplied by the
number of microlenses of the Haso (Default value 6).
Max. number of iterations Maximum number of iterations (Default value 250).
Residual variation limit Residual variation limit (Default value 5x10-5).

The default value corresponds to the standard integration option.

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If Modal reconstruction of the wavefront is selected, the wavefront can be reconstructed using the
following two types of polynomial:
· Legendre polynomial: Legendre polynomials are suited to rectangular pupils. The software uses the
rectangular pupil defined in the Features panel. Wavefront reconstruction is performed via this
medium.
· Zernike polynomial: The choice of Zernike polynomials imposes a round pupil. The software uses
the round pupil defined in the Features panel. Wavefront reconstruction is performed via this
medium.

Common parameters

Number of coefficients
For both the Legendre and Zernike wavefront reconstruction polynomial types, the number of
coefficients to be calculated can be adjusted via the "Number of coefficients" controller.
The higher this number, the more the high spatial frequencies of the wavefront will be considered in
the calculation, but at the cost of a long and tedious calculation.
Most optical calculation softwares use 64 Zernike coefficients at most.

Coefficients normalization

For both the Legendre and Zernike wavefront reconstruction polynomial types, there are two types of
coefficient normalization :
· RMS normalization,
· PV normalization .

The list of calculated polynomial coefficients can be obtained by opening the modal coefficients
diagnosis window.

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Zernike types

There are three types of Zernike coefficient types :

· Circular,
· Elliptic (optional),
· Annular (optional).

Zernike indexing

There are two types of Zernike coefficient indexing :

· Noll indices,
· Wyant indices.

Zernike projection pupil

There are three main modes to define the Zernike projection pupil :
· Circular defined by X center (mm), Y center (mm), and Radius (mm)
· Elliptic defined by X center (mm), Y center (mm), X half axis (mm), X half axis (mm) and
Rotation angle (°)
· Annular ( by X center (mm), Y center (mm), Radius (mm) and Inner radius (mm)

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Pupil center

Manual option :
In this mode, the coordinates of the center of the circular pupil can be configured manually by setting
the value of X center (mm) and Y center (mm).

Auto option :
The software automatically determines the largest possible circular pupil inscribed in this analysis
zone.
It uses the computable micro-lenses and the user pupil to calculate the position and radius of this
circle. The diagnostics on the circular pupil found are indicated as follows:
In Inscribed pupil mode, the largest circular pupil is such that all the micro-lenses inside it are
computable and not switched off by the user. The "Fill" feature can extrapolate from isolated switched
off micro-lenses to increase the size of the largest circular pupil.
In this mode, at each measurement, the software evaluates the largest pupil and can change it
according to any noise or beam movement. It is difficult to compare the values of polynomial
coefficients in this mode, because it is impossible to ascertain whether the aberrations are changing
or whether the pupil is changing. To observe the changes in quantity of the aberration according to a
system parameter to be characterized, a manual pupil size management mode should be used to
ensure that the polynomial coefficients are comparable from one acquisition to the next because they
have been defined on a pupil that remains stable.

Pupil radius

Manual option :
In this mode, the radius of the circular pupil can be configured manually by setting the value of
Radius (mm).

Automatic detection options: inscribed or circumscribed.

The software automatically searches for the radius of the round projection pupil.
Circumscribed: all the micro-lenses of the effective pupil will be reunited in the modal pupil. The
software finds the circle that includes all the micro-lenses of the effective pupil. The micro-lenses of
the modal pupil are not necessarily all illuminated. In this mode, it is possible for many micro-lenses
to be unlit in the projection pupil for the calculation of Zernike coefficients. When there is a large
number of coefficients to calculate, the coefficient values calculated may be strong because of the
rapid divergence of Zernike polynomials at the edge of a pupil.
Inscribed: the software finds the largest circle inscribed in the effective pupil. All the micro-lenses of
the modal pupil are illuminated.

Important: In this mode, at each measurement, the software evaluates the projection pupil and can
change its diameter according to any noise or beam movement. It may be difficult to compare the
values of polynomial coefficients in this mode, because it is impossible to ascertain whether the
aberrations values are changing because of physical aberrations evolution or only because the
projection pupil diameter is slightly changing. To observe the changes in quantity of the aberration
according to a system parameter to be characterized, a manual pupil management mode should be
used to ensure that the polynomial coefficients are comparable from one acquisition to the next
because they have been defined on a pupil that remains stable.

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Detect pupil radius :

The software automatically determines the largest possible circular pupil Circumscribed in analysis
zone.
In this mode, the software evaluates once the largest pupil and can change it according to any noise
or beam movement.

Pupil center

After this operation, the coordinates of the center of the elliptic pupil can be configured manually by
setting the value of X center (mm) and Y center (mm).
And two different axis lengths and rotation axis can be configured manually according the beam
geometry.

Pupil radius

The radius of the elliptic pupil can be configured manually by setting the value of X half axis (mm)
and Y half axis (mm).

Pupil rotation

The rotation of the elliptic pupil can be configured manually by setting the value of Rotation angle (°).

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Detect pupil radius :

The software automatically determines the largest possible annular pupil Circumscribed in analysis
zone.
In this mode, the software evaluates once the largest pupil and can change it according to any noise
or beam movement.

Pupil center

After this operation, the coordinates of the center of the annular pupil can be configured manually by
setting the value of X center (mm) and Y center (mm).
And pupil radius and the inner radius can be configured manually according the beam geometry.

Pupil radius

The radius of the annular pupil can be configured manually by setting the value of Radius (mm).

Pupil rotation

The inner radius of the annular pupil can be configured manually by setting the value of Inner radius
(mm).

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Pupil geometry

Manual option :
In this mode, the coordinates of the center of the circular pupil can be configured manually by setting
the value of X center (mm), Y center (mm), X size (mm) and Y size (mm).

Auto option :
The software automatically determines the largest possible square pupil inscribed in this analysis
zone.
It uses the computable micro-lenses and the mask to calculate the position and size of this square.
The largest square pupil is such that all the micro-lenses inside it are computable and not switched off
by the user. The "Fill" feature can extrapolate from isolated switched off micro-lenses to increase the
size of the largest square pupil.
In this mode, at each measurement, the software evaluates the largest pupil and can change it
according to any noise or beam movement. It is difficult to compare the values of polynomial
coefficients in this mode, because it is impossible to ascertain whether the aberrations are changing
or whether the pupil is changing. To observe the changes in quantity of the aberration according to a
system parameter to be characterized, a manual pupil management mode should be used to ensure
that the polynomial coefficients are comparable from one acquisition to the next because they have
been defined on a pupil that remains stable.

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The wavefront can be reconstructed using the following types of polynomial:

· Legendre polynomial
· Zernike polynomial with RMS or standard normalization
· Annular Zernike polynomial

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The wavefront can be reconstructed using the Legendre polynomial. The polynomial expression can
be found into next pages.
Expression for Legendre standard polynomials:

N° Équation Nom
1 x Tilt at 0°
2 y Tilt at 90°
3 1/2 (3xæ-1) Cylinder at 0°
4 xy Astigmatism at 45°
5 1/2 (3yæ-1) Cylinder at 90°
6 1/2 (5xÆ-3x) Linear coma at 0°
7 1/2 (3xæ-1)y
8 1/2 x(3yæ-1)
9 1/2 (5yÆ-3y) Linear coma at 90°
10 1/8 (35xô-30xæ+3)
11 1/2 (5xÆ-3x)y
12 1/4 (3xæ-1)(3yæ-1)
13 1/2 x(5yÆ-3y)
14 1/8 (35yô-30yæ+3)
15 1/8 (63xö-70xÆ+15x)
16 1/8 (35xô-30xæ+3)y
17 1/4 (5xÆ-3x)(3yæ-1)
18 1/4 (3xæ-1)(5yÆ-3y)
19 1/8 x(35yô-30yæ+3)
20 1/8 (63yö-70yÆ+15y)
21 1/16 (231xò-315xô+105xæ-5)
22 1/8 (63xö-70xÆ+15x)y
23 1/16 (35xô-30xæ+3)(3yæ-1)
24 1/4 (5xÆ-3x)(5yÆ-3y)
25 1/16 (3xæ-1)(35yô-30yæ+3)
26 1/8 x(63yö-70yÆ+15y)
27 1/16 (231yò-315yô+105yæ-5)
28 1/16 (429xû-693xö+315xÆ-35x)
29 1/16 (231xò-315xô+105xæ-5)y
30 1/16 (63xö-70xÆ+15x)(3yæ-1)
31 1/16 (35xô-30xæ+3)(5yÆ-3y)
32 1/16 (5xÆ-3x)(35yô-30yæ+3)
33 1/16 (3xæ-1)(63yö-70yÆ+15y)
34 1/16 x(231yò-315yô+105yæ-5)

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Expression for Legendre RMS polynomials

N° Équation Nom
1 £(3) x Tilt at 0°
2 £(3) y Tilt at 90°
3 £(5)/2 (3xæ-1) Cylinder at 0°
4 3 xy Astigmatism at 45°
5 £(5)/2 (3yæ-1) Cylinder at 90°
6 £(7)/2 (5xÆ-3x) Linear coma at 0°
7 £(15)/2 (3xæ-1)y
8 £(15)/2 x(3yæ-1)
9 £(7)/2 (5yÆ-3y) Linear coma at 90°
10 3/8 (35xô-30xæ+3)
11 £(21)/2 (5xÆ-3x)y
12 5/4 (3xæ-1)(3yæ-1)
13 £(21)/2 x(5yÆ-3y)
14 3/8 (35yô-30yæ+3)
15 £(11)/8 (63xö-70xÆ+15x)
16 £(27)/8 (35xô-30xæ+3)y
17 £(35)/4 (5xÆ-3x)(3yæ-1)
18 £(35)/4 (3xæ-1)(5yÆ-3y)
19 £(27)/8 x(35yô-30yæ+3)
20 £(11)/8 (63yö-70yÆ+15y)
21 £(33)/16 (231xò-315xô+105xæ-5)
22 £(45)/8 (63xö-70xÆ+15x)y
23 7/16 (35xô-30xæ+3)(3yæ-1)
24 £(45)/4 (5xÆ-3x)(5yÆ-3y)
25 £(33)/16 (3xæ-1)(35yô-30yæ+3)
26 £(13)1/8 x(63yö-70yÆ+15y)
27 £(15)/16 (231yò-315yô+105yæ-5)
28 £(39)/16 (429xû-693xö+315xÆ-35x)
29 £(33)/16 (231xò-315xô+105xæ-5)y
30 £(55)/16 (63xö-70xÆ+15x)(3yæ-1)
31 £(63)/16 (35xô-30xæ+3)(5yÆ-3y)
32 £(63)/16 (5xÆ-3x)(35yô-30yæ+3)
33 £(55)/16 (3xæ-1)(63yö-70yÆ+15y)

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34 £(39)/16 x(231yò-315yô+105yæ-5)

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The wavefront can be reconstructed using the Zernike polynomial. The polynomial expression can be
found into next pages.

Expression for Noll ordered Zerinke PV (or standard) polynomials

N° n m Equation Name
2 1 1 ì cos(î) Tilt at 0°
3 1 -1 ì sin(î) Tilt at 90°
4 2 0 2ìæ - 1 Focus
5 2 -2 ìæ sin(2î) 45° Primary astigmatism
6 2 2 ìæ cos(2î) 0° Primary astigmatism
7 3 -1 (3ìæ-2)ì sin(î) Primary y-Coma
8 3 1 (3ìæ-2)ì cos(î) Primary x-Coma
9 3 -3 ìÆ sin(3î)
10 3 3 ìÆ cos(3î)
11 4 0 6ìô - 6ìæ + 1 Primary spherical aberration
12 4 2 (4ìæ-3)ìæ cos(2î) 0° secondary astigmatism
13 4 -2 (4ìæ-3)ìæ sin(2î) 45° secondary astigmatism
14 4 4 ìô cos(4î)
15 4 -4 ìô sin(4î)
16 5 1 (10ìô-12ìæ+3)ì cos(î) Secondary x coma
17 5 -1 (10ìô-12ìæ+3)ì sin(î) Secondary y coma
18 5 3 (5ìæ-4)ìÆ cos(3î)
19 5 -3 (5ìæ-4)ìÆ sin(3î)
20 5 5 ìö cos(5î)
21 5 -5 ìö sin(5î)
22 6 0 20ìò-30ìô+12ìæ-1 Secondary spherical aberration
23 6 -2 (15ìô-20ìæ+6)ìæ sin(2î) 45° Tertiary astigmatism
24 6 2 (15ìô-20ìæ+6)ìæ cos(2î) 0° Tertiary astigmatism
25 6 -4 (6ìæ-5)ìô sin(4î)
26 6 4 (6ìæ-5)ìô cos(4î)
27 6 -6 ìò sin(6î)
28 6 6 ìò cos(6î)
29 7 -1 (35ìò-60ìô+30ìæ-4)ì sin(î) Tertiary y-coma
30 7 1 (35ìò-60ìô+30ìæ-4)ì cos(î) Tertiary x-coma
31 7 -3 (21ìô-30ìæ+10)ìÆ sin(3î)

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32 7 3 (21ìô-30ìæ+10)ìÆ cos(3î)

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Expression for Wyant ordered Zerinke PV (or standard) polynomials

N° n m Equation Name
1 1 1 ì cos(î) Tilt at 0°
2 1 -1 ì sin(î) Tilt at 90°
3 2 0 2ìæ - 1 Focus
4 2 2 ìæ cos(2î) Astigmatism at 0°
5 2 -2 ìæ sin(2î) Astigmatism at 45°
6 3 1 (3ìæ-2)ì cos(î) Coma at 0°
7 3 -1 (3ìæ-2)ì sin(î) Coma at 90°
8 4 0 6ìô - 6ìæ + 1 3rd order spherical aberration
9 3 3 ìÆ cos(3î) Trefoil at 0°
10 3 -3 ìÆ sin(3î) Trefoil at 90°
11 4 2 (4ìæ-3)ìæ cos(2î) 5th order astigmatism at 0°
12 4 -2 (4ìæ-3)ìæ sin(2î) 5th order astigmatism at 45°
13 5 1 (10ìô-12ìæ+3)ì cos(î) 5th order coma at 0°
14 5 -1 (10ìô-12ìæ+3)ì sin(î) 5th order coma at 90°
15 6 0 20ìò-30ìô+12ìæ-1 5th order spherical aberration
16 4 4 ìô cos(4î) Tetrafoil at 0°
17 4 -4 ìô sin(4î) Tetrafoil at 45°
18 5 3 (5ìæ-4)ìÆ cos(3î) 7th order trefoil at 0°
19 5 -3 (5ìæ-4)ìÆ sin(3î) 7th order trefoil at 90°
20 6 2 (15ìô-20ìæ+6)ìæ cos(2î) 7th order astigmatism at 0°
21 6 -2 (15ìô-20ìæ+6)ìæ sin(2î) 7th order astigmatism at 45°
22 7 1 (35ìò-60ìô+30ìæ-4)ì cos(î) 7th order coma at 0°
23 7 -1 (35ìò-60ìô+30ìæ-4)ì sin(î) 7th order coma at 90°
24 8 0 70ìù-140ìò+90ìô-20ìæ+1 7th order spherical aberration
25 5 5 ìö cos(5î) Pentafoil at 0°
26 5 -5 ìö sin(5î) Pentafoil at 90°
27 6 4 (6ìæ-5)ìô cos(4î) 9th order tetrafoil at 0°
28 6 -4 (6ìæ-5)ìô sin(4î) 9th order tetrafoil at 45°
29 7 3 (21ìô-30ìæ+10)ìÆ cos(3î) 9th order trefoil at 0°
30 7 -3 (21ìô-30ìæ+10)ìÆ sin(3î) 9th order trefoil at 90°
31 8 2 (56ìò-105ìô+60ìæ-10)ìæ cos(2î) 9th order astigmatism at 0°
32 8 -2 (56ìò-105ìô+60ìæ-10)ìæ sin(2î) 9th order astigmatism at 45°
33 9 1 (126ìù-280ìò+210ìô-60ìæ+5)ì cos(î) 9th order coma at 0°
34 9 -1 (126ìù-280ìò+210ìô-60ìæ+5)ì sin(î) 9th order coma at 90°
35 10 0 252ìÉÖ-630ìù+560ìò-210ìô+30ìæ-1 9th order spherical aberration

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Expression for Noll ordered Zerinke RMS polynomials

N° n m Equation Name
2 1 1 2 ì cos(î) Tilt at 0°
3 1 -1 2 ì sin(î) Tilt at 90°
4 2 0 £(3) 2ìæ - 1 Focus
5 2 -2 £(6) ìæ sin(2î) 45° Primary astigmatism
6 2 2 £(6) ìæ cos(2î) 0° Primary astigmatism
7 3 -1 £(8) (3ìæ-2)ì sin(î) Primary y-Coma
8 3 1 £(8) (3ìæ-2)ì cos(î) Primary x-Coma
9 3 -3 £(8) ìÆ sin(3î)
10 3 3 £(8) ìÆ cos(3î)
11 4 0 £(5) 6ìô - 6ìæ + 1 Primary spherical aberration
12 4 2 £(10) (4ìæ-3)ìæ cos(2î) 0° secondary astigmatism
13 4 -2 £(10) (4ìæ-3)ìæ sin(2î) 45° secondary astigmatism
14 4 4 £(10) ìô cos(4î)
15 4 -4 £(10) ìô sin(4î)
16 5 1 £(12) (10ìô-12ìæ+3)ì cos(î) Secondary x coma
17 5 -1 £(12) (10ìô-12ìæ+3)ì sin(î) Secondary y coma
18 5 3 £(12) (5ìæ-4)ìÆ cos(3î)
19 5 -3 £(12) (5ìæ-4)ìÆ sin(3î)
20 5 5 £(12) ìö cos(5î)
21 5 -5 £(12) ìö sin(5î)
22 6 0 £(7) 20ìò-30ìô+12ìæ-1 Secondary spherical aberration
23 6 -2 £(14) (15ìô-20ìæ+6)ìæ sin(2î) 45° Tertiary astigmatism
24 6 2 £(14) (15ìô-20ìæ+6)ìæ cos(2î) 0° Tertiary astigmatism
25 6 -4 £(14) (6ìæ-5)ìô sin(4î)
26 6 4 £(14) (6ìæ-5)ìô cos(4î)
27 6 -6 £(14) ìò sin(6î)
28 6 6 £(14) ìò cos(6î)
29 7 -1 4 (35ìò-60ìô+30ìæ-4)ì sin(î) Tertiary y-coma
30 7 1 4 (35ìò-60ìô+30ìæ-4)ì cos(î) Tertiary x-coma
31 7 -3 4 (21ìô-30ìæ+10)ìÆ sin(3î)
32 7 3 4 (21ìô-30ìæ+10)ìÆ cos(3î)

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Expression for Wyant ordered RMS Zernike polynomials

N° n m Equation Name
1 1 1 2 ì cos(î) ) Tilt at 0°
2 1 -1 2 ì sin(î) ) Tilt at 90°
3 2 0 £(3).( 2ìæ - 1 ) Focus
4 2 2 £(6).( ìæ cos(2î) ) Astigmatism at 0°
5 2 -2 £(6).( ìæ sin(2î) ) Astigmatism at 45°
6 3 1 £(8).( (3ìæ-2)ì cos(î) ) Coma at 0°
7 3 -1 £(8).( (3ìæ-2)ì sin(î) ) Coma at 90°
8 4 0 £(5).( 6ìô - 6ìæ + 1 ) 3rd order spherical aberration
9 3 3 £(8).( ìÆ cos(3î) ) Trefoil at 0°
10 3 -3 £(8).( ìÆ sin(3î) ) Trefoil at 90°
11 4 2 £(10).( (4ìæ-3)ìæ cos(2î) ) 5th order astigmatism at 0°
12 4 -2 £(10).( (4ìæ-3)ìæ sin(2î) ) 5th order astigmatism at 45°
13 5 1 £(12).( (10ìô-12ìæ+3)ì cos(î) ) 5th order coma at 0°
14 5 -1 £(12).( (10ìô-12ìæ+3)ì sin(î) ) 5th order coma at 90°
15 6 0 £(7).( 20ìò-30ìô+12ìæ-1 ) 5th order spherical aberration
16 4 4 £(10).( ìô cos(4î) ) Tetrafoil at 0°
17 4 -4 £(10).( ìô sin(4î) ) Tetrafoil at 45°
18 5 3 £(12).( (5ìæ-4)ìÆ cos(3î) ) 7th order trefoil at 0°
19 5 -3 £(12).( (5ìæ-4)ìÆ sin(3î) ) 7th order trefoil at 90°
20 6 2 £(14).( (15ìô-20ìæ+6)ìæ cos(2î) ) 7th order astigmatism at 0°
21 6 -2 £(14).( (15ìô-20ìæ+6)ìæ sin(2î) ) 7th order astigmatism at 45°
22 7 1 £(16).( (35ìò-60ìô+30ìæ-4)ì cos(î) ) 7th order coma at 0°
23 7 -1 £(16).( (35ìò-60ìô+30ìæ-4)ì sin(î) ) 7th order coma at 90°
24 8 0 3( 70ìù-140ìò+90ìô-20ìæ+1 ) 7th order spherical aberration
25 5 5 £(12).( ìö cos(5î) ) Pentafoil at 0°
26 5 -5 £(12).( ìö sin(5î) ) Pentafoil at 90°
27 6 4 £(14).( (6ìæ-5)ìô cos(4î) ) 9th order tetrafoil at 0°
28 6 -4 £(14).( (6ìæ-5)ìô sin(4î) ) 9th order tetrafoil at 45°
29 7 3 4.( (21ìô-30ìæ+10)ìÆ cos(3î) ) 9th order trefoil at 0°
30 7 -3 4.( (21ìô-30ìæ+10)ìÆ sin(3î) ) 9th order trefoil at 90°
31 8 2 £(18).( (56ìò-105ìô+60ìæ-10)ìæ cos(2î) ) 9th order astigmatism at 0°
32 8 -2 £(18).( (56ìò-105ìô+60ìæ-10)ìæ sin(2î) ) 9th order astigmatism at 45°
33 9 1 £(20).( (126ìù-280ìò+210ìô-60ìæ+5)ì cos(î) ) 9th order coma at 0°
34 9 -1 £(20).( (126ìù-280ìò+210ìô-60ìæ+5)ì sin(î) ) 9th order coma at 90°
35 10 0 £(11).( 252ìÉÖ-630ìù+560ìò-210ìô+30ìæ-1 ) 9th order spherical aberration

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The wavefront can be reconstructed using the Annular Zernike polynomial.

Expression is defied from the next two scientific articles:

Mahajan, Virendra N. Zernike annular polynomials for imaging systems with annular pupils
1981 JOSA.71.000075

Mahajan, Virendra N. Zernike annular polynomials for imaging systems with annular pupils
1984 JOSAA.1.000685

Those articles describe how to obtain the radial contribution according the inner radius value.

The Annular Zernike expression is same as into NOLL or WYANT expression except from the radical
part. It could be found into Standard or RMS expression paragraph.

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9.2.4 Aberrations Filtering

Zonal reconstruction
For a zonal reconstruction, aberration filtering is performed according to the local slopes.
The formalism is the same as that described in the Beam parameters formalism 63 .
In zonal reconstruction mode, the tilts, focus and astigmatism can be filtered.

Modal reconstruction
For a modal reconstruction, the coefficient corresponding to the filtered aberration is set to zero.
In Zernike reconstruction mode, each aberration can be filtered unitarily to the 3rd order. For higher
order, the filter is activated on a full Zernike order.
In Legendre reconstruction mode, the tilts, focus and astigmatism can be filtered.
The Residual after projection filtering option filters the wavefront part reconstructed with the zonal
algorithm (aberrations beyond the specified number of coefficient). Please refer to the chapter Modal
reconstruction 79 for further details on the modal reconstruction mode implemented by Imagine
Optic.

Important: The modal filtering formalism results in real differences in the wavefront after filtering in
the presence of an aberration such as a spherical aberration, because filtering the curvature in terms
of local slopes is not the same as filtering the curvature in the Zernike sense. This raises the problem
of defining the best focal point in the presence of aberrations.

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9.3 Associated displays

Data from wavefront analysis are display in two associated display windows : Wavefront and modal
coefficient (refer to Metrology toolbar 16 )

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9.3.1 Wavefront
Please refer to the chapter Diagnosis area and displays 18 for detailed information on the common
features of this type of display.

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In case the wavefront reconstruction is modal, the projection pupil is overlayed to the wavefront map.

Wavefront PV
The Wavefront PV is computed as the maximum wavefront value minus the minimum wavefront value
on the measurement pupil.

Wavefront RMS
The Wavefront RMS is computed as shown in the formula below:

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9.3.2 Modal coefficients

Please refer to the chapter Diagnosis area and displays 18 for detailed information on the common
features of this type of display.

The coefficients names depends on the chosen modal polynomial basis.

The values may be in microns or fractions of lambda depending on the selected unit.
Each coefficient may be added to the Time related measurements window and Zoom manager.

· Display area controls :

Copy as text: Right click on the display area to export displayed values as formatted text into
the windows clipboard

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Part X
Propagation
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Propagation
Important:
· Please check the setup wavelength as a preparatory step (Features panel > Sensor) to ensure the
correctness of all the calculations where it is directly involved (such as the point spread function or
the modulation transfer function)
· As the aberration filtering parameterization impacts the propagation computation, the differences
between the aberration filtering method in zonal and modal reconstruction modes might cause an
offset on the propagation plane position computation, resulting in a residual focus in modal mode
on PSF and MTF even if all aberrations have been filtered.

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10.1 Principle
The characterization of a beam in terms of intensity and wavefront allows a certain number of its
fundamental parameters to be calculated by simply processing the initial measurement data.

Point Spread Function (PSF)

The point spread function or PSF is the impulse response of an optical sytem, that is, the output
image of an input point source.
In other words, the PSF is the intensity distribution in a plane perpendicular to the optical axis at any
location of the beam's propagation (especially at the location calculated as being the beam focal
point).

Note: when used with the Simulation tool, the PSF is an excellent pedagogical tool because it can
display the effect of aberrations on the shape of a focal spot.

Modulation Transfert Function (MTF)

The modulation transfer function or MTF indicates how much of the object's contrast is captured after
passing through an optical system as a function of spatial frequency. It is a classic criterion especially
for imaging systems, as it allows to judge the imaging quality in terms of spatial frequency response.
The spatial frequency is given in cy/mm (cycles per millimeter).

M² Parameter (LASER beam characterization)

The characterization of a beam in terms of intensity and wavefront allows a certain number of its
fundamental parameters to be calculated by simply processing the initial measurement data.
In particular, the parameter M², introduced by Siegmann ([Link], 'Lasers', University Science
Books), has become the reference criterion for beam characterization, especially for LASER beams.

The classical method used to calculate M² is based on studying the beam size in several transverse
planes. Typically, this measurement is performed by moving a camera along the path of the beam
being studied.

An alternative to this protocol is based on a numerical simulation of beam propagation using a full
characterization (phase and intensity) of the beam in one of the transverse planes.
Here we present the operation of the M² calculation software using the data from the wavefront
measurement performed by a wavefront sensor type operating on the Shack-Hartmann principle.

Tne M² calculation can be calculated from 4 different methods : using Encircled energy, Ensquared
energy, ISO 11146-1 beam characterization and ISO 11146-2 beam characterization

How-to

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The above figure shows two possible configurations for measuring the PSF or MTF or M² of a given
beam. As with any measurement performed with the wavefront sensor, the convergent or divergent
nature of the analysis beam does not affect the quality of the measurement, provided that it is within
the dynamic range of the sensor curvature.
Imagine Optic propagation module offers at least two significant advantages over classical
measurements methods:

1) The simplicity of the protocol:

· PSF measurement: whether the focal point is real or virtual, if the wavefront measurement is
feasible, PSF can be calculated. If the beam arrives collimated on the wavefront sensor, a message
appears to indicate that the curvature radius is infinite; nevertheless, the PSF can still be calculated
by adding a virtual perfect lens 113 . Objectives working on infinite-focal point combinations can
therefore be characterised "back-to-front", i.e. using the principle of inverse return of the light.
· MTF measurement: a single measurement performed by the HASO is sufficient to calculate the
MTF in 2D and therefore along all radial directions along the beam. MTF data is updated at the same
time as the wavefront, allowing the live adjustment of the optical system using a MTF criterion.
· M² measurement: As with any measurement performed with the wavefront sensor, the convergent
or divergent nature of the analysis beam does not affect the quality of the measurement, provided
that it is included in the measurement dynamic of the sensor curvature. The advantage of the
module presented here over classic measurements using image acquisition performed in several
transverse planes is that the protocol is simple: whether the focal point is real or virtual, if the
wavefront measurement is feasible, M² can be calculated.

2) The accuracy of the measurements:

A wavefront measurement with a wavefront sensor is performed to an accuracy of the order of
lambda/10 Peak-to-Valley and consequently:
· the PSF calculation directly benefits from this accuracy. There are no processing steps that may
decrease the quality of the computed PSF, unlike classical method which requires the
post-treatment of an image from a camera located at the focal point, including noise removal
operations and deconvolution by the object's shape.
· the MTF calculation is performed with an accuracy of less than 1 point, which cannot be achieved by
any chart-based measuring instrument.

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Aliasing

The PSF and MTF computation rely on the Fresnel propagation equations, and therefore require the
use of a Fast Fourier Transform.
In the event of a strong aberration, the result can be incorrect because of aliasing phenomenon due
to an insufficient sampling of the phase function.
Aliasing is to be suspected in the case where:
· The PSF measurement looks like textured pattern and not a deformed spot.
· The MTF measurement cutoff frequency is very low with respect to the reference cutoff frequency.
· The M² measurement could not be achieved (see M² Parameters restrictions to get more details)
The best way to prevent this is to numerically oversample 81 the phase and the intensity.

Example of PSF computed on a wavefront with huge spherical aberration.

With oversampling x1 and aliasing (left) vs oversampling x4 and no aliasing (right)

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10.2 Parameters
10.2.1 Perfect lens
The perfect lens feature modifies the curvature of the measured wavefront.

Use case: the beam entering the sensor is collimated.

When the beam is collimated, the curvature is close to 0, and a small change in the measured
curvature has a huge impact on the longitudinal position of the focal point.
As consequences:
· the spatial frequency scale for MTF computation is not stable
· the best focal plane position where the PSF is computed varies quickly, causing a effect of flicker on
the PSF display.

Perfect lens modes

None
Use the measured radius of curvature.

Add to measurement
Add the radius of curvature corresponding to the specified perfect lens focal length to the measured
one.

Replace measurement
Replace the measured radius of curvature with the one corresponding to the specified perfect lens
focal length.

Perfect lens focal length

Focal length of the perfect lens to use in millimeters.
Note: When using a RFLEX, it is very useful to add the focal length of the objective lens of the RFLEX
module to obtain an MTF in the focal plane of the current measuring instrument.

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10.2.2 Defocus manager

By default, the PSF is calculated in the plane of the best focal point. The position of this plane along
the optical axis therefore depends on the radius of curvature of the incident wavefront.
If the position of the best focal plane changes during an optical adjustment, the software will
automatically adjust it according to the measured radius of curvature:

In such a case, the automatic adjustment can be deactivated using the focus lock.
Furthermore, it can be useful to observe the PSF evolution in planes located slightly in front of or
beyond the best focal plane.
Taking all these parameters into account, we can summarize by saying that the PSF is computed in an
observation plane whose position is defined by a reference position + a defocus.

Defocus manager modes

The defocus manager modes define the way the reference position is computed.

Autofocus
The reference position is the best focal point plane position, automatically computed from the
measure.
The position of the plane along the optical axis is given by the Focus position (mm) value.

Lock now
When locking is activated, the current plane position is memorized as the reference plane position
and all PSF calculations are performed with respect to it, without taking any further focal point
variations into account.

Defocus (mm)
Defocus position of the observation plane towards the reference plane along the optical axis in
millimeters.

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Focus position (mm)

Best focal point plane position along the optical axis.

In 4.4.2 Waveview version and newer, the best focal point plane position value (R0) depends on the
wavefront reconstruction mode : Zonal / Modal reconstruction

In Zonal reconstruction mode case, R0 is computed from wavefront slopes

RO is proportional to (ax + by) / 2 from X Slopes and Y Slopes plan equation
Please refer to the Formalism 63 chapter for detailed information on each displayed value.

In Modal Zernike reconstruction mode case, R0 is computed from Zernike coefficients, especially the
Zernike coefficient related to the focus (2ìæ - 1)
In NOLL indexing case:
R0 = R² / (4 * Z4)
where R is the radius of the round projection pupil (mm)
Z4 is the value (mm) of index 4 of Zernike coefficient (PV expression) refer to the PV
expression NOLL indexing 94 chapter
In WYANT indexing case :
R0 = R² / (4 * Z3)
where R is the radius of the round projection pupil
Z3 is the value (mm) of index 3 of Zernike coefficient (PV expression) refer to the PV
expression WYANT indexing 96 chapter

In Modal Legendre reconstruction mode case, R0 is computed from Legendre coefficients, especially
the Legendre coefficient related to the focus 1/2 (3xæ-1) and 1/2 (3yæ-1)
R0 = 1 /( 1.5 * ( (L3 / rx²) ) + (L5 / ry² ) );
where rx is semi size along X axis (mm) of the rectangular projection pupil
ry is semi size along Y axis (mm)of the rectangular projection pupil
L3 is the is the value (mm) of index 2 of Legendre coefficient (PV expression) refer to the
PV expression indexing 91 chapter
L5 is the is the value (mm) of index 2 of Legendre coefficient (PV expression) refer to the
PV expression indexing 91 chapter

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10.2.3 Propagated intensity

The PSF calculation involves not only the phase difference, but also the intensity in the pupil.

Note:
A well-known example of the effect of intensity on PSF is a beam with a Gaussian intensity profile
(laser) that focuses in a Gaussian if it is free of aberration.
Without aberration, a beam from a round aperture has a PSF which is an Airy disc.

Flat intensity
Use this option if inhomogeneous flux in the pupil is related to implementation, and should not enter
into the PSF calculation for the optical system being characterized.
This is the most frequent case.

Measured intensity
Use this option when the pupil intensity must be taken into account.

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10.2.4 PSF features setup

Zoom factor
Spatial zoom restricts the size of the support in which the PSF is calculated.
Important: If the support size is smaller than the energy distribution, aliasing problems occur.

Vertical / horizontal symmetry and Rotation

To allow for any inversion due to the optical setup, the Transpose, Flip X and Flip Y buttons are used
to change
- Vertical flip and Horizontal flip to make symmetry of the PSF display.
- Transpose to make a rotation of the PSF display.

Beam analyzer:
Two enclosed type can be chosen : Circle or Ellipse

Circle type:
The beam analyzer gives the encircled energy diameter.

Energy threshold (%)

The beam analyzer gives control over the percentage of energy that should be reached to compute
the encircled energy diameter.
For example: if the Energy threshold is 50%, the cumulated values on the circle centered on the PSF,
whose diameter is the encircled energy diameter, will be 50% of the cumulated values on the PSF full
support.

Ellipse type:
The beam analyzer gives the ellipse parameters : semi-minor axis semi-major axis length and angle.
The second moment method is used to get the elliptic from PSF.

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10.2.5 MTF features setup

Profil angle (A)

The standard representation of the
MTF is a plot with the spatial
frequency on X axis, and contrast
response on Y axis. In most
characterization applications, the
MTF analysis is performed in two
directions to determine the
potential asymmetries of the
controlled optical system.

The WaveView software offers the

possibility to chose the main MTF
analysis angle: the Profile angle
(A) in degrees.
The MTF diagnosis window will
then display two contrast-vs-
frequency profiles, one for the
angle A and another on for the
angle A+90°.

Note: By combining the angle

specification feature and the the
Time related measurements tool,
the software also offers the
possibility of getting the radial
evolution of the contrast ratio value
corresponding to a specified spatial
frequency or the radial evolution of
the spatial frequency
corresponding to a fixed contrast
ratio value.

Fixed parameter
A particular point of the profile can be monitored: either a contrast value can be calculated for a given
spatial frequency, or reciprocally the spatial frequency corresponding to a given contrast.
The type of the fixed parameter (contrast or frequency) is common to both profiles (main angle A and
angle A + 90°), but the value can differ.

When Evaluate at fixed feature is "Spatial frequency", Frequency at A and Frequency at A+90° can
be specified in cy/mm.
When Evaluate at fixed feature is "Normalized contrast", Contrast at A and Contrast at A+90° can
be specified as a decimal number between 0 and 1.

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10.2.6 M² features setup

Waist sampling
The number of observation planes in which the beam size calculation will be performed can be
adjusted. Foar each observation planes, the energy beam distribution is calculated as in PSF module.

Method
In the various observation planes, the beam characterizations can be calculated using the following
methods (see M² Parameter process) 130 :

· ISO 11146 - I or II
· ISO 11146 - Astigmatism
· ISO 11146 - Circular
· ISO 11146 - General astig.

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10.3 Associated displays

10.3.1 Spot diagram
Please refer to the chapter Diagnosis area and displays 18 for detailed information on the common
features of this type of display.

The "spot diagram" is used to estimate the shape of the focal point of the beam being analysed.
Because the wavefront sensor measures local slopes, it is easy to determine the path of the light rays
and to see ’their intersection with a given plane.
The "spot diagram" represents the intersection of the light rays with a plane close to the best focal
plane.
The points shown on the graph are from the analysed pupil.

A color is associated with each impact point so that the impact point under consideration can be
located according to its starting point in the pupil.
The color code, associated with each impact point, is used to rank the rays according to their distance
from the center of estimated focal point.

A red circle draws the diffraction limit of the beam at the focal into the graphical spot diagram
representation.
The radius of this circle is determined by the following formula:

1.22 * (Lambda * R) / D
where
D is the diameter of the measured pupil,

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R is the radius of curvature of the wavefront,

and Lambda is the wavelength.

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10.3.2 PSF
Please refer to the chapter Diagnosis area and displays 18 for detailed information on the common
features of this type of display.

Strehl ratio
The Strehl ratio is a classic criterion for the characterization of optical systems, providing fast
quantification of the quality of an optical system with respect to an equivalent system without defects.
The usual definition of the Strehl ratio is as follows:

PSF indicates the point spread function of the system being studied. The PSF-reference refers to that
of an equivalent system without aberrations.
Theoretically, the Strehl ratio thus defined cannot have a value above 1.
The software calculates the reference PSF as the PSF of a beam with the same pupil but without
aberration. The maximum value is taken from this calculation, and the ratio of the two maxima gives
the Strehl ratio.

Encircled energy diameter

Diameter of the circle that contains the specified percentage of energy of the PSF.
Pleaser refer to chapter PSF parameters 117 for more information on the energy percentage
parameter.

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Ellipse semi minor axis

Semi minor axis dimension of the ellipse that contains the energy of the PSF .
Pleaser refer to chapter PSF parameters 117 for more information.

Ellipse semi major axis

Semi major axis dimension of the ellipse that contains the energy of the PSF .
Pleaser refer to chapter PSF parameters 117 for more information.

Ellipse angle
Angle of the ellipse that contains the energy of the PSF .
Pleaser refer to chapter PSF parameters 117 for more information.

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10.3.3 MTF
Please refer to the chapter Diagnosis area and displays 18 for detailed information on the common
features of this type of display.

The MTF window is split in two parts:

· The first graph shows the MTF profile for angle A,
with the user fixed parameter and matching variant
value.
· The second graph shows the MTF profile for angle
A + 90°, with the user fixed parameter and
matching variant value.

Please refer to the chapter MTF parameters 118 for

more information on the MTF parameterization.

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10.3.4 M squared
Please refer to the chapter Diagnosis area and displays 18 for detailed information on the common
features of this type of display.

M squared method : method identification

Detected beam shape : can be circular, simple astigmatic or general astigmatic
Wavelength : wavelength used into the propagation tool
Intensity contrast : (Imax - Imin) / (Imax + Imin) from measured intensity
PSF slice position : red cursor position into the map of energy along one axis

Nota bene:
ellipticity = Minor axis size / Major axis size

ISO 1146 - I or I (simple astigmatic beam case) or ISO 11146 - astigmatic display
data

In case of astigmatim beam (ellipticity less than 0.87)

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M squared : beam quality factor: It represents the degree of variation of a beam from an
ideal Gaussian beam.
z X or z Y : waist position (mm) along X axis, respectively Y axis.
0 0
Z X or Z X : Rayleigh length along X axis, respectively Y axis.
r r
2*W X or 2*W X : beam waist diameter (mm) along X axis, respectively Y axis.
0 0
Divergence X / Y : angular spread of the diverging beam in milliradians along X axis,
respectively Y axis.
BPP X / Y : Beam Parameter Product (mm * milliradians), defined as the the product of
beam radius w0 (mm) and the beam digervence half-angle (milliradians) along X axis, respectively Y
axis.

Astigmastism % : (Zoy-Zox) / ((Zoy+Zox)/2)

Waist Asymmetry : 2*w0Y / 2*w0X
Div. Asymmetry : Divergence Y / Divergence X

PSF slice : physical beam characterizations from the current displayed distribution at PSF slice Z
position

ISO 1146 - circular or ISO 1146 - general astig.

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or
ISO 1146 - I or II (cicular beam case) or ISO 1146 - I or II (general astigmatic beam
case)

In case of circular beam (ellipticity more than 0.87)

in case of general astigmatic beam

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M squared : beam quality factor: It represents the degree of variation of a beam from an ideal
Gaussian beam.
z : waist position (mm).
0
Z : Rayleigh length.
r
2*W : beam waist diameter (mm).
0
Divergence : angular spread of the diverging beam in milliradians.
BPP : Beam Parameter Product (mm * milliradians), defined as the the product of beam
radius w0 (mm) and the beam digervence half-angle (milliradians).

PSF slice : physical beam characterization from the current displayed distribution at PSF slice Z
position

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10.4 Technical appendix

10.4.1 LASER beam charactrerization
The purpose of the M² parameter as introduced by Siegmann is to model the behaviour of any beam,
taking the fundamental laser emission mode (TEM 00) as reference: the Gaussian beam. Thus, in a
way, the parameter being studied characterizes the 'perfect Gaussian deviation' of a beam.
The mathematical definition commonly accepted as a reference is as follows:

with w0 waist radiusq beam divergence half-angle, andl the wavelength of the beam being analysed.
The propagation of a perfect Gaussian beam is modeled by the following equations:

These equations describe the spatial behaviour of the intensity and the beam curvature along the
propagation length.
Using the M² parameter, a simple model can be found for the behaviour of a real beam that does not
satisfy the above equations. This is done by introducing a simple multiplication factor (i.e. the M²
parameter defined above) into these equations. The equations then become:

M² therefore takes values³ 1. This type of criterion is very useful because it contains the intensity and
phase information, which can be adapted to many different beams, and is practical for the user
because it gives a point of comparison (the perfect Gaussian, with known characteristics) and easy
modelling of the beam being used.
The definition of the parameter taken into account depends on measurable waist size and divergence
data. The accuracy of measuring this parameter therefore depends on the correct calculation of waist
sizes and the corresponding angular spectrum based on the measurements taken.

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The following process is used to calculate the LASER beam parameters.

First Step: Calculation of measured wavefront parameters

The radius at 1/e² of the encircled energy from the measured intensity surface is calculated on the
one hand, and the radius of curvature from the measured wavefront is calculated on the other hand.
If the measured beam is assumed to be a perfect Gaussian beam, the position of the waist with
respect to the wavefront sensor can be determined, followed by the Rayleigh distance:

z : waist position
0
Z : Rayleigh length
r
R : measured radius of curvature
0
w : beam radius
i

Second Step: Seven propagation planes centered on z are defined and spaced at intervals of Z .
0 r
Using the beam propagation by Fourier transform, the energy distribution (PSF) is determined at the
following distances:

z - 3 Z , z -2 Z , z - Z , z , z + Z , z +2 Z , z +3 Z .
0 r 0 r 0 r 0 0 r 0 r 0 r

Based on the calculated energy mappings, the physical beam characterization for each Z position are
computing (see below Beam size computing). Those data are performed by hyperbola approximation.
Using hyperbola approximation with data (zi, wi), the new parameters Z' and Z' are obtained.
0 r
Third Step: N propagation planes centered on z , are then defined and placed not more than +/- 2 Z
0 r
from Z . Using the beam propagation by Fourier transform, the energy distribution is determined at
0
the following distances:

z -2 Z + i ( 4Z / (N-1) ) i = 0 to N-1
0 r r

Fourth Step:
Using physical beam characterizations and position, the final LASER beam parameters are obtained :
z , z , w , divergence angle (Div) and M².
0 r o
Approximation by hyperbola
To apply an adjustment to the hyperbola without using a nonlinear adjustment, it must not be applied
to the hyperbola.
But the square of the hyperbola, which then becomes a second-order polynomial. {a , a , a } can be
0 1 2
performed by the SVD method.

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Let z be the various propagation planes.

Let w be the size measurements taken in each of these planes.
Them, the beam parameters are obtained using the coefficients {a , a , a } :
0 1 2

ISO 11146 - I or II method

11146-1 method is based on ISO 11146-1 standard, the second order moments of the power (energy)
density distribution are used for the determination of beam widths.
This method is used when simple astigmatic or circular beams are studied.

Within ISO 11146-2:2021, the description of laser beams is accomplished by means of the second
order moments of the Wigner distribution rather than physical quantities such as beam widths and
divergence angles.
This method is used when general astigmatic beams are studied.

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There are two types of restriction or precaution for using the LASER beam parameter calculation
module:

Limitations of the method according to whether the LASER is Mono-mode or

Multi-mode

Because the Imagine Optic wavefront sensor uses the Shack-Hartmann principle, it can characterize a
laser source whether transverse multi-mode or not, in almost every situation:

· For TEM00 mono-mode sources, the best possible accuracy is obtained. This is the most suitable
configuration for the system.

· For sources containing a transverse mode only, measurement remains possible, except for the
waist, where the amplitude is discontinuous for higher-order modes. It is nonetheless possible to
reconstruct the intensity distribution at the waist from a measurement in a plane far from the waist,
and to find the analysed mode.

· For very multi-mode sources (e.g. power lasers whose beam comprises numerous modes), the
analyzer is able to characterize the output beam because it is an 'average' of all the many modes it
contains: the measured average phase is truly representative of the actual phase in this case.
However, the analyzer is not able to take the spatial coherence of the source into account.

· Slightly multi-mode laser sources (mixture of a few transverse modes) are the only case where the
measurement inaccuracy due to the Shack Hartmann principle makes it impossible to consider that
the M² measurement taken by the sensor falls within the stated performance characteristics. This
restriction is not only due to the fact that it is mathematically impossible to trace the modes
constituting a beam from an intensity distribution, but also to the fact that the wavefront sensor,
which measures only one wavefront, is insufficiently sensitive to the phase variations of the various
transverse modes constituting the beam in this case.

Aliasing

The formalism used to calculate M² is based on the Fresnel propagation equations, and therefore
requires the FFT (Fast Fourier Transform) to be calculated. In the event of a strong aberration, the
result can be incorrect because of aliasing and the under sampling of the phase function. Two tests
are performed during the calculations:
1. a test on the measured wavefront
2. a test on the wavefronts calculated in the various observation planes

These two tests are performed as indicated by the following inequality:

| Local Slope | < ( Lambda/ 2 p)

where Lambda is the wavelength, p the wavefront sampling step, and | Local Slope | the
characteristic local slope of the wavefront

A warning message appears if this test is not OK.

The best way to prevent this is to artificially oversample the phase and the intensity.

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Intensity map

There is another source of inaccuracy specific to this method, which is inherent in the nature of the
beams analysed: the Gaussian beams that are characteristic of laser emissions. In theory, the energy
in a plane transverse to a Gaussian beam is distributed on an infinite pupil. The proportion of energy
present at the edges decreases considerably as the distance from the central maximum increases.
The mathematical model for the intensity distribution of a Gaussian centered at the origin in an (x,y)
plane is given by:

where s represents the radius at 1/e² of the intensity of the Gaussian, considered to be the size of the
Gaussian: a finite size in this case.

Because a Gaussian beam cannot be physically measured on an infinite pupil, any measurement of
this type of beam involves a truncation of the detected energy, which increases in significance:
- When the pupil is small compared to the beam size as defined above,
- When the sensitivity of the detector used is not suitable for the measurement of the 'feet' of the
Gaussian.

As an order of magnitude, the truncation of a Gaussian by a pupil of radius equal to the size of the
Gaussian as defined above would correspond to a loss of 13.5% of the total energy transported by the
beam.
Any excessive truncation then affects the propagation calculation, partly because of the energy loss,
and partly because of the changes to the intensity distribution. This leads to incorrect beam
parameter values, particularly for the parameter M².

The formalism used to calculate M² is based on the Fresnel propagation equations. It is important to
sample the intensity surface so as to avoid truncating its Gaussian distribution.
A warning message appears if intensity surface truncation exceeds 1/e² .

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Part XI
Simulation
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Simulation
The Simulation tool purpose is to generate theoretical local slopes maps from classical optical
metrology models: aberrations described as polynomial projections (Legendre or Zernike)
The generated local slopes feed the measurement process 6 that will compute downstream
diagnosis (such as wavefront, beam parameters, PSF or MTF ...).

Use case :
This feature is useful for comparing an actual measurement to a theoretical value. When this value
has been generated, the slopes can be saved in a file that can be selected as the Reference 66 with
respect to its actual measurement.

Important:
· The number of microlenses on which the slopes are generated can be only equal to the number of
microlenses of the wavefront sensor selected for simulation.
· The data are sent to the processing pipe windows until the "Update" button is pressed or the "Auto
Update" is activated.
· For a measurement referenced with respect to a simulated wavefront, special attention must be
paid to the pupil used to generate the theoretical wavefront. When a measurement is off-centered
with respect to a reference file, significant differential aberrations can be generated, not because of
a difference in aberration, but because of unequal definitions of the pupil.

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11.1 Wavefront simulation window

Open file / Save

The simulation parameters can be saved in a file and then reloaded later via the Save and Open file
buttons (*.mcd format).

Update / Auto update

To prevent the accidental erasure of the slopes already acquired, the data are sent to the other
windows only when the "update" button is clicked.
The "auto update" button is used to send the data when the simulation parameters change.

Reset
Sets all simulated coefficients values to 0.

Sensor
Opens the dialog that allow user to select or change the wavefront sensor to be simulated.

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11.2 Parameters
The local slope generating method is the same for any of the simulation modes:
· Select the modal simulation mode (Zernike coefficients on round pupil / Legendre coefficients on
rectangular pupil)
· Select the slope mapping creation parameters from the available controllers.

For further information about modal coefficients, refer to the section on Modal reconstruction
parameters 84 .

Important: Mappings of local slopes are generated from the polynomial coefficients. The software
therefore uses the Cartesian derivatives of the polynomials to calculate the local slopes. For example,
when generating the pure curvature according to Zernike (2r²-1), mappings of local slopes that are
perfect planes are obtained: X slopes = 4x and Y slopes = 4y.

Maximize pupil

Automatic determination of the biggest modal pupil inscribed in the simulated sensor geometry.
Uncheck the box to manually define the simulation pupil.

Coefficients parameters

Coefficients type : Modal projection mode (Zernike or Legendre).

Number of coefficients : Number of coefficients to consider for simulation.
Coefficients normalization: For a simulation in Zernike Mode, the user can choose PV or RMS
normalization of the coefficients.

Simulation pupil definition

Pupil X center, pupil Y center: coordinates of the simulation pupil center in mm, with (0,0) at the
sensor's center.
Pupil radius (Zernike) / Pupil X size, pupil Y size (Legendre): dimensions of the simulation pupil in
mm.

Note : If Maximize pupil is checked, those values cannot be set manually and indicate the
automatically computed simulation pupil geometry in mm.

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Part XII
Software use
cases
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Software use cases

12.1 How to handle reference wavefront

When a reference is loaded, only the RAW measurement are taken into account to subtract from the
current measurement (the post processing setup are ignored. refer to File formats 146 section).

If only residual measurement (current displayed measurement) is needed to be subtract to a future

measurement, Save as RAW action (refer to Diagnosis area and displays 18 section) can be used to save
the processed measurement as raw measurement data in the has file.

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12.2 How to use full speed acquisition

1. Put the wanted number of images into the full speed sequence Acquisition modes > Fullspeed >
number of frames feature
2. Press Acquisition modes > Fullspeed > Allocate memory. You can see the progress of this action
at the bottom line information of WaveView (status bar).

3. Press the Fullspeed icon on the vertical left bar

Once all images are saved in the memory, the acquisition sequence can be replayed using a set of
actions to view the movie below the dashed line of the left vertical bar.

The replayed movie speed can be changed at a desired frame rate set in Acquisition modes >
Fullspeed > Replay speed feature.
To save the recorded data, please use AutoSave features

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12.3 How to save the recorded data

With the WaveView Software, you can get many data during different acquisition modes : Full Speed /
Script / Load data from Folder

There are different ways to get all diagnostics data from those recorded data during replay function.
· Use Time related measurements tool to get any computed scalar evolution
· Use auto save function to get all diagnostics data into file (TXT file file or Imagine Optic file format -
HAS - HIMG - MCD)

In this paragraph, the next step shows how to manage the software to save automatically file(s) into a
specific folder

1. Browse the folder to save to Autosave > Export to

2. Put the number of files to save into Autosave > Numbers of record according to the number of
data you have into the current acquisition sequence or into the current folder.
3. Choose at least one file format (TXT - HAS - HIMG - MCD file format)
4. Tick Autosave > Activate

5. Please Play icon on the vertical left bar

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12.4 how to set WaveView to record data automatically (script

mode)
In WaveView, this function is called Scripted. You can define when to start, data acquisition duration,
and interval in Acquisition modes > Scripted features section

1. Acquisition modes > Scripted > Self-timer(s) feature defines the starting delay point. To start
immediately when this value is set at 0s.
2. Acquisition modes > Scripted > Acquisition duration(s) feature defines the duration of the
measurement in second.
3. Acquisition modes > Scripted > Time interval(s) feature defines the time interval of each data
acquisition
4. Set AutoSave features section to record the data
5. Browse the folder to save to Autosave > Export to
6. Put the number of files to save into Autosave > Numbers of record according to the number of
data which will be acquired
7. Choose at least one file format (TXT - HAS - HIMG - MCD file format)
8. Tick Autosave > Activate

9. Press Play Script icon on the vertical left bar

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Part XIII
Data export
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Data export

13.1 Export to Imagine Optic file format

Imagine Optic formats

Three imagine Optic fileformat have been implemented to export / import data :

· HIMG file to save image data

· HAS file to save wavefront data
· MCD file to save modal coefficients data

Those format is compliant to use the wavekit functionalities to customize your diagnostic into your
own software development.

HIMG format
himg files store the content of the camera image (spot map) and may also contain local slopes
information.

The advantage of storing associated local slopes is to have a record of the tilt tracking state in case the
alignment changed over time.
The following data are saved:
· Acquisition parameters
· Image data
· Resulting local slopes

The two first part of the file (Acquisition parameters and Image data) are crypted.
Since the 4.4.2 wavesuite version, to reduce the HIMG file size on HardDisk, the Image data part is
compressed.

NOTE:
· New HIMG fileformat can not be used with older Wavesuite versions.
· It is possible to save HIMG without this new compress option, using features list in Expert mode
display
Options > FileFormat > use packet fomat

HAS format
.has files are used to save the measurement resulting from a calculation on a camera image or
simulation.

The phase values are not directly saved in the file. The software recalculates it when the file is
opened.
This means that the reconstruction parameters of the phase can be changed after the file is
reopened.
The software asks you to select the set parameters you want to use (from file or from instance) when
you open a measurement file.
The following data are saved into different XML section:

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· Sensor information (Serial number, wavelength calibration, revision, model, Software options)
· Hartmanngram processing setup (when applicable)
· Acquisition parameters of the source image (when applicable)
· RAW measurement part
· RAW local slopes
· RAW measurement pupil
· RAW Intensity
· Post processing part
· Mask (when applicable)
· Reference wavefront (when applicable)
· double path (when applicable),
· fill (when applicable),
· erode (when applicable)
· Intensity threshold (when applicable)
· Wavefront processing part

This file can be saved using three different ways:

· Save button into tool bar on the top of Waveview main window
· Save action into the wavefront display window (Refer to Diagnosis area and displays 18 section to
get more information)
· Save as RAW action into the wavefront display window (Refer to Diagnosis area and displays 18
section to get more information)
In this last case,, if one of the next processing step (user pupil, reference, double path, fill, erode or
intensity threshold) has been activated, these are applied before saving the measurement.

MCD format
.mcd files store a modal projection result.

The following data are saved:

· Type of modal projection (Zernike or Legendre)
· Coefficients values
· Projection pupil parameters

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13.2 Export to txt file

The software provides an export in a txt format of the data contained in the diagnostic windows.

The data is in ASCII format. The array of values come from either the time-dependent data, 3D maps
(wavefront values, PSF, etc.) or 2D curves (MTF curve, etc.).

These recording actions are available in each window presenting data:

· either by right-click on the data tables or on the graphic representations of the data.

· either at the top right using the context menu by clicking on the three dots

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13.3 Export to int CodeV fille format

The software provide an export of wavefront data in microns in an int format, compatible with the
CODE V® software.

This option is accessible in the Wavefront diagnostic window using Save as INT in the following
context menu:

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13.4 Autosave data

The AutoSave feature automatically exports the number of .has files specified in the Number of
records field to the directory indicated in the Export to entry.
The export stops automatically when the number of files is reached.

The Save once action allow to save all the selected files into the selected folder in the Export to entry.

Filename prefix option allow to add text ID before the predefined name file.

NOTE :
· File naming during an autosave process is defined as below

<Filename prefix (if exist)>_<Data_ID>_<Acquisition_Date_Hour_Minute_Second_MicroSecond>.<

FileExtention>

· Data_ID and file extensions are defined

Data_ID FileExtention
Image data (HIMG) Empty himg
Image data (TXT) Image txt
Wavefront data (HAS) Empty has
Wavefront data (TXT) wavefront txt

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Wavefront data (INT) Empty int

Slopes data (TXT) slopes txt
Intensity data (TXT) intensity txt
Modal coefficients (MCD) Empty mcd
Modal coefficients (TXT) modal_coefficients txt
Spot diagram (TXT) Spot diagram txt
PSF (TXT) psf txt
MTF (TXT) mtf txt
MSQ (TXT) msq txt

· Date is defined as ISO 8601 norm

AAAA_MM_ DD_xxh_yymin_zzs_wwwwwwus
AAAA years
MM Month
DD Day
xx Hour (0-24)
yy Minute
zz Second
wwwwww Microseconds

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13.5 Other export

The software provide an export in a PNG format of the data contained in the diagnostic windows.

· either at the top right using the context menu by clicking on the three dots

Print Screen : Saves a screenshot of the current diagnosis window.

· either a CRT+C by selecting the diagnostic window to export. A CRT+V in a WORD ® type text editor
or an image editor allows you to retrieve the image from the window.

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Part XIV
Contact &
Support
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Contact & Support

Thank you for choosing Imagine Optic's products.

For technical support, please contact:

Technical support
Website [Link]
Email support@[Link]
Phone +33 (0) 1 64 86 15 60

For all other remarks, questions, requests, please contact:

Imagine Optic SA
18 rue Charles De Gaulle
Orsay 9140, France

Website [Link]
Email contact@[Link]
Phone +33 (0)1 64 86 15 60

Imagine Optic, Inc

· Imagine Optic/Axiom Optics
1035 Cambridge St, Unit 19.
Cambridge, MA 02141, USA

Phone +1(617) 401 2198

Email contactus@[Link]

· West coast office

Phone + 1(916) 366 6103

Email contactus@[Link]

Back product

To send us back your product when you have a critical issue with our system, please follow
instructions from your Zendesk ticket exchange and find below the address of our support service
department.
Imagine Optic SA
Service support client
18 rue Charles De Gaulle
Orsay 91400, France

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