Atvr
Atvr
An IMPORTANT NOTICE at the end of this data sheet addresses availability, warranty, changes, use in safety-critical applications,
intellectual property matters and other important disclaimers. PRODUCTION DATA.
AM625, AM625-Q1, AM623, AM620-Q1
SPRSP58C – JUNE 2022 – REVISED OCTOBER 2025 [Link]
2 Applications
• Human Machine Interfaces (HMI)
• Retail automation
• Driver Monitoring System (DMS/OMS) / In-Cabin Monitoring (ICM)
• Telematics Control Unit (TCU)
• 3D Point Cloud
• Vehicle to Infrastructure / Vehicle to Vehicle (V2X / V2V)
• 3D Re-configurable automotive instrument cluster
• Appliance user interface and connectivity
• Medical equipment
3 Description
The low-cost AM62x Sitara™ MPU family of application processors are built for Linux® application development.
With scalable Arm® Cortex®-A53 performance and embedded features, such as dual-display support and 3D
graphics acceleration, along with an extensive set of peripherals, making the AM62x device well-suited for a
broad range of industrial and automotive applications while offering intelligent features and optimized power
architecture.
Functional safety requirements can be addressed using the integrated Cortex-M4F cores and dedicated
peripherals, which can all be isolated from the rest of the AM62x processor.
The 3-port Gigabit Ethernet switch has one internal port and two external ports with Time-Sensitive Networking
(TSN) capable. An additional PRU module on the device enables real-time I/O capability for customer’s own use
cases. In addition, the extensive set of peripherals included in AM62x enable system-level connectivity, such
as USB, MMC/SD, Camera interface, OSPI, CAN-FD and GPMC for parallel host interface to an external ASIC/
FPGA. The AM62x device also supports secure boot for IP protection with the built-in Hardware Security Module
(HSM) and employs advanced power management support for portable and power-sensitive applications.
Products in the AM62x processor family:
• AM625 – Human-machine Interaction SoC with Arm® Cortex®-A53-based edge AI and full-HD dual-display
• AM625-Q1 – Automotive Display SoC with embedded safety for digital clusters
• AM623 – Internet of Things (IoT) and Gateway SoC with Arm® Cortex®-A53-based object and gesture
recognition
• AM620-Q1 – Automotive Compute SoC with embedded safety for driver monitoring, networking and V2X
systems
Package Information
PART NUMBER PACKAGE(1) PACKAGE SIZE(2)
AM625 ALW (FCCSP BGA, 425) 13mm × 13mm
ALW (FCCSP BGA, 425) 13mm × 13mm
AM625-Q1
AMC (FCBGA, 441) 17.2mm × 17.2mm
AM623 ALW (FCCSP BGA, 425) 13mm × 13mm
ALW (FCCSP BGA, 425) 13mm × 13mm
AM620-Q1
AMC (FCBGA, 441) 17.2mm x 17.2mm
(1) For more information, see Mechanical, Packaging, and Orderable Information.
(2) The package size (length × width) is a nominal value and includes pins, where applicable.
Note
To understand what device features are currently supported by TI Software Development Kits
(SDKs), search for the AM62x Software Build Sheet located in the Downloads tab option provided
at Processor-SDK-AM62x.
AM62x
Application Cores MCUSS With FFI
® ® ® PRUSS
Arm®
2x Arm Arm Arm
® ®
Cortex
Cortex-A53
-A53
®
Cortex -A53 ®
Cortex -M4F
System Memory
Arm®
2x Arm
®
Arm
® 256KB TCM
® ®
Cortex
Cortex-A53
-A53
®
Cortex -A53 64KB OCRAM
with ECC GPMC
DDR4/LPDDR4
General Connectivity (Main Domain) General Connectivity with inline ECC 3x MMCSD
(MCUSS) (16b)
2-port Gb Ethernet w/ 1588
GPIO
3x SPI GPIO
Multimedia
2x SPI
8x UART 3x ePWM 2x Display 3D Graphics
with DPI Processing Unit
UART and OLDI (LVDS)
CAN-FD 3x eCAP
System Services
DMA Firewall DCC ECC
Device/Power System Secure
Manager Monitor Boot
Debug IPC ESM Timers
Table of Contents
1 Features............................................................................1 6.12 Timing and Switching Characteristics................... 102
2 Applications..................................................................... 4 7 Detailed Description....................................................226
3 Description.......................................................................4 7.1 Overview................................................................. 226
3.1 Functional Block Diagram........................................... 5 7.2 Processor Subsystems........................................... 227
4 Device Comparison......................................................... 7 7.3 Accelerators and Coprocessors..............................228
4.1 Related Products........................................................ 8 7.4 Other Subsystems.................................................. 229
5 Terminal Configuration and Functions........................10 7.5 Peripherals..............................................................231
5.1 Pin Diagrams............................................................ 10 8 Applications, Implementation, and Layout............... 236
5.2 Pin Attributes.............................................................12 8.1 Device Connection and Layout Fundamentals....... 236
5.3 Signal Descriptions................................................... 54 8.2 Peripheral- and Interface-Specific Design
5.4 Pin Connectivity Requirements.................................84 Information................................................................ 237
6 Specifications................................................................ 88 8.3 Clock Routing Guidelines........................................244
6.1 Absolute Maximum Ratings...................................... 88 9 Device and Documentation Support..........................245
6.2 ESD Ratings for Devices which are not AEC - 9.1 Device Nomenclature..............................................245
Q100 Qualified............................................................ 90 9.2 Tools and Software................................................. 248
6.3 ESD Ratings for AEC - Q100 Qualified Devices.......90 9.3 Documentation Support.......................................... 248
6.4 Power-On Hours (POH)............................................ 90 9.4 Support Resources................................................. 248
6.5 Recommended Operating Conditions.......................91 9.5 Trademarks............................................................. 248
6.6 Operating Performance Points..................................93 9.6 Electrostatic Discharge Caution..............................249
6.7 Power Consumption Summary................................. 93 9.7 Glossary..................................................................249
6.8 Electrical Characteristics...........................................94 10 Revision History........................................................ 250
6.9 VPP Specifications for One-Time Programmable 11 Mechanical, Packaging, and Orderable
(OTP) eFuses..............................................................99 Information.................................................................. 255
6.10 Thermal Resistance Characteristics..................... 100 11.1 Packaging Information.......................................... 255
6.11 Temperature Sensor Characteristics.....................101
4 Device Comparison
Table 4-1 shows a comparison between devices, highlighting the differences.
Note
Availability of features listed in this table are a function of shared IO pins, where IO signals associated
with many of the features are multiplexed to a limited number of pins. The SysConfig tool should
be used to assign signal functions to pins. This will provide a better understanding of limitations
associated with pin multiplexing.
Note
To understand what device features are currently supported by TI Software Development Kits
(SDKs), search for the AM62x Software Build Sheet located in the Downloads tab option provided
at Processor-SDK-AM62x.
WKUP_CTRL_MMR_CFG0_JTAG_USER_ID[31:13](1)
Register bit values by device "Features" code (See Device Naming Convention for more information on device features)
C: 0x1D123 0x1D0A3 – 0x1D103 0x1D083 – – – –
G: 0x1D127 0x1D0A7 0x1D067 0x1D107 0x1D087 0x1D047 0x1D307 0x1D287 0x1D247
PROCESSORS AND ACCELERATORS
Speed Grades (See Device Speed Grades) T, S, K, G
Arm Cortex-A53 Quad Dual Single Quad Dual Single Quad Dual Single
Arm A53
Microprocessor Subsystem Core Core Core Core Core Core Core Core Core
Arm Cortex-M4F Single Core
Arm M4F
in MCU domain Functional Safety Optional(5)
3D Graphics Engine 3D Graphics
Yes Yes Yes No No No No No No
(OpenGL ES 3.1, Vulkan 1.2) engine
Device Management
WKUP_R5F Single core
Subsystem
Crypto Accelerators Security Yes
PROGRAM AND DATA STORAGE
On-Chip Shared Memory
OCSRAM 64KB (with SECDED ECC)
(RAM) in MAIN Domain
On-Chip Shared Memory
MCU_MSRAM 256KB
(RAM) in M4F Domain
DDR4/LPDDR4 DDR
DDRSS 16-bit data with inline ECC; up to 8GB using DDR4 or 4GB using LPDDR4
Subsystem
General-Purpose Memory
GPMC Up to 128MB with ECC
Controller
PERIPHERALS
1x DPI No
Display Subsystem DSS
1x OLDI (LVDS) No
Modular Controller Area
Network Interface with Full MCAN 3
CAN-FD Support
General-Purpose I/O GPIO Up to 168
Inter-Integrated Circuit
I2C 6
Interface
Multichannel Audio Serial Port MCASP 3
Multichannel Serial Peripheral
MCSPI 5
Interface
(1) For more details about the WKUP_MMR0_JTAG_USER_ID register and DEVICE_ID bit field, see the device TRM.
(2) One flash interface, configured as OSPI0 or QSPI0.
(3) PRU Subsystem (PRUSS) is available when selecting an orderable part number that includes a Features code of C. Refer to Device
Naming Convention for definition of feature codes.
(4) Industrial Communication Subsystem support is not available for this family of devices.
(5) Functional Safety is available when selecting an orderable part number that includes a Functional Safety code of F. Refer to Device
Naming Convention for definition of feature codes.
• Ethernet PHYs
• Power management / PMICs
• Clocks and timing
• Power switches
• CAN transceivers
• ESD Protection
Please reference the AM62x EVM schematic for details of how these devices are implemented in a system
design, and bill of materials for specific part number recommendations.
Figure 5-1 shows the ball locations for the 425-ball flip chip ball grid array (FCCSP BGA) package, where
the HTML version provides additional information when hovering your cursor over a ball. This figure is used
in conjunction with Section 5.2.1 through Table 5-74 (Pin Attributes table and all Signal Descriptions tables,
including the Connectivity Requirements table).
1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 17 18 19 20 21 22 23 24 25
MCU_OSC0 WKUP MCU_UART0 MCU_UART0 MCU_SPI0 MCU_I2C0 WKUP_I2C0 WKUP UART0 EXT MCASP0 MCASP0
A VSS RSVD1 _UART0 TCK TDI SPI0_CS0 SPI0_CLK I2C0_SDA I2C1_SDA MMC1_CMD MMC1_DAT0 MMC2_SDCD VSS VSS
_XO _RTSn _TXD _CTSn _CLK _SCL _SDA _CLKOUT0 _CTSn _REFCLK1 _AXR2 _ACLKR
MCU_OSC0 MCU_MCAN0 WKUP MCU_UART0 MCU_UART0 PMIC_LPM MCU_SPI0 WKUP_I2C0 MCU_RESETS UART0 MCASP0 MCASP0 MCASP0
B RSVD0 _UART0 TRSTn TMS SPI0_D0 SPI0_D1 I2C0_SCL I2C1_SCL MMC1_DAT1 MMC1_CLK MMC2_SDWP MMC2_DAT0 VSS
_XI _RX _RXD _RXD _RTSn _EN0 _CS1 _SCL TATz _RTSn _AXR1 _AXR3 _ACLKX
J DDR0_A0 DDR0_A1 DDR0_ODT1 DDR0_CKE1 VSS VPP VDD_CORE VDDR_CORE VSS VDD_CORE VDDSHV6 CAP_VDDS6 OSPI0_D7 OSPI0_D4 OSPI0_DQS OSPI0_D5
DDR0_ACT GPMC0
N DDR0_BA1 DDR0_BG1 DDR0_WE_n VDD_CORE VDD_CORE VDDR_CORE VDD_CORE VDDR_CORE VSS VDDSHV3 GPMC0_AD1 GPMC0_AD2 GPMC0_AD3
_n _BE1n
P DDR0_A8 DDR0_A7 DDR0_A9 DDR0_A11 VSS VDDS_DDR VSS VSS VDDR_CORE VDD_CORE VDDSHV3 CAP_VDDS3 GPMC0_AD6 GPMC0_AD5 GPMC0_AD4 GPMC0_CLK
DDR0 GPMC0
R DDR0_A13 DDR0_A6 DDR0_A10 DDR0_A12 VDDS_DDR VDD_CORE VDDR_CORE VSS VDD_CORE VSS VSS VSS GPMC0_AD7 GPMC0_AD8 GPMC0_AD9
_ALERT_n _AD11
OLDI0 OLDI0 CSI0 RGMII1 RGMII1 RGMII1_TX RGMII1 RGMII2 RGMII2_RX RGMII2
AD VSS MMC0_DAT6 OLDI0_A1N OLDI0_A5P OLDI0_A6P OLDI0_A7N VSS USB1_DM USB0_DP VSS CSI0_RXN2 CSI0_RXN1 VSS MDIO0_MDC VSS
_CLK0N _CLK1P _RXCLKN _RXC _TD3 _CTL _TD1 _TD2 _CTL _RXC
OLDI0 OLDI0 USB0 CSI0 RGMII1_RX RGMII1 RGMII1 RGMII1 RGMII2 RGMII2 RGMII2
AE VSS RSVD3 OLDI0_A5N OLDI0_A6N OLDI0_A7P VSS USB1_DP USB0_DM VSS CSI0_RXP2 CSI0_RXP1 VSS VSS VSS
_CLK0P _CLK1N _RCALIB _RXCLKP _CTL _TD2 _TXC _TD0 _TXC _RD3 _RD0
Not to scale
Figure 5-2 shows the ball locations for the 441-ball flip chip ball grid array (FCBGA BGA) package, where
the HTML version provides additional information when hovering your cursor over a ball. This figure is used
in conjunction with Section 5.2.1 through Table 5-74 (Pin Attributes table and all Signal Descriptions tables,
including the Connectivity Requirements table).
1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 17 18 19 20 21
WKUP WKUP MCU_OSC0 MCU_OSC0 WKUP MCU_UART0 WKUP_I2C0 MCU_I2C0 MCU_RESETS MCASP0
A VSS _LFOSC0 _LFOSC0 VSS _UART0 TRSTn UART0_RXD SPI0_D1 MCAN0_RX I2C1_SDA I2C1_SCL MMC1_DAT0 MMC1_CLK VSS
_XI _XO _XI _XO _CTSn _RXD _SDA _SDA TATz _AXR1
MCU WKUP WKUP MCU_UART0 MCU_SPI0 MCU_UART0 MCU_I2C0 WKUP UART0 MCASP0 MCASP0
B MCU_PORz RSVD0 _UART0 _UART0 EMU1 TMS MCAN0_TX MMC1_SDWP EXTINTn MMC1_DAT1 MMC1_DAT2 MMC2_DAT0
_ERRORn _RTSn _RXD _TXD _CLK _CTSn _SCL _CLKOUT0 _CTSn _AXR2 _AXR3
MCU_MCAN0 MCU_MCAN0 WKUP PMIC_LPM MCU_SPI0 MCU UART0 EXT MCASP0 MCASP0
C VDDS_DDR DDR0_DQ0 RSVD1 _UART0 TCK SPI0_CS0 SPI0_D0 MMC1_SDCD MMC1_CMD MMC1_DAT3 MMC2_SDWP MMC2_CMD
_RX _TX _TXD _EN0 _CS1 _RESETz _RTSn _REFCLK1 _AFSX _ACLKX
DDR0_CAS GPMC0
J DDR0_CK0 DDR0_WE_n DDR0_ODT0 DDR0_A4 VSS VDDS_OSC0 VDDS_DDR VDD_CORE VSS VDD_CORE VSS VDD_CORE VSS CAP_VDDS6 VSS GPMC0_WEn GPMC0_DIR GPMC0_WPn OSPI0_D7
_n _CSn0
VDDS_DDR VDDA_DDR
L VSS DDR0_BG1 DDR0_BA1 DDR0_BG0 DDR0_BA0 VSS VDDS_DDR VSS VDD_CORE VSS VDD_CORE VSS CAP_VDDS1 VSS GPMC0_AD5 GPMC0_AD6 GPMC0_AD1 GPMC0_AD2 GPMC0_AD3
_C _PLL0
DDR0_DQS1 VDDA_1P8 VDDA_3P3 VDDA_1P8 VDDA_1P8 VOUT0 VOUT0 VOUT0 VOUT0 VOUT0
R DDR0_DQ9 DDR0_DQ8 DDR0_DM1 VSS RSVD4 VSS VSS CAP_VDDS2 VDDSHV2 VDDSHV2 VSS
_n _OLDI0 _USB _USB _CSIRX0 _DATA9 _DATA2 _DATA3 _DATA4 _DATA0
Not to scale
2. BALL NAME: Ball name assigned to each terminal of the Ball Grid Array package (this name is typically
taken from the primary MUXMODE 0 signal function).
3. SIGNAL NAME: Signal name(s) of all dedicated and pin multiplexed signal functions associated with a ball.
Note
Many device pins support multiple signal functions. Some signal functions are selected via a single
layer of multiplexers associated with pins. Other signal functions are selected via two or more layers
of multiplexers, where one layer is associated with the pins and other layers are associated with
peripheral logic functions.
Table 5-1, Pin Attributes (ALW, AMC Packages) only defines signal multiplexing at the pins. For more
information, related to signal multiplexing at the pins, see the Pad Configuration Registers section in
the Device Configuration chapter of the device TRM. For information associated with peripheral signal
multiplexing, see the respective peripheral chapter in the device TRM.
4. MUX MODE: The MUXMODE value associated with each pin multiplexed signal function:
a. MUXMODE 0 is the primary pin multiplexed signal function. However, the primary pin multiplexed signal
function is not necessarily the default pin multiplexed signal function.
Note
The value found in the MUX MODE AFTER RESET column defines the default pin multiplexed
signal function selected when MCU_PORz is deasserted.
b. MUXMODE values 1 through 15 are possible for pin multiplexed signal functions. However, not all
MUXMODE values have been implemented. The only valid MUXMODE values are those defined as pin
multiplexed signal functions within the Pin Attributes table. Only valid values of MUXMODE should be
used.
c. Bootstrap defines SOC configuration pins, where the logic state applied to each pin is latched on the
rising edge of PORz_OUT. These input signal functions are fixed to their respective pins and are not
programmable via MUXMODE.
d. An empty box means Not Applicable.
Note
The following configurations of MUXMODE must be avoided for proper device operation.
• Configuring multiple pins operating as inputs to the same pin multiplexed signal function is not
supported as it can yield unexpected results.
• Configuring a pin to an undefined pin multiplexing mode will cause the pin behavior to be
undefined.
10. I/O OPERATING VOLTAGE: This column describes I/O operating voltage options of the respective power
supply, when applicable.
An empty box means Not Applicable.
For more information, see valid operating voltage range(s) defined for each power supply in Section 6.5,
Recommended Operating Conditions.
11. POWER: The power supply of the associated I/O, when applicable.
An empty box means Not Applicable.
12. HYS: Indicates if the input buffer associated with this I/O has hysteresis:
• Yes: With hysteresis
• No: Without hysteresis
• An empty box means Not Applicable.
For more information, see the hysteresis values in Section 6.8, Electrical Characteristics.
13. BUFFER TYPE: This column defines the buffer type associated with a terminal. This information can be
used to determine which Electrical Characteristics table is applicable.
An empty box means Not Applicable.
For electrical characteristics, refer to the appropriate buffer type table in Section 6.8, Electrical
Characteristics.
14. PULL UP/DOWN TYPE: Indicates the presence of an internal pullup or pulldown resistor. Pullup and
pulldown resistors can be enabled or disabled via software.
• PU: Internal pull-up
• PD: Internal pull-down
• PU/PD: Internal pull-up and pull-down
• An empty box means No internal pull.
15. PADCONFIG Register:Name of the IO pad configuration register associated with Ball.
16. PADCONFIG Address:Physical address of the IO pad configuration register associated with Ball.
E12 D9 PADCONFIG: EMU0 0 IO 0 On / Off / Up On / Off / Up 0 1.8V / 3.3V VDDSHV_MCU Yes LVCMOS PU/PD
MCU_PADCONFIG30
0x04084078
EMU1
C11 B10 PADCONFIG: EMU1 0 IO 0 On / Off / Up On / Off / Up 0 1.8V / 3.3V VDDSHV_MCU Yes LVCMOS PU/PD
MCU_PADCONFIG31
0x0408407C
EXTINTn EXTINTn 0 I 1
D16 B16 PADCONFIG: Off / Off / NA Off / Off / NA 7 1.8V / 3.3V VDDSHV0 Yes I2C OD FS
PADCONFIG125 GPIO1_31 7 IOD pad
0x000F41F4
EXT_REFCLK1 0 I 0
SYNC1_OUT 1 O
SPI2_CS3 2 IO 1
EXT_REFCLK1 SYSCLKOUT0 3 O
A18 C14 PADCONFIG: TIMER_IO4 4 IO 0 Off / Off / Off Off / Off / Off 7 1.8V / 3.3V VDDSHV0 Yes LVCMOS PU/PD
PADCONFIG124
0x000F41F0 CLKOUT0 5 O
CP_GEMAC_CPTS0_RFT_CLK 6 I 0
GPIO1_30 7 IO pad
ECAP0_IN_APWM_OUT 8 IO 0
GPMC0_ADVn_ALE 0 O
MCASP1_AXR2 2 IO 0
GPMC0_ADVn_ALE
PR0_PRU0_GPO9 4 IO 0
L23 K20 PADCONFIG: Off / Off / Off Off / Off / Off 7 1.8V / 3.3V VDDSHV3 Yes LVCMOS PU/PD
PADCONFIG33 PR0_PRU0_GPI9 5 I 0
0x000F4084
TRC_DATA7 6 O
GPIO0_32 7 IO pad
GPMC0_CLK 0 O
MCASP1_AXR3 2 IO 0
GPMC0_CLK GPMC0_FCLK_MUX 3 O
P25 M19 PADCONFIG: PR0_PRU0_GPO8 4 IO 0 Off / Off / Off Off / Off / Off 7 1.8V / 3.3V VDDSHV3 Yes LVCMOS PU/PD
PADCONFIG31
0x000F407C PR0_PRU0_GPI8 5 I 0
TRC_DATA6 6 O
GPIO0_31 7 IO pad
D1 B1 PADCONFIG: MCU_ERRORn 0 IO Off / Off / Down On / SS / Down 0 1.8V VDDS_OSC0 Yes LVCMOS PU/PD
MCU_PADCONFIG24
0x04084060
MCU_I2C0_SCL MCU_I2C0_SCL 0 IOD 1
D10 A10 PADCONFIG: Off / Off / NA On / SS / NA 7 1.8V / 3.3V VDDSHV_MCU Yes I2C OD FS
MCU_PADCONFIG18 MCU_GPIO0_18 7 IOD pad
0x04084048
MCU_MCAN0_RX 0 I 1
MCU_MCAN0_RX
MCU_TIMER_IO0 1 IO 0
B3 C4 PADCONFIG: Off / Off / Off Off / Off / Off 7 1.8V / 3.3V VDDSHV_CANUART Yes LVCMOS PU/PD
MCU_PADCONFIG14 MCU_SPI1_CS3 2 IO 1
0x04084038
MCU_GPIO0_14 7 IO pad
MCU_MCAN0_TX 0 O
MCU_MCAN0_TX
WKUP_TIMER_IO0 1 IO 0
D6 C5 PADCONFIG: Off / Off / Off Off / Off / Off 7 1.8V / 3.3V VDDSHV_CANUART Yes LVCMOS PU/PD
MCU_PADCONFIG13 MCU_SPI0_CS3 2 IO 1
0x04084034
MCU_GPIO0_13 7 IO pad
MCU_MCAN1_RX 0 I 1
MCU_TIMER_IO3 1 IO 0
MCU_MCAN1_RX
MCU_SPI0_CS2 2 IO 1
D4 D6 PADCONFIG: Off / Off / Off Off / Off / Off 7 1.8V / 3.3V VDDSHV_CANUART Yes LVCMOS PU/PD
MCU_PADCONFIG16 MCU_SPI1_CS2 3 IO 1
0x04084040
MCU_SPI1_CLK 4 IO 0
MCU_GPIO0_16 7 IO pad
B12 A12 PADCONFIG: Off / Low / Off Off / SS / Off 0 1.8V / 3.3V VDDSHV_MCU Yes LVCMOS PU/PD
MCU_PADCONFIG23 MCU_GPIO0_21 7 IO pad
0x0408405C
MCU_RESETz
E11 C9 PADCONFIG: MCU_RESETz 0 I On / Off / Up On / Off / Up 0 1.8V / 3.3V VDDSHV_MCU Yes LVCMOS PU/PD
MCU_PADCONFIG21
0x04084054
MCU_SPI0_CLK MCU_SPI0_CLK 0 IO 0
A7 B7 PADCONFIG: Off / Off / Off Off / Off / Off 7 1.8V / 3.3V VDDSHV_MCU Yes LVCMOS PU/PD
MCU_PADCONFIG2 MCU_GPIO0_2 7 IO pad
0x04084008
MCU_SPI0_CS0 MCU_SPI0_CS0 0 IO 1
E8 E7 PADCONFIG: WKUP_TIMER_IO1 4 IO 0 Off / Off / Off Off / Off / Off 7 1.8V / 3.3V VDDSHV_MCU Yes LVCMOS PU/PD
MCU_PADCONFIG0
0x04084000 MCU_GPIO0_0 7 IO pad
MCU_SPI0_CS1 0 IO 1
MCU_OBSCLK0 1 O
MCU_SPI0_CS1
MCU_SYSCLKOUT0 2 O
B8 C8 PADCONFIG: Off / Off / Off Off / Off / Off 7 1.8V / 3.3V VDDSHV_MCU Yes LVCMOS PU/PD
MCU_PADCONFIG1 MCU_EXT_REFCLK0 3 I 0
0x04084004
MCU_TIMER_IO1 4 IO 0
MCU_GPIO0_1 7 IO pad
MCU_SPI0_D0 MCU_SPI0_D0 0 IO 0
D9 E8 PADCONFIG: Off / Off / Off Off / Off / Off 7 1.8V / 3.3V VDDSHV_MCU Yes LVCMOS PU/PD
MCU_PADCONFIG3 MCU_GPIO0_3 7 IO pad
0x0408400C
MCU_SPI0_D1 MCU_SPI0_D1 0 IO 0
C9 D8 PADCONFIG: Off / Off / Off Off / Off / Off 7 1.8V / 3.3V VDDSHV_MCU Yes LVCMOS PU/PD
MCU_PADCONFIG4 MCU_GPIO0_4 7 IO pad
0x04084010
B5 A8 PADCONFIG: Off / Off / Off Off / Off / Off 7 1.8V / 3.3V VDDSHV_CANUART Yes LVCMOS PU/PD
MCU_PADCONFIG5 MCU_GPIO0_5 7 IO pad
0x04084014
MCU_UART0_TXD MCU_UART0_TXD 0 O
A5 B6 PADCONFIG: Off / Off / Off Off / Off / Off 7 1.8V / 3.3V VDDSHV_CANUART Yes LVCMOS PU/PD
MCU_PADCONFIG6 MCU_GPIO0_6 7 IO pad
0x04084018
MDIO0_MDC MDIO0_MDC 0 O
AD24 V17 PADCONFIG: Off / Off / Off Off / Off / Off 7 1.8V / 3.3V VDDSHV2 Yes LVCMOS PU/PD
PADCONFIG88 GPIO0_86 7 IO pad
0x000F4160
MDIO0_MDIO MDIO0_MDIO 0 IO 0
AB22 U16 PADCONFIG: Off / Off / Off Off / Off / Off 7 1.8V / 3.3V VDDSHV2 Yes LVCMOS PU/PD
PADCONFIG87 GPIO0_85 7 IO pad
0x000F415C
MMC0_CLK 0 IO 0
I2C3_SCL 1 IOD 1
EHRPWM2_A 2 IO 0
MMC0_CLK
PR0_PRU1_GPO4 3 O
AB1 Y1 PADCONFIG: Off / Off / Off Off / Off / Off 7 1.8V / 3.3V VDDSHV4 Yes SDIO PU/PD
PADCONFIG134 PR0_PRU1_GPI4 4 I 0
0x000F4218
SPI1_CS1 5 IO 1
TIMER_IO4 6 IO 0
GPIO1_40 7 IO pad
B24 B21 PADCONFIG: MCASP1_AXR0 1 IO 0 Off / Off / Off Off / Off / Off 7 1.8V / 3.3V VDDSHV6 Yes SDIO PU/PD
PADCONFIG69
0x000F4114 GPIO0_68 7 IO pad
MMC2_DAT1 MMC2_DAT1 0 IO 1
C25 D21 PADCONFIG: MCASP1_AXR1 1 IO 0 Off / Off / Off Off / Off / Off 7 1.8V / 3.3V VDDSHV6 Yes SDIO PU/PD
PADCONFIG68
0x000F4110 GPIO0_67 7 IO pad
H24 G19 PADCONFIG: Off / Off / Off Off / Off / Off 7 1.8V / 3.3V VDDSHV1 Yes LVCMOS PU/PD
PADCONFIG0 GPIO0_0 7 IO pad
0x000F4000
OSPI0_DQS OSPI0_DQS 0 I 0
J24 H20 PADCONFIG: UART5_CTSn 5 I 1 Off / Off / Off Off / Off / Off 7 1.8V / 3.3V VDDSHV1 Yes LVCMOS PU/PD
PADCONFIG2
0x000F4008 GPIO0_2 7 IO pad
G25 G18 PADCONFIG: UART5_RTSn 5 O Off / Off / Off Off / Off / Off 7 1.8V / 3.3V VDDSHV1 Yes LVCMOS PU/PD
PADCONFIG1
0x000F4004 GPIO0_1 7 IO pad
OSPI0_CSn0 OSPI0_CSn0 0 O
F23 F19 PADCONFIG: Off / Off / Off Off / Off / Off 7 1.8V / 3.3V VDDSHV1 Yes LVCMOS PU/PD
PADCONFIG11 GPIO0_11 7 IO pad
0x000F402C
OSPI0_CSn1 OSPI0_CSn1 0 O
G21 F17 PADCONFIG: Off / Off / Off Off / Off / Off 7 1.8V / 3.3V VDDSHV1 Yes LVCMOS PU/PD
PADCONFIG12 GPIO0_12 7 IO pad
0x000F4030
OSPI0_CSn2 0 O
SPI1_CS1 1 IO 1
OSPI0_CSn2 OSPI0_RESET_OUT1 2 O
H21 E17 PADCONFIG: MCASP1_AFSR 3 IO 0 Off / Off / Off Off / Off / Off 7 1.8V / 3.3V VDDSHV1 Yes LVCMOS PU/PD
PADCONFIG13
0x000F4034 MCASP1_AXR2 4 IO 0
UART5_RXD 5 I 1
GPIO0_13 7 IO pad
OSPI0_CSn3 0 O
OSPI0_RESET_OUT0 1 O
OSPI0_CSn3 OSPI0_ECC_FAIL 2 I 1
E24 E18 PADCONFIG: MCASP1_ACLKR 3 IO 0 Off / Off / Off Off / Off / Off 7 1.8V / 3.3V VDDSHV1 Yes LVCMOS PU/PD
PADCONFIG14
0x000F4038 MCASP1_AXR3 4 IO 0
UART5_TXD 5 O
GPIO0_14 7 IO pad
OSPI0_D0 OSPI0_D0 0 IO 0
E25 F18 PADCONFIG: Off / Off / Off Off / Off / Off 7 1.8V / 3.3V VDDSHV1 Yes LVCMOS PU/PD
PADCONFIG3 GPIO0_3 7 IO pad
0x000F400C
OSPI0_D1 OSPI0_D1 0 IO 0
G24 G17 PADCONFIG: Off / Off / Off Off / Off / Off 7 1.8V / 3.3V VDDSHV1 Yes LVCMOS PU/PD
PADCONFIG4 GPIO0_4 7 IO pad
0x000F4010
OSPI0_D2 OSPI0_D2 0 IO 0
F25 F21 PADCONFIG: Off / Off / Off Off / Off / Off 7 1.8V / 3.3V VDDSHV1 Yes LVCMOS PU/PD
PADCONFIG5 GPIO0_5 7 IO pad
0x000F4014
OSPI0_D3 OSPI0_D3 0 IO 0
F24 F20 PADCONFIG: Off / Off / Off Off / Off / Off 7 1.8V / 3.3V VDDSHV1 Yes LVCMOS PU/PD
PADCONFIG6 GPIO0_6 7 IO pad
0x000F4018
B7 C7 PADCONFIG: Off / Off / Off Off / SS / Off 0 1.8V / 3.3V VDDSHV_CANUART Yes LVCMOS PU/PD
MCU_PADCONFIG32 MCU_GPIO0_22 7 IO pad
0x04084080
PORz_OUT
E21 E13 PADCONFIG: PORz_OUT 0 O Off / Low / Off Off / SS / Off 0 1.8V / 3.3V VDDSHV0 Yes LVCMOS PU/PD
PADCONFIG148
0x000F4250
RESETSTATz
F22 E14 PADCONFIG: RESETSTATz 0 O Off / Low / Off Off / SS / Off 0 1.8V / 3.3V VDDSHV0 Yes LVCMOS PU/PD
PADCONFIG147
0x000F424C
RESET_REQz
F20 E15 PADCONFIG: RESET_REQz 0 I On / Off / Up On / Off / Up 0 1.8V / 3.3V VDDSHV0 Yes LVCMOS PU/PD
PADCONFIG146
0x000F4248
AE17 W14 PADCONFIG: RMII1_RX_ER 1 I 0 Off / Off / Off Off / Off / Off 7 1.8V / 3.3V VDDSHV2 Yes LVCMOS PU/PD
PADCONFIG81
0x000F4144 GPIO0_79 7 IO pad
RGMII1_TXC RGMII1_TXC 0 IO 0
AE19 W16 PADCONFIG: RMII1_CRS_DV 1 I 0 Off / Off / Off Off / Off / Off 7 1.8V / 3.3V VDDSHV2 Yes LVCMOS PU/PD
PADCONFIG76
0x000F4130 GPIO0_74 7 IO pad
RGMII1_TX_CTL RGMII1_TX_CTL 0 O
AD19 V15 PADCONFIG: RMII1_TX_EN 1 O Off / Off / Off Off / Off / Off 7 1.8V / 3.3V VDDSHV2 Yes LVCMOS PU/PD
PADCONFIG75
0x000F412C GPIO0_73 7 IO pad
RGMII2_RXC 0 I 0
RMII2_REF_CLK 1 I 0
RGMII2_RXC MCASP2_AXR1 2 IO 0
AD23 V18 PADCONFIG: PR0_PRU0_GPO1 3 IO 0 Off / Off / Off Off / Off / Off 7 1.8V / 3.3V VDDSHV2 Yes LVCMOS PU/PD
PADCONFIG96
0x000F4180 PR0_PRU0_GPI1 4 I 0
PR0_ECAP0_SYNC_IN 5 I 0
GPIO1_2 7 IO pad
RGMII2_RX_CTL 0 I 0
RMII2_RX_ER 1 I 0
RGMII2_RX_CTL
MCASP2_AXR3 2 IO 0
AD22 W19 PADCONFIG: Off / Off / Off Off / Off / Off 7 1.8V / 3.3V VDDSHV2 Yes LVCMOS PU/PD
PADCONFIG95 PR0_PRU0_GPO0 3 IO 0
0x000F417C
PR0_PRU0_GPI0 4 I 0
GPIO1_1 7 IO pad
RGMII2_TXC 0 IO 0
RMII2_CRS_DV 1 I 0
RGMII2_TXC
MCASP2_AXR5 2 IO 0
AE21 Y18 PADCONFIG: Off / Off / Off Off / Off / Off 7 1.8V / 3.3V VDDSHV2 Yes LVCMOS PU/PD
PADCONFIG90 PR0_PRU1_GPO1 3 O
0x000F4168
PR0_PRU1_GPI1 4 I 0
GPIO0_88 7 IO pad
AB17 W15 PADCONFIG: RMII1_RXD0 1 I 0 Off / Off / Off Off / Off / Off 7 1.8V / 3.3V VDDSHV2 Yes LVCMOS PU/PD
PADCONFIG83
0x000F414C GPIO0_81 7 IO pad
RGMII1_RD1 RGMII1_RD1 0 I 0
AC17 Y16 PADCONFIG: RMII1_RXD1 1 I 0 Off / Off / Off Off / Off / Off 7 1.8V / 3.3V VDDSHV2 Yes LVCMOS PU/PD
PADCONFIG84
0x000F4150 GPIO0_82 7 IO pad
RGMII1_RD2 RGMII1_RD2 0 I 0
AB16 AA17 PADCONFIG: PR0_UART0_RTSn 2 O Off / Off / Off Off / Off / Off 7 1.8V / 3.3V VDDSHV2 Yes LVCMOS PU/PD
PADCONFIG85
0x000F4154 GPIO0_83 7 IO pad
RGMII1_RD3 RGMII1_RD3 0 I 0
AA15 Y15 PADCONFIG: Off / Off / Off Off / Off / Off 7 1.8V / 3.3V VDDSHV2 Yes LVCMOS PU/PD
PADCONFIG86 GPIO0_84 7 IO pad
0x000F4158
RGMII1_TD0 RGMII1_TD0 0 O
AE20 U14 PADCONFIG: RMII1_TXD0 1 O Off / Off / Off Off / Off / Off 7 1.8V / 3.3V VDDSHV2 Yes LVCMOS PU/PD
PADCONFIG77
0x000F4134 GPIO0_75 7 IO pad
RGMII1_TD1 RGMII1_TD1 0 O
AD20 AA19 PADCONFIG: RMII1_TXD1 1 O Off / Off / Off Off / Off / Off 7 1.8V / 3.3V VDDSHV2 Yes LVCMOS PU/PD
PADCONFIG78
0x000F4138 GPIO0_76 7 IO pad
RGMII1_TD2 RGMII1_TD2 0 O
AE18 Y17 PADCONFIG: PR0_UART0_RXD 2 I 1 Off / Off / Off Off / Off / Off 7 1.8V / 3.3V VDDSHV2 Yes LVCMOS PU/PD
PADCONFIG79
0x000F413C GPIO0_77 7 IO pad
RGMII1_TD3 RGMII1_TD3 0 O
AD18 AA18 PADCONFIG: PR0_UART0_TXD 2 O Off / Off / Off Off / Off / Off 7 1.8V / 3.3V VDDSHV2 Yes LVCMOS PU/PD
PADCONFIG80
0x000F4140 GPIO0_78 7 IO pad
A10 C10 PADCONFIG: TCK 0 I On / Off / Up On / Off / Up 0 1.8V / 3.3V VDDSHV_MCU Yes LVCMOS PU/PD
MCU_PADCONFIG25
0x04084064
TDI
A11 D10 PADCONFIG: TDI 0 I On / Off / Up On / Off / Up 0 1.8V / 3.3V VDDSHV_MCU Yes LVCMOS PU/PD
MCU_PADCONFIG27
0x0408406C
TDO
D12 E10 PADCONFIG: TDO 0 OZ Off / Off / Up Off / SS / Up 0 1.8V / 3.3V VDDSHV_MCU Yes LVCMOS PU/PD
MCU_PADCONFIG28
0x04084070
TMS
B11 B11 PADCONFIG: TMS 0 I On / Off / Up On / Off / Up 0 1.8V / 3.3V VDDSHV_MCU Yes LVCMOS PU/PD
MCU_PADCONFIG29
0x04084074
TRSTn
B10 A11 PADCONFIG: TRSTn 0 I On / Off / Down On / Off / Down 0 1.8V / 3.3V VDDSHV_MCU Yes LVCMOS PU/PD
MCU_PADCONFIG26
0x04084068
C20 D17 PADCONFIG: Off / Off / Down Off / Off / Down 7 1.8V / 3.3V VDDSHV0 Yes LVCMOS PU/PD
PADCONFIG149 GPIO1_50 7 IO pad
0x000F4254
F18 E16 PADCONFIG: Off / Off / Down Off / Off / Down 7 1.8V / 3.3V VDDSHV0 Yes LVCMOS PU/PD
PADCONFIG150 GPIO1_51 7 IO pad
0x000F4258
VDDA_1P8_USB,
AC9 V9 USB1_RCALIB USB1_RCALIB A 1.8V / 3.3V USB2PHY
VDDA_3P3_USB
VDDA_1P8_USB,
AB10 U9 USB1_VBUS USB1_VBUS A 1.8V / 3.3V USB2PHY
VDDA_3P3_USB
Y11 R11 VDDA_1P8_USB VDDA_1P8_USB PWR
W14 R12 VDDA_1P8_CSIRX0 VDDA_1P8_CSIRX0 PWR
W10, W9 P9, R9 VDDA_1P8_OLDI0 VDDA_1P8_OLDI0 PWR
Y13 R10 VDDA_3P3_USB VDDA_3P3_USB PWR
W13 P12 VDDA_CORE_CSIRX0 VDDA_CORE_CSIRX0 PWR
W12 P11 VDDA_CORE_USB VDDA_CORE_USB PWR
L9 VDDA_DDR_PLL0 VDDA_DDR_PLL0 PWR
L11 H10 VDDA_MCU VDDA_MCU PWR
U11 N10 VDDA_PLL0 VDDA_PLL0 PWR
U15 P14 VDDA_PLL1 VDDA_PLL1 PWR
L14 K12 VDDA_PLL2 VDDA_PLL2 PWR
T9 M7 VDDA_TEMP0 VDDA_TEMP0 PWR
G16 F16 VDDA_TEMP1 VDDA_TEMP1 PWR
J12, K16,
N12, N14, H11, M10,
VDDR_CORE VDDR_CORE PWR
P16, R12, M13
T10, U14
F15, G14 F12, G13 VDDSHV0 VDDSHV0 PWR
L18, M19 K15, K16 VDDSHV1 VDDSHV1 PWR
W16, W19 R14, R15 VDDSHV2 VDDSHV2 PWR
N18, P18,
N15, N16 VDDSHV3 VDDSHV3 PWR
T19, U18
T7 N7, P7 VDDSHV4 VDDSHV4 PWR
G17 F14, G14 VDDSHV5 VDDSHV5 PWR
J18 H15, H16 VDDSHV6 VDDSHV6 PWR
A12 B12 PADCONFIG: Off / Off / Off Off / SS / Off 0 1.8V / 3.3V VDDSHV_MCU Yes LVCMOS PU/PD
MCU_PADCONFIG33 MCU_GPIO0_23 7 IO pad
0x04084084
WKUP_I2C0_SCL WKUP_I2C0_SCL 0 IOD 1
B4 B5 PADCONFIG: MCU_SPI0_CS2 2 IO 1 Off / Off / Off Off / Off / Off 7 1.8V / 3.3V VDDSHV_CANUART Yes LVCMOS PU/PD
MCU_PADCONFIG9
0x04084024 MCU_GPIO0_9 7 IO pad
WKUP_UART0_TXD WKUP_UART0_TXD 0 O
C5 C6 PADCONFIG: MCU_SPI1_CS2 2 IO 1 Off / Off / Off Off / Off / Off 7 1.8V / 3.3V VDDSHV_CANUART Yes LVCMOS PU/PD
MCU_PADCONFIG10
0x04084028 MCU_GPIO0_10 7 IO pad
Note
Signal names and descriptions provided in each Signal Descriptions table, represent the pin
multiplexed signal function which is implemented at the pin and selected via PADCONFIG registers.
Device subsystems may provide secondary multiplexing of signal functions, which are not described
in these tables. For more information on secondary multiplexed signal functions, see the respective
peripheral chapter of the device TRM.
For more information on the IO cell configurations, see the Pad Configuration Registers section in Device
Configuration chapter of the device TRM.
5.3.1 CPSW3G
[Link] MAIN Domain
Table 5-2. CPSW3G0 RGMII1 Signal Descriptions
SIGNAL NAME [1] PIN TYPE [2] DESCRIPTION [3] ALW PIN [4] AMC PIN [4]
RGMII1_RXC I RGMII Receive Clock AD17 AA16
RGMII1_RX_CTL I RGMII Receive Control AE17 W14
RGMII1_TXC IO RGMII Transmit Clock AE19 W16
RGMII1_TX_CTL O RGMII Transmit Control AD19 V15
RGMII1_RD0 I RGMII Receive Data 0 AB17 W15
RGMII1_RD1 I RGMII Receive Data 1 AC17 Y16
RGMII1_RD2 I RGMII Receive Data 2 AB16 AA17
RGMII1_RD3 I RGMII Receive Data 3 AA15 Y15
RGMII1_TD0 O RGMII Transmit Data 0 AE20 U14
RGMII1_TD1 O RGMII Transmit Data 1 AD20 AA19
RGMII1_TD2 O RGMII Transmit Data 2 AE18 Y17
RGMII1_TD3 O RGMII Transmit Data 3 AD18 AA18
5.3.2 CPTS
Note
Some CPTS signals are connected directly to CPTS modules within the device. Other CPTS signals
are connected to the Time Sync Router and fanned out to peripherals linked to the router. Input
signals are sent to the peripherals while output signals are sourced from the peripherals. For more
information, see the Time Sync and Compare Events section in the Time Sync chapter in the device
TRM.
5.3.3 CSI-2
[Link] MAIN Domain
Table 5-7. CSIRX0 Signal Descriptions
SIGNAL NAME [1] PIN TYPE [2] DESCRIPTION [3] ALW PIN [4] AMC PIN [4]
CSI-2 Differential Receive Clock Input
CSI0_RXCLKN I AD15 AA14
(negative)
CSI0_RXCLKP I CSI-2 Differential Receive Clock Input (positive) AE15 AA13
CSI-2 D-PHY connection to external calibration
CSI0_RXRCALIB (1) A AA14 T11
resistor
CSI0_RXN0 I CSI-2 Differential Receive Input (negative) AB14 Y13
CSI0_RXN1 I CSI-2 Differential Receive Input (negative) AD14 V13
CSI0_RXN2 I CSI-2 Differential Receive Input (negative) AD13 U12
CSI0_RXN3 I CSI-2 Differential Receive Input (negative) AB12 W12
CSI0_RXP0 I CSI-2 Differential Receive Input (positive) AC15 Y12
CSI0_RXP1 I CSI-2 Differential Receive Input (positive) AE14 V12
CSI0_RXP2 I CSI-2 Differential Receive Input (positive) AE13 U11
CSI0_RXP3 I CSI-2 Differential Receive Input (positive) AC13 W11
(1) An external 499 Ω ±1% resistor must be connected between this pin and VSS and the maximum power dissipation for the resistor is
7.2mW. No external voltage should be applied to this pin.
5.3.4 DDRSS
[Link] MAIN Domain
Table 5-8. DDRSS0 Signal Descriptions
SIGNAL NAME [1] PIN TYPE [2] DESCRIPTION [3] ALW PIN [4] AMC PIN [4]
DDR0_ACT_n O DDRSS Activation Command N6 M1
DDR0_ALERT_n IO DDRSS Alert R3 N1
DDR0_CAS_n O DDRSS Column Address Strobe M4 J3
DDR0_PAR O DDRSS Command and Address Parity T1 M2
DDR0_RAS_n O DDRSS Row Address Strobe M5 K5
(1) An external 240 Ω ±1% resistor must be connected between this pin and VSS. The maximum power dissipation for the resistor is
5.2mW. No external voltage should be applied to this pin.
5.3.5 DSS
[Link] MAIN Domain
Table 5-9. DSS0 Signal Descriptions
SIGNAL NAME [1] PIN TYPE [2] DESCRIPTION [3] ALW PIN [4] AMC PIN [4]
VOUT0_DE O Video Output Data Enable Y20 T17
VOUT0_EXTPCLKIN I Video Output External Pixel Clock Input V25 P17
VOUT0_HSYNC O Video Output Horizontal Sync AB24 W21
VOUT0_PCLK O Video Output Pixel Clock Output AC24 U17
VOUT0_VSYNC O Video Output Vertical Sync AC25 T16
VOUT0_DATA0 O Video Output Data 0 U22 R21
VOUT0_DATA1 O Video Output Data 1 V24 P18
VOUT0_DATA2 O Video Output Data 2 W25 R18
VOUT0_DATA3 O Video Output Data 3 W24 R19
VOUT0_DATA4 O Video Output Data 4 Y25 R20
VOUT0_DATA5 O Video Output Data 5 Y24 T20
VOUT0_DATA6 O Video Output Data 6 Y23 T21
VOUT0_DATA7 O Video Output Data 7 AA25 T19
VOUT0_DATA8 O Video Output Data 8 V21 U21
VOUT0_DATA9 O Video Output Data 9 W21 R17
VOUT0_DATA10 O Video Output Data 10 V20 T18
VOUT0_DATA11 O Video Output Data 11 AA23 U20
VOUT0_DATA12 O Video Output Data 12 AB25 U19
VOUT0_DATA13 O Video Output Data 13 AA24 V21
VOUT0_DATA14 O Video Output Data 14 Y22 U18
VOUT0_DATA15 O Video Output Data 15 AA21 V20
VOUT0_DATA16 O Video Output Data 16 R24 N20
VOUT0_DATA17 O Video Output Data 17 R25 N21
VOUT0_DATA18 O Video Output Data 18 T25 M17
VOUT0_DATA19 O Video Output Data 19 R21 N18
VOUT0_DATA20 O Video Output Data 20 T22 N17
VOUT0_DATA21 O Video Output Data 21 T24 N19
VOUT0_DATA22 O Video Output Data 22 U25 P19
VOUT0_DATA23 O Video Output Data 23 U24 P20
5.3.6 ECAP
[Link] MAIN Domain
Table 5-10. ECAP0 Signal Descriptions
SIGNAL NAME [1] PIN TYPE [2] DESCRIPTION [3] ALW PIN [4] AMC PIN [4]
Enhanced Capture (ECAP) Input or Auxiliary
ECAP0_IN_APWM_OUT IO A18, C13 C14, D13
PWM (APWM) Output
5.3.8 EPWM
[Link] MAIN Domain
Table 5-15. EPWM Signal Descriptions
SIGNAL NAME [1] PIN TYPE [2] DESCRIPTION [3] ALW PIN [4] AMC PIN [4]
EHRPWM_SOCA O EHRPWM Start of Conversion A B16 E12
EHRPWM_SOCB O EHRPWM Start of Conversion B A16 D14
EHRPWM_TZn_IN0 I EHRPWM Trip Zone Input 0 (active low) B14 A14
EHRPWM_TZn_IN1 I EHRPWM Trip Zone Input 1 (active low) AA2 V2
EHRPWM_TZn_IN2 I EHRPWM Trip Zone Input 2 (active low) AC1 W3
EHRPWM_TZn_IN3 I EHRPWM Trip Zone Input 3 (active low) C15 B13
EHRPWM_TZn_IN4 I EHRPWM Trip Zone Input 4 (active low) E15 A15
EHRPWM_TZn_IN5 I EHRPWM Trip Zone Input 5 (active low) C13 D13
5.3.9 EQEP
[Link] MAIN Domain
Table 5-19. EQEP0 Signal Descriptions
SIGNAL NAME [1] PIN TYPE [2] DESCRIPTION [3] ALW PIN [4] AMC PIN [4]
EQEP0_A (1) I EQEP Quadrature Input A B19 B18
EQEP0_B (1) I EQEP Quadrature Input B A19 B17
EQEP0_I (1) IO EQEP Index E18 D18
EQEP0_S (1) IO EQEP Strobe B18 A18
(1) This EQEP input signal has a debounce function. For more information on I/O Debounce configuration, see the TRM Device
Configuration chapter.
(1) This EQEP input signal has a debounce function. For more information on I/O Debounce configuration, see the TRM Device
Configuration chapter.
(1) This EQEP input signal has a debounce function. For more information on I/O Debounce configuration, see the TRM Device
Configuration chapter.
5.3.10 GPIO
[Link] MAIN Domain
Table 5-22. GPIO0 Signal Descriptions
SIGNAL NAME [1] PIN TYPE [2] DESCRIPTION [3] ALW PIN [4] AMC PIN [4]
GPIO0_0 IO General Purpose Input/Output H24 G19
GPIO0_1 IO General Purpose Input/Output G25 G18
GPIO0_2 IO General Purpose Input/Output J24 H20
GPIO0_3 IO General Purpose Input/Output E25 F18
GPIO0_4 IO General Purpose Input/Output G24 G17
GPIO0_5 IO General Purpose Input/Output F25 F21
GPIO0_6 IO General Purpose Input/Output F24 F20
GPIO0_7 IO General Purpose Input/Output J23 G21
GPIO0_8 IO General Purpose Input/Output J25 H21
GPIO0_9 IO General Purpose Input/Output H25 G20
GPIO0_10 IO General Purpose Input/Output J22 J21
GPIO0_11 IO General Purpose Input/Output F23 F19
GPIO0_12 IO General Purpose Input/Output G21 F17
(1) This GPIO input signal has a debounce function. For more information on I/O Debounce configuration, see the TRM Device
Configuration chapter.
(1) This GPIO input signal has a debounce function. For more information on I/O Debounce configuration, see the TRM Device
Configuration chapter.
(2) This EQEP input signal has a debounce function. For more information on I/O Debounce configuration, see the TRM Device
Configuration chapter.
(1) This GPIO input signal has a debounce function. For more information on I/O Debounce configuration, see the TRM Device
Configuration chapter.
5.3.11 GPMC
[Link] MAIN Domain
Table 5-25. GPMC0 Signal Descriptions
SIGNAL NAME [1] PIN TYPE [2] DESCRIPTION [3] ALW PIN [4] AMC PIN [4]
GPMC Address Valid (active low) or Address
GPMC0_ADVn_ALE O L23 K20
Latch Enable
GPMC0_CLK O GPMC clock P25 M19
GPMC0_DIR O GPMC Data Bus Signal Direction Control M22 J19
GPMC0_FCLK_MUX O GPMC functional clock output P25 M19
GPMC Output Enable (active low) or Read
GPMC0_OEn_REn O L24 K21
Enable (active low)
5.3.12 I2C
[Link] MAIN Domain
Table 5-26. I2C0 Signal Descriptions
SIGNAL NAME [1] PIN TYPE [2] DESCRIPTION [3] ALW PIN [4] AMC PIN [4]
I2C0_SCL IOD I2C Clock B16 E12
I2C0_SDA IOD I2C Data A16 D14
5.3.13 MCAN
[Link] MAIN Domain
Table 5-32. MCAN0 Signal Descriptions
SIGNAL NAME [1] PIN TYPE [2] DESCRIPTION [3] ALW PIN [4] AMC PIN [4]
MCAN0_RX I MCAN Receive Data E15 A15
MCAN0_TX O MCAN Transmit Data C15 B13
5.3.14 MCASP
[Link] MAIN Domain
Table 5-35. MCASP0 Signal Descriptions
SIGNAL NAME [1] PIN TYPE [2] DESCRIPTION [3] ALW PIN [4] AMC PIN [4]
MCASP0_ACLKR IO MCASP Receive Bit Clock A20 D16
MCASP0_ACLKX IO MCASP Transmit Bit Clock B20 C17
MCASP0_AFSR IO MCASP Receive Frame Sync E19 D15
MCASP0_AFSX IO MCASP Transmit Frame Sync D20 C16
MCASP0_AXR0 IO MCASP Serial Data (Input/Output) E18 D18
MCASP0_AXR1 IO MCASP Serial Data (Input/Output) B18 A18
MCASP0_AXR2 IO MCASP Serial Data (Input/Output) A19 B17
MCASP0_AXR3 IO MCASP Serial Data (Input/Output) B19 B18
5.3.15 MCSPI
[Link] MAIN Domain
Table 5-38. MCSPI0 Signal Descriptions
SIGNAL NAME [1] PIN TYPE [2] DESCRIPTION [3] ALW PIN [4] AMC PIN [4]
SPI0_CLK IO SPI Clock A14 D12
SPI0_CS0 IO SPI Chip Select 0 A13 C11
SPI0_CS1 IO SPI Chip Select 1 C13 D13
SPI0_CS2 IO SPI Chip Select 2 A15 B14
SPI0_CS3 IO SPI Chip Select 3 B15 C13
SPI0_D0 IO SPI Data 0 B13 C12
SPI0_D1 IO SPI Data 1 B14 A14
5.3.16 MDIO
[Link] MAIN Domain
Table 5-43. MDIO0 Signal Descriptions
SIGNAL NAME [1] PIN TYPE [2] DESCRIPTION [3] ALW PIN [4] AMC PIN [4]
MDIO0_MDC O MDIO Clock AD24 V17
MDIO0_MDIO IO MDIO Data AB22 U16
5.3.17 MMC
[Link] MAIN Domain
Table 5-44. MMC0 Signal Descriptions
SIGNAL NAME [1] PIN TYPE [2] DESCRIPTION [3] ALW PIN [4] AMC PIN [4]
MMC0_CLK IO MMC/SD/SDIO Clock AB1 Y1
MMC0_CMD IO MMC/SD/SDIO Command Y3 V3
MMC0_DAT0 IO MMC/SD/SDIO Data AA2 V2
MMC0_DAT1 IO MMC/SD/SDIO Data AA1 V1
MMC0_DAT2 IO MMC/SD/SDIO Data AA3 W2
(1) For MMC2 to work properly, the CTRLMMR_PADCONFIG71 register must be configured to set (1) the RXACTIVE bit and reset (0) the
TX_DIS bit.
(2) These MMCSD2 host controller input signals must be multiplexed to pins which are powered by the VDDSHV0 IO power rail rather
than the VDDSHV6 IO power rail when the MMC2 port is connected to a UHS-I SD Card that requires the VDDSHV6 IO power rail to
change its operating voltage from 3.3V to 1.8V when transitioning to one of the UHS-I data transfer modes.
5.3.18 OLDI
[Link] MAIN Domain
Table 5-47. OLDI0 Signal Descriptions
SIGNAL NAME [1] PIN TYPE [2] DESCRIPTION [3] ALW PIN [4] AMC PIN [4]
OLDI0_A0N IO OLDI Differential Data (negative) AA5 AA2
OLDI0_A0P IO OLDI Differential Data (positive) Y6 AA3
OLDI0_A1N IO OLDI Differential Data (negative) AD3 V5
OLDI0_A1P IO OLDI Differential Data (positive) AB4 V6
OLDI0_A2N IO OLDI Differential Data (negative) Y8 U7
OLDI0_A2P IO OLDI Differential Data (positive) AA8 U6
OLDI0_A3N IO OLDI Differential Data (negative) AB6 W6
OLDI0_A3P IO OLDI Differential Data (positive) AA7 W5
OLDI0_A4N IO OLDI Differential Data (negative) AC6 AA4
5.3.19 OSPI
[Link] MAIN Domain
Table 5-48. OSPI0 Signal Descriptions
SIGNAL NAME [1] PIN TYPE [2] DESCRIPTION [3] ALW PIN [4] AMC PIN [4]
OSPI0_CLK O OSPI Clock H24 G19
OSPI Data Strobe (DQS) or Loopback Clock
OSPI0_DQS I J24 H20
Input
OSPI0_ECC_FAIL I OSPI ECC Status E24 E18
OSPI0_LBCLKO IO OSPI Loopback Clock Output G25 G18
OSPI0_CSn0 O OSPI Chip Select 0 (active low) F23 F19
OSPI0_CSn1 O OSPI Chip Select 1 (active low) G21 F17
OSPI0_CSn2 O OSPI Chip Select 2 (active low) H21 E17
OSPI0_CSn3 O OSPI Chip Select 3 (active low) E24 E18
OSPI0_D0 IO OSPI Data 0 E25 F18
OSPI0_D1 IO OSPI Data 1 G24 G17
OSPI0_D2 IO OSPI Data 2 F25 F21
OSPI0_D3 IO OSPI Data 3 F24 F20
OSPI0_D4 IO OSPI Data 4 J23 G21
OSPI0_D5 IO OSPI Data 5 J25 H21
OSPI0_D6 IO OSPI Data 6 H25 G20
OSPI0_D7 IO OSPI Data 7 J22 J21
OSPI0_RESET_OUT0 O OSPI Reset E24 E18
OSPI0_RESET_OUT1 O OSPI Reset H21 E17
(1) This pin must always be connected via a 6.3V or greater, 0.8uF to 1.5μF capacitor to VSS if the respective VDDSHVx pin is ever
operated at 3.3V. The capacitor selected must provide a capacitance within the defined range after it has been derated for DC-bias,
operating temperature, and aging effects. There are three connection options if the respective VDDSHVx pin is only operated at 1.8V.
The pin can be connected to the same decoupling capacitor that is required for 3.3V operation, it can be left unconnected, or it can be
connected to the same 1.8V power source as the respective VDDSHVx pin.
5.3.21 PRUSS
Note
The PRUSS contains a second layer of peripheral signal multiplexing to enable additional functionality
on the PRU GPO and GPI signals. This internal wrapper multiplexing is described in the PRUSS
chapter in the device TRM
5.3.22 Reserved
Table 5-52. Reserved Signal Descriptions
SIGNAL NAME [1] PIN TYPE [2] DESCRIPTION [3] ALW PIN [4] AMC PIN [4]
RSVD0 N/A Reserved, must be left unconnected B1 B3
RSVD1 N/A Reserved, must be left unconnected A2 C3
RSVD2 N/A Reserved, must be left unconnected F6 E6
RSVD3 N/A Reserved, must be left unconnected AE2 F8
RSVD4 N/A Reserved, must be left unconnected T2 R6
RSVD5 N/A Reserved, must be left unconnected U4 T13
RSVD6 N/A Reserved, must be left unconnected AA12 T14
RSVD7 N/A Reserved, must be left unconnected Y15 M4
RSVD8 N/A Reserved, must be left unconnected E7 M5
[Link] Clock
[Link].1 MCU Domain
Table 5-54. MCU Clock Signal Descriptions
SIGNAL NAME [1] PIN TYPE [2] DESCRIPTION [3] ALW PIN [4] AMC PIN [4]
MCU_OSC0_XI I High frequency oscillator input B2 A5
MCU_OSC0_XO O High frequency oscillator output A3 A6
[Link] System
[Link].1 MAIN Domain
Table 5-56. System Signal Descriptions
SIGNAL NAME [1] PIN TYPE [2] DESCRIPTION [3] ALW PIN [4] AMC PIN [4]
External clock input to McASP or output from A15, AE22,
AUDIO_EXT_REFCLK0 IO B14, D18, W20
McASP E18
External clock input to McASP or output from
AUDIO_EXT_REFCLK1 IO B15, D20, K25 C13, C16, J20
McASP
RMII Clock Output (50MHz). This pin is
used for clock source to the external RMII
CLKOUT0 O PHY and must also be routed back to the A18 C14
respective RMII[x]_REF_CLK pin for proper
device operation.
EXTINTn I External Interrupt D16 B16
EXT_REFCLK1 I External clock input to Main Domain A18 C14
Main Domain Observation clock output for test
OBSCLK0 O B16, T25 E12, M17
and debug purposes only
PORz_OUT O Main Domain POR status output E21 E13
RESETSTATz O Main Domain warm reset status output F22 E14
RESET_REQz I Main Domain external warm reset request input F20 E15
Main Domain system clock output (divided by 4)
SYSCLKOUT0 O A18 C14
for test and debug purposes only
[Link] VMON
Table 5-59. VMON Signal Descriptions
SIGNAL NAME [1] PIN TYPE [2] DESCRIPTION [3] ALW PIN [4] AMC PIN [4]
Voltage monitor input for 1.8V SoC power
VMON_1P8_SOC A G10 H9
supply
Voltage monitor input for 3.3V SoC power
VMON_3P3_SOC A K10 K11
supply
Voltage monitor input, fixed 0.45V (+/-3%)
threshold. Use with external precisionVoltage
VMON_VSYS A H10 F6
divider to monitor a higherVoltage rail such as
the PMIC input supply.
5.3.24 TIMER
[Link] MAIN Domain
Table 5-60. TIMER Signal Descriptions
SIGNAL NAME [1] PIN TYPE [2] DESCRIPTION [3] ALW PIN [4] AMC PIN [4]
Timer Inputs and Outputs (not tied to single
TIMER_IO0 IO AA3, B17, D22 A17, C19, W2
timer instance)
Timer Inputs and Outputs (not tied to single
TIMER_IO1 IO A17, C21 A16, B20
timer instance)
Timer Inputs and Outputs (not tied to single
TIMER_IO2 IO B21, C15 B13, B19
timer instance)
Timer Inputs and Outputs (not tied to single
TIMER_IO3 IO A22, E15 A15, A19
timer instance)
Timer Inputs and Outputs (not tied to single
TIMER_IO4 IO A18, AB1, B22 A20, C14, Y1
timer instance)
Timer Inputs and Outputs (not tied to single
TIMER_IO5 IO A16, A21, Y3 C18, D14, V3
timer instance)
Timer Inputs and Outputs (not tied to single
TIMER_IO6 IO A15, D17 B14, C15
timer instance)
5.3.25 UART
[Link] MAIN Domain
Table 5-63. UART0 Signal Descriptions
SIGNAL NAME [1] PIN TYPE [2] DESCRIPTION [3] ALW PIN [4] AMC PIN [4]
UART0_CTSn I UART Clear to Send (active low) A15 B14
UART0_RTSn O UART Request to Send (active low) B15 C13
UART0_RXD I UART Receive Data D14 A13
UART0_TXD O UART Transmit Data E14 E11
5.3.26 USB
[Link] MAIN Domain
Table 5-72. USB0 Signal Descriptions
SIGNAL NAME [1] PIN TYPE [2] DESCRIPTION [3] ALW PIN [4] AMC PIN [4]
USB0_DM IO USB 2.0 Differential Data (negative) AE11 AA11
USB0_DP IO USB 2.0 Differential Data (positive) AD11 Y10
USB0_DRVVBUS O USB VBUS control output (active high) C20 D17
USB0_RCALIB (1) A Pin to connect to calibration resistor AE10 T8
USB0_VBUS (2) A USB Level-shifted VBUS Input AC11 V10
(1) An external 499 Ω ±1% resistor must be connected between this pin and VSS and the maximum power dissipation for the resistor is
7.2mW. No external voltage should be applied to this pin.
(2) An external resistor divider is required to limit the voltage applied to the device pin. For more information, see Section 8.2.3, USB
VBUS Design Guidelines.
(1) An external 499 Ω ±1% resistor must be connected between this pin and VSS and the maximum power dissipation for the resistor is
7.2mW. No external voltage should be applied to this pin.
(2) An external resistor divider is required to limit the voltage applied to the device pin. For more information, see Section 8.2.3, USB
VBUS Design Guidelines.
Note
All power balls must be supplied with the voltages specified in Section 6.5, Recommended Operating
Conditions, unless otherwise specified .
Note
For additional clarification, "leave unconnected" or "no connect" (NC) means no signal traces can be
connected to these device ball numbers.
(1) To determine which power supply is associated with any IO, see POWER column of the Pin Attributes table.
Note
Internal pull resistors are weak and may not source enough current to maintain a valid logic level
for some operating conditions. This can be the case when connected to components with leakage
to the opposite logic level, or when external noise sources couple to signal traces attached to balls
which are only pulled to a valid logic level by the internal resistor. Therefore, external pull resistors are
recommended to hold a valid logic level on balls with external connections.
Many of the device IOs are turned off by default and external pull resistors may be required to hold
inputs of any attached device in a valid logic state until software initializes the respective IOs. The
state of configurable device IOs are defined in the BALL STATE DURING RESET RX/TX/PULL and
BALL STATE AFTER RESET RX/TX/PULL columns of the Pin Attributes table. Any IO with its input
buffer (RX) turned off is allowed to float without damaging the device. However, any IO with its input
buffer (RX) turned on shall never be allowed to float to any potential between VILSS and VIHSS. The
input buffer can enter a high-current state which could damage the IO cell if allowed to float between
these levels.
6 Specifications
6.1 Absolute Maximum Ratings
over operating junction temperature range (unless otherwise noted)(1) (2)
PARAMETER MIN MAX UNIT
VDD_CORE Core supply -0.3 1.05 V
VDDR_CORE RAM supply -0.3 1.05 V
VDD_CANUART CANUART core supply -0.3 1.05 V
VDDA_CORE_CSIRX0 CSIRX0 core supply -0.3 1.05 V
VDDA_CORE_USB USB0 and USB1 core supply -0.3 1.05 V
VDDA_DDR_PLL0(3) DDR Deskew PLL supply -0.3 1.05 V
VDDS_DDR DDR PHY IO supply -0.3 1.57 V
VDDS_DDR_C DDR clock IO supply -0.3 1.57 V
VDDS_OSC0 MCU_OSC0 supply -0.3 1.98 V
VDDA_MCU RCOSC, POR, POK, and MCU_ PLL0 analog supply -0.3 1.98 V
MAIN_PLL0, MAIN_PLL12, MAIN_PLL16, and MAIN_PLL17
VDDA_PLL0 -0.3 1.98 V
analog supply
VDDA_PLL1 MAIN_PLL1 and MAIN_PLL2 analog supply -0.3 1.98 V
VDDA_PLL2 MAIN_PLL8 and MAIN_PLL15 analog supply -0.3 1.98 V
VDDA_1P8_CSIRX0 CSIRX0 1.8V analog supply -0.3 1.98 V
VDDA_1P8_OLDI0 OLDI0 1.8V analog supply -0.3 1.98 V
VDDA_1P8_USB USB0 and USB1 1.8V analog supply -0.3 1.98 V
VDDA_TEMP0 TEMP0 analog supply -0.3 1.98 V
VDDA_TEMP1 TEMP1 analog supply -0.3 1.98 V
VPP eFuse ROM programming supply -0.3 1.98 V
VDDSHV_MCU IO supply for IO MCU -0.3 3.63 V
VDDSHV_CANUART IO supply for IO CANUART -0.3 3.63 V
VDDSHV0 IO supply for IO group 0 -0.3 3.63 V
VDDSHV1 IO supply for IO group 1 -0.3 3.63 V
VDDSHV2 IO supply for IO group 2 -0.3 3.63 V
VDDSHV3 IO supply for IO group 3 -0.3 3.63 V
VDDSHV4 IO supply for IO group 4 -0.3 3.63 V
VDDSHV5 IO supply for IO group 5 -0.3 3.63 V
VDDSHV6 IO supply for IO group 6 -0.3 3.63 V
VDDA_3P3_USB USB0 and USB1 3.3V analog supply -0.3 3.63 V
MCU_PORz -0.3 3.63 V
MCU_I2C0_SCL, MCU_I2C0_SDA,
WKUP_I2C0_SCL, WKUP_I2C0_SDA,
-0.3 1.98(4) V
and EXTINTn
When operating at 1.8V
MCU_I2C0_SCL, MCU_I2C0_SDA,
Steady-state max voltage at all fail-safe IO pins WKUP_I2C0_SCL, WKUP_I2C0_SDA,
-0.3 3.63(4)
and EXTINTn
When operating at 3.3V
VMON_1P8_SOC -0.3 1.98 V
VMON_3P3_SOC -0.3 3.63 V
VMON_VSYS(5) -0.3 1.98 V
(1) Operation outside the Absolute Maximum Ratings may cause permanent device damage. Absolute Maximum Ratings do not imply
functional operation of the device at these or any other conditions beyond those listed under Section 6.5, Recommended Operating
Conditions. If used outside the Recommended Operating Conditions but within the Absolute Maximum Ratings, the device may not be
fully functional, and this may affect device reliability, functionality, performance, and shorten the device lifetime.
(2) All voltage values are with respect to VSS, unless otherwise noted.
(3) The VDDA_DDR_PLL0 power rail is only available on the AMC package. This power rail is internally connected to VDD_CORE in the
ALW package.
(4) The absolute maximum ratings for these fail-safe pins depends on their IO supply operating voltage. Therefore, this value is also
defined by the maximum VIH value found in the I2C Open-Drain, and Fail-Safe (I2C OD FS) Electrical Characteristics section, where
the electrical characteristics table has separate parameter values for 1.8V mode and 3.3V mode.
(5) The VMON_VSYS pin provides a way to monitor the system power supply. For more information, see Section 8.2.4, System Power
Supply Monitor Design Guidelines.
(6) This parameter applies to all IO pins which are not fail-safe and the requirement applies to all values of IO supply voltage. For
example, if the voltage applied to a specific IO supply is 0 volts the valid input voltage range for any IO powered by that supply will be
–0.3 to +0.3 volts. Special attention should be applied anytime peripheral devices are not powered from the same power sources used
to power the respective IO supply. It is important the attached peripheral never sources a voltage outside the valid input voltage range,
including power supply ramp-up and ramp-down sequences.
(7) An external resistor divider is required to limit the voltage applied to this device pin. For more information, see Section 8.2.3, USB
Design Guidelines.
(8) VDD is the voltage on the corresponding power-supply pin(s) for the IO.
(9) For current pulse injection (I-Test):
• Pins stressed per JEDEC JESD78 (Class II) and passed with specified I/O pin injection current and clamp voltage of 1.5 times
maximum recommended I/O voltage and negative 0.5 times maximum recommended I/O voltage.
Fail-safe IO terminals are designed such they do not have dependencies on the respective IO power supply
voltage. This allows external voltage sources to be connected to these IO terminals when the respective IO
power supplies are turned off. The MCU_I2C0_SCL, MCU_I2C0_SDA, WKUP_I2C0_SCL, WKUP_I2C0_SDA,
EXTINTn, VMON_1P8_SOC, VMON_3P3_SOC, VMON_VSYS, and MCU_PORz are the only fail-safe IO
terminals. All other IO terminals are not fail-safe and the voltage applied to them should be limited to the value
defined by the "Steady-state max voltage at all other IO pins" parameter in Section 6.1.
Tperiod
Tundershoot
6.2 ESD Ratings for Devices which are not AEC - Q100 Qualified
VALUE UNIT
(1) JEDEC document JEP155 states that 500V HBM allows safe manufacturing with a standard ESD control process.
(2) JEDEC document JEP157 states that 250V CDM allows safe manufacturing with a standard ESD control process.
(1) AEC - Q100-002 indicates that HBM stressing shall be in accordance with the ANSI/ESDA/JEDEC JS-001 specification.
(1) This information is provided solely for your convenience and does not extend or modify the warranty provided under TI's standard
terms and conditions for TI semiconductor products.
(2) Unless specified in the table above, all voltage domains and operating conditions are supported in the device at the noted
temperatures.
(3) POH is a function of voltage, temperature and time. Usage at higher voltages and temperatures will result in a reduction in POH.
(4) Automotive profile is defined as 20000 power on hours with a junction temperature as follows: 5%@-40°C, 65%@70°C, 20%@110°C,
and 10%@125°C.
(1) The voltage at the device ball must never drop below the MIN voltage or rise above the MAX voltage for any amount of time during
normal device operation.
(2) VDD_CORE, VDDA_CORE_CSIRX0, VDDA_CORE_USB, and VDDA_DDR_PLL0 shall be sourced from the same power source.
Care should be taken to ensure that voltage differential between VDD_CORE and VDDA_CORE_USB is within +/- 1%.
(3) The VDDA_DDR_PLL0 power rail is only available on the AMC package. This power rail is internally connected to VDD_CORE in the
ALW package.
(4) VDD_CANUART shall be connected to an always on power source when using Partial IO low power mode. VDD_CANUART shall be
connected to the same power source as VDD_CORE, VDDA_CORE_CSI_DSI, VDDA_CORE_USB, and VDDA_DDR_PLL0 when not
using Partial IO low power mode.
(5) VDDS_DDR and VDDS_DDR_C shall be sourced from the same power source.
(6) Refer to the Recommended Operating Conditions for OTP eFuse Programming table for VPP supply voltages based on eFuse usage.
(7) The VMON_VSYS pin provides a way to monitor the system power supply. For more information, see Section 8.2.4, System Power
Supply Monitor Design Guidelines.
(8) An external resistor divider is required to limit the voltage applied to this device pin. For more information, see Section 8.2.3, USB
Design Guidelines.
(9) VDDSHV_CANUART shall be connected to an always on power source when using Partial IO low power mode. VDDSHV_CANUART
shall be connected to any valid IO power source when not using Partial IO low power mode.
From 1600
High ARM0 500 250 400 400 400 (Max) From
PLL 333, DDR
400
Bypass 250, PLL
or
to or 250 Bypass(4)
200
Speed 200 (DRAM DLL to
Low Grade N/A 125 133 133 133 Bypass) 1600
Maximum
(1) Default operating frequency, set by software at boot. Supports Dynamic Frequency Scaling after boot.
(2) Fixed operating frequency, set by software at boot.
(3) Maximum DDR Frequency will be limited based on the specific memory type (vendor) used in a system and by PCB implementation.
Refer to DDR Board Design and Layout Guidelines for the proper PCB implementation to achieve maximum DDR frequency.
(4) The DDR PLL output, which sources DDR0_CK0 and DDR0_CK0_n, is typically defined in units of frequency. So the "DDR PLL
Bypass" transaction rate is equal to 2x the DDR PLL output frequency when operating in bypass mode.
(1) VDD stands for corresponding power supply. For more information on the power supply name and the corresponding ball(s), see
POWER column of the Pin Attributes table.
(2) This value also defines the Absolute Maximum Ratings value the IO.
(3) This parameter defines leakage current when the terminal is operating as an input, undriven output, or both input and undriven output.
(4) The IOL parameter defines the minimum Low Level Output Current for which the device is able to maintain the specified VOL value.
The value defined by this parameter should be considered the maximum current available to a system implementation which needs to
maintain the specified VOL value for attached components.
(5) f = toggle frequency of the input signal in Hz.
(6) This MIN parameter only applies to input signal functions which are not defined in their respective Timing and Switching
Characteristics sections. Select the MIN parameter which results in the largest value.
(7) I2C Hs-mode is not supported when operating the IO in 3.3V mode.
(1) This parameter defines leakage current when the terminal is operating as an input.
(2) f = toggle frequency of the input signal in Hz.
(3) This MIN parameter only applies to input signal functions which are not defined in their respective Timing and Switching
Characteristics sections. Select the MIN parameter which results in the largest value.
(1) This parameter defines leakage current when the terminal is operating as an input.
(1) This parameter defines leakage current when the terminal is operating as an input.
(1) This parameter defines leakage current when the terminal is operating as an input, undriven output, or both input and undriven output,
without internal pulls enabled.
(2) VDD stands for corresponding power supply. For more information on the power supply name and the corresponding ball(s), see
POWER column of the Pin Attributes table.
(3) The IOL and IOH parameters define the minimum Low Level Output Current and High Level Output Current for which the device is
able to maintain the specified VOL and VOH values. Values defined by these parameters should be considered the maximum current
available to a system implementation which needs to maintain the specified VOL and VOH values for attached components.
(4) f = toggle frequency of the input signal in Hz.
(5) This MIN parameter only applies to input signal functions which are not defined in their respective Timing and Switching
Characteristics sections. Select the MIN parameter which results in the largest value.
(1) VDD stands for corresponding power supply. For more information on the power supply name and the corresponding ball(s), see
POWER column of the Pin Attributes table.
(2) This parameter defines leakage current when the terminal is operating as an input, undriven output, or both input and undriven output,
without internal pulls enabled.
(3) The IOL and IOH parameters define the minimum Low Level Output Current and High Level Output Current for which the device is
able to maintain the specified VOL and VOH values. Values defined by these parameters should be considered the maximum current
available to a system implementation which needs to maintain the specified VOL and VOH values for attached components.
(4) f = toggle frequency of the input signal in Hz.
(5) This MIN parameter only applies to input signal functions which are not defined in their respective Timing and Switching
Characteristics sections. Select the MIN parameter which results in the largest value.
(1) VDD stands for corresponding power supply. For more information on the power supply name and the corresponding ball(s), see
POWER column of the Pin Attributes table.
Note
CSIRX0 is compliant with MIPI DPHY v1.2 dated August 1, 2014, including ECNs and Errata as
applicable.
Note
The USB0 and USB1 interfaces are compliant with Universal Serial Bus Revision 2.0 Specification
dated April 27, 2000 including ECNs and Errata as applicable.
Note
The DDR interface is compatible with DDR4 devices that are JESD79-4B standard-compliant, and
LPDDR4 devices that are JESD209-4B standard-compliant
Note
The thermal parameters are generated following JEDEC standard JESD51x and are not intended
for design parameters. If you need a more accurate thermal representation, download the processor
thermal model and import your PCB design into a thermal simulation environment. For details on
thermal implementation guidelines, see the Thermal Solution Guidance section.
Note
The default SLEWRATE settings in each pad configuration register must be used to ensure timings,
unless specific instructions are given otherwise.
Note
All power balls must be supplied with the voltages specified in the Recommended Operating
Conditions section, unless otherwise specified in Signal Descriptions and Pin Connectivity
Requirements.
Supply value
t
slew rate < 18 mV/μs
slew > (supply value) / (18 mV/μs)
or
supply value × 55.6 μs/V
SPRT740_ELCH_06
Figure 6-4 defines a transition region with one or more power rails which must be sourced from a single common
power supply. No transitions are shown within the region to represent a single ramp within the transition region.
Note
The power supply sequencing requirements defined in this section does not include entry or exit
from low power modes. See Section [Link].3, Partial IO Power Sequencing for more information on
power supply sequence requirements when entering or exiting low power modes.
Note
All power rails must be turned off and decay below 300mV before initiating a new power-up
sequence anytime a power rail drops below the minimum value defined in Recommended
Operating Conditions. The only exception is when entering/exiting Partial IO low power mode with
VDDSHV_CANUART and VDD_CANUART sourced from an always on power source. For this use
case the VDDSHV_CANUART and VDD_CANUART power rails are allowed to remain on.
(1) VSYS represents the name of a supply which sources power to the entire system. This supply is expected to be a pre-regulated supply
that sources power management devices which source all other supplies.
(2) VMON_VSYS input is used to monitor VSYS via an external resistor divider circuit. For more information, see the System Power
Supply Monitor Design Guidelines.
(3) VDDSHV_CANUART, VDDSHV_MCU, and VDDSHVx [x=0-3] are dual voltage IO supplies which can be operated at 1.8V or 3.3V
depending on the application requirements.
VDDSHV_CANUART shall be connected to an always-on power source when using Partial IO low power mode, or connected to any
valid IO power source when not using Partial IO low power mode. When VDDSHV_CANUART is not connected to an always-on power
source and is operating at 3.3V, it shall be ramped up with other 3.3V supplies during the 3.3V ramp period defined by this waveform.
When any of the VDDSHV_MCU and VDDSHVx [x=0-3] IO supplies are operating at 3.3V, they shall be ramped up with other 3.3V
supplies during the 3.3V ramp period defined by this waveform.
(4) The VMON_3P3_SOC input is used to monitor supply voltage and shall be connected to the respective 3.3V supply source.
(5) VDDSHV_CANUART, VDDSHV_MCU, and VDDSHVx [x=0-3] are dual voltage IO supplies which can be operated at 1.8V or 3.3V
depending on the application requirements.
VDDSHV_CANUART shall be connected to an always-on power source when using Partial IO low power mode, or connected to any
valid IO power source when not using Partial IO low power mode. When VDDSHV_CANUART is not connected to an always-on power
source and is operating at 1.8V, it shall be ramped up with other 1.8V supplies during the 1.8V ramp period defined by this waveform.
When any of the VDDSHV_MCU and VDDSHVx [x=0-3] IO supplies are operating at 1.8V, they shall be ramped up with other 1.8V
supplies during the 1.8V ramp period defined by this waveform.
(6) The VMON_1P8_SOC input is used to monitor supply voltage and shall be connected to the respective 1.8V supply source.
(7) VDDSHV4, VDDSHV5, and VDDSHV6 were designed to support power-up, power-down, or dynamic voltage change without any
dependency on other power rails. This capability is required to support UHS-I SD Cards.
(8) VDDS_DDR and VDDS_DDR_C are expected to be powered by the same source such that they ramp together.
(9) VDD_CANUART shall be connected to an always-on power source when using Partial IO low power mode.
When VDD_CANUART is connected to an always-on power source, the potential applied to VDD_CORE must never be greater than
the potential applied to VDD_CANUART + 0.18V during power-up or power-down. This requires VDD_CANUART to ramp up before
and ramp down after VDD_CORE. VDD_CANUART does not have any ramp requirements beyond the one defined for VDD_CORE.
(10) VDD_CANUART shall be connected to the same power source as VDD_CORE, VDDA_CORE_CSIRX0, VDDA_CORE_USB, and
VDDA_DDR_PLL0 when not using Partial IO low power mode.
VDD_CANUART, VDD_CORE, VDDA_CORE_CSIRX0, VDDA_CORE_USB, and VDDA_DDR_PLL0 can be operated at 0.75V or
0.85V. When these supplies are operating at 0.75V, they shall be ramped up prior to VDDR_CORE as defined by this waveform.
(11) VDD_CANUART shall be connected to the same power source as VDD_CORE, VDD_CORE, VDDA_CORE_CSIRX0,
VDDA_CORE_USB, and VDDA_DDR_PLL0 when not using Partial IO low power mode.
VDD_CANUART, VDD_CORE, VDDA_CORE_CSIRX0, VDDA_CORE_USB, and VDDA_DDR_PLL0 can be operated at 0.75V or
0.85V. When these supplies are operating at 0.85V, they shall be powered from the same source as VDDR_CORE and ramped during
the 0.85V ramp period defined by this waveform.
(12) The potential applied to VDDR_CORE must never be greater than the potential applied to VDD_CORE + 0.18V during power-up or
power-down. This requires VDD_CORE to ramp up before and ramp down after VDDR_CORE when VDD_CORE is operating at
0.75V. VDD_CORE does not have any ramp requirements beyond the one defined for VDDR_CORE.
VDD_CORE and VDDR_CORE are expected to be powered by the same source so they ramp together when VDD_CORE is
operating at 0.85V.
(13) VPP is the 1.8V eFuse programming supply, which shall be left floating (HiZ) or grounded during power-up/down sequences and
during normal device operation. This supply shall only be sourced while programming eFuse.
VSYS
Waveform A VMON_VSYS
Waveform B
Waveform C
Waveform D
Waveform E
Waveform F
Waveform G
Waveform H
Waveform I Hi-Z
Waveform J
Waveform K
AM62Ax_ELCH_01
Note
The power supply sequencing requirements defined in this section does not include entry or exit
from low power modes. See Section [Link].3, Partial IO Power Sequencing for more information on
power supply sequence requirements when entering or exiting low power modes.
Note
All power rails must be turned off and decay below 300mV before initiating a new power-up
sequence anytime a power rail drops below the minimum value defined in Recommended
Operating Conditions. The only exception is when entering/exiting Partial IO low power mode with
VDDSHV_CANUART and VDD_CANUART sourced from an always on power source. For this use
case the VDDSHV_CANUART and VDD_CANUART power rails are allowed to remain on.
VSYS
Horizontal dashed lines represent a use case where the system power remains turned “on”
Waveform A VMON_VSYS while the device power management solution is turned “off”.
Waveform B
Waveform C
Waveform D
Waveform E
Waveform F
Waveform G
Waveform H
Waveform I Hi-Z
Waveform J
Waveform K
AM62Ax_ELCH_02
(1) VDD stands for corresponding power supply. For more information on the power supply name and the corresponding ball(s), see
POWER column of the Pin Attributes table.
(1) This timing parameter is valid only after all supplies are valid and MCU_PORz has been asserted for the specified time.
Figure 6-9. MCU_RESETz, MCU_RESETSTATz, and RESETSTATz Timing Requirements and Switching
Characteristics
(1) This timing parameter is valid only after all supplies are valid and MCU_PORz has been asserted for the specified time.
Figure 6-10. RESET_REQz and RESETSTATz Timing Requirements and Switching Characteristics
ERR1
MCU_ERRORn
(PWM Mode Enabled)
ERR2
ERR3
MCU_ERRORn
(PWM Mode Disabled)
CLK1
CLK2 CLK3
Input Clock
CLK4
CLK5 CLK6
Output Clock
Device
MCU_OSC0_XI MCU_OSC0_XO
Crystal
CL1 CL2
PCB Ground
AM65x_MCU_OSC_INT_01
The crystal must be in the fundamental mode of operation and parallel resonant. Table 6-22 summarizes the
required electrical constraints.
Table 6-22. MCU_OSC0 Crystal Circuit Requirements
PARAMETER MIN TYP MAX UNIT
Fxtal Crystal Parallel Resonance Frequency 25 MHz
Fxtal Crystal Frequency Stability and Tolerance Ethernet RGMII and RMII ±100 ppm
not used
Ethernet RGMII and RMII ±50
using derived clock
CL1+PCBXI Capacitance of CL1 + CPCBXI 12 24 pF
CL2+PCBXO Capacitance of CL2 + CPCBXO 12 24 pF
CL Crystal Load Capacitance 6 12 pF
Cshunt Crystal Circuit Shunt Capacitance ESRxtal = 30Ω 25MHz 7 pF
ESRxtal = 40Ω 25MHz 5 pF
ESRxtal = 50Ω 25MHz 5 pF
ESRxtal Crystal Effective Series Resistance (1) Ω
(1) The maximum ESR of the crystal is a function of the crystal frequency and shunt capacitance. See the Cshunt parameter.
When selecting a crystal, the system design must consider temperature and aging characteristics of the crystal
based on worst case environment and expected life expectancy of the system.
Table 6-23 details the switching characteristics of the oscillator.
Table 6-23. MCU_OSC0 Switching Characteristics - Crystal Mode
PARAMETER PACKAGE MIN TYP MAX UNIT
CXI XI Capacitance ALW 0.812 pF
AMC 1.635 pF
CXO XO Capacitance ALW 0.83 pF
AMC 1.72 pF
VDD_CORE (min.)
VDD_CORE
VSS
Voltage
VSS MCU_OSC0_XO
tsX
Time
AM65x_MCU_OSC_STARTUP_02
Device
Crystal Circuit PCB
Components Signal Traces
MCU_OSC0_XI
MCU_OSC0_XO
AM65x_MCU_OSC_CC_05
Load capacitors, CL1 and CL2 in Figure 6-16, should be chosen such that the below equation is satisfied. CL in
the equation is the load specified by the crystal manufacturer.
CL = [(CL1 + CPCBXI + CXI) × (CL2 + CPCBXO + CXO)] / [(CL1 + CPCBXI + CXI) + (CL2 + CPCBXO + CXO)]
To determine the value of CL1 and CL2, multiply the capacitive load value CL by 2. Using this result, subtract
the combined values of CPCBXI + CXI to determine the value of CL1 and the combined values of CPCBXO + CXO
to determine the value of CL2. For example, if CL = 10pF, CPCBXI = 2.9pF, CXI = 0.5pF, CPCBXO = 3.7pF, CXO =
0.5pF, the value of CL1 = [(2CL) - (CPCBXI + CXI)] = [(2 × 10pF) - 2.9pF - 0.5pF)] = 16.6pF and CL2 = [(2CL) -
(CPCBXO + CXO)] = [(2 × 10pF) - 3.7pF - 0.5pF)] = 15.8pF
[Link].1.2 Shunt Capacitance
The crystal circuit must also be designed such that it does not exceed the maximum shunt capacitance for
MCU_OSC0 operating conditions defined in Table 6-22. Shunt capacitance, Cshunt, of the crystal circuit is a
combination of crystal shunt capacitance and parasitic contributions. PCB signal traces which connect crystal
circuit components to MCU_OSC0 have mutual parasitic capacitance to each other, CPCBXIXO, where the PCB
designer should be able to extract mutual parasitic capacitance between these signal traces. The device
package also has mutual parasitic capacitance, CXIXO, where this mutual parasitic capacitance value is defined
in Table 6-23.
PCB routing should be designed to minimize mutual capacitance between XI and XO signal traces. This is
typically done by keeping signal traces short and not routing them in close proximity. Mutual capacitance can
also be minimized by placing a ground trace between these signals when the layout requires them to be routed
in close proximity. It is important to minimize the mutual capacitance on the PCB to provide as much margin as
possible when selecting a crystal.
Device
Crystal Circuit PCB
Components Signal Traces
MCU_OSC0_XI
CPCBXIXO CXIXO
CO
MCU_OSC0_XO
AM65x_MCU_OSC_SC_06
A crystal should be chosen such that the below equation is satisfied. CO in the equation is the maximum shunt
capacitance specified by the crystal manufacturer.
Cshunt ≥ CO + CPCBXIXO + CXIXO
For example, the equation would be satisfied when the crystal being used is 25MHz with an ESR = 30Ω,
CPCBXIXO = 0.04pF, CXIXO = 0.01pF, and shunt capacitance of the crystal is less than or equal to 6.95pF.
Note
1. A DC steady-state condition is not allowed on MCU_OSC0_XI when the oscillator is powered up.
This is not allowed because MCU_OSC0_XI is internally AC coupled to a comparator that can
enter an unknown state when DC is applied to the input. Therefore, application software must
power down MCU_OSC0 any time MCU_OSC0_XI is not toggling between logic states.
2. The LVCMOS clock signal sourcing the MCU_OSC0_XI input must have monotonic transitions.
The clock source should be connected to MCU_OSC0_XI with a point-to-point connection,
via a series termination resistor placed near the clock source. The series termination resistor
value should match the clock source output impedance to the transmission line impedance. For
example, the series termination resistor value needs to be 20 ohms if the clock source has an
output impedance of 30 ohms and the PCB signal trace has a characteristic impedance of 50
ohms. This allows the reflection that returns from the far end of the un-terminated transmission
line to be completely absorbed such that is does not introduce any non-monotonic events on the
signal.
3. The PCB trace length connecting the LVCMOS clock source to MCU_OSC0_XI should be
minimized. This reduces capacitive loading and decreases probability of external noise sources
coupling into the clock signal. Reduced capacitive loading improves rise/fall times of the clock
signal which reduces the probability of jitter being introduced in the system.
Device
MCU_OSC0_XI MCU_OSC0_XO
PCB Ground
AM65x_MCU_OSC_EXT_CLK_03
(1) Most LVCMOS oscillator datasheets define their maximum Output Rise/Fall times with a capacitive load much larger than the actual
load that will be applied by the combined PCB trace capacitance and MCU_OSC0_XI input capacitance. It should not be difficult to
find a LVCMOS oscillator that meets this requirement. However, the system designer must confirm the LVCMOS oscillator selected will
provide the appropriate rise/fall time to MCU_OSC0_XI input.
(2) Most LVCMOS oscillator datasheets define their max RMS Phase Jitter using a larger bandwidth integration range than required by
this device. To get a more appropriate value, it may be necessary to contact the LVCMOS oscillator manufacture and ask them to
provide a maximum RMS Phase Jitter using the same bandwidth integration range that has been defined for this parameter.
Device
WKUP_LFOSC0_XI WKUP_LFOSC0_XO
Rd
Crystal (Optional)
(Optional) Rbias
Cf1 Cf2
PCB Ground
J7ES_LF_OSC_INT_12
Note
User should set CTRLMMR_WKUP_LFXOSC_TRIM[18:16] i_mult = 3b’001 for CL in the range 6pf to
9.5pf. CTRLMMR_WKUP_LFXOSC_TRIM [18:16] i_mult = 3b’010 for CL in the range 8.5pf to 12pf.
Default setting is 3b’010.
Note
The load capacitors, Cf1 and Cf2 in Figure 6-22, should be chosen such that the below equation is
satisfied. CL in the equation is the load specified by the crystal manufacturer. All discrete components
used to implement the oscillator circuit should be placed as close as possible to the associated
oscillator WKUP_LFOSC0_XI, WKUP_LFOSC0_XO, and VSS pins.
Cf1Cf2
CL=
(Cf1+Cf2)
J7ES_CL_MATH_03
The crystal must be in the fundamental mode of operation and parallel resonant. Table 6-26 summarizes the
required electrical constraints.
Table 6-26. WKUP_LFOSC0 Crystal Electrical Characteristics
NAME DESCRIPTION MIN TYP MAX UNIT
Parallel resonance crystal frequency 32768 Hz
fp
Crystal Frequency Stability and Tolerance ±100 PPM
Cf1 Cf1 load capacitance for crystal parallel resonance with Cf1 = Cf2 12 24 pF
Cf2 Cf2 load capacitance for crystal parallel resonance with Cf1 = Cf2 12 24 pF
ESRxtal – 40 kΩ 4 pF
ESRxtal – 60 kΩ 3 pF
Cshunt Shunt capacitance
ESRxtal – 80 kΩ 2 pF
ESRxtal – 100 kΩ 1 pF
ESR Crystal effective series resistance (1) Ω
(1) The maximum ESR of the crystal is a function of the crystal frequency and shunt capacitance. See the Cshunt parameter.
When selecting a crystal, the system design must consider the temperature and aging characteristics of a based
on the worst case environment and expected life expectancy of the system.
Table 6-27 details the switching characteristics of the oscillator and the requirements of the input clock.
Table 6-27. WKUP_LFOSC0 Switching Characteristics – Crystal Mode
NAME DESCRIPTION MIN TYP MAX UNIT
fxtal Oscillation frequency 32768 Hz
tsX Start-up time 96.5 ms
VDD_CORE (min.)
VDD_CORE
VSS
Voltage
WKUP_LFOSC0_XO
VSS
tsX
Time
LFXOSC_STARTUP_02
Device
WKUP_LFOSC0_XI WKUP_LFOSC0_XO
PCB Ground
AM62x_MCU_OSC_EXT_CLK_03
Device
WKUP_LFOSC0_XI WKUP_LFOSC0_XO
NC
PCB Ground
[Link] Recommended System Precautions for Clock and Control Signal Transitions
All clock and strobe signals must transition between VIH and VIL (or between VIL and VIH) in a monotonic
manner.
Monotonic transitions are more likely to occur with fast signal transitions. It is easy for noise to create non-
monotonic events on a signal with slow transitions. Therefore, avoid slow signal transitions on all clock and
control signals since they are more likely to generate glitches inside the device.
6.12.5 Peripherals
[Link] CPSW3G
For more details about features and additional description information on the device Gigabit Ethernet MAC, see
the corresponding subsections within Signal Descriptions and Detailed Description sections.
[Link].1 CPSW3G MDIO Timing
Table 6-28, Table 6-29, Table 6-30, and Figure 6-26 present timing conditions, timing requirements, and
switching characteristics for CPSW3G MDIO.
Table 6-28. CPSW3G MDIO Timing Conditions
PARAMETER MIN MAX UNIT
INPUT CONDITIONS
SRI Input slew rate 0.9 3.6 V/ns
OUTPUT CONDITIONS
CL Output load capacitance 10 470 pF
PCB CONNECTIVITY REQUIREMENTS
td(Trace Delay) Propagation delay of each trace 0 5 ns
td(Trace Mismatch Delay) Propagation delay mismatch across all traces 1 ns
MDIO3
MDIO4
MDIO5
MDIO[x]_MDC
MDIO1
MDIO2
MDIO[x]_MDIO
(input)
MDIO7
MDIO[x]_MDIO
(output)
CPSW2G_MDIO_TIMING_01
(1) VDD stands for corresponding power supply. For more information on the power supply name and the corresponding ball(s), see
POWER column of the Pin Attributes table.
RMII1
RMII2
RMII[x]_REF_CLK
RMII3
Table 6-33. RMII[x]_RXD[1:0], RMII[x]_CRS_DV, and RMII[x]_RX_ER Timing Requirements – RMII Mode
see Figure 6-28
NO. PARAMETER DESCRIPTION MIN MAX UNIT
RMII4 tsu(RXD-REF_CLK) Setup time, RMII[x]_RXD[1:0] valid before RMII[x]_REF_CLK 4 ns
tsu(CRS_DV-REF_CLK) Setup time, RMII[x]_CRS_DV valid before RMII[x]_REF_CLK 4 ns
tsu(RX_ER-REF_CLK) Setup time, RMII[x]_RX_ER valid before RMII[x]_REF_CLK 4 ns
RMII5 th(REF_CLK-RXD) Hold time RMII[x]_RXD[1:0] valid after RMII[x]_REF_CLK 2 ns
th(REF_CLK-CRS_DV) Hold time, RMII[x]_CRS_DV valid after RMII[x]_REF_CLK 2 ns
th(REF_CLK-RX_ER) Hold time, RMII[x]_RX_ER valid after RMII[x]_REF_CLK 2 ns
RMII4
RMII5
RMII[x]_REF_CLK
RMII[x]_RXD[1:0], RMII[x]_CRS_DV,
RMII[x]_RX_ER
RMII6
RMII[x]_REF_CLK
RMII[x]_TXD[1:0], RMII[x]_TX_EN
(1) VDD stands for corresponding power supply. For more information on the power supply name and the corresponding ball(s), see
POWER column of the Pin Attributes table.
RGMII1
RGMII2
RGMII3
(A)
RGMII[x]_RXC
RGMII4
RGMII5
(B)
RGMII[x]_RD[3:0] 1st Half-byte 2nd Half-byte
(B)
RGMII[x]_RX_CTL RXDV RXERR
A. RGMII[x]_RXC must be externally delayed relative to the data and control pins.
B. Data and control information is received using both edges of the clocks. RGMII[x]_RD[3:0] carries data bits 3-0 on the rising edge of
RGMII[x]_RXC and data bits 7-4 on the falling edge of RGMII[x]_RXC. Similarly, RGMII[x]_RX_CTL carries RXDV on rising edge of
RGMII[x]_RXC and RXERR on falling edge of RGMII[x]_RXC.
(1) Output setup/hold times are defining a delay relationship of the transmit data and control outputs relative to the transmit clock output,
but this output relationship is being presented as the minimum setup/hold times provided to the attached receiver. This approach
matches how the output timing relationships are defined in the RGMII specification.
RGMII6
RGMII7
RGMII8
(A)
RGMII[x]_TXC
RGMII9
(B)
RGMII[x]_TD[3:0] 1st Half-byte 2nd Half-byte
RGMII10
(B)
RGMII[x]_TX_CTL TXEN TXERR
A. TXC is delayed internally before being driven to the RGMII[x]_TXC pin. This internal delay is always enabled.
B. Data and control information is received using both edges of the clocks. RGMII[x]_TD[3:0] carries data bits 3-0 on the rising edge of
RGMII[x]_TXC and data bits 7-4 on the falling edge of RGMII[x]_TXC. Similarly, RGMII[x]_TX_CTL carries TXEN on rising edge of
RGMII[x]_TXC and TXERR on falling edge of RGMII[x]_TXC.
[Link] CPTS
Table 6-40, Table 6-41, Figure 6-32, Table 6-42, and Figure 6-33 present timing conditions, timing requirements,
and switching characteristics for CPTS.
Table 6-40. CPTS Timing Conditions
PARAMETER MIN MAX UNIT
INPUT CONDITIONS
SRI Input slew rate 0.5 5 V/ns
OUTPUT CONDITIONS
CL Output load capacitance 2 10 pF
HWn_TSPUSH
T3 T4 T5
RFT_CLK
TS_COMP
T8 T9
TS_SYNC
T10 T11
SYNCn_OUT
For more information, see Common Platform Time Sync (CPTS) chapter in the device TRM.
[Link] CSI-2
Note
For more information, see the Camera Serial Interface Receiver (CSI_RX_IF) section in the device
TRM. The CSI_RX_IF is connected to device port instances named CSIRXn, where n is the instance
number.
The CSI_RX_IF and associated D-PHY implements a CSI-2 port (CSIRX0) compliant with the MIPI D-PHY
specification v1.2 and the MIPI CSI-2 specification v1.3, with 4 differential data lanes plus 1 differential clock
lane operating in synchronous double data rate mode. For CSI-2 timing details, see the respective MIPI
specifications mentioned above.
• Support for 1-, 2-, 3- or 4-lane data transfer modes up to 1.5Gbps per lane.
[Link] DDRSS
For more details about features and additional description information on the device (LP)DDR4 Memory
Interface, see the corresponding subsections within Signal Descriptions and Detailed Description sections.
Table 6-43 and Figure 6-34 present switching characteristics for DDRSS.
Table 6-43. DDRSS Switching Characteristics
see Figure 6-34
NO. PARAMETER DDR TYPE MIN MAX UNIT
(1) Minimum DDR clock Cycle time will be limited based on the specific memory type (vendor) used in a system and by PCB
implementation. Refer to DDR Board Design and Layout Guidelines for the proper PCB implementation to achieve maximum DDR
frequency.
DDR0_CKP
DDR0_CKN
For more information, see DDR Subsystem (DDRSS) section in Memory Controllers chapter in the device TRM.
[Link] DSS
Table 6-44, Table 6-45, Figure 6-35, Table 6-46 and Figure 6-36 present timing conditions, timing requirements,
and switching characteristics for DSS.
Table 6-44. DSS Timing Conditions
PARAMETER MIN MAX UNIT
INPUT CONDITIONS
SRI Input slew rate 1.44 26.4 V/ns
OUTPUT CONDITIONS
CL Output load capacitance 1.5 5 pF
PCB CONNECTIVITY REQUIREMENTS
td(Trace Mismatch Delay) Propagation delay mismatch across all traces 100 ps
D7
D6 D8
Falling-edge Clock Reference
VOUT(x)_EXTPCLKIN
Rising-edge Clock Reference
VOUT(x)_EXTPCLKIN
DPI_TIMING_02
D2
D1 D3
Falling-edge Clock Reference
VOUT(x)_PCLK
Rising-edge Clock Reference
VOUT(x)_PCLK
D5
VOUT(x)_VSYNC
D5
VOUT(x)_HSYNC
D4
D5
VOUT(x)_DE
DPI_TIMING_01
A. The assertion of data can be programmed to occur on the falling or rising edge of the pixel clock. Refer to Display Subsystem (DSS)
section in Peripherals chapter in the device TRM.
B. The polarity and pulse width of VOUT(x)_HSYNC and VOUT(x)_VSYNC are programmable, refer to Display Subsystem (DSS) section
in Peripherals chapter in the device TRM.
C. The VOUT(x)_PCLK frequency is configurable, refer to Display Subsystem section in Peripherals chapter in the device TRM.
For more information, see Display Subsystem (DSS) and Peripherals section in Peripherals chapter of the
device TRM.
[Link] ECAP
Table 6-47, Table 6-48, Figure 6-37, Table 6-49, and Figure 6-38 present timing conditions, timing requirements,
and switching characteristics for ECAP.
Table 6-47. ECAP Timing Conditions
PARAMETER MIN MAX UNIT
INPUT CONDITIONS
SRI Input slew rate 1 4 V/ns
OUTPUT CONDITIONS
CL Output load capacitance 2 7 pF
CAP1
CAP
EPERIPHERALS_TIMNG_01
CAP2
APWM
EPERIPHERALS_TIMNG_02
For more information, see Enhanced Capture (ECAP) Module section in Peripherals chapter in the device TRM.
DBTR5 toh(TRC_CLK-TRC_DATAI) Output hold time, TRC_CLK edge to TRC_DATA invalid 0.85 ns
DBTR6 tosu(TRC_CTLV-TRC_CLK) Output setup time, TRC_CTL valid to TRC_CLK edge 0.85 ns
DBTR7 toh(TRC_CLK-TRC_CTLI) Output hold time, TRC_CLK edge to TRC_CTL invalid 0.85 ns
3.3V Mode
DBTR1 tc(TRC_CLK) Cycle time, TRC_CLK 8.78 ns
DBTR2 tw(TRC_CLKH) Pulse width, TRC_CLK high 3.64 ns
DBTR3 tw(TRC_CLKL) Pulse width, TRC_CLK low 3.64 ns
tosu(TRC_DATAV-
DBTR4 Output setup time, TRC_DATA valid to TRC_CLK edge 1.10 ns
TRC_CLK)
DBTR5 toh(TRC_CLK-TRC_DATAI) Output hold time, TRC_CLK edge to TRC_DATA invalid 1.10 ns
DBTR6 tosu(TRC_CTLV-TRC_CLK) Output setup time, TRC_CTL valid to TRC_CLK edge 1.10 ns
DBTR7 toh(TRC_CLK-TRC_CTLI) Output hold time, TRC_CLK edge to TRC_CTL invalid 1.10 ns
DBTR1
DBTR2 DBTR3
TRC_CLK
(Worst Case 1)
(Ideal)
(Worst Case 2)
DBTR4 DBTR5 DBTR4 DBTR5
DBTR6 DBTR7 DBTR6 DBTR7
TRC_DATA
TRC_CTL
SPRSP08_Debug_01
[Link].2 JTAG
Table 6-52. JTAG Timing Conditions
PARAMETER MIN MAX UNIT
INPUT CONDITIONS
SRI Input slew rate 0.5 2.0 V/ns
OUTPUT CONDITIONS
CL Output load capacitance 5 15 pF
PCB CONNECTIVITY REQUIREMENTS
td(Trace Delay) Propagation delay of each trace 83.5 1000(1) ps
td(Trace Mismatch Delay) Propagation delay mismatch across all traces 100 ps
(1) Maximum propagation delay associated with the JTAG signal traces has a significant impact on maximum TCK operating frequency. It
may be possible to increase the trace delay beyond this value, but the operating frequency of TCK must be reduced to account for the
additional trace delay.
(1) The maximum TCK operating frequency assumes the following timing requirements and switching characteristis for the attached
debugger. The operating frequency of TCK must be reduced to provide appropriate timing margin if the debugger exceeds any of these
assumptions.
• Minimum TDO setup time of 2ns relative to the rising edge of TCK
• TDI and TMS output delay in the range of -12.9ns to 13.9ns relative to the falling edge of TCK
(2) P = TCK cycle time in ns
J1
J2 J3
TCK
J4 J5 J4 J5
TDI / TMS
J7
J6
TDO
[Link] EPWM
Table 6-55, Table 6-56, Figure 6-41, Table 6-57, Figure 6-42, Figure 6-43, and Figure 6-44 present timing
conditions, timing requirements, and switching characteristics for EPWM.
Table 6-55. EPWM Timing Conditions
PARAMETER MIN MAX UNIT
INPUT CONDITIONS
SRI Input slew rate 1 4 V/ns
OUTPUT CONDITIONS
CL Output load capacitance 2 7 pF
PWM6
EHRPWM_SYNCI
PWM7
EHRPWM_TZn_IN
EPERIPHERALS_TIMNG_07
PWM1
EHRPWM_A/B
PWM1
PWM2
EHRPWM_SYNCO
PWM5
EHRPWM_SOCA/B
EPERIPHERALS_TIMNG_04
PWM3
EHRPWM_A/B
EHRPWM_TZn_IN
EPERIPHERALS_TIMING_05
PWM4
EHRPWM_A/B
EHRPWM_TZn_IN
For more information, see Enhanced Pulse Width Modulation (EPWM) Module section in Peripherals chapter in
the device TRM.
[Link] EQEP
Table 6-58, Table 6-59, Figure 6-45, and Table 6-60 present timing conditions, timing requirements, and
switching characteristics for EQEP.
Table 6-58. EQEP Timing Conditions
PARAMETER MIN MAX UNIT
INPUT CONDITIONS
SRI Input slew rate 1 4 V/ns
OUTPUT CONDITIONS
CL Output load capacitance 2 7 pF
QEP1
QEP_A/B
QEP2
QEP_I
QEP3
QEP4
QEP_S
QEP5 EPERIPHERALS_TIMNG_03
For more information, see Enhanced Quadrature Encoder Pulse (EQEP) Module section in Peripherals chapter
in the device TRM.
[Link] GPIO
Table 6-61, Table 6-62, and Table 6-63 present timing conditions, timing requirements, and switching
characteristics for GPIO.
The device has three instances of the GPIO module.
• MCU_GPIO0
• GPIO0
• GPIO1
Note
GPIOn_x is generic name used to describe a GPIO signal, where n represents the specific GPIO
module and x represents one of the input/output signals associated with the module.
For additional description information on the device GPIO, see the corresponding subsections within
Signal Descriptions and Detailed Description sections.
(1) VDD stands for corresponding power supply. For more information on the power supply name and the corresponding ball(s), see
POWER column of the Pin Attributes table.
For more information, see General-Purpose Interface (GPIO) section in Peripherals chapter in the device TRM.
[Link] GPMC
For more details about features and additional description information on the device General-Purpose Memory
Controller, see the corresponding subsections within Signal Descriptions and Detailed Description sections.
Table 6-64 presents timing conditions for GPMC.
Table 6-64. GPMC Timing Conditions
PARAMETER MIN MAX UNIT
INPUT CONDITIONS
SRI Input slew rate 1.65 4 V/ns
OUTPUT CONDITIONS
CL Output load capacitance 2 20 pF
PCB CONNECTIVITY REQUIREMENTS
133MHz Synchronous Mode 140 360 ps
td(Trace Delay) Propagation delay of each trace
All other modes 140 720 ps
td(Trace Mismatch
Propagation delay mismatch across all traces 200 ps
Delay)
For more information, see General-Purpose Memory Controller (GPMC) section in Peripherals chapter in the
device TRM.
[Link].1 GPMC and NOR Flash — Synchronous Mode
Table 6-65 and Table 6-66 present timing requirements and switching characteristics for GPMC and NOR Flash -
Synchronous Mode.
Table 6-65. GPMC and NOR Flash Timing Requirements — Synchronous Mode
see Figure 6-46, Figure 6-47, and Figure 6-50
NO. PARAMETER DESCRIPTION MIN MAX UNIT
F12 tsu(dV-clkH) Setup time, GPMC_AD[15:0] valid before GPMC_CLK 0.92 ns
high
F13 th(clkH-dV) Hold time, GPMC_AD[15:0] valid after GPMC_CLK high 2.09 ns
F21 tsu(waitV-clkH) Setup time, GPMC_WAIT[j](1) (2) valid before GPMC_CLK 0.92 ns
high
F22 th(clkH-waitV) Hold time, GPMC_WAIT[j](1) (2) valid after GPMC_CLK 2.09 ns
high
Table 6-66. GPMC and NOR Flash Switching Characteristics – Synchronous Mode
see Figure 6-46, Figure 6-47, Figure 6-48, Figure 6-49, and Figure 6-50
NO. PARAMETER DESCRIPTION MIN MAX UNIT
F0 tc(clk) Cycle time, GPMC_CLK(16) 7.52 ns
F1 tw(clkH) Typical pulse duration, GPMC_CLK high 0.475P(13) - ns
0.3
F1 tw(clkL) Typical pulse duration, GPMC_CLK low 0.475P(13) - ns
0.3
F2 td(clkH-csnV) Delay time, GPMC_CLK rising edge to GPMC_CSn[i] F(5) - 2.2 F(5) + 3.75 ns
transition(12)
F3 td(clkH-CSn[i]V) Delay time, GPMC_CLK rising edge to GPMC_CSn[i] D(4) - 2.2 D(4) + 4.5 ns
invalid(12)
F4 td(aV-clk) Delay time, GPMC_A[27:1] valid to GPMC_CLK first edge B(2) - 2.3 B(2) + 4.5 ns
F5 td(clkH-aIV) Delay time, GPMC_CLK rising edge to GPMC_A[27:1] invalid -2.3 4.5 ns
Table 6-66. GPMC and NOR Flash Switching Characteristics – Synchronous Mode (continued)
see Figure 6-46, Figure 6-47, Figure 6-48, Figure 6-49, and Figure 6-50
NO. PARAMETER DESCRIPTION MIN MAX UNIT
F6 td(be[x]nV-clk) Delay time, GPMC_BE0n_CLE, GPMC_BE1n valid to B(2) - 2.3 B(2) + 1.9 ns
GPMC_CLK first edge
F7 td(clkH-be[x]nIV) Delay time, GPMC_CLK rising edge to GPMC_BE0n_CLE, D(4) - 2.3 D(4) + 1.9 ns
GPMC_BE1n invalid
F8 td(clkH-advn) Delay time, GPMC_CLK rising edge to GPMC_ADVn_ALE G(6) - 2.3 G(6) + 4.5 ns
transition
F9 td(clkH-advnIV) Delay time, GPMC_CLK rising edge to GPMC_ADVn_ALE D(4) - 2.3 D(4) + 4.5 ns
invalid
F10 td(clkH-oen) Delay time, GPMC_CLK rising edge to GPMC_OEn_REn H(7) - 2.3 H(7) + 3.5 ns
transition
F11 td(clkH-oenIV) Delay time, GPMC_CLK rising edge to GPMC_OEn_REn D(4) - 2.3 D(4) + 3.5 ns
invalid
F14 td(clkH-wen) Delay time, GPMC_CLK rising edge to GPMC_WEn transition I(8) - 2.3 I(8) + 4.5 ns
F15 td(clkH-do) Delay time, GPMC_CLK rising edge to GPMC_AD[15:0] - 2.3 + 2.7 ns
transition(9)
F15 td(clkL-do) Delay time, GPMC_CLK falling edge to GPMC_AD[15:0] data - 2.3 + 2.7 ns
bus transition(10)
F15 td(clkL-do). Delay time, GPMC_CLK falling edge to GPMC_AD[15:0] data - 2.3 + 2.7 ns
bus transition(11)
F17 td(clkH-be[x]n) Delay time, GPMC_CLK rising edge to GPMC_BE0n_CLE, - 2.3 + 1.9 ns
GPMC_BE1n transition(9)
F17 td(clkL-be[x]n) Delay time, GPMC_CLK falling edge to GPMC_BE0n_CLE, - 2.3 + 1.9 ns
GPMC_BE1n transition(10)
F17 td(clkL-be[x]n). Delay time, GPMC_CLK falling edge to GPMC_BE0n_CLE, - 2.3 + 1.9 ns
GPMC_BE1n transition(11)
F18 tw(csnV) Pulse duration, GPMC_CSn[i](12) low A(1) ns
F19 tw(be[x]nV) Pulse duration, GPMC_BE0n_CLE, GPMC_BE1n low C(3) ns
F20 tw(advnV) Pulse duration, GPMC_ADVn_ALE low K(14) ns
– G = 0.5 × ADVExtraDelay × GPMC_FCLK(15) if (ClkActivationTime and ADVWrOffTime are odd) or (ClkActivationTime and
ADVWrOffTime are even)
– G = (1 + 0.5 × ADVExtraDelay) × GPMC_FCLK(15) otherwise
• Case GPMCFCLKDIVIDER = 2:
– G = 0.5 × ADVExtraDelay × GPMC_FCLK(15) if ((ADVWrOffTime - ClkActivationTime) is a multiple of 3)
– G = (1 + 0.5 × ADVExtraDelay) × GPMC_FCLK(15) if ((ADVWrOffTime - ClkActivationTime - 1) is a multiple of 3)
– G = (2 + 0.5 × ADVExtraDelay) × GPMC_FCLK(15) if ((ADVWrOffTime - ClkActivationTime - 2) is a multiple of 3)
(7) For OE falling edge (OE activated) and IO DIR rising edge (Data Bus input direction):
• Case GPMCFCLKDIVIDER = 0:
– H = 0.5 × OEExtraDelay × GPMC_FCLK(15)
• Case GPMCFCLKDIVIDER = 1:
– H = 0.5 × OEExtraDelay × GPMC_FCLK(15) if (ClkActivationTime and OEOnTime are odd) or (ClkActivationTime and
OEOnTime are even)
– H = (1 + 0.5 × OEExtraDelay) × GPMC_FCLK(15) otherwise
• Case GPMCFCLKDIVIDER = 2:
– H = 0.5 × OEExtraDelay × GPMC_FCLK(15) if ((OEOnTime - ClkActivationTime) is a multiple of 3)
– H = (1 + 0.5 × OEExtraDelay) × GPMC_FCLK(15) if ((OEOnTime - ClkActivationTime - 1) is a multiple of 3)
– H = (2 + 0.5 × OEExtraDelay) × GPMC_FCLK(15) if ((OEOnTime - ClkActivationTime - 2) is a multiple of 3)
F1
F0 F1
GPMC_CLK
F2 F3
F18
GPMC_CSn[i]
F4
GPMC_A[MSB:1] Valid Address
F6 F7
F19
GPMC_BE0n_CLE
F19
GPMC_BE1n
F6 F8 F8
F20 F9
GPMC_ADVn_ALE
F10 F11
GPMC_OEn_REn
F13
F12
GPMC_AD[15:0] D0
GPMC_WAIT[j]
GPMC_01
A. In GPMC_CSn[i], i is equal to 0, 1, 2 or 3.
B. In GPMC_WAIT[j], j is equal to 0 or 1.
Figure 6-46. GPMC and NOR Flash — Synchronous Single Read (GPMCFCLKDIVIDER = 0)
F1
F0 F1
GPMC_CLK
F2 F3
GPMC_CSn[i]
F4
GPMCA[MSB:1] Valid Address
F6 F7
GPMC_BE0n_CLE
F7
GPMC_BE1n
F6 F8 F8 F9
GPMC_ADVn_ALE
F10 F11
GPMC_OEn_REn
F13 F13
F12 F12
GPMC_AD[15:0] D0 D1 D2 D3
F21 F22
GPMC_WAIT[j]
GPMC_02
A. In GPMC_CSn[i], i is equal to 0, 1, 2 or 3.
B. In GPMC_WAIT[j], j is equal to 0 or 1.
Figure 6-47. GPMC and NOR Flash — Synchronous Burst Read — 4x16–bit (GPMCFCLKDIVIDER = 0)
F1
F1 F0
GPMC_CLK
F2 F3
GPMC_CSn[i]
F4
GPMC_A[MSB:1] Valid Address
F17
F6 F17 F17
GPMC_BE0n_CLE
F17
F17 F17
GPMC_BE1n
F6 F8 F8 F9
GPMC_ADVn_ALE
F14 F14
GPMC_WEn
F15 F15 F15
GPMC_AD[15:0] D0 D1 D2 D3
GPMC_WAIT[j]
GPMC_03
A. In GPMC_CSn[i], i is equal to 0, 1, 2 or 3.
B. In GPMC_WAIT[j], j is equal to 0 or 1.
F1
F0 F1
GPMC_CLK
F2 F3
GPMC_CSn[i]
F6 F7
GMPC_BE0n_CLE Valid
F6 F7
GPMC_BE1n Valid
F4
GPMC_A[27:17] Address (MSB)
F12
F4 F5 F13 F12
GPMC_AD[15:0] Address (LSB) D0 D1 D2 D3
F8 F8 F9
GPMC_ADVn_ALE
F10 F11
GPMC_OEn_REn
GPMC_WAIT[j]
GPMC_04
A. In GPMC_CSn[i], i is equal to 0, 1, 2 or 3.
B. In GPMC_WAIT[j], j is equal to 0 or 1.
Figure 6-49. GPMC and Multiplexed NOR Flash — Synchronous Burst Read
F1
F1 F0
GPMC_CLK
F2 F3
F18
GPMC_CSn[i]
F4
GPMC_A[27:17] Address (MSB)
F17
F6 F17 F17
GPMC_BE1n
F17
F6 F17 F17
BPMC_BE0n_CLE
F8 F8
F20 F9
GPMC_ADVn_ALE
F14 F14
GPMC_WEn
F15 F15 F15
GPMC_AD[15:0] Address (LSB) D0 D1 D2 D3
F22 F21
GPMC_WAIT[j]
GPMC_05
A. In GPMC_CSn[i], i is equal to 0, 1, 2 or 3.
B. In GPMC_WAIT[j], j is equal to 0 or 1.
Figure 6-50. GPMC and Multiplexed NOR Flash — Synchronous Burst Write
(1) The FA5 parameter illustrates the amount of time required to internally sample input data. It is expressed in number of GPMC
functional clock cycles. From start of read cycle and after FA5 functional clock cycles, input data is internally sampled by active
functional clock edge. FA5 value must be stored inside the AccessTime register bit field.
(2) The FA20 parameter illustrates amount of time required to internally sample successive input page data. It is expressed in number of
GPMC functional clock cycles. After each access to input page data, next input page data is internally sampled by active functional
clock edge after FA20 functional clock cycles. The FA20 value must be stored in the PageBurstAccessTime register bit field.
(3) The FA21 parameter illustrates amount of time required to internally sample first input page data. It is expressed in number of GPMC
functional clock cycles. From start of read cycle and after FA21 functional clock cycles, first input page data is internally sampled by
active functional clock edge. FA21 value must be stored inside the AccessTime register bit field.
(4) P = PageBurstAccessTime × (TimeParaGranularity + 1) × GPMC_FCLK(6)
(5) H = AccessTime × (TimeParaGranularity + 1) × GPMC_FCLK(6)
(6) GPMC_FCLK is general-purpose memory controller internal functional clock period in ns.
Table 6-68. GPMC and NOR Flash Switching Characteristics – Asynchronous Mode
see Figure 6-51, Figure 6-52, Figure 6-53, Figure 6-54, Figure 6-55, and Figure 6-56
NO. PARAMETER DESCRIPTION MIN MAX UNIT
FA0 tw(be[x]nV) Pulse duration, output lower-byte enable and command latch enable N(12) ns
GPMC_BE0n_CLE, output upper-byte enable GPMC_BE1n valid
time
FA1 tw(csnV) Pulse duration, output chip select GPMC_CSn[i](13) low A(1) ns
FA3 td(csnV-advnIV) Delay time, output chip select GPMC_CSn[i](13)
valid to output B(2) -2 B(2) +2 ns
address valid and address latch enable GPMC_ADVn_ALE invalid
FA4 td(csnV-oenIV) Delay time, output chip select GPMC_CSn[i](13) valid to output C(3) - 2 C(3) + 2 ns
enable GPMC_OEn_REn invalid (Single read)
FA9 td(aV-csnV) Delay time, output address GPMC_A[27:1] valid to output chip J(9) - 2 J(9) + 2 ns
select GPMC_CSn[i](13) valid
FA10 td(be[x]nV-csnV) Delay time, output lower-byte enable and command latch enable J(9) - 2 J(9) + 2 ns
GPMC_BE0n_CLE, output upper-byte enable GPMC_BE1n valid to
output chip select GPMC_CSn[i](13) valid
FA12 td(csnV-advnV) Delay time, output chip select GPMC_CSn[i](13) valid to output K(10) - 2 K(10) + 2 ns
address valid and address latch enable GPMC_ADVn_ALE valid
FA13 td(csnV-oenV) Delay time, output chip select GPMC_CSn[i](13) valid to output L(11) - 2 L(11) + 2 ns
enable GPMC_OEn_REn valid
FA16 tw(aIV) Pulse duration output address GPMC_A[26:1] invalid between 2 G(7) ns
successive read and write accesses
FA18 td(csnV-oenIV) Delay time, output chip select GPMC_CSn[i](13) valid to output I(8) - 2 I(8) + 2 ns
enable GPMC_OEn_REn invalid (Burst read)
FA20 tw(aV) Pulse duration, output address GPMC_A[27:1] valid - 2nd, 3rd, and D(4) ns
4th accesses
FA25 td(csnV-wenV) Delay time, output chip select GPMC_CSn[i](13) valid to output write E(5) - 2 E(5) + 2 ns
enable GPMC_WEn valid
FA27 td(csnV-wenIV) Delay time, output chip select GPMC_CSn[i](13) valid to output write F(6) - 2 F(6) + 2 ns
enable GPMC_WEn invalid
FA28 td(wenV-dV) Delay time, output write enable GPMC_WEn valid to output data 2 ns
GPMC_AD[15:0] valid
Table 6-68. GPMC and NOR Flash Switching Characteristics – Asynchronous Mode (continued)
see Figure 6-51, Figure 6-52, Figure 6-53, Figure 6-54, Figure 6-55, and Figure 6-56
NO. PARAMETER DESCRIPTION MIN MAX UNIT
FA29 td(dV-csnV) Delay time, output data GPMC_AD[15:0] valid to output chip select J(9) - 2 J(9) + 2 ns
GPMC_CSn[i](13) valid
FA37 td(oenV-aIV) Delay time, output enable GPMC_OEn_REn valid to output address 2 ns
GPMC_AD[15:0] phase end
GPMC_FCLK
GPMC_CLK
FA5
FA1
GPMC_CSn[i]
FA9
GPMC_A[MSB:1] Valid Address
FA0
FA10
GPMC_BE0n_CLE Valid
FA0
GPMC_BE1n Valid
FA10
FA3
FA12
GPMC_ADVn_ALE
FA4
FA13
GPMC_OEn_REn
GPMC_AD[15:0] Data IN 0 Data IN 0
GPMC_WAIT[j]
GPMC_06
B. FA5 parameter illustrates amount of time required to internally sample input data. It is expressed in number of GPMC functional clock
cycles. From start of read cycle and after FA5 functional clock cycles, input data will be internally sampled by active functional clock
edge. FA5 value must be stored inside AccessTime register bits field.
C. GPMC_FCLK is an internal clock (GPMC functional clock) not provided externally.
Figure 6-51. GPMC and NOR Flash — Asynchronous Read — Single Word
GPMC_FCLK
GPMC_CLK
FA5 FA5
FA1 FA1
GPMC_CSn[i]
FA16
FA9 FA9
FA3 FA3
FA12 FA12
GPMC_ADCn_ALE
FA4 FA4
FA13 FA13
GPMC_OEn_REn
GPMC_AD[15:0] Data Upper
GPMC_WAIT[j]
GPMC_07
GPMC_FCLK
GPMC_CLK
FA21 FA20 FA20 FA20
FA1
GPMC_CSn[i]
FA9
GPMC_A[MSB:1] Add0 Add1 Add2 Add3 Add4
FA0
FA10
GPMC_BE0n_CLE
FA0
FA10
GPMC_BE1n
FA12
GPMC_ADVn_ALE
FA18
FA13
GPMC_OEn_REn
GPMC_AD[15:0] D0 D1 D2 D3 D3
GPMC_WAIT[j]
GPMC_08
Figure 6-53. GPMC and NOR Flash — Asynchronous Read — Page Mode 4x16–Bit
GPMC_FCLK
GPMC_CLK
FA1
GPMC_CSn[i]
FA9
GPMC_A[MSB:1] Valid Address
FA0
FA10
GPMC_BE0n_CLE
FA0
FA10
GPMC_BE1n
FA3
FA12
GPMC_ADVn_ALE
FA27
FA25
GPMC_WEn
FA29
GPMC_AD[15:0] Data OUT
GPMC_WAIT[j]
GPMC_09
Figure 6-54. GPMC and NOR Flash — Asynchronous Write — Single Word
GPMC_FCLK
GPMC_CLK
FA1
FA5
GPMC_CSn[i]
FA9
GPMC_A[27:17] Address (MSB)
FA0
FA10
GPMC_BE0n_CLE Valid
FA0
FA10
GPMC_BE1n Valid
FA3
FA12
GPMC_ADVn_ALE
FA4
FA13
GPMC_OEn_REn
FA29 FA37
GPMC_AD[15:0] Address (LSB) Data IN Data IN
GPMC_WAIT[j]
GPMC_10
Figure 6-55. GPMC and Multiplexed NOR Flash — Asynchronous Read — Single Word
GPMC_FCLK
GPMC_CLK
FA1
GPMC_CSn[i]
FA9
GPMC_A[27:17] Address (MSB)
FA0
FA10
GPMC_BE0n_CLE
FA0
FA10
GPMC_BE1n
FA3
FA12
GPMC_ADVn_ALE
FA27
FA25
GPMC_WEn
FA29 FA28
GPMC_AD[15:0] Valid Address (LSB) Data OUT
GPMC_WAIT[j]
GPMC_11
Figure 6-56. GPMC and Multiplexed NOR Flash — Asynchronous Write — Single Word
(1) The GNF12 parameter illustrates the amount of time required to internally sample input data. It is expressed in number of GPMC
functional clock cycles. From start of the read cycle and after GNF12 functional clock cycles, input data is internally sampled by the
active functional clock edge. The GNF12 value must be stored inside AccessTime register bit field.
(2) J = AccessTime × (TimeParaGranularity + 1) × GPMC_FCLK(3)
(3) GPMC_FCLK is general-purpose memory controller internal functional clock period in ns.
Table 6-70. GPMC and NAND Flash Switching Characteristics – Asynchronous Mode
see Figure 6-57, Figure 6-58, Figure 6-59 and Figure 6-60
NO. PARAMETER MIN MAX UNIT
GNF0 tw(wenV) Pulse duration, output write enable GPMC_WEn valid A(1) ns
GNF1 td(csnV-wenV) Delay time, output chip select GPMC_CSn[i](13) valid to output write B(2) - 2 B(2) + 2 ns
enable GPMC_WEn valid
GNF2 tw(cleH-wenV) Delay time, output lower-byte enable and command latch enable C(3) - 2 C(3) + 2 ns
GPMC_BE0n_CLE high to output write enable GPMC_WEn valid
GNF3 tw(wenV-dV) Delay time, output data GPMC_AD[15:0] valid to output write D(4) - 2 D(4) + 2 ns
enable GPMC_WEn valid
GNF4 tw(wenIV-dIV) Delay time, output write enable GPMC_WEn invalid to output data E(5) - 2 E(5) + 2 ns
GPMC_AD[15:0] invalid
GNF5 tw(wenIV-cleIV) Delay time, output write enable GPMC_WEn invalid to output F(6) - 2 F(6) + 2 ns
lower-byte enable and command latch enable GPMC_BE0n_CLE
invalid
GNF6 tw(wenIV-CSn[i]V) Delay time, output write enable GPMC_WEn invalid to output chip G(7) - 2 G(7) + 2 ns
select GPMC_CSn[i](13) invalid
GNF7 tw(aleH-wenV) Delay time, output address valid and address latch enable C(3) - 2 C(3) + 2 ns
GPMC_ADVn_ALE high to output write enable GPMC_WEn valid
GNF8 tw(wenIV-aleIV) Delay time, output write enable GPMC_WEn invalid to output F(6) - 2 F(6) + 2 ns
address valid and address latch enable GPMC_ADVn_ALE invalid
GNF9 tc(wen) Cycle time, write H(8) ns
GNF10 td(csnV-oenV) Delay time, output chip select GPMC_CSn[i](13) valid to output I(9) -2 I(9) +2 ns
enable GPMC_OEn_REn valid
GNF13 tw(oenV) Pulse duration, output enable GPMC_OEn_REn valid K(10) ns
GNF14 tc(oen) Cycle time, read L(11) ns
GNF15 tw(oenIV-CSn[i]V) Delay time, output enable GPMC_OEn_REn invalid to output chip M(12) -2 M(12) +2 ns
select GPMC_CSn[i](13) invalid
GPMC_FCLK
GNF1 GNF6
GPMC_CSn[i]
GNF2 GNF5
GPMC_BE0n_CLE
GPMC_ADCn_ALE
GPMC_OEn_REn
GNF0
GPMC_WEn
GNF3 GNF4
GPMC_AD[15:0] Command
GPMC_12
A. In GPMC_CSn[i], i is equal to 0, 1, 2 or 3.
GPMC_FCLK
GNF1 GNF6
GPMC_CSn[i]
GPMC_BE0n_CLE
GNF7 GNF8
GPMC_ADVn_ALE
GPMC_OEn_REn
GNF9
GNF0
GPMC_WEn
GNF3 GNF4
GPMC_AD[15:0] Address
GPMC_13
A. In GPMC_CSn[i], i is equal to 0, 1, 2 or 3.
GPMC_FCLK
GNF12
GNF10 GNF15
GPMC_CSn[i]
GPMC_BE0n_CLE
GPMC_ADVn_ALE
GNF14
GNF13
GPMC_OEn_REn
GPMC_AD[15:0] DATA
GPMC_WAIT[j]
GPMC_14
A. GNF12 parameter illustrates amount of time required to internally sample input data. It is expressed in number of GPMC functional
clock cycles. From start of read cycle and after GNF12 functional clock cycles, input data will be internally sampled by active functional
clock edge. GNF12 value must be stored inside AccessTime register bits field.
B. GPMC_FCLK is an internal clock (GPMC functional clock) not provided externally.
C. In GPMC_CSn[i], i is equal to 0, 1, 2 or 3. In GPMC_WAIT[j], j is equal to 0 or 1.
GPMC_FCLK
GNF1 GNF6
GPMC_CSn[i]
GPMC_BE0n_CLE
GPMC_ADVn_ALE
GPMC_OEn_REn
GNF9
GNF0
GPMC_WEn
GNF3 GNF4
GPMC_AD[15:0] DATA
GPMC_15
[Link] I2C
The device contains six multicontroller Inter-Integrated Circuit (I2C) controllers. Each I2C controller was
designed to be compliant to the Philips I2C-bus™ specification version 2.1. However, the device IOs are not
fully compliant to the I2C electrical specification. The speeds supported and exceptions are described per IO
buffer type. See the BUFFER TYPE column of the Pin Attributes table to determine which IO buffer type is
associated with a specific I2C instance.
• LVCMOS or SDIO
– Speeds:
• Standard-mode (up to 100Kbits/s)
– 1.8V
– 3.3V
• Fast-mode (up to 400Kbits/s)
– 1.8V
– 3.3V
– Exceptions:
• The IOs associated with these ports are not compliant to the fall time requirements defined in the I2C
specification because they are implemented with higher performance LVCMOS push-pull IOs that were
designed to support other signal functions that could not be implemented with I2C compatible IOs. The
LVCMOS IOs being used on these ports are connected such they emulate open-drain outputs. This
emulation is achieved by forcing a constant low output and disabling the output buffer to enter the Hi-Z
state.
• The I2C specification defines a maximum input voltage VIH of (VDDmax + 0.5V), which exceeds the
absolute maximum ratings for the device IOs. The system must be designed to ensure the I2C signals
never exceed the limits defined in the Absolute Maximum Ratings section of this datasheet.
• I2C OD FS
– Speeds:
• Standard-mode (up to 100Kbits/s)
– 1.8V
– 3.3V
• Fast-mode (up to 400Kbits/s)
– 1.8V
– 3.3V
• Hs-mode (up to 3.4Mbits/s)
– 1.8V
– Exceptions:
• The IOs associated with these ports were not design to support Hs-mode while operating at 3.3V. So
Hs-mode is limited to 1.8V operation.
• The rise and fall times of the I2C signals connected to these ports must not exceed a slew rate of
0.08V/ns (or 8E+7V/s). This limit is more restrictive than the minimum fall time limits defined in the I2C
specification. Therefore, it may be necessary to add additional capacitance to the I2C signals to slow
the rise and fall times such that they do not exceed a slew rate of 0.08V/ns.
• The I2C specification defines a maximum input voltage VIH of (VDDmax + 0.5V), which exceeds the
absolute maximum ratings for the device IOs. The system must be designed to ensure the I2C signals
never exceed the limits defined in the Absolute Maximum Ratings section of this datasheet.
Note
I2C3 have one or more signals which can be multiplexed to more than one pin. Timing requirements
and switching characteristics defined in this section are only valid for specific pin combinations known
as IOSETs. Valid pin combinations or IOSETs for this interface are defined in the SysConfig-PinMux
Tool.
Refer to the Philips I2C-bus specification version 2.1 for timing details.
For more details about features and additional description information on the device Inter-Integrated Circuit, see
the corresponding subsections within Signal Descriptions and Detailed Description sections.
[Link] MCAN
Table 6-71 and Table 6-72 presents timing conditions and switching characteristics for MCAN.
For more details about features and additional description information on the device Controller Area Network
Interface, see the corresponding subsections within Signal Descriptions and Detailed Description sections.
Note
The device has multiple MCAN modules. MCANn is a generic prefix applied to MCAN signal names,
where n represents the specific MCAN module.
For more information, see Modular Controller Area Network (MCAN) section in Peripherals chapter in the device
TRM.
[Link] MCASP
Note
MCASP1 and MCASP2 have one or more signals which can be multiplexed to more than one pin.
Timing requirements and switching characteristics defined in this section are only valid for specific pin
combinations known as IOSETs. Valid pin combinations or IOSETs for this interface are defined in the
SysConfig-PinMux Tool.
Table 6-73, Table 6-74, Figure 6-61, Table 6-75, and Figure 6-62 present timing conditions, timing requirements,
and switching characteristics for MCASP.
Table 6-73. MCASP Timing Conditions
PARAMETER MIN MAX UNIT
INPUT CONDITIONS
SRI Input slew rate 0.7 5 V/ns
OUTPUT CONDITIONS
CL Output load capacitance 1 10 pF
PCB CONNECTIVITY REQUIREMENTS
td(Trace Delay) Propagation delay of each trace 100 1100 ps
td(Trace Mismatch Delay) Propagation delay mismatch across all traces 100 ps
ASP2
ASP1
ASP2
MCASP[x]_AHCLKR/X (Falling Edge Priority)
ASP4
ASP3 ASP4
(A)
MCASP[x]_ACLKR/X (CLKRP = CLKXP = 0)
(B)
MCASP[x]_ACLKR/X (CLKRP = CLKXP = 1)
ASP6
ASP5
MCASP[x]_AFSR/X (Bit Width, 0 Bit Delay)
ASP8
ASP7
MCASP[x]_AXR[x] (Data In/Receive)
A. For CLKRP = CLKXP = 0, the MCASP transmitter is configured for rising edge (to shift data out) and the MCASP receiver is configured
for falling edge (to shift data in).
B. For CLKRP = CLKXP = 1, the MCASP transmitter is configured for falling edge (to shift data out) and the MCASP receiver is configured
for rising edge (to shift data in).
ASP10
ASP9 ASP10
ASP12
ASP11
ASP12
(A)
MCASP[x]_ACLKR/X (CLKRP = CLKXP = 1)
(B)
MCASP[x]_ACLKR/X (CLKRP = CLKXP = 0)
ASP13 ASP13
ASP13 ASP13
MCASP[x]_AFSR/X (Bit Width, 0 Bit Delay)
A. For CLKRP = CLKXP = 1, the MCASP transmitter is configured for falling edge (to shift data out) and the MCASP receiver is configured
for rising edge (to shift data in).
B. For CLKRP = CLKXP = 0, the MCASP transmitter is configured for rising edge (to shift data out) and the MCASP receiver is configured
for falling edge (to shift data in).
For more information, see Multichannel Audio Serial Port (MCASP) section in Peripherals chapter in the device
TRM.
[Link] MCSPI
Note
MCSPI1, MCSPI2, MCU_MCSPI0, and MCU_MCSPI1 have one or more signals which can be
multiplexed to more than one pin. Timing requirements and switching characteristics defined in this
section are only valid for specific pin combinations known as IOSETs. Valid pin combinations or
IOSETs for this interface are defined in the SysConfig-PinMux Tool.
For more details about features and additional description information on the device Serial Port Interface, see
the corresponding subsections within Signal Descriptions and Detailed Description sections.
Table 6-76 presents timing conditions for MCSPI.
Table 6-76. MCSPI Timing Conditions
PARAMETER MIN MAX UNIT
INPUT CONDITIONS
SRI Input slew rate 2 8.5 V/ns
OUTPUT CONDITIONS
CL Output load capacitance 6 12 pF
For more information, see Multichannel Serial Peripheral Interface (MCSPI) section in Peripherals chapter in the
device TRM.
PHA=0
EPOL=1
SPI_CS[i] (OUT)
SM1
SM3
SM8 SM2 SM9
SPI_SCLK (OUT) POL=0
SM1
SM3
SM2
POL=1
SPI_SCLK (OUT)
SM5
SM5
SM4 SM4
SPI_D[x] (IN) Bit n-1 Bit n-2 Bit n-3 Bit n-4 Bit 0
PHA=1
EPOL=1
SPI_CS[i] (OUT)
SM2
SM1
SM8 SM3 SM9
SPI_SCLK (OUT) POL=0
SM1
SM2
SM3
POL=1
SPI_SCLK (OUT)
SM5
SM4
SM4 SM5
SPI_D[x] (IN) Bit n-1 Bit n-2 Bit n-3 Bit 1 Bit 0
SPRSP08_TIMING_McSPI_02
PHA=0
EPOL=1
SPI_CS[i] (OUT)
SM1
SM3
SM8 SM2 SM9
SPI_SCLK (OUT) POL=0
SM1
SM3
POL=1 SM2
SPI_SCLK (OUT)
SPI_D[x] (OUT) Bit n-1 Bit n-2 Bit n-3 Bit n-4 Bit 0
PHA=1
EPOL=1
SPI_CS[i] (OUT)
SM1
SM2
SM8 SM3 SM9
SPI_SCLK (OUT) POL=0
SM1
SM2
POL=1 SM3
SPI_SCLK (OUT)
SPI_D[x] (OUT) Bit n-1 Bit n-2 Bit n-3 Bit 1 Bit0
SPRSP08_TIMING_McSPI_01
SS1
SS2
SS8 SS3 SS9
SPI_SCLK (IN) POL=0
SS1
SS2
POL=1 SS3
SPI_SCLK (IN)
SS5 SS4
SS4 SS5
SPI_D[x] (IN) Bit n-1 Bit n-2 Bit n-3 Bit n-4 Bit 0
PHA=1
EPOL=1
SPI_CS[i] (IN)
SS1
SS2
SS8 SS3 SS9
POL=0
SPI_SCLK (IN)
SS1
SS3
POL=1 SS2
SPI_SCLK (IN)
SS4
SS5
SS4 SS5
SPI_D[x] (IN) Bit n-1 Bit n-2 Bit n-3 Bit 1 Bit 0
SPRSP08_TIMING_McSPI_04
PHA=0
EPOL=1
SPI_CS[i] (IN)
SS1
SS2
SS8 SS3 SS9
SPI_SCLK (IN) POL=0
SS1
SS2
POL=1 SS3
SPI_SCLK (IN)
SPI_D[x] (OUT) Bit n-1 Bit n-2 Bit n-3 Bit n-4 Bit 0
PHA=1
EPOL=1
SPI_CS[i] (IN)
SS1
SS2
SS8 SS3 SS9
POL=0
SPI_SCLK (IN)
SS1
SS3
POL=1 SS2
SPI_SCLK (IN)
SPI_D[x] (OUT)
Bit n-1 Bit n-2 Bit n-3 Bit 1 Bit 0
SPRSP08_TIMING_McSPI_03
[Link] MMCSD
The MMCSD Host Controller provides an interface to embedded Multi-Media Card (MMC), Secure Digital (SD),
and Secure Digital IO (SDIO) devices. The MMCSD Host Controller deals with MMC/SD/SDIO protocol at
transmission level, data packing, adding cyclic redundancy checks (CRCs), start/end bit insertion, and checking
for syntactical correctness.
For more details about MMCSD interfaces, see the corresponding MMC0, MMC1, and MMC2 subsections within
Signal Descriptions and Detailed Description sections.
Note
Some operating modes require software configuration of the MMC DLL delay settings, as shown in
Table 6-81 and Table 6-100.
The modes which show a value of "Tuning" in the ITAPDLYSEL column of Table 6-81 and Table 6-100
require a tuning algorithm to be used for optimizing input timing. Refer to the MMCSD Programming
Guide in the device TRM for more information on the tuning algorithm and configuration of input
delays required to optimize input timing.
For more information, see Multi-Media Card/Secure Digital (MMCSD) Interface section in Peripherals chapter in
the device TRM.
(1) NA means this register field has no function when operating with half-cycle timing, which is required for this mode.
(2) Tuning means this mode requires a tuning algorithm to be used to determine optimal input timing
(1) This parameter defines the minimum data valid window required by the host, where any data valid window presented to the host
greater than this value ensures the host is able to capture valid data. The value defined by this parameter is smaller than the smallest
possible data valid window defined for any eMMC device operating in HS200 mode.
HS2004
VIH
MMC0_CMD Valid
MMC0_DAT[7:0] Window
VIL
MMC[x]_CLK
DS1 DS2
MMC[x]_CMD
DS3 DS4
MMC[x]_DAT[3:0]
DS5
DS6 DS7
MMC[x]_CLK
D S8
MMC[x]_CMD
D S9
MMC[x]_DAT[3:0]
MMC[x]_CLK
HS1 H S2
MMC[x]_CMD
HS3 H S4
MMC[x]_DAT[3:0]
HS5
HS6 HS7
MMC[x]_CLK
H S8
MMC[x]_CMD
H S9
MMC[x]_DAT[3:0]
MMC[x]_CLK
SDR121 SDR122
MMC[x]_CMD
SDR123 SDR124
MMC[x]_DAT[3:0]
SDR125
SDR126 SDR127
MMC[x]_CLK
SDR128 SDR128
MMC[x]_CMD
SDR129 SDR129
MMC[x]_DAT[3:0]
MMC[x]_CLK
SDR251 SDR252
MMC[x]_CMD
SDR253 SDR254
MMC[x]_DAT[3:0]
SDR255
SDR256 SDR257
MMC[x]_CLK
SDR258 SDR258
MMC[x]_CMD
SDR259 SDR259
MMC[x]_DAT[3:0]
SDR505
SDR506 SDR507
MMC[x]_CLK
SDR508 SDR508
MMC[x]_CMD
SDR509 SDR509
MMC[x]_DAT[3:0]
DDR505
DDR506 DDR507
MMC[x]_CLK
DDR508
MMC[x]_CMD
DDR509 DDR509
MMC[x]_DAT[3:0]
SDR1045
SDR1046 SDR1047
MMC[x]_CLK
SDR1048 SDR1048
MMC[x]_CMD
SDR1049 SDR1049
MMC[x]_DAT[3:0]
(1) NA means this register field has no function when operating with half-cycle timing, which is required for this mode.
(2) Tuning means this mode requires a tuning algorithm to be used to determine optimal input timing
MMC[x]_CLK
DS1 DS2
MMC[x]_CMD
DS3 DS4
MMC[x]_DAT[3:0]
DS5
DS6 DS7
MMC[x]_CLK
D S8
MMC[x]_CMD
D S9
MMC[x]_DAT[3:0]
MMC[x]_CLK
HS1 H S2
MMC[x]_CMD
HS3 H S4
MMC[x]_DAT[3:0]
HS5
HS6 HS7
MMC[x]_CLK
H S8
MMC[x]_CMD
H S9
MMC[x]_DAT[3:0]
MMC[x]_CLK
SDR121 SDR122
MMC[x]_CMD
SDR123 SDR124
MMC[x]_DAT[3:0]
SDR125
SDR126 SDR127
MMC[x]_CLK
SDR128 SDR128
MMC[x]_CMD
SDR129 SDR129
MMC[x]_DAT[3:0]
MMC[x]_CLK
SDR251 SDR252
MMC[x]_CMD
SDR253 SDR254
MMC[x]_DAT[3:0]
SDR255
SDR256 SDR257
MMC[x]_CLK
SDR258 SDR258
MMC[x]_CMD
SDR259 SDR259
MMC[x]_DAT[3:0]
SDR505
SDR506 SDR507
MMC[x]_CLK
SDR508 SDR508
MMC[x]_CMD
SDR509 SDR509
MMC[x]_DAT[3:0]
DDR505
DDR506 DDR507
MMC[x]_CLK
DDR508
MMC[x]_CMD
DDR509 DDR509
MMC[x]_DAT[3:0]
SDR1045
SDR1046 SDR1047
MMC[x]_CLK
SDR1048 SDR1048
MMC[x]_CMD
SDR1049 SDR1049
MMC[x]_DAT[3:0]
[Link] OLDI
[Link].1 OLDI0 Switching Characteristics
Table 6-113 and Figure 6-95 present switching characteristics for OLDI0.
Table 6-113. OLDI0 Switching Characteristics
NO. PARAMETER MODE MIN TYP MAX UNIT
Rise time, OLDI0_CLK[1:0]P, Slow(1) 0.5 ns
OLDI1 tt(LHTT) OLDI0_CLK[1:0]N, OLDI0_A[7:0]P,
and OLDI0_A[7:0]N Fast(2) 0.25 ns
(1) Slow mode: TXDRV[3:0] = 0100b without back termination (RTERM_EN = 0b with 100Ω differential termination on far-end only)
(2) Fast mode: TXDRV[3:0] = 1000b with back termination (RTERM_EN = 1b with 100Ω differential termination on far-end only, or
RTERM_EN = 0b with 100Ω differential termination on near-end and far-end)
OLDI3
OLDI1, OLDI2
OLDI0_CLK[1:0]P 80%
20%
80%
OLDI0_CLK[1:0]N
20%
OLDI11
OLDI10
OLDI9
OLDI8
OLDI7
OLDI6
OLDI5
OLDI4
OLDI1, OLDI2
OLDI0_A[7:0]P 80%
bit 1 bit 0 bit 6 bit 5 bit 4 bit 3 bit 2
OLDI0_A[7:0]N 20%
For more information, see Display Subsystem (DSS) and Peripherals section in Peripherals chapter in the device
TRM.
[Link] OSPI
OSPI0 offers two data capture modes, PHY mode and Tap mode.
PHY mode uses an internal reference clock to transmit and receive data via a DLL based PHY, where each
reference clock cycle produces a single cycle of OSPI0_CLK for Single Data Rate (SDR) transfers or a half
cycle of OSPI0_CLK for Double Data Rate (DDR) transfers. PHY mode supports four clocking topologies
for the receive data capture clock. Internal PHY Loopback - uses the internal reference clock as the PHY
receive data capture clock. Internal Pad Loopback - uses OSPI0_LBCLKO looped back into the PHY from the
OSPI0_LBCLKO pin as the PHY receive data capture clock. External Board Loopback - uses OSPI0_LBCLKO
looped back into the PHY from the OSPI0_DQS pin as the PHY receive data capture clock. DQS - uses the DQS
output from the attached device as the PHY receive data capture clock. SDR transfers are not supported when
using the Internal Pad Loopback and DQS clocking topologies. DDR transfers are not supported when using the
Internal PHY Loopback or Internal Pad Loopback clocking topologies.
Tap mode uses an internal reference clock with selectable taps to adjusted data transmit and receive capture
delays relative to OSPI0_CLK, which is a divide by 4 of the internal reference clock for SDR transfers or a divide
by 8 of the internal reference clock for DDR transfers. Tap mode only supports one clocking topology for the
receive data capture clock. No Loopback - uses the internal reference clock as the Tap receive data capture
clock. This clocking topology supports a maximum internal reference clock rate of 200MHz, which produces an
OSPI0_CLK rate up to 50MHz for SDR mode or 25MHz for DDR mode.
For more information, see Octal Serial Peripheral Interface (OSPI) section in Peripherals chapter in the device
TRM.
For more details about features and additional description information on the device Octal Serial Peripheral
Interface, see the corresponding subsections within Signal Descriptions and Detailed Description sections.
Section [Link].1 defines timing requirements and switching characteristics associated with PHY mode and
Section [Link].2 defines timing requirements and switching characteristics associated with Tap mode.
Table 6-114 presents timing conditions for OSPI0.
Table 6-114. OSPI0 Timing Conditions
PARAMETER MODE MIN MAX UNIT
INPUT CONDITIONS
SRI Input slew rate 1 6 V/ns
OUTPUT CONDITIONS
CL Output load capacitance 3 10 pF
PCB CONNECTIVITY REQUIREMENTS
No Loopback
Propagation delay of OSPI0_CLK trace Internal PHY Loopback 450 ps
Internal Pad Loopback
td(Trace Delay)
Propagation delay of OSPI0_LBCLKO
External Board Loopback 2L(1) - 30 2L(1) + 30 ps
trace
Propagation delay of OSPI0_DQS trace DQS L(1) - 30 L(1) + 30 ps
Propagation delay mismatch of
td(Trace Mismatch
OSPI0_D[7:0] and OSPI0_CSn[3:0] All modes 60 ps
Delay)
relative to OSPI0_CLK
Receive
All modes PHY_CONFIG_RX_DLL_DELAY_FLD (2)
PHY_MASTER_CONTROL_REG
All modes PHY_MASTER_PHASE_DETECT_SELECTOR_FLD 0x3
(1) Minimum setup and hold time requirements for OSPI0_D[7:0] inputs are not defined when Data Training is used to find the optimum
data valid window. The tDVW parameter defines the minimum data invalid window required. This parameter is provided in lieu of
minimum setup and minimum hold times, where it must be used to check compatibility with the data valid window provided by an
attached device.
OSPI_DQS
OSPI_D[i:0]
OSPI_TIMING_04
Figure 6-96. OSPI0 Timing Requirements – PHY Data Training, DDR with DQS
OSPI_DQS
O21 O22
OSPI_D[i:0]
OSPI_TIMING_06
Figure 6-97. OSPI0 Timing Requirements – PHY Data Training, SDR with External Board Loopback
OSPI_CSn
O4 O3 O5
OSPI_CLK
O2
O6 O6
O1
OSPI_D[i:0]
OSPI_TIMING_01
OSPI_CSn
O10 O7 O11
OSPI_CLK O9 O8
O12
OSPI_D[i:0]
OSPI_TIMING_02
Note
Timing parameters defined in this section are only applicable when data training is not implemented
and DLL delays are configured as described in Table 6-118 and Table 6-121.
Setup time, OSPI0_D[7:0] valid before 1.8V, SDR with Internal PHY Loopback 4.8 ns
O19 tsu(D-CLK)
active OSPI0_CLK edge 3.3V, SDR with Internal PHY Loopback 5.19 ns
Hold time, OSPI0_D[7:0] valid after active 1.8V, SDR with Internal PHY Loopback -0.5 ns
O20 th(CLK-D)
OSPI0_CLK edge 3.3V, SDR with Internal PHY Loopback -0.5 ns
Setup time, OSPI0_D[7:0] valid before 1.8V, SDR with External Board Loopback 0.6 ns
O21 tsu(D-LBCLK)
active OSPI0_DQS edge 3.3V, SDR with External Board Loopback 0.9 ns
Hold time, OSPI0_D[7:0] valid after active 1.8V, SDR with External Board Loopback 1.7 ns
O22 th(LBCLK-D)
OSPI0_DQS edge 3.3V, SDR with External Board Loopback 2.0 ns
OSPI_CLK
O19 O20
OSPI_D[i:0]
OSPI_TIMING_05
Figure 6-100. OSPI0 Timing Requirements – PHY SDR with Internal PHY Loopback
OSPI_DQS
O21 O22
OSPI_D[i:0]
OSPI_TIMING_06
Figure 6-101. OSPI0 Timing Requirements – PHY SDR with External Board Loopback
208 Submit Document Feedback Copyright © 2025 Texas Instruments Incorporated
OSPI_CSn
O10 O7 O11
OSPI_CLK O9 O8
O12
OSPI_D[i:0]
OSPI_TIMING_02
Setup time, OSPI0_D[7:0] valid before 1.8V, DDR with DQS -0.46 ns
O15 tsu(D-LBCLK)
active OSPI0_DQS edge 3.3V, DDR with External Board Loopback 1.23 ns
3.3V, DDR with DQS -0.66 ns
1.8V, DDR with External Board Loopback 1.24(1) ns
Hold time, OSPI0_D[7:0] valid after active 1.8V, DDR with DQS 3.59 ns
O16 th(LBCLK-D)
OSPI0_DQS edge 3.3V, DDR with External Board Loopback 1.44(1) ns
3.3V, DDR with DQS 7.92 ns
(1) This Hold time requirement is larger than the Hold time provided by a typical OSPI/QSPI/SPI device. Therefore, the trace length
between the SoC and attached OSPI/QSPI/SPI device must be sufficiently long enough to ensure that the Hold time is met at the SoC.
The length of the SoC's external loopback clock (OSPI0_LBCLKO to OSPI0_DQS) may need to be shortened to compensate.
OSPI_DQS
OSPI_D[i:0]
OSPI_TIMING_04
Figure 6-103. OSPI0 Timing Requirements – PHY DDR with External Board Loopback or DQS
OSPI_CSn
O4 O3 O5
OSPI_CLK
O2
O6 O6
O1
OSPI_D[i:0]
OSPI_TIMING_01
(1) T = OSPI_RD_DATA_CAPTURE_REG[DELAY_FLD]
(2) R = reference clock cycle time in ns
OSPI_CLK
O19 O20
OSPI_D[i:0]
OSPI_TIMING_05
OSPI_CSn
O10 O7 O11
OSPI_CLK O9 O8
O12
OSPI_D[i:0]
OSPI_TIMING_02
(1) T = OSPI_RD_DATA_CAPTURE_REG[DELAY_FLD]
(2) R = reference clock cycle time in ns
OSPI_CLK
OSPI_D[i:0]
OSPI_TIMING_03
OSPI_CSn
O4 O3 O5
OSPI_CLK
O2
O6 O6
O1
OSPI_D[i:0]
OSPI_TIMING_01
[Link] PRUSS
The device has a single Programmable Real-Time Unit Subsystem (PRUSS), which includes two PRU cores.
The programmable nature of the PRU cores, along with their access to pins, events and all device resources,
provides flexibility in implementing fast real-time responses, specialized data handling operations, custom
peripheral interfaces, and off-loading of tasks from the other processor cores in the device.
For more details about features and additional description information on the device PRUSS, see the
corresponding sections within Signal Descriptions and Detailed Description.
Note
PRUSS contains a second layer of peripheral signal multiplexing to enable additional functionality on
the PRU GPO and GPI signals. This peripheral multiplexing is described in the PRUSS chapter in the
device TRM.
Note
PRUSS has one or more signals which can be multiplexed to more than one pin. Timing requirements
and switching characteristics defined in this section are only valid for specific pin combinations known
as IOSETs. Valid pin combinations or IOSETs for this interface are defined in the SysConfig-PinMux
Tool.
Note
PRUSS signals have different functionality depending on the mode of operation. The signal naming in
this section matches the naming used in the PRU Module Interface section in the device TRM.
GPO[n:0]
PRDO1 PRU_TIMING_02
A. n in GPO[n:0] = 19.
PRPC1
PRPC3
PRPC2
CLOCKIN
DATAIN
PRPC5
PRPC4 PRU_TIMING_03
Figure 6-110. PRUSS PRU Parallel Capture Timing Requirements – Rising Edge Mode
PRPC1
PRPC3
PRPC2
CLOCKIN
DATAIN
PRPC5
PRPC4 PRU_TIMING_04
Figure 6-111. PRUSS PRU Parallel Capture Timing Requirements – Falling Edge Mode
(1) P = Internal shift in clock period in ns, defined by PRUn_GPI_DIV0 and PRUn_GPI_DIV1 bit fields in the GPCFGn_REG register,
where PRUn represents the respective PRU0 or PRU1 instance.
PRSI1
PRSI2
DATAIN
PRU_TIMING_05
(1) P = Software programmable shift out clock period in ns, defined by PRUn_GPO_DIV0 and PRUn_GPO_DIV1 bit fields in the
GPCFGn_REG register, where PRUn represents the respective PRU0 or PRU1 instance.
(2) The Z parameter is defined as follows, where PRUn represents the respective PRU0 or PRU1 instance.
a. If PRUn_GPI_DIV0 and PRUn_GPI_DIV1 are INTEGERS -or- if PRUn_GPI_DIV0 is a NON-INTEGER and PRUn_GPI_DIV1 is
an EVEN INTEGER then, Z equals (PRUn_GPI_DIV0 * PRUn_GPI_DIV1).
b. If PRUn_GPI_DIV0 is a NON-INTEGER and PRUn_GPI_DIV1 is an ODD INTEGER then, Z equals (PRUn_GPI_DIV0 *
PRUn_GPI_DIV1 + 0.5).
c. If PRUn_GPI_DIV0 is an INTEGER and PRUn_GPI_DIV1 is a NON-INTEGER then, Z equals (PRUn_GPI_DIV0 *
PRUn_GPI_DIV1 + 0.5 * PRUn_GPI_DIV0).
d. If PRUn_GPI_DIV0 and PRUn_GPI_DIV1 are NON-INTEGERS then, Z equals (PRUn_GPI_DIV0 * PRUn_GPI_DIV1 + 0.25 *
PRUn_GPI_DIV0).
(3) The Y parameter is defined as follows, where PRUn represents the respective PRU0 or PRU1 instance.
a. If PRUn_GPI_DIV0 and PRUn_GPI_DIV1 are INTEGERS -or- if PRUn_GPI_DIV0 is a NON-INTEGER and PRUn_GPI_DIV1 is
an EVEN INTEGER then, Y equals (PRUn_GPI_DIV0 * PRUn_GPI_DIV1).
b. If PRUn_GPI_DIV0 is a NON-INTEGER and PRUn_GPI_DIV1 is an ODD INTEGER then, Y equals (PRUn_GPI_DIV0 *
PRUn_GPI_DIV1 - 0.5).
c. If PRUn_GPI_DIV0 is an INTEGER and PRUn_GPI_DIV1 is a NON-INTEGER then, Y equals (PRUn_GPI_DIV0 *
PRUn_GPI_DIV1 - 0.5 * PRUn_GPI_DIV0).
d. If PRUn_GPI_DIV0 and PRUn_GPI_DIV1 are NON-INTEGERS then, Y1 equals (PRUn_GPI_DIV0 * PRUn_GPI_DIV1 - 0.25 *
PRUn_GPI_DIV0) and Y2 equals (PRUn_GPI_DIV0 * PRUn_GPI_DIV1 + 0.25 * PRUn_GPI_DIV0), where Y1 is the first high
pulse and Y2 is the second high pulse.
PRSO1
PRSO2H PRSO2L
CLOCKOUT
DATAOUT
PRSO3
PRU_TIMING_06
EDIO_DATA_OUT
IEPIO4 PRU_EDIO_DATA_OUT_TIMING_00
(1) This value represents an absolute maximum load capacitance. As the UART baud rate increases, it may be necessary to reduce the
load capacitance to a value less than this maximum limit to provide enough timing margin for the attached device. The output rise/fall
times increase as capacitive load increases, which decreases the time data is valid for the receiver of the attached devices. Therefore,
it is important to understand the minimum data valid time required by the attached device at the operating baud rate. Then use the
device IBIS models to verify the actual load capacitance on the UART signals does not increase the rise/fall times beyond the point
where the minimum data valid time of the attached device is violated.
0.95U(1)
2 tw(RXDS) Pulse width, receive start bit low (2) ns
(1) U = UART baud time in ns = 1/actual baud rate, where the actual baud rate is defined in the UART Baud Rate Settings table of the
device TRM.
2
1
Start
Bit VIH
PRGi_UART0_RXD
VIL
Data Bits
4
3
Start
Bit
PRGi_UART0_TXD
Data Bits
PRU_UART_TIMING_01_RCVRVIHVIL
PREP1
CAP
PREP2
SYNCI
PREP3
APWM
PREP4
SYNCO
[Link] Timers
For more details about features and additional description information on the device Timers, see the
corresponding subsections within Signal Descriptions and Detailed Description sections.
Table 6-141. Timer Timing Conditions
PARAMETER MIN MAX UNIT
INPUT CONDITIONS
SRI Input slew rate 0.5 5 V/ns
OUTPUT CONDITIONS
CL Output load capacitance 2 10 pF
T1 T2
TIMER_IOx (inputs)
T3 T4
TIMER_IOx (outputs)
TIMER_01
For more information, see Timers section in Peripherals chapter in the device TRM.
[Link] UART
For more details about features and additional description information on the device Universal Asynchronous
Receiver Transmitter, see the corresponding subsections within Signal Descriptions and Detailed Description
sections.
Table 6-144. UART Timing Conditions
PARAMETER MIN MAX UNIT
INPUT CONDITIONS
SRI Input slew rate 0.5 5 V/ns
OUTPUT CONDITIONS
CL Output load capacitance 1 30(1) pF
(1) This value represents an absolute maximum load capacitance. As the UART baud rate increases, it may be necessary to reduce the
load capacitance to a value less than this maximum limit to provide enough timing margin for the attached device. The output rise/fall
times increase as capacitive load increases, which decreases the time data is valid for the receiver of the attached devices. Therefore,
it is important to understand the minimum data valid time required by the attached device at the operating baud rate. Then use the
device IBIS models to verify the actual load capacitance on the UART signals does not increase the rise/fall times beyond the point
where the minimum data valid time of the attached device is violated.
0.95U(1)
2 tw(RXDS) Pulse width, receive start bit low (2) ns
(1) U = UART baud time in ns = 1/actual baud rate, where the actual baud rate is defined in the UART Baud Rate Settings table of the
device TRM.
2
1
Start
VIH
UARTi_RXD Bit
VIL
Data Bits
4
3
Start
UARTi_TXD Bit
Data Bits
UART_TIMING_01_RCVRVIHVIL
For more information, see Universal Asynchronous Receiver/Transmitter (UART) section in Peripherals chapter
in the device TRM.
[Link] USB
The USB 2.0 subsystem is compliant with the Universal Serial Bus (USB) Specification, revision 2.0. Refer to the
specification for timing details.
For more details about features and additional description information on the device Universal Serial Bus
Subsystem (USB), see the corresponding subsections within Signal Descriptions and Detailed Description
sections.
7 Detailed Description
7.1 Overview
The low-cost AM62x Sitara™ MPU family of application processors are built for Linux® application development.
With scalable Arm® Cortex®-A53 performance and embedded features, such as dual-display support and 3D
graphics acceleration, along with an extensive set of peripherals, making the AM62x device well-suited for a
broad range of industrial and automotive applications while offering intelligent features and optimized power
architecture.
Functional safety requirements can be addressed using the integrated Cortex-M4F cores and dedicated
peripherals, which can all be isolated from the rest of the AM62x processor.
The 3-port Gigabit Ethernet switch has one internal port and two external ports with Time-Sensitive Networking
(TSN) capable. An additional PRU module on the device enables real-time I/O capability for customer’s own use
cases. In addition, the extensive set of peripherals included in AM62x enable system-level connectivity, such
as USB, MMC/SD, Camera interface, OSPI, CAN-FD and GPMC for parallel host interface to an external ASIC/
FPGA. The AM62x device also supports secure boot for IP protection with the built-in Hardware Security Module
(HSM) and employs advanced power management support for portable and power-sensitive applications.
Note
For more information on features, subsystems, and architecture of superset device System on Chip
(SoC), see the device TRM.
The Cortex®-A53 cores are general-purpose processors that can be used for running customer applications.
The A53SS is built around the Cortex®-A53 MPCore™ (Arm®-A53 Cluster), which is provided by Arm and
configured by TI. It is based on the symmetric multiprocessor (SMP) architecture, and thus, it delivers high
performance and optimal power management, debug and emulation capabilities.
The A53 processor is a multi-issue out-of-order superscalar execution engine with integrated L1 Instruction
and Data Caches, compatible with Arm®v8-A architecture. It delivers significantly more performance than its
predecessors at a higher level of power efficiency.
The Arm®v8-A architecture brings a number of new features. These include 64-bit data processing, extended
virtual addressing and 64-bit general purpose registers. The A53 processor is Arm’s first Arm®v8-A processor
aimed at providing power-efficient 64-bit processing. It features an in-order, 8-stage, dual-issue pipeline, and
improved integer, Arm® Neon™, Floating-Point Unit (FPU) and memory performance.
The A53 CPU supports two execution states: AArch32 and AArch64. The AArch64 state gives the A53 CPU its
ability to execute 64-bit applications, while the AArch32 state allows the processor to execute existing Arm®v7-A
applications.
The A53SS integrates advanced features including Arm®v8 Cryptography Extensions, GICv3 architecture,
ECC and parity protection for caches, dedicated watchdog timers per core, high-throughput 256-bit VBUSM
interfaces, and a PBIST controller with BISOR for built-in self-test and reliability.
For more information, see Arm Cortex-A53 Subsystem section in Processors and Accelerators chapter in the
device TRM.
7.2.2 Device/Power Manager
The WKUP_R5FSS is a single-core implementation of the Arm® Cortex®-R5F processor that acts as the
Device Manager responsible for boot, resource management, and power management functions. It also includes
accompanying memories (L1 caches and tightly-coupled memories), standard Arm® CoreSight™ debug and
trace architecture, integrated vectored interrupt manager (VIM), ECC aggregators, and various other modules for
protocol conversion and address translation for easy integration into the SoC.
For more information, see Device Manager Cortex R5F Subsystem section in Processors and Accelerators
chapter in the device TRM.
7.2.3 Arm Cortex-M4F
The MCU_M4FSS is an Arm® Cortex®-M4F based subsystem that can run safety processing or be used as
a general purpose MCU. During the boot process, the MCU_M4FSS will be configured by an initial software
running on a different core. Following configuration, software will release the safety processor (M4F) out of reset,
and at this point safety processor code or general purpose code can start execution.
Note
The Cortex-M4F processor is a Cortex-M4 processor that includes the optional floating point unit
(FPU) extension.
For more information, see Cortex-M4F Subsystem section in Processors and Accelerators chapter in the device
TRM.
Each peripheral with PDMA support has its own dedicated state machine to track the transmit and receives of
the data for each peripheral.
For more information, see Data Movement Architecture Overview section in Peripherals chapter in the device
TRM.
7.4.5 Real-Time Clock (RTC)
The basic purpose for the RTC is to keep time of day. The other equally important purpose of RTC is for Digital
Rights management. Some degree of tamper proofing is needed to ensure that simply stopping, resetting, or
corrupting the RTC does not go unnoticed so that if this occurs, the application can re-acquire the time of day
from a trusted source.
For more information, see Real-Time Clock section in Peripherals chapter in the device TRM.
7.5 Peripherals
7.5.1 Gigabit Ethernet Switch (CPSW3G)
The 3-port Gigabit Ethernet Switch (CPSW3G) subsystem provides Ethernet packet communication for the
device and can be configured as an Ethernet switch. It supports two external 10/100/1000Mbps Ethernet ports
with selectable RGMII and RMII interfaces and one internal Communications Port Programming Interface (CPPI)
port.
For more information, see Gigabit Ethernet Switch section in Peripherals chapter in the device TRM.
7.5.2 Camera Serial Interface Receiver (CSI_RX_IF)
The integration of the CSI_RX_IF module allows the device to stream video inputs from multiple cameras to
internal memory.
For more information, see Camera Serial Interface Receiver section in Peripherals chapter in the device TRM.
7.5.3 DDR Subsystem (DDRSS)
DDRSS0 supports LPDDR4 and DDR4 memory types up to 1600MT/s with a 16-bit bus and in-line ECC,
addressing up to 4GB (LPDDR4) and 8GB (DDR4). It features a 128-bit system interface, advanced scheduling
and refresh control, full command coherency, and JEDEC-compliant low-power modes for efficient and reliable
operation across extended temperature ranges.
For more information, see DDR Subsystem section in Peripherals chapter in the device TRM.
7.5.4 Display Subsystem (DSS)
The Display Subsystem (DSS) is a flexible, multi-pipeline subsystem that supports high-resolution display
outputs. DSS includes input pipelines providing multi-layer blending with transparency to enable on-the-fly
composition. Various pixel processing capabilities are supported, such as color space conversion and scaling,
among others. DSS includes a DMA engine, which allows direct access to the frame buffer (device system
memory). Display outputs can connect seamlessly to an Open LVDS Display Interface transmitter (OLDITX), or
can directly drive device pads as a Display Parallel Interface (DPI).
For more information, see Display Subsystem section in Peripherals chapter in the device TRM.
7.5.5 Enhanced Capture (ECAP)
The Enhanced Capture (ECAP) module is a timing peripheral designed to accurately capture and measure
external signal characteristics such as period, frequency, duty cycle, or pulse width. ECAP operates using a
32-bit time-stamp counter and up to four 32-bit capture registers. Captured values can be used to calculate
timing intervals, generate interrupts, or trigger other peripherals.
The module can generate interrupts on any of the capture events and supports both absolute time-capture
and delta-time stamp capture modes, programmable edge polarity for each capture event, and can operate in
auxiliary PWM (APWM) mode to generate a PWM output when not used for capture. The ECAP also supports
one-shot capture mode of up to four time-stamp events, and continuous capture mode of time stamps in a
four-deep circular buffer.
These capabilities make the ECAP module useful for speed measurement, position sensing, and precise input
signal monitoring control applications.
For more information, see Enhanced Capture (ECAP) Module section in Peripherals chapter in the device TRM.
7.5.6 Error Location Module (ELM)
The Error Location Module (ELM) operates in conjunction with the General-Purpose Memory Controller (GPMC)
to support error detection and correction for NAND flash memories. It processes syndrome polynomials
generated during NAND page reads using a Bose–Chaudhuri–Hocquenghem (BCH) algorithm to identify error
locations within a data block. The ELM supports 4-, 8-, and 16-bit error correction per 512-byte block, with
interrupt generation upon completion and register-based access to error count and location data.
For more information, see Error Location Module (ELM) section in Peripherals chapter in the device TRM.
7.5.7 Enhanced Pulse Width Modulation (EPWM)
Enhanced Pulse Width Modulation (EPWM) module is a highly flexible timer-based peripheral used for
generating precise pulse-width modulated waveforms for motor control, digital power, and general-purpose
timing applications.
The EPWM module provides programmable period, duty cycle, and phase control, with features such as dead-
band generation with independent rising- and falling-edge delay control, trip-zone inputs for fault handling,
time-base synchronization input/output signals for synchronization with other EPWM modules, and ability to
generate events to trigger CPU interrupts and ADC conversions, thus enabling precise synchronization between
control loops and waveform generation.
Additional capabilities include PWM chopping by a high-frequency carrier signal to reduce EMI and improve
signal quality, and programmable event prescaling functionality for fine-grained control over how often PWM
events trigger actions.
For more information, see Enhanced Pulse Width Modulation (EPWM) section in Peripherals chapter in the
device TRM.
7.5.8 Error Signaling Module (ESM)
The Error Signaling Module (ESM) aggregates events and/or errors from throughout the device into one location.
It can signal both low and high priority interrupts to a processor to deal with an event and/or manipulate an I/O
error pin to signal an external hardware that an error has occurred. Therefore an external controller is able to
reset the device or keep the system in a safe, known state.
For more information, see Error Signaling Module section in Peripherals chapter in the device TRM.
7.5.9 Enhanced Quadrature Encoder Pulse (EQEP)
The Enhanced Quadrature Encoder Pulse (EQEP) peripheral is used to interface with quadrature-encoded
signals from rotary or linear encoders, commonly used in high performance motion and position control systems,
providing accurate position, direction, and speed information.
The EQEP module supports decoding of A-phase and B-phase signals, along with index signal (QEPI) for
absolute position reference.
The 32-bit EQEP module features a position counter and control unit for position measurement with
programmable reset, a quadrature edge-capture unit for low-speed measurement, a unit time base for real-time
speed measurement, along with a watchdog timer for loss of encoder activity. The EQEP also generates
interrupts on compare, overflow/underflow, and index events, supporting flexible motion control algorithms.
For more information, see Enhanced Quadrature Encoder Pulse (EQEP) section in Peripherals chapter in the
device TRM.
7.5.10 General-Purpose Interface (GPIO)
The General-Purpose Input/Output (GPIO) peripheral provides dedicated general-purpose pins that can be
configured as either inputs or outputs. When configured as an output, the user can write to an internal register to
control the state driven on the output pin. When configured as an input, user can obtain the state of the input by
reading the state of an internal register.
A GPIO module supports up to 144 dedicated signals distributed in 9 banks, each one comprising up to 16 GPIO
signals.
Interrupt generation can be enabled independently for each bank of 16 GPIO signals. Interrupts can be triggered
by rising and/or falling edge, specified for each interrupt capable GPIO signal.
In addition, the GPIO peripheral can produce DMA synchronization events in different event generation modes.
GPIO signals set/clear functionality is also available.
For more information, see General-Purpose Interface section in Peripherals chapter in the device TRM.
7.5.11 General-Purpose Memory Controller (GPMC)
The General-Purpose Memory Controller is a unified memory controller dedicated for interfacing with external
memory devices like:
• Asynchronous SRAM-like memories and application-specific integrated circuit (ASIC) devices
• Asynchronous, synchronous, and page mode (available only in non-multiplexed mode) burst NOR flash
devices
• NAND flash
• Pseudo-SRAM devices
For more information, see General-Purpose Memory Controller section in Peripherals chapter in the device
TRM.
7.5.12 Global Timebase Counter (GTC)
The GTC module is a 64-bit free-running up-counter compliant with Arm®v8 system counter requirments, with
no rollover over the device lifetime when the full 64-bit counter is used, and support of selectable counter-bit
outputs as a push events.
The GTC provides a unified time reference across all cores and peripherals for consistent timestamping and
synchronization.
For more information, see Global Timebase Counter section in Peripherals chapter in the device TRM.
7.5.13 Inter-Integrated Circuit (I2C)
The Inter-Integrated Circuit (I2C) controller provides an interface between a local host (LH), such as an Arm and
any I2C-bus-compatible device that connects via the I2C serial bus. External components attached to the I2C bus
can serially transmit and receive up to 8 bits of data to and from the LH device through the 2-wire I2C interface.
Each multicontroller I2C module can be configured to act like a target or controller I2C-compatible device.
The I2C instances are implemented with I2C compliant, open-drain I/O buffers, or with standard push-pull I/O
buffers. The I2C instances associated with I2C open-drain I/O buffers can support HS-mode (up to 3.4Mbps
when operating at 1.8V, and limited to 400kbps when operating at 3.3V).
The I2C instances associated with standard push-pull I/O buffers can support Fast-mode (up to 400kbps). The
standard push-pull I/O buffers being used on these ports are connected such they emulate open-drain outputs.
This emulation is achieved by forcing a constant low output and disabling the output buffer to enter the Hi-Z
state.
For more information, see Inter-Integrated Circuit section in Peripherals chapter in the device TRM.
7.5.14 Modular Controller Area Network (MCAN)
The Controller Area Network (CAN) is a serial communications protocol which efficiently supports distributed
real-time control with a high level of security. CAN has high immunity to electrical interference and the ability
to self-diagnose and repair data errors. In a CAN network, many short messages are broadcast to the entire
network, which provides for data consistency in every node of the system.
The MCAN module supports both classic CAN and CAN FD (CAN with Flexible Data-Rate) specifications. CAN
FD feature allows high throughput and increased payload per data frame. The classic CAN and CAN FD devices
can coexist on the same network without any conflict.
CAN and CAN FD devices connect to the physical layer of the CAN network through external (for the device)
transceivers. Each MCAN module supports flexible bit rates greather than 1Mbps and is compliant to ISO
11898-1:2015.
For more information, see Modular Controller Area Network (MCAN) section in Peripherals chapter in the device
TRM.
7.5.19 Timers
The general-purpose timer (TIMER) is a 32-bit module that supports timer mode for periodic event generation,
capture mode for precise timestamping of external events, and compare mode for match-based interrupts.
TIMER modules support cascading two 32-bit timers to form a 64-bit counter.
TIMER contains a free running upward counter with auto reload capability on overflow and can be read and
written on the fly (while counting). TIMER supports interrupts generated on overflow, compare and capture
events. All internal timer interrupt sources are merged in one module interrupt line and one wake-up line and
each internal interrupt source can be independently enabled or disabled.
TIMER modules can generate 1-ms tick with 32768-Hz functional clock.
For more information, see Timers section in Peripherals chapter in the device TRM.
7.5.20 Universal Asynchronous Receiver/Transmitter (UART)
The UART is a peripheral that utilizes the DMA for data transfer or interrupt polling via host CPU. All UART
modules support IrDA and CIR modes when 48MHz function clock is used. Each UART can be used for
configuration and data exchange with a number of external peripheral devices or interprocessor communication
between devices.
The UART module supports high-speed communication up to 3.6Mbps with a 64-byte FIFO buffer for both
transmission and reception, and includes advanced features like auto flow control, configurable data formats,
sleep mode, and extended modem control signals. It also offers programmable interrupt levels, auto-baud
detection, and internal loopback for testing.
For more information, see Universal Synchronous/Asynchronous Receiver/Transmitter section in Peripherals
chapter in the device TRM.
7.5.21 Universal Serial Bus Subsystem (USBSS)
The Universal Serial Bus Subsystem (USBSS) provides a connectivity solution for numerous consumer portable
devices by implementing a mechanism for data transfer between USB devices.
USBSS features Dual Role Device (DRD) functionality, enabling operation in Host mode at High-Speed
(480Mbps), Full-Speed (12Mbps), or Low-Speed (1.5Mbps), and Peripheral mode at High-Speed (480Mbps)
or Full-Speed (12Mbps), offering flexible operation and integrated VBUS detection. The subsystem is compliant
with the xHCI 1.1 specification for host controller interface compatibility.
For more information, see Universal Serial Bus Subsystem (USBSS) section in Peripherals chapter in the device
TRM.
A B
R1
0 Ω*
OSPI/QSPI/SPI
OSPI[x]_CLK
Device Clock Input
OSPI[x]_LBCLKO
E F
OSPI[x]_D[y], OSPI/QSPI/SPI
OSPI[x]_CSn[z] Device IO[y], CS#
OSPI_Board_01
* 0Ω resistor (R1), located as close as possible to the OSPI[x]_CLK pin, is placeholder for fine tuning, if needed.
Figure 8-1. OSPI Connectivity Schematic for No Loopback, Internal PHY Loopback, and Internal Pad
Loopback
Note
The External Board Loopback hold time requirement (defined by parameter number O16 in the OSPI0
Timing Requirements - PHY DDR Mode section) may be larger than the hold time provided by a
typical OSPI/QSPI/SPI device. In this case, the propagation delay of OPSI[x]_LBCLKO pin to the
OSPI[x]_DQS pin (C to D) can be reduced to provide additional hold time.
A B
R1
0 Ω*
OSPI/QSPI/SPI
OSPI[x]_CLK
Device Clock Input
C
R1
0 Ω*
OSPI[x]_LBCLKO
E F
OSPI[x]_D[y], OSPI/QSPI/SPI
OSPI[x]_CSn[z] Device IO[y], CS#
OSPI_Board_02
* 0Ω resistor (R1), located as close as possible to the OSPI[x]_CLK and OSPI[x]_LBCLKO pins, is a placeholder for fine tuning, if
needed.
A B
R1
0 Ω*
OSPI/QSPI/SPI
OSPI[x]_CLK
Device Clock Input
OSPI[x]_LBCLKO
C D
E F
OSPI[x]_D[y], OSPI/QSPI/SPI
OSPI[x]_CSn[z] Device IO[y], CS#
OSPI_Board_03
* 0Ω resistor (R1), located as close as possible to the OSPI[x]_CLK pin, is a placeholder for fine tuning, if needed.
Device
USBn_VBUS
16.5 kΩ 3.48 kΩ
±1% ±1%
VBUS signal
10 kΩ
±1% 6.8V
(BZX84C6V8 or equivalent)
VSS VSS
J7ES_USB_VBUS_01
The USB0_VBUS pin can be considered to be fail-safe because the external circuit in Figure 8-4 limits the input
current to the actual device pin in a case where VBUS is applied while the device is powered off.
8.2.4 System Power Supply Monitor Design Guidelines
The VMON_VSYS pin provides a way to monitor a system power supply. This system power supply is typically
a single pre-regulated power source for the entire system and can be connected to the VMON_VSYS pin via
and external resistor divider circuit. This system supply is monitored by comparing the external voltage divider
output voltage to an internal voltage reference, where a power fail event is triggered when the voltage applied
to VMON_VSYS drops below the internal reference voltage. The actual system power supply voltage trip point
is determined by the system designer when selecting component values used to implement the external resistor
voltage divider circuit.
When designing the resistor divider circuit the designer must understand various factors which contribute to
variability in the system power supply monitor trip point. The first thing to consider is the initial accuracy of
the VMON_VSYS input threshold which has a nominal value of 0.45V, with a variation of ±3%. Precision
1% resistors with similar thermal coefficient are recommended for implementing the resistor voltage divider.
This minimizes variability contributed by resistor value tolerances. Input leakage current associated with
VMON_VSYS must also be considered since any current flowing into the pin creates a loading error on the
voltage divider output. The VMON_VSYS input leakage current can be in the range of 10nA to 2.5µA when
applying 0.45V.
Note
The resistor voltage divider shall be designed such that the output voltage never exceeds the
maximum value defined in the Recommended Operating Conditions section, during normal operating
conditions.
Figure 8-5 presents an example, where the system power supply is nominally 5V and the maximum trigger
threshold is 5V - 10%, or 4.5V.
For this example, the designer must understand which variables effect the maximum trigger threshold when
selecting resistor values. A device which has a VMON_VSYS input threshold of 0.45V + 3% needs to be
considered when trying to design a voltage divider that doesn’t trip until the system supply drops 10%. The effect
of resistor tolerance and input leakage also needs to be considered, but the contribution to the maximum trigger
point is not obvious. When selecting component values which produce a maximum trigger voltage, the system
designer must consider a condition where the value of R1 is 1% low and the value of R2 is 1% high combined
with a condition where input leakage current for the VMON_VSYS pin is 2.5µA. When implementing a resistor
divider where R1 = 4.81KΩ and R2 = 40.2KΩ, the result is a maximum trigger threshold of 4.517V.
Once component values have been selected to satisfy the maximum trigger voltage as described above, the
system designer can determine the minimum trigger voltage by calculating the applied voltage that produces an
output voltage of 0.45V - 3% when the value of R1 is 1% high and the value of R2 is 1% low, and the input
leakage current is 10nA, or zero. Using an input leakage of zero with the resistor values given above, the result
is a minimum trigger threshold of 4.013V.
This example demonstrates a system power supply voltage trip point that ranges from 4.013V to 4.517V.
Approximately 250mV of this range is introduced by VMON_VSYS input threshold accuracy of ±3%,
approximately 150 mV of this range is introduced by resistor tolerance of ±1%, and approximately 100mV of
this range is introduced by loading error when VMON_VSYS input leakage current is 2.5µA.
The resistor values selected in this example produces approximately 100µA of bias current through the resistor
divider when the system supply is 4.5V. The 100mV of loading error mentioned above can be reduced to about
10mV by increasing the bias current through the resistor divider to approximately 1mA. So resistor divider bias
current vs loading error is something the system designer needs to consider when selecting component values.
The system designer must also consider implementing a noise filter on the voltage divider output since
VMON_VSYS has minimum hysteresis and a high-bandwidth response to transients. This can be done by
installing a capacitor across R1 as shown in Figure 8-5. However, the system designer must determine the
response time of this filter based on system supply noise and expected response to transient events.
Device
VMON_VSYS
R2
VSYS
40.2 kΩ ±1% (System Power Supply)
R1 4.81 kΩ
C1
±1%
Value = Determined by system designer
VSS
SPRSP56_VMON_ER_MON_01
VMON_1P8_SOC pin provides a way to monitor external 1.8V power supplies. This pin must be connected
directly to their respective power source. An internal resistor divider with software control is implemented inside
the SoC for each of these pins. Software can program each internal resistor divider to create appropriate under
voltage and over voltage interrupts.
VMON_3P3_SOC pin provides a way to monitor external 3.3V power supplies. This pin must be connected
directly to their respective power source. An internal resistor divider with software control is implemented inside
the SoC for each of these pins. Software can program each internal resistor divider to create appropriate under
voltage and over voltage interrupts.
Note
Implementing a ground guard between the MCU_OSC0_XI and MCU_OSC0_XO signals is critical
to minimize shunt capacitance between the two signals. Routing these two signals adjacent to each
other without a ground guard between them will effectively reduce the gain of the oscillator amplifier,
which reduces its ability to start oscillation.
GND vias
Device
Cap
GND guard
MCU_OSC0_XO
GND vias
Figure 8-6. MCU_OSC0 PCB requirements
X Experimental device that is not necessarily representative of the final device's electrical
specifications and may not use production assembly flow.
P Prototype device that is not necessarily the final silicon die and may not necessarily meet final
electrical specifications.
null (BLANK) Production version of the silicon die that is fully qualified and meets final electrical specifications.
X and P devices and TMDX development-support tools are shipped against the following disclaimer:
"Developmental product is intended for internal evaluation purposes."
Production devices and TMDS development-support tools have been characterized fully, and the quality and
reliability of the device have been demonstrated fully. TI's standard warranty applies.
Predictions show that prototype devices (X or P) have a greater failure rate than the standard production
devices. Texas Instruments recommends that these devices not be used in any production system because their
expected end-use failure rate still is undefined. Only qualified production devices are to be used.
For orderable part numbers of AM62x devices in the ALW or AMC package types, see the Package Option
Addendum at the end of this document, the TI website ([Link]), or contact your TI sales representative.
Note
Some devices may have a cosmetic circular marking visible on the top of the device package which
results from the production test process. In addition, some devices may also show a color variation in
the package substrate which results from the substrate manufacturer. These differences are cosmetic
only with no reliability impact.
SITARA
SITARA aBBBBBBr
aBBBBBBr ZfYytPPPQ1
ZfYytPPPQ1
XXXXXXX
XXXXXXX
A1 (PIN ONE INDICATOR) YYY G1 A1 (PIN ONE INDICATOR)
YYY ZZZ G1
O O
(1) BLANK in the symbol or part number is collapsed so there are no gaps between characters.
(2) Applies to device max junction temperature.
XDS™, Code Composer Studio™, and TI E2E™ are trademarks of Texas Instruments.
Arm®, Cortex®, and TrustZone® are registered trademarks of Arm Limited (or its subsidiaries) in the US and/or
elsewhere.
MIPI® is a registered trademark of MIPI Alliance.
Secure Digital® and SD® are registered trademarks of SD Card Association.
Eclipse® is a registered trademark of Eclipse Foundation AISBL.
All trademarks are the property of their respective owners.
9.6 Electrostatic Discharge Caution
This integrated circuit can be damaged by ESD. Texas Instruments recommends that all integrated circuits be handled
with appropriate precautions. Failure to observe proper handling and installation procedures can cause damage.
ESD damage can range from subtle performance degradation to complete device failure. Precision integrated circuits may
be more susceptible to damage because very small parametric changes could cause the device not to meet its published
specifications.
9.7 Glossary
TI Glossary This glossary lists and explains terms, acronyms, and definitions.
10 Revision History
Changes from June 15, 2023 to October 31, 2025 (from Revision B (JUNE 2023) to Revision C
(OCTOBER 2025)) Page
• Global: Removed references to Industrial functional safety.............................................................................. 1
• Global: Updated the introductory sentence in 10 timing sections......................................................................1
• (Features): Added "/SDIO" to the Multi-Media Card/Secure Digital bullet in Media and Data Storage.............. 1
• (Features): Removed the "Trace over USB supported" bullet from High-Speed Interfaces............................... 1
• Global: Moved the Revision History section to the back of the document.........................................................1
• (Description): Removed the list of applications and corrected typographical errors...........................................4
• (Description): Removed sentence describing package options..........................................................................4
• (Package Information): Added 13mm×13mm ALW package options for AM625-Q1 and AM620-Q1................ 4
• (Device Comparison): Updated total number of available external General-Purpose I/Os in the device from
170 to 168...........................................................................................................................................................7
• (Device Comparison): Updated the name of the JTAG User ID register............................................................ 7
• (Device Comparison): Changed "Up to 1GB" to "Up to 128MB" in the General-Purpose Memory Controller
description.......................................................................................................................................................... 7
• (Device Comparison): Changed "LVDS" to "OLDI (LVDS)" in the Display Subsystem description.................... 7
• (Device Comparison): Added row to indicate GTC support................................................................................7
• (Related Products): Added links to products for design completion................................................................... 8
• (ALW FCCSP Pin Diagram): Changed the figure from a bottom view a top view............................................ 10
• (AMC FCBGA Pin Diagram): Changed the figure from a bottom view a top view............................................10
• (EPWM0 Signal Descriptions): Updated the EHRPWM0_SYNCO description................................................ 60
• (MMC2 Signal Descriptions): Added Note 2 to the MMC2_SDCD and MMC2_SDWP signals....................... 72
• (Power Supply Signal Descriptions): Updated the table notes associated with the CAP_VDDSx pins to clarify
the need for capacitance derating and describe additional connectivity options .............................................73
• (Power Supply Signal Descriptions): Updated the description of several power rails to clarify their function.. 73
• (MCU System Signal Descriptions): Updated the description of the MCU_PORz signal function................... 80
• (UART1 Signal Descriptions): Corrected the description for UART1_DCDn....................................................81
• (Pin Connectivity Requirements): Updated the connectivity requirements description for MCU_I2C0 and
WKUP_I2C0 balls to allow connecting external pull-down resistors when selecting a GPIO signal function...84
• (Connectivity Requirements): Updated the Connection Requirements descriptions for CSI0 balls to clarify
connectivity expectations when not using all four lanes................................................................................... 84
• (Pin Connectivity Requirements): Updated the VMON_3P3_SOC connectivity requirements.........................84
• (Absolute Maximum Ratings): Updated the description of several power rails to clarify their function............ 88
• (ESD Ratings): Added ALW corner pins to ESD Ratings section for AEC-Q100 qualified devices..................90
• (Recommended Operating Conditions): Updated the description of several power rails to clarify their
function............................................................................................................................................................. 91
• (I2C Open-Drain, and Fail-Safe Electrical Characteristics) Added a table note to the Input Leakage Current
parameter......................................................................................................................................................... 94
• (I2C Open-Drain, and Fail-Safe Electrical Characteristics) Separated the Input Leakage Current Test
Conditions into two rows...................................................................................................................................94
• (Fail-Safe Reset Electrical Characteristics) Added a table note to the Input Leakage Current parameter.......95
• (Fail-Safe Reset Electrical Characteristics) Separated the Input Leakage Current Test Conditions into two
rows.................................................................................................................................................................. 95
• (High-Frequency Oscillator Electrical Characteristics) Added a table note to the Input Leakage Current
parameter......................................................................................................................................................... 95
• (High-Frequency Oscillator Electrical Characteristics) Separated the Input Leakage Current Test Conditions
into two rows.....................................................................................................................................................95
• (Low-Frequency Oscillator Electrical Characteristics) Added a table note to the Input Leakage Current
parameter......................................................................................................................................................... 95
• (Low-Frequency Oscillator Electrical Characteristics) Separated the Input Leakage Current Test Conditions
into two rows.....................................................................................................................................................95
• (SDIO Electrical Characteristics) Added a table note to the Input Leakage Current parameter.......................96
• (SDIO Electrical Characteristics) Separated the Input Leakage Current Test Conditions into two rows.......... 96
• (SDIO Electrical Characteristics): Changed VDDSHV5 power rail name used to define the VIL/VILSS/VIH/
VIHSS/VOL/VOH parameter values by referencing a generic power rail name (VDD), where applicable, and
added an associated table note........................................................................................................................96
• (LVCMOS Electrical Characteristics) Added a table note to the Input Leakage Current parameter................ 97
• (LVCMOS Electrical Characteristics) Separated the Input Leakage Current Test Conditions into two rows....97
• (Recommended Operating Conditions for OTP eFuse Programming): Removed the OPP NOM (BOOT)
reference from the VDD_CORE parameter description, and changed the VPP Slew Rate description to clarify
it only applies to power-up................................................................................................................................99
• (Impact to Your Hardware Warranty): Updated/Changed the "Consequently, TI will have no …" sentence in
the paragraph................................................................................................................................................... 99
• (Thermal Resistance Characteristics): Added Note....................................................................................... 100
• (Thermal Resistance Characteristics for ALW and AMC Package): Updated the thermal parameter values for
the ALW package that is not AEC - Q100 qualified, and added thermal parameter values for the ALW
package that is AEC - Q100 qualified.............................................................................................................100
• (Temperature Sensor Characteristics): Added new section to define Voltage and Temperature Module (VTM)
on die temperature sensor characteristics......................................................................................................101
• (Power-Up Sequencing): Added note to clarify power rails must decay below 300mv before initiating a new
power-up sequence........................................................................................................................................ 105
• (Power-Up Sequencing): Added the missing VDDA_1P8_OLDI0 power rail to Waveform C in the Power-Up
Sequencing - Supply / Signal Assignments table........................................................................................... 105
• (Power-Down Sequencing): Added note to clarify power rails must decay below 300mv before initiating a new
power-up sequence........................................................................................................................................ 108
• (Power-Down Sequencing): Added the missing VDDA_1P8_OLDI0 power rail to Waveform C in the Power-
Down Sequencing - Supply / Signal Assignments table.................................................................................108
• (Power-Down Sequencing – Supply / Signal Assignments): Changed VDDSHV_CANUART to
VDD_CANUART in table note 4..................................................................................................................... 108
• (Power-Down Sequencing): Updated the Power-Down Sequence diagram to account for a use case where
the system power remains turned on while the device power management solution is turned off. Also included
an option that allows the ramp-down of IO power rails to be extended until the last core power rail ramps
down and it is possible for MCU_PORz to be asserted before the supplies begin to sequence off...............108
• (Reset Timing Conditions): Changed the Input slew rate minimum values for VDD = 1.8V and VDD = 3.3V
(original values were swapped).......................................................................................................................111
• (BOOTMODE Timing Requirements): Updated the description for parameters RST23 and RST24.............. 111
• (Input Clocks / Oscillators): Added VOUT0_EXTPCLKIN...............................................................................119
• (MCU_OSC0 LVCMOS Digital Clock Source): Added additional notes and the new MCU_OSC0 LVCMOS
Digital Clock Source Requirements table....................................................................................................... 123
• (WKUP_LFOSC0 Crystal Electrical Characteristics) Included a new parameter that defines the maximum
Crystal Frequency Stability and Tolerance..................................................................................................... 125
• (PLLs): Updated the PLL names to include it's number reference used in the TRM......................................128
• (CPSW3G MDIO Timing): Changed the minimum setup time value (parameter MDIO1) from "90" to "45". Also
changed the minimum and maximum output delay time values (parameter MDIO7) from "-150" and "150" to
"-10" and "10" respectively............................................................................................................................. 130
• (CPSW3G MDIO Timing Conditions): Added propagation delay and propagation delay mismatch timing
parameters......................................................................................................................................................130
• (CPSW3G RMII Timing Conditions): Changed the maximum input slew rate for both operating voltages.... 131
• (CPSW3G RGMII Timing Conditions): Added operating voltage conditions to the Input Slew Rate parameter
to allow a relaxed slew rate when operating at 1.8V...................................................................................... 133
• (CPTS): Updated reference name for the TRM section under the timing tables............................................ 136
• (CSI-2): Included a comment in the note that explains port instance name relationship and removed the first
paragraph since it didn't contain any information related to Timing and Switching Characteristics............... 137
• (ECAP – Timing Requirements and Switching Characteristics): Updated the clock source referenced in table
note 1..............................................................................................................................................................141
• (EPWM – Timing Requirements and Switching Characteristics): Updated the clock source referenced in table
note 1..............................................................................................................................................................144
• (EQEP – Timing Requirements): Updated the clock source referenced in table note 1.................................146
• (GPIO Timing Conditions): Updated the Input slew rate parameter to include operating voltage with relaxed
minimum values and corrected a typographical error on the maximum value of the I2C OD FS buffer type
operating at 3.3V. The previous maximum value of 0.8V/ns should have been 0.08V/ns for it to be equivalent
to the maximum value of 8E+7 defined in the Electrical Characteristics table for the I2C OD FS buffer....... 147
• (GPIO Timing Requirements): Removed the voltage conditions in the MODE column and changed the
minimum value to accommodate the reduced minimum Input Slew Rate values in the GPIO Timing
Conditions table..............................................................................................................................................147
• (GPMC and NOR Flash Timing Requirements — Synchronous Mode): Removed the GPMC_FCLK=100MHz
column timing values and the associated not_div_by_1_mode timing values for GPMC_FCLK=133MHz.
Simplified several parameter descriptions. Also removed two table notes, one that described register
configuration for GPMC_FCLK selection, and another that described register configuration for
div_by_1_mode.............................................................................................................................................. 148
• (GPMC and NOR Flash Switching Characteristics – Synchronous Mode): Removed the
GPMC_FCLK=100MHz column timing values and the associated not_div_by_1_mode timing values for
GPMC_FCLK=133MHz. Simplified several parameter descriptions. Changed the timing variable in
parameters F3 and F11 to "D". Removed the "J" timing variable from the F15 and F17 parameters. Updated
the table notes................................................................................................................................................ 148
• (GPMC and NOR Flash Timing Requirements – Asynchronous Mode): Removed the MODE column and the
table note that described register configuration for div_by_1_mode. Added the correct table note for
parameter FA21 .............................................................................................................................................156
• (GPMC and NOR Flash Switching Characteristics – Asynchronous Mode): Removed the MODE column and
redundant rows. Also removed the table note that described register configuration for div_by_1_mode...... 156
• (GPMC and NAND Flash Timing Requirements – Asynchronous Mode): Removed the MODE column and the
table note that described register configuration for div_by_1_mode.............................................................. 163
• (GPMC and NAND Flash Switching Characteristics – Asynchronous Mode): Removed the MODE column and
the table note that described register configuration for div_by_1_mode. Added table notes and associated
reference links for timing variables B, C, D, E, F, G, H, I, K, L, and M........................................................... 163
• (I2C): Changed the maximum slew rate value from 0.8V/ns to 0.08V/ns and added "when operating at 3.3V"
to clarify the exception is not applicable to 1.8V operation.............................................................................166
• (I2C): Changed the supported speeds and exception descriptions so they are organized based on IO buffer
type rather than I2C port instance.................................................................................................................. 166
• (MCAN): Updated reference name for the TRM section under the timing tables........................................... 168
• (MCASP): Changed the IOSET note that explains timing limitations associated with valid pin combinations.....
........................................................................................................................................................................169
• (MCSPI): Changed the IOSET note that explains timing limitations associated with valid pin combinations.173
• (MCSPI Switching Characteristics - Controller Mode): Replaced previous table notes 2 and 3 with new table
notes 2, 3, 4, and 5.........................................................................................................................................174
• (MMC0 - eMMC/SD/SDIO Interface): Clarified the Default Speed, High Speed, UHS-I SDR12, and UHS-I
SDR25 modes are only available for connectivity to embedded SDIO devices, and removed the UHS-I
SDR50, UHS-I DDR50, and UHS-I SDR104 modes...................................................................................... 180
• (MMC0 DLL Delay Mapping for all Timing Modes): Changed the register name, changed the OTAPDLYENA
and OTAPDLYSEL values for Legacy SDR, High Speed SDR, Default Speed, and High Speed modes, and
removed the CLKBUFSEL column because this register bit field doesn't provide any function.....................180
• (HS200 Mode): Added "MMC0 Timing Requirements....................................................................................184
• (MMC1/MMC2 DLL Delay Mapping for all Timing Modes): Changed the register names, and changed the
OTAPDLYENA and OTAPDLYSEL values for Default Speed and High Speed modes..................................192
• (MMC1/MMC2 DLL Delay Mapping for all Timing Modes): Removed the CLKBUFSEL column because this
register bit field doesn't provide any function................................................................................................. 192
• (OLDI0 Switching Characteristics): Changed the formulas in parameters OLDI5 through OLDI11............... 201
• (OSPI0 DLL Delay Mapping for PHY Data Training): Added a delay value for the
"PHY_MASTER_PHASE_DETECT_SELECTOR_FLD" register bit field.......................................................204
• (OSPI0 Timing Requirements – PHY Data Training): Added three new timing parameters. Two that define
timing parameters associated with SRD with External Board Loopback, and one that defines the minimum
input data valid window for each mode. Also updated Note 1 to clarify the purpose of the new data valid
window parameter.......................................................................................................................................... 204
• (OSPI0 Timing Requirements – PHY Data Training, SDR with External Board Loopback): Added a new timing
requirements diagram for SDR with External Board Loopback...................................................................... 204
• (OSPI Switching Characteristics – PHY Data Training): Added seven new timing parameters. Six that define
timing parameters associated with SRD with External Board Loopback, and one that defines the maximum
output data valid window for each mode........................................................................................................ 204
• (OSPI Switching Characteristics – PHY Data Training): Corrected the formulas associated with timing
parameters O5 and O11................................................................................................................................. 204
• (OSPI0 Switching Characteristics – PHY SDR Data Training): Added a new switching characteristics diagram
for SDR with External Board Loopback.......................................................................................................... 204
• (OSPI0 DLL Delay Mapping for PHY SDR Timing Modes): Added a delay value for the
"PHY_MASTER_PHASE_DETECT_SELECTOR_FLD" register bit field.......................................................208
• (OSPI0 Switching Characteristics – PHY SDR Mode): Corrected the formulas associated with timing
parameters O10 and O11............................................................................................................................... 208
• (OSPI0 DLL Delay Mapping for PHY DDR Timing Modes): Added a delay value for the
"PHY_MASTER_PHASE_DETECT_SELECTOR_FLD" register bit field.......................................................210
• (OSPI0 Switching Characteristics – PHY DDR Mode): Corrected the formulas associated with timing
parameters O4 and O5...................................................................................................................................210
• (Overview): Removed the list of applications and corrected typographical errors..........................................226
• (Overview): Removed sentence describing package options.........................................................................226
• (Detailed Description – A53SS): Added clarification regarding the A53SS features supported by the device.....
........................................................................................................................................................................227
• (Detailed Description – DMSS): Added reference to the TRM to ensure consistency with the structure and
formatting of other sections in the datasheet..................................................................................................229
• (Detailed Description – PDMA): Added clarification regarding the PDMA features supported by the device.229
• (Detailed Description – CPSW3G): Added clarification regarding the CPSW3G features supported by the
device............................................................................................................................................................. 231
• (Detailed Description – DDRSS): Added clarification regarding the DDRSS features supported by the
device............................................................................................................................................................. 231
• (Detailed Description – ECAP): Added clarification regarding the ECAP features supported by the device..231
• (Detailed Description – ELM): Added clarification regarding the ELM features supported by the device...... 231
• (Detailed Description – EPWM): Added clarification regarding the EPWM features supported by the device.....
........................................................................................................................................................................232
• (Detailed Description – EQEP): Added clarification regarding the EQEP features supported by the device. 232
• (Detailed Description – GPIO): Added clarification regarding the GPIO features supported by the device... 232
• (Detailed Description – GTC): Added clarification regarding the GTC features supported by the device...... 233
• (Detailed Description – I2C): Updated the first sentence to ensure consistency with the structure and
formatting of other sections in the datasheet and updated the I/O buffer references.....................................233
• (Detailed Description – MCAN): Added clarification regarding the MCAN features supported by the device......
........................................................................................................................................................................233
• (Detailed Description – McASP): Removed the first sentence to ensure consistency with the structure and
formatting of other sections in the document..................................................................................................234
• (Detailed Description – MCSPI): Added clarification regarding the MCSPI features supported by the device.....
........................................................................................................................................................................234
• (Detailed Description – MMCSD): Added clarification regarding the MMCSD features supported by the
device............................................................................................................................................................. 234
• (Detailed Descriprion - OSPI): Added clarification regarding the OSPI features supported by the device.....234
• (Detailed Description – Timers): Added clarification regarding the Timers features supported by the device235
• (Detailed Description – UART): Added clarification regarding the UART features supported by the device..235
• (Detailed Description – USBSS): Added clarification regarding the USBSS features supported by the
device............................................................................................................................................................. 235
• (USB VBUS Design Guidelines): Changed the 3.5kΩ resistor value to 3.48kΩ since 3.5kΩ is not a standard
value for 1% resistors..................................................................................................................................... 241
• (Clock Routing Guidelines): Added new section............................................................................................ 244
• (Device Naming Convention): Added Device revision B................................................................................ 247
• (Tools and Software): Added clarification regarding the SysConfig features..................................................248
[Link] 10-Dec-2025
PACKAGING INFORMATION
Orderable part number Status Material type Package | Pins Package qty | Carrier RoHS Lead finish/ MSL rating/ Op temp (°C) Part marking
(1) (2) (3) Ball material Peak reflow (6)
(4) (5)
AM6201ASGFHIAMCRQ1 Active Production FCBGA (AMC) | 441 500 | LARGE T&R Yes Call TI Level-3-250C-168 HR -40 to 125 AM6201A
SGFHIAMCQ1
131
AM6201ASGFHIAMCRQ1.B Active Production FCBGA (AMC) | 441 500 | LARGE T&R Yes Call TI Level-3-250C-168 HR -40 to 125 AM6201A
SGFHIAMCQ1
131
AM6201BSGFHIALWRQ1 Active Production FCCSP (ALW) | 425 1000 | LARGE T&R Yes Call TI Level-3-260C-168 HR -40 to 125 01BSGFHI
AM6201BSGFHIAMCRQ1 Active Production FCBGA (AMC) | 441 500 | LARGE T&R - Call TI Level-3-250C-168 HR -40 to 125 01BSGFHI Q1
AM6201BTGFHIALWRQ1 Active Production FCCSP (ALW) | 425 1000 | LARGE T&R Yes Call TI Level-3-260C-168 HR -40 to 125 01BTGFHI
AM6201BTGFHIAMCRQ1 Active Production FCBGA (AMC) | 441 500 | LARGE T&R - Call TI Level-3-250C-168 HR -40 to 125 01BTGFHI Q1
AM6202ATGFHIAMCRQ1 Active Production FCBGA (AMC) | 441 500 | LARGE T&R Yes Call TI Level-3-250C-168 HR -40 to 125 AM6202A
TGFHIAMCQ1
131
AM6202ATGFHIAMCRQ1.B Active Production FCBGA (AMC) | 441 500 | LARGE T&R Yes Call TI Level-3-250C-168 HR -40 to 125 AM6202A
TGFHIAMCQ1
131
AM6202BSGFHIALWRQ1 Active Production FCCSP (ALW) | 425 1000 | LARGE T&R Yes Call TI Level-3-260C-168 HR -40 to 125 02BSGFHI
AM6202BSGFHIAMCRQ1 Active Production FCBGA (AMC) | 441 500 | LARGE T&R - Call TI Level-3-250C-168 HR -40 to 125 02BSGFHI Q1
AM6202BTGFHIALWRQ1 Active Production FCCSP (ALW) | 425 1000 | LARGE T&R Yes Call TI Level-3-260C-168 HR -40 to 125 02BTGFHI
AM6202BTGFHIAMCRQ1 Active Production FCBGA (AMC) | 441 500 | LARGE T&R - Call TI Level-3-250C-168 HR -40 to 125 02BTGFHI Q1
AM6204ASGFHIAMCRQ1 Active Production FCBGA (AMC) | 441 500 | LARGE T&R Yes Call TI Level-3-250C-168 HR -40 to 125 AM6204A
SGFHIAMCQ1
131
AM6204ASGFHIAMCRQ1.B Active Production FCBGA (AMC) | 441 500 | LARGE T&R Yes Call TI Level-3-250C-168 HR -40 to 125 AM6204A
SGFHIAMCQ1
131
AM6204BSGFHIALWRQ1 Active Production FCCSP (ALW) | 425 1000 | LARGE T&R Yes Call TI Level-3-260C-168 HR -40 to 125 04BSGFHI
AM6204BSGFHIAMCRQ1 Active Production FCBGA (AMC) | 441 500 | LARGE T&R - Call TI Level-3-250C-168 HR -40 to 125 04BSGFHI Q1
AM6204BTGFHIALWRQ1 Active Production FCCSP (ALW) | 425 1000 | LARGE T&R Yes Call TI Level-3-260C-168 HR -40 to 125 04BTGFHI
AM6204BTGFHIAMCRQ1 Active Production FCBGA (AMC) | 441 500 | LARGE T&R - Call TI Level-3-250C-168 HR -40 to 125 04BTGFHI Q1
AM6231AKGGHHALW Active Production FCCSP (ALW) | 425 119 | JEDEC Yes Call TI Level-3-260C-168 HR 0 to 95 AM6231A
TRAY (10+1) KGGHHALW
131
Addendum-Page 1
PACKAGE OPTION ADDENDUM
[Link] 10-Dec-2025
Orderable part number Status Material type Package | Pins Package qty | Carrier RoHS Lead finish/ MSL rating/ Op temp (°C) Part marking
(1) (2) (3) Ball material Peak reflow (6)
(4) (5)
AM6231AKGGHHALW.B Active Production FCCSP (ALW) | 425 119 | JEDEC Yes Call TI Level-3-260C-168 HR 0 to 95 AM6231A
TRAY (10+1) KGGHHALW
131
AM6231ASGGGAALW Active Production FCCSP (ALW) | 425 119 | JEDEC Yes Call TI Level-3-260C-168 HR -40 to 105 AM6231A
TRAY (10+1) SGGGAALW
131
AM6231ASGGGAALW.B Active Production FCCSP (ALW) | 425 119 | JEDEC Yes Call TI Level-3-260C-168 HR -40 to 105 AM6231A
TRAY (10+1) SGGGAALW
131
AM6231ASGGHAALW Active Production FCCSP (ALW) | 425 119 | JEDEC Yes Call TI Level-3-260C-168 HR -40 to 105 AM6231A
TRAY (10+1) SGGHAALW
131
AM6231ASGGHAALW.B Active Production FCCSP (ALW) | 425 119 | JEDEC Yes Call TI Level-3-260C-168 HR -40 to 105 AM6231A
TRAY (10+1) SGGHAALW
131
AM6231ASGGHIALWR Active Production FCCSP (ALW) | 425 1000 | LARGE T&R Yes Call TI Level-3-260C-168 HR -40 to 125 AM6231A
SGGHIALW
131
AM6231ASGGHIALWR.B Active Production FCCSP (ALW) | 425 1000 | LARGE T&R Yes Call TI Level-3-260C-168 HR -40 to 125 AM6231A
SGGHIALW
131
AM6231ATCGHAALW Active Production FCCSP (ALW) | 425 119 | JEDEC Yes Call TI Level-3-260C-168 HR -40 to 105 AM6231A
TRAY (10+1) TCGHAALW
131
AM6231ATCGHAALW.B Active Production FCCSP (ALW) | 425 119 | JEDEC Yes Call TI Level-3-260C-168 HR -40 to 105 AM6231A
TRAY (10+1) TCGHAALW
131
AM6231ATGGHAALWR Active Production FCCSP (ALW) | 425 1000 | LARGE T&R Yes Call TI Level-3-260C-168 HR -40 to 105 AM6231A
TGGHAALW
131
AM6231ATGGHAALWR.B Active Production FCCSP (ALW) | 425 1000 | LARGE T&R Yes Call TI Level-3-260C-168 HR -40 to 105 AM6231A
TGGHAALW
131
AM6231ATGGHIALWR Active Production FCCSP (ALW) | 425 1000 | LARGE T&R Yes Call TI Level-3-260C-168 HR -40 to 125 AM6231A
TGGHIALW
131
Addendum-Page 2
PACKAGE OPTION ADDENDUM
[Link] 10-Dec-2025
Orderable part number Status Material type Package | Pins Package qty | Carrier RoHS Lead finish/ MSL rating/ Op temp (°C) Part marking
(1) (2) (3) Ball material Peak reflow (6)
(4) (5)
AM6231ATGGHIALWR.B Active Production FCCSP (ALW) | 425 1000 | LARGE T&R Yes Call TI Level-3-260C-168 HR -40 to 125 AM6231A
TGGHIALW
131
AM6232ASCGHAALWR Active Production FCCSP (ALW) | 425 1000 | LARGE T&R Yes Call TI Level-3-260C-168 HR -40 to 105 AM6232A
SCGHAALW
131
AM6232ASCGHAALWR.B Active Production FCCSP (ALW) | 425 1000 | LARGE T&R Yes Call TI Level-3-260C-168 HR -40 to 105 AM6232A
SCGHAALW
131
AM6232ASGGHAALW Active Production FCCSP (ALW) | 425 119 | JEDEC Yes Call TI Level-3-260C-168 HR -40 to 105 AM6232A
TRAY (10+1) SGGHAALW
131
AM6232ASGGHAALW.B Active Production FCCSP (ALW) | 425 119 | JEDEC Yes Call TI Level-3-260C-168 HR -40 to 105 AM6232A
TRAY (10+1) SGGHAALW
131
AM6232ATCGGAALW Active Production FCCSP (ALW) | 425 119 | JEDEC Yes Call TI Level-3-260C-168 HR -40 to 105 AM6232A
TRAY (10+1) TCGGAALW
131
AM6232ATCGGAALW.B Active Production FCCSP (ALW) | 425 119 | JEDEC Yes Call TI Level-3-260C-168 HR -40 to 105 AM6232A
TRAY (10+1) TCGGAALW
131
AM6232ATCGHAALW Active Production FCCSP (ALW) | 425 119 | JEDEC Yes Call TI Level-3-260C-168 HR -40 to 105 AM6232A
TRAY (10+1) TCGHAALW
131
AM6232ATCGHAALW.B Active Production FCCSP (ALW) | 425 119 | JEDEC Yes Call TI Level-3-260C-168 HR -40 to 105 AM6232A
TRAY (10+1) TCGHAALW
131
AM6232ATGGHAALWR Active Production FCCSP (ALW) | 425 1000 | LARGE T&R Yes Call TI Level-3-260C-168 HR -40 to 105 AM6232A
TGGHAALW
131
AM6232ATGGHAALWR.B Active Production FCCSP (ALW) | 425 1000 | LARGE T&R Yes Call TI Level-3-260C-168 HR -40 to 105 AM6232A
TGGHAALW
131
AM6232ATGGHIALWR Active Production FCCSP (ALW) | 425 1000 | LARGE T&R Yes Call TI Level-3-260C-168 HR -40 to 125 AM6232A
TGGHIALW
131
Addendum-Page 3
PACKAGE OPTION ADDENDUM
[Link] 10-Dec-2025
Orderable part number Status Material type Package | Pins Package qty | Carrier RoHS Lead finish/ MSL rating/ Op temp (°C) Part marking
(1) (2) (3) Ball material Peak reflow (6)
(4) (5)
AM6232ATGGHIALWR.B Active Production FCCSP (ALW) | 425 1000 | LARGE T&R Yes Call TI Level-3-260C-168 HR -40 to 125 AM6232A
TGGHIALW
131
AM6234ASCGHAALWR Active Production FCCSP (ALW) | 425 1000 | LARGE T&R Yes Call TI Level-3-260C-168 HR -40 to 105 AM6234A
SCGHAALW
131
AM6234ASCGHAALWR.B Active Production FCCSP (ALW) | 425 1000 | LARGE T&R Yes Call TI Level-3-260C-168 HR -40 to 105 AM6234A
SCGHAALW
131
AM6234ASGGHAALWR Active Production FCCSP (ALW) | 425 1000 | LARGE T&R Yes Call TI Level-3-260C-168 HR -40 to 105 AM6234A
SGGHAALW
131
AM6234ASGGHAALWR.B Active Production FCCSP (ALW) | 425 1000 | LARGE T&R Yes Call TI Level-3-260C-168 HR -40 to 105 AM6234A
SGGHAALW
131
AM6234ATCGGAALW Active Production FCCSP (ALW) | 425 119 | JEDEC Yes Call TI Level-3-260C-168 HR -40 to 105 AM6234A
TRAY (10+1) TCGGAALW
131
AM6234ATCGGAALW.B Active Production FCCSP (ALW) | 425 119 | JEDEC Yes Call TI Level-3-260C-168 HR -40 to 105 AM6234A
TRAY (10+1) TCGGAALW
131
AM6234ATCGHAALW Active Production FCCSP (ALW) | 425 119 | JEDEC Yes Call TI Level-3-260C-168 HR -40 to 105 AM6234A
TRAY (10+1) TCGHAALW
131
AM6234ATCGHAALW.B Active Production FCCSP (ALW) | 425 119 | JEDEC Yes Call TI Level-3-260C-168 HR -40 to 105 AM6234A
TRAY (10+1) TCGHAALW
131
AM6234ATGGHAALW Active Production FCCSP (ALW) | 425 119 | JEDEC Yes Call TI Level-3-260C-168 HR -40 to 105 AM6234A
TRAY (10+1) TGGHAALW
131
AM6234ATGGHAALW.B Active Production FCCSP (ALW) | 425 119 | JEDEC Yes Call TI Level-3-260C-168 HR -40 to 105 AM6234A
TRAY (10+1) TGGHAALW
131
AM6234ATGGHIALWR Active Production FCCSP (ALW) | 425 1000 | LARGE T&R Yes Call TI Level-3-260C-168 HR -40 to 125 AM6234A
TGGHIALW
131
Addendum-Page 4
PACKAGE OPTION ADDENDUM
[Link] 10-Dec-2025
Orderable part number Status Material type Package | Pins Package qty | Carrier RoHS Lead finish/ MSL rating/ Op temp (°C) Part marking
(1) (2) (3) Ball material Peak reflow (6)
(4) (5)
AM6234ATGGHIALWR.B Active Production FCCSP (ALW) | 425 1000 | LARGE T&R Yes Call TI Level-3-260C-168 HR -40 to 125 AM6234A
TGGHIALW
131
AM6251ASGGHAALWR Active Production FCCSP (ALW) | 425 1000 | LARGE T&R Yes Call TI Level-3-260C-168 HR -40 to 105 AM6251A
SGGHAALW
131
AM6251ASGGHAALWR.B Active Production FCCSP (ALW) | 425 1000 | LARGE T&R Yes Call TI Level-3-260C-168 HR -40 to 105 AM6251A
SGGHAALW
131
AM6251ATCGHAALW Active Production FCCSP (ALW) | 425 119 | JEDEC Yes Call TI Level-3-260C-168 HR -40 to 105 AM6251A
TRAY (10+1) TCGHAALW
131
AM6251ATCGHAALW.B Active Production FCCSP (ALW) | 425 119 | JEDEC Yes Call TI Level-3-260C-168 HR -40 to 105 AM6251A
TRAY (10+1) TCGHAALW
131
AM6251ATGGHAALWR Active Production FCCSP (ALW) | 425 1000 | LARGE T&R Yes Call TI Level-3-260C-168 HR -40 to 105 AM6251A
TGGHAALW
131
AM6251ATGGHAALWR.B Active Production FCCSP (ALW) | 425 1000 | LARGE T&R Yes Call TI Level-3-260C-168 HR -40 to 105 AM6251A
TGGHAALW
131
AM6251BSGFHIALWRQ1 Active Production FCCSP (ALW) | 425 1000 | LARGE T&R Yes Call TI Level-3-260C-168 HR -40 to 125 51BSGFHI
AM6251BSGFHIAMCRQ1 Active Production FCBGA (AMC) | 441 500 | LARGE T&R - Call TI Level-3-250C-168 HR -40 to 125 51BSGFHI Q1
AM6252ASGFHIAMCRQ1 Active Production FCBGA (AMC) | 441 500 | LARGE T&R Yes Call TI Level-3-250C-168 HR -40 to 125 AM6252A
SGFHIAMCQ1
131
AM6252ASGFHIAMCRQ1.B Active Production FCBGA (AMC) | 441 500 | LARGE T&R Yes Call TI Level-3-250C-168 HR -40 to 125 AM6252A
SGFHIAMCQ1
131
AM6252ASGGHAALWR Active Production FCCSP (ALW) | 425 1000 | LARGE T&R Yes Call TI Level-3-260C-168 HR -40 to 105 AM6252A
SGGHAALW
131
AM6252ASGGHAALWR.B Active Production FCCSP (ALW) | 425 1000 | LARGE T&R Yes Call TI Level-3-260C-168 HR -40 to 105 AM6252A
SGGHAALW
131
Addendum-Page 5
PACKAGE OPTION ADDENDUM
[Link] 10-Dec-2025
Orderable part number Status Material type Package | Pins Package qty | Carrier RoHS Lead finish/ MSL rating/ Op temp (°C) Part marking
(1) (2) (3) Ball material Peak reflow (6)
(4) (5)
AM6252ATCGGAALW Active Production FCCSP (ALW) | 425 119 | JEDEC Yes Call TI Level-3-260C-168 HR -40 to 105 AM6252A
TRAY (10+1) TCGGAALW
131
AM6252ATCGGAALW.B Active Production FCCSP (ALW) | 425 119 | JEDEC Yes Call TI Level-3-260C-168 HR -40 to 105 AM6252A
TRAY (10+1) TCGGAALW
131
AM6252ATCGHAALW Active Production FCCSP (ALW) | 425 119 | JEDEC Yes Call TI Level-3-260C-168 HR -40 to 105 AM6252A
TRAY (10+1) TCGHAALW
131
AM6252ATCGHAALW.B Active Production FCCSP (ALW) | 425 119 | JEDEC Yes Call TI Level-3-260C-168 HR -40 to 105 AM6252A
TRAY (10+1) TCGHAALW
131
AM6252ATGGHAALWR Active Production FCCSP (ALW) | 425 1000 | LARGE T&R Yes Call TI Level-3-260C-168 HR -40 to 105 AM6252A
TGGHAALW
131
AM6252ATGGHAALWR.B Active Production FCCSP (ALW) | 425 1000 | LARGE T&R Yes Call TI Level-3-260C-168 HR -40 to 105 AM6252A
TGGHAALW
131
AM6252BSGFHIAMCRQ1 Active Production FCBGA (AMC) | 441 500 | LARGE T&R - Call TI Level-3-250C-168 HR -40 to 125 52BSGFHI Q1
AM6252BTCFHIALWRQ1 Active Production FCCSP (ALW) | 425 1000 | LARGE T&R Yes Call TI Level-3-260C-168 HR -40 to 125 52BTCFHI
AM6252BTGFHIALWRQ1 Active Production FCCSP (ALW) | 425 1000 | LARGE T&R Yes Call TI Level-3-260C-168 HR -40 to 125 52BTGFHI
AM6252BTGFHIAMCRQ1 Active Production FCBGA (AMC) | 441 500 | LARGE T&R - Call TI Level-3-250C-168 HR -40 to 125 52BTGFHI Q1
AM6254ASGGHAALW Active Production FCCSP (ALW) | 425 119 | JEDEC Yes Call TI Level-3-260C-168 HR -40 to 105 AM6254A
TRAY (10+1) SGGHAALW
131
AM6254ASGGHAALW.B Active Production FCCSP (ALW) | 425 119 | JEDEC Yes Call TI Level-3-260C-168 HR -40 to 105 AM6254A
TRAY (10+1) SGGHAALW
131
AM6254ATCGGAALW Active Production FCCSP (ALW) | 425 119 | JEDEC Yes Call TI Level-3-260C-168 HR -40 to 105 AM6254A
TRAY (10+1) TCGGAALW
131
AM6254ATCGGAALW.B Active Production FCCSP (ALW) | 425 119 | JEDEC Yes Call TI Level-3-260C-168 HR -40 to 105 AM6254A
TRAY (10+1) TCGGAALW
131
Addendum-Page 6
PACKAGE OPTION ADDENDUM
[Link] 10-Dec-2025
Orderable part number Status Material type Package | Pins Package qty | Carrier RoHS Lead finish/ MSL rating/ Op temp (°C) Part marking
(1) (2) (3) Ball material Peak reflow (6)
(4) (5)
AM6254ATCGHAALW Active Production FCCSP (ALW) | 425 119 | JEDEC Yes Call TI Level-3-260C-168 HR -40 to 105 AM6254A
TRAY (10+1) TCGHAALW
131
AM6254ATCGHAALW.B Active Production FCCSP (ALW) | 425 119 | JEDEC Yes Call TI Level-3-260C-168 HR -40 to 105 AM6254A
TRAY (10+1) TCGHAALW
131
AM6254ATCGHIALWR Active Production FCCSP (ALW) | 425 1000 | LARGE T&R Yes Call TI Level-3-260C-168 HR -40 to 125 AM6254A
TCGHIALW
131
AM6254ATCGHIALWR.B Active Production FCCSP (ALW) | 425 1000 | LARGE T&R Yes Call TI Level-3-260C-168 HR -40 to 125 AM6254A
TCGHIALW
131
AM6254ATGFHIAMCRQ1 Active Production FCBGA (AMC) | 441 500 | LARGE T&R Yes Call TI Level-3-250C-168 HR -40 to 125 AM6254A
TGFHIAMCQ1
131
AM6254ATGFHIAMCRQ1.B Active Production FCBGA (AMC) | 441 500 | LARGE T&R Yes Call TI Level-3-250C-168 HR -40 to 125 AM6254A
TGFHIAMCQ1
131
AM6254ATGGHAALW Active Production FCCSP (ALW) | 425 119 | JEDEC Yes Call TI Level-3-260C-168 HR -40 to 105 AM6254A
TRAY (10+1) TGGHAALW
131
AM6254ATGGHAALW.B Active Production FCCSP (ALW) | 425 119 | JEDEC Yes Call TI Level-3-260C-168 HR -40 to 105 AM6254A
TRAY (10+1) TGGHAALW
131
AM6254BSGFHIAMCRQ1 Active Production FCBGA (AMC) | 441 500 | LARGE T&R - Call TI Level-3-250C-168 HR -40 to 125 54BSGFHI Q1
AM6254BTCFHIALWRQ1 Active Production FCCSP (ALW) | 425 1000 | LARGE T&R Yes Call TI Level-3-260C-168 HR -40 to 125 54BTCFHI
AM6254BTGFHIALWRQ1 Active Production FCCSP (ALW) | 425 1000 | LARGE T&R Yes Call TI Level-3-250C-168 HR -40 to 125 54BTGFHI
AM6254BTGFHIAMCRQ1 Active Production FCBGA (AMC) | 441 500 | LARGE T&R - Call TI Level-3-250C-168 HR -40 to 125 54BTGFHI Q1
(1)
Status: For more details on status, see our product life cycle.
(2)
Material type: When designated, preproduction parts are prototypes/experimental devices, and are not yet approved or released for full production. Testing and final process, including without limitation quality assurance,
reliability performance testing, and/or process qualification, may not yet be complete, and this item is subject to further changes or possible discontinuation. If available for ordering, purchases will be subject to an additional
waiver at checkout, and are intended for early internal evaluation purposes only. These items are sold without warranties of any kind.
(3)
RoHS values: Yes, No, RoHS Exempt. See the TI RoHS Statement for additional information and value definition.
Addendum-Page 7
PACKAGE OPTION ADDENDUM
[Link] 10-Dec-2025
(4)
Lead finish/Ball material: Parts may have multiple material finish options. Finish options are separated by a vertical ruled line. Lead finish/Ball material values may wrap to two lines if the finish value exceeds the maximum
column width.
(5)
MSL rating/Peak reflow: The moisture sensitivity level ratings and peak solder (reflow) temperatures. In the event that a part has multiple moisture sensitivity ratings, only the lowest level per JEDEC standards is shown.
Refer to the shipping label for the actual reflow temperature that will be used to mount the part to the printed circuit board.
(6)
Part marking: There may be an additional marking, which relates to the logo, the lot trace code information, or the environmental category of the part.
Multiple part markings will be inside parentheses. Only one part marking contained in parentheses and separated by a "~" will appear on a part. If a line is indented then it is a continuation of the previous line and the two
combined represent the entire part marking for that device.
Important Information and Disclaimer:The information provided on this page represents TI's knowledge and belief as of the date that it is provided. TI bases its knowledge and belief on information provided by third parties, and
makes no representation or warranty as to the accuracy of such information. Efforts are underway to better integrate information from third parties. TI has taken and continues to take reasonable steps to provide representative
and accurate information but may not have conducted destructive testing or chemical analysis on incoming materials and chemicals. TI and TI suppliers consider certain information to be proprietary, and thus CAS numbers
and other limited information may not be available for release.
In no event shall TI's liability arising out of such information exceed the total purchase price of the TI part(s) at issue in this document sold by TI to Customer on an annual basis.
• Catalog : AM625
• Automotive : AM625-Q1
Addendum-Page 8
PACKAGE MATERIALS INFORMATION
[Link] 20-Nov-2025
B0 W
Reel
Diameter
Cavity A0
A0 Dimension designed to accommodate the component width
B0 Dimension designed to accommodate the component length
K0 Dimension designed to accommodate the component thickness
W Overall width of the carrier tape
P1 Pitch between successive cavity centers
Sprocket Holes
Q1 Q2 Q1 Q2
Pocket Quadrants
Pack Materials-Page 1
PACKAGE MATERIALS INFORMATION
[Link] 20-Nov-2025
Pack Materials-Page 2
PACKAGE MATERIALS INFORMATION
[Link] 20-Nov-2025
Width (mm)
H
W
Pack Materials-Page 3
PACKAGE MATERIALS INFORMATION
[Link] 20-Nov-2025
Device Package Type Package Drawing Pins SPQ Length (mm) Width (mm) Height (mm)
AM6232ATGGHAALWR FCCSP ALW 425 1000 336.6 336.6 41.3
AM6232ATGGHIALWR FCCSP ALW 425 1000 336.6 336.6 41.3
AM6234ASCGHAALWR FCCSP ALW 425 1000 336.6 336.6 41.3
AM6234ASGGHAALWR FCCSP ALW 425 1000 336.6 336.6 41.3
AM6234ATGGHIALWR FCCSP ALW 425 1000 336.6 336.6 41.3
AM6251ASGGHAALWR FCCSP ALW 425 1000 336.6 336.6 41.3
AM6251ATGGHAALWR FCCSP ALW 425 1000 336.6 336.6 41.3
AM6251BSGFHIALWRQ1 FCCSP ALW 425 1000 336.6 336.6 41.3
AM6251BSGFHIAMCRQ1 FCBGA AMC 441 500 336.6 336.6 41.3
AM6252ASGFHIAMCRQ1 FCBGA AMC 441 500 336.6 336.6 41.3
AM6252ASGGHAALWR FCCSP ALW 425 1000 336.6 336.6 41.3
AM6252ATGGHAALWR FCCSP ALW 425 1000 336.6 336.6 41.3
AM6252BSGFHIAMCRQ1 FCBGA AMC 441 500 336.6 336.6 41.3
AM6252BTCFHIALWRQ1 FCCSP ALW 425 1000 336.6 336.6 41.3
AM6252BTGFHIALWRQ1 FCCSP ALW 425 1000 336.6 336.6 41.3
AM6252BTGFHIAMCRQ1 FCBGA AMC 441 500 336.6 336.6 41.3
AM6254ATCGHIALWR FCCSP ALW 425 1000 336.6 336.6 41.3
AM6254ATGFHIAMCRQ1 FCBGA AMC 441 500 336.6 336.6 41.3
AM6254BSGFHIAMCRQ1 FCBGA AMC 441 500 336.6 336.6 41.3
AM6254BTCFHIALWRQ1 FCCSP ALW 425 1000 336.6 336.6 41.3
AM6254BTGFHIALWRQ1 FCCSP ALW 425 1000 336.6 336.6 41.3
AM6254BTGFHIAMCRQ1 FCBGA AMC 441 500 336.6 336.6 41.3
Pack Materials-Page 4
PACKAGE MATERIALS INFORMATION
[Link] 20-Nov-2025
TRAY
W-
Outer
tray
width
Text
Pack Materials-Page 5
PACKAGE MATERIALS INFORMATION
[Link] 20-Nov-2025
Pack Materials-Page 6
PACKAGE OUTLINE
ALW0425A SCALE 1.000
FCCSP - 0.89 mm max height
PLASTIC BALL GRID ARRAY
13.1
B A
12.9
BALL A1
CORNER
13.1
12.9
0.15 C
SEATING PLANE
0.08 C
0.273
12 TYP
0.150
(0.5)
SYMM
AE
AD
AC (0.5)
AB
AA
Y
W
V
U
T
R
P SYMM
12 TYP N
M
L
K
J
H
G
F
E
D 0.35
425X
C 0.25
B 0.15 C A B
A
1 3 5 7 9 11 13 15 17 19 21 23 25
0.08 C
2 4 6 8 10 12 14 16 18 20 22 24
0.5 TYP
0.5 TYP
4227026/C 04/2025
NOTES:
1. All linear dimensions are in millimeters. Any dimensions in parenthesis are for reference only. Dimensioning and tolerancing
per ASME Y14.5M.
2. This drawing is subject to change without notice.
[Link]
EXAMPLE BOARD LAYOUT
ALW0425A FCCSP - 0.89 mm max height
PLASTIC BALL GRID ARRAY
(0.5) TYP
425X ( 0.25)
1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 17 18 19 20 21 22 23 24 25
(0.5) TYP A
B
C
D
E
F
G
H
J
K
L
M
SYMM
N
P
R
T
U
V
W
Y
AA
AB
AC
AD
AE
SYMM
( 0.25) ( 0.25)
SOLDER MASK EXPOSED METAL
METAL EDGE SOLDER MASK
OPENING
OPENING
NON-SOLDER MASK SOLDER MASK
DEFINED DEFINED
(PREFERRED)
SOLDER MASK DETAILS
NOT TO SCALE
4227026/C 04/2025
NOTES: (continued)
3. Final dimensions may vary due to manufacturing tolerance considerations and also routing constraints.
For information, see Texas Instruments literature number SPRAA99 ([Link]/lit/spraa99).
[Link]
EXAMPLE STENCIL DESIGN
ALW0425A FCCSP - 0.89 mm max height
PLASTIC BALL GRID ARRAY
(0.5) TYP
425X ( 0.25)
1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 17 18 19 20 21 22 23 24 25
(0.5) TYP A
B
C
D
E
F
G
H
J
K
L
M
SYMM
N
P
R
T
U
V
W
Y
AA
AB
AC
AD
AE
SYMM
4227026/C 04/2025
NOTES: (continued)
4. Laser cutting apertures with trapezoidal walls and rounded corners may offer better paste release.
[Link]
PACKAGE OUTLINE
AMC0441A SCALE 0.900
FCBGA - 2.57 mm max height
BALL GRID ARRAY
17.3 A
B
17.1
BALL A1 CORNER
PIN 1 ID
(OPTIONAL) 17.3
17.1
( 12.8)
0.1 C
( 11)
( 16.8)
SEATING PLANE
(0.577)
0.15 C
0.5
TYP
0.3
16 TYP
(0.6) TYP
0.8 TYP SYMM
(0.6) TYP
AA
Y
W
V
U
T
R
P
N
SYMM M
L 16
K
J TYP
H
G
F
E
D
0.55 C
441X
0.45 B
0.25 C A B A
1 2 3 4 5 6 7 8 9 10 12 14 16 18 20
0.1 C 11 13 15 17 19 21
0.8 TYP
4228316/A 12/2021
NOTES:
1. All linear dimensions are in millimeters. Any dimensions in parenthesis are for reference only. Dimensioning and tolerancing
per ASME Y14.5M.
2. This drawing is subject to change without notice.
[Link]
EXAMPLE BOARD LAYOUT
AMC0441A FCBGA - 2.57 mm max height
BALL GRID ARRAY
1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 17 18 19 20 21
(0.8) TYP A
B
C
D
E
F
G
H
J
K
SYMM
L
M
N
P
R
T
U
V
W
Y
AA
SYMM
0.07 MAX
( 0.4) 0.07 MIN METAL UNDER
METAL SOLDER MASK
EXPOSED METAL
NOTES: (continued)
3. Final dimensions may vary due to manufacturing tolerance considerations and also routing constraints.
For more information, see Texas Instruments literature number SPRU811 ([Link]/lit/spru811).
[Link]
EXAMPLE STENCIL DESIGN
AMC0441A FCBGA - 2.57 mm max height
BALL GRID ARRAY
1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 17 18 19 20 21
(0.8) TYP A
B
C
D
E
F
G
H
J
K SYMM
L
M
N
P
R
T
U
V
W
Y
AA
SYMM
4228316/A 12/2021
NOTES: (continued)
4. Laser cutting apertures with trapezoidal walls and rounded corners may offer better paste release.
[Link]
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