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Chapter7 Lecture Note

Chapter 7 of ECE 431 focuses on Combinational MOS Logic Circuits, detailing design parameters, transient analysis, and various circuit implementations such as NAND and NOR gates. It discusses the calculations of output voltages and load capacitance, as well as complex logic circuits like AOI and OAI gates. Additionally, it introduces CMOS transmission gates and complementary pass-transistor logic, highlighting their advantages and disadvantages.

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0% found this document useful (0 votes)
7 views38 pages

Chapter7 Lecture Note

Chapter 7 of ECE 431 focuses on Combinational MOS Logic Circuits, detailing design parameters, transient analysis, and various circuit implementations such as NAND and NOR gates. It discusses the calculations of output voltages and load capacitance, as well as complex logic circuits like AOI and OAI gates. Additionally, it introduces CMOS transmission gates and complementary pass-transistor logic, highlighting their advantages and disadvantages.

Uploaded by

siri.betha28
Copyright
© All Rights Reserved
We take content rights seriously. If you suspect this is your content, claim it here.
Available Formats
Download as PDF, TXT or read online on Scribd

ECE 431 Digital Circuit Design

Chapter 7 Combinational MOS


Logic Circuits

Lecture given by Qiliang Li

1
7.1 Introduction

Design Parameters:
Critical voltage points
e.g., VOL and Vth
dynamic transient response
7.2 MOS Logic Circuits with Depletion nMOS Loads

NOR gate
7.2 MOS Logic Circuits with Depletion nMOS Loads

Calculate VOH
VOH = VDD

Calculate VOL
I load ,saturation (VOL ,VDD − VOL ) = I drive,linear (VOH ,VOL )

kload
VOL = VOH − VT 0 − (VOH − VT 0 ) 2 − ( )⋅ | VT ,load (VOL ) |2
kdriver

Use VT0 (for VT,load (VOL)) to calculate VOL , iterate, use VOL to calculate VT,load

i. Va = VOH, Vb = VOL i and ii are Just like we discussed in chapter 6


ii. Va = VOL, Vb = VOH
iii. Va = VOH, Vb = VOH
7.2 MOS Logic Circuits with Depletion nMOS Loads

iii. Va = VOH, Vb = VOH

kload 2 kdriver , A 2 kdriver ,B 2


| VT ,load (VOL ) | = [2(VA − VT 0 )VOL − VOL ] + [2(VB − VT 0 )VOL − VOL ]
2 2 2

Generally VOH = VA = VB

Equivalent driver-to-load ratio


W W
kdriver , A + kdriver ,B kn' ,driver [( ) A + ( )B ]
kR = = L L
kload W
kn' ,load ( )load
L

kload
VOL = VOH − VT 0 − (VOH − VT 0 ) 2 − ( )⋅ | VT ,load (VOL ) |2
kdriver , A + kdriver ,B
7.2 MOS Logic Circuits with Depletion nMOS Loads

linear

µnCox W
ID = (∑( 2
) )[2(VGS − VT 0 )Vout − Vout ]
2 k ( on ) L k

saturation
µnCox W
ID = (∑( ) )(VGS − VT 0 ) 2
2 k ( on ) L k
7.2 MOS Logic Circuits with Depletion nMOS Loads

Transient analysis

The load capacitance at the output node


of the equivalent inverter corresponding
to a NOR gate is always larger than the
total lumped load capacitance of an
actual inverter with the same dimensions.
Two-input NAND gate
P282-283
kload
VOL ≈ 2(VOH − VT 0 − (VOH − VT 0 ) 2 − ( )⋅ | VT ,load (VOL ) |2 )
kdriver
kdriver 2
ID = [2(VGS − VT 0 )VDS − VDS ]
4
 
 
 
 1  W
  ~~~~~~~ ( )
1 L
∑ 
 k ( on )  W  
 
  L k 
Transient analysis of NAND gate
The value of the lumped capacitance Cload depends on the input voltage conditions.

VA is equal to VOH , VB is swiching from VOH to VOL


VA is equal to VOH , VB is swiching from VOH to VOL

Cload = C gd ,load + C gd , A + C gd ,B + C gs , A + Cdb, A + Cdb,B + Csb, A + Csb,load + Cwire

VB is equal to VOH , VA is swiching from VOH to VOL

Cload = C gd ,load + C gd , A + Cdb, A + Csb,load + Cwire


7.3 CMOS logic circuits

CMOS NOR2
CMOS NOR2
Layout of simple CMOS logic Gate
7.4 Complex logic circuits
7.4 Complex logic circuits – AOI and OAI Gates

AND-OR-INVERT (AOI) –> sum-of-products realization


OR-AND-INVERT (OAI) –> product-of-sums realization
7.4 Complex logic circuits – AOI and OAI Gates

AND-OR-INVERT (AOI) –> sum-of-products realization


OR-AND-INVERT (OAI) –> product-of-sums realization
The pseudo-nMOS implementation of the OAI gate
Example 7.2
CMOS Full-Adder Circuit

Three inputs: A, B and C (carry_in)

sum _ out = A ⊕ B ⊕ C = ABC + ABC + ABC + AC B


carry _ out = AB + AC + BC
Transistor-leve schematic of the one-bit full-adder circuit
Optimized CMOS full adder

CMOS full-adder using minimum-size


transistors
Block diagram of a carry ripple adder chain consisting of full adders
7.5 CMOS Transmission Gates (Pass Gates)
(TG)

Bidirectional switch between the nodes A and B which is controlled by signal C


See figure

VDS ,n = VDD − Vout


VGS ,n = VDD − Vout
The nMOS transistor will be in
saturation for Vout < VDD – VT,n
turned off for Vout > VDD – VT,n

VDS , p = VDD − Vout

VGS , p = −VDD
ID = IDS,n + ISD,P

Equivalent resistance
VDD − Vout VDD − Vout
Req ,n = Req , p =
I DS ,n I SD , p
Region 1: Output voltage is smaller than the absolute value of pMOS
transistor threshold voltage, Vout < |VT, P|.

2(VDD − Vout )
Req ,n =
kn (VDD − Vout − VT ,n ) 2

2(VDD − Vout )
Req , p =
k p (VDD − | VT , p |)2
Region 2: |VT, P| < Vout < (VDD – VT,n ) .

2(VDD − Vout )
Req ,n =
kn (VDD − Vout − VT ,n ) 2

2(VDD − Vout )
Req , p =
k p [2(VDD − | VT , p |)(VDD − Vout ) − (VDD − Vout ) 2 ]

2
Req , p =
k p [2(VDD − | VT , p |) − (VDD − Vout )]
Region 3: Vout > (VDD – VT,n ) .

nMOS will be turned off, resulting in ann open-circuit equivalent.


2
Req , p =
k p [2(VDD − | VT , p |) − (VDD − Vout )]
Using TG for complex gate

Two-input multiplexer circuit implemented using two CMOS TGs


Eight-transistor CMOS TG implementation of the XOR function

Six-transistor CMOS TG implementation of the XOR function


Figure 7.40: (a) CMOS TG realization of a three-variable Boolean function. (b) All pMOS
transistors can be placed into one n-well to save area

layout
Complementary Pass-Transistor Logic (CPL)

The complexity of full-CMOS pass-gate logic circuit can be reduced dramatically by


adopting another circuit concept, call CPL.
The main idea behind CPL is to use a purely nMOS pass –transistor network for the
logic operations, instead of a CMOS TG network.

Disadvantages: “in CPL circuits, the threshold voltages of nMOS transistors in the
pass-gate network must be reduced to about 0 V through threshold-adjustment
implants, in order to eliminate the threshold-voltage drop. This, on the other
hand, reduces the overall noise immunity and makes the transistors more
susceptible to subthreshold conduction in the off-mode.”

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